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Microscopy
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Electron Microscopy Transfer System to Protect Atmosphere‐Sensitive Materials for Scanning Electron Microscopy Characterization
Microscopy Research and Technique
2026-01-03
Large volume ‘chunk’ lift out for 3D tomographic analysis using analytical plasma focussed ion beam – scanning electron microscopy
Micron
2026-01-02
Evaluation of the reproducibility and crystal tracking precision of TEM goniometers in tomography experiments
Ultramicroscopy
2026-01-07
Application of Noise2Inverse and adaptation (Noise2Phase) to single‐mask x‐ray phase contrast micro‐computed tomography
Journal of Microscopy
2025-12-31
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