IEEE Journal of the Electron Devices Society

Papers
(The TQCC of IEEE Journal of the Electron Devices Society is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-04-01 to 2024-04-01.)
ArticleCitations
First RF Power Operation of AlN/GaN/AlN HEMTs With >3 A/mm and 3 W/mm at 10 GHz36
Time-Dependent Dielectric Breakdown of Commercial 1.2 kV 4H-SiC Power MOSFETs33
Large-Signal Modeling of GaN HEMTs Using Hybrid GA-ANN, PSO-SVR, and GPR-Based Approaches30
Demonstration of Low-Temperature Fine-Pitch Cu/SiO₂ Hybrid Bonding by Au Passivation26
Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures26
Compact Millimeter-Wave On-Chip Dual-Band Bandpass Filter in 0.15-μm GaAs Technology25
Improvement in Self-Heating Characteristic by Incorporating Hetero-Gate-Dielectric in Gate-All-Around MOSFETs24
1T1C FeRAM Memory Array Based on Ferroelectric HZO With Capacitor Under Bitline24
READ-Optimized 28nm HKMG Multibit FeFET Synapses for Inference-Engine Applications21
Performance Analysis on Complementary FET (CFET) Relative to Standard CMOS With Nanosheet FET18
Steep Switching Characteristics of L-Shaped Tunnel FET With Doping Engineering18
Electrolyte-Gated Field Effect Transistors in Biological Sensing: A Survey of Electrolytes17
A Novel SiC Asymmetric Cell Trench MOSFET With Split Gate and Integrated JBS Diode17
Analysis of Low Voltage RF Power Capability on AlGaN/GaN and InAlN/GaN HEMTs for Terminal Applications17
1.3 kV Reverse-Blocking AlGaN/GaN MISHEMT With Ultralow Turn-On Voltage 0.25 V17
Ultrathin Sub-5-nm Hf₁₋ZrO₂ for a Stacked Gate-all-Around Nanowire Ferroelectric FET With Internal Metal Gate16
AM PWM Driving Circuit for Mini-LED Backlight in Liquid Crystal Displays16
Variability Study of Ferroelectric Field-Effect Transistors Towards 7nm Technology Node16
1 W/mm Output Power Density for H-Terminated Diamond MOSFETs With Al2O3/SiO2Bi-Layer Passivation at 2 GHz15
An Inclusive Structural Analysis on the Design of 1.2kV 4H-SiC Planar MOSFETs15
Aqueous Solution Derived Amorphous Indium Doped Gallium Oxide Thin-Film Transistors14
Work-Function Fluctuation of Gate-All-Around Silicon Nanowire n-MOSFETs: A Unified Comparison Between Cuboid and Voronoi Methods14
Efficient and Optimized Methods for Alleviating the Impacts of IR-Drop and Fault in RRAM Based Neural Computing Systems14
A Low Power and IR Drop Compensable AMOLED Pixel Circuit Based on Low-Temperature Poly-Si and Oxide (LTPO) TFTs Hybrid Technology13
GaN Integrated Bridge Circuits on Bulk Silicon Substrate: Issues and Proposed Solution13
A 1200-V-Class Ultra-Low Specific On-Resistance SiC Lateral MOSFET With Double Trench Gate and VLD Technique13
On the Conduction Properties of Vertical GaN n-Channel Trench MISFETs12
Pixellated Perovskite Photodiode on IGZO Thin Film Transistor Backplane for Low Dose Indirect X-Ray Detection12
Novel Si/SiC Heterojunction Lateral Double-Diffused Metal Oxide Semiconductor With SIPOS Field Plate by Simulation Study12
Modeling and Design of FTJs as Multi-Level Low Energy Memristors for Neuromorphic Computing12
Light-Controlled Gap-Type TFT Used for Large-Area Under-Screen Fingerprint Sensor12
Characteristics of Field-Emission Emitters Based On Graphene Decorated ZnO Nanostructures12
Low-Temperature Solution-Processed All Organic Integration for Large-Area and Flexible High-Resolution Imaging12
Comprehensive Investigation and Comparative Analysis of Machine Learning-Based Small-Signal Modelling Techniques for GaN HEMTs12
GaN MSM UV Detectors With Different Electrode Materials11
High-Temperature Characterizations of a Half-Bridge Wire-Bondless SiC MOSFET Module11
Analysis of Trap and Recovery Characteristics Based on Low-Frequency Noise for E-Mode GaN HEMTs Under Electrostatic Discharge Stress11
Core-Shell Dual-Gate Nanowire Memory as a Synaptic Device for Neuromorphic Application11
High-Performance ZnO Thin-Film Transistors on Flexible PET Substrates With a Maximum Process Temperature of 100 °C11
Abnormal Bias Instabilities Induced by Lateral H2O Diffusion Into Top-Gate Insulator of a-InGaZnO Thin-Film Transistors11
Determining the Electrical Charging Speed Limit of ReRAM Devices11
Parasitic Capacitance Analysis of Three-Independent-Gate Field-Effect Transistors11
Field-Plated NiO/Ga2O3 p-n Heterojunction Power Diodes With High-Temperature Thermal Stability and Near Unity Ideality Factors11
Ultra-Scaled AlOx Diffusion Barriers for Multibit HfOx RRAM Operation10
Optimal Design and Noise Analysis of High-Performance DBR-Integrated Lateral Germanium (Ge) Photodetectors for SWIR Applications10
Design and Simulation of Near-Terahertz GaN Photoconductive Switches–Operation in the Negative Differential Mobility Regime and Pulse Compression10
4H-SiC-Based ESD Protection Design With Optimization of Segmented LIGBT for High-Voltage Applications10
A Hybrid Model of Turn-Off Loss and Turn-Off Time for Junction Temperature Extraction10
A Novel Real-Time TFT Threshold Voltage Compensation Method for AM-OLED Using Double Sampling of Source Node Voltage10
An Improved Transistor Modeling Methodology Exploiting the Quasi-Static Approximation10
Sheet Resistance Reduction of MoS₂ Film Using Sputtering and Chlorine Plasma Treatment Followed by Sulfur Vapor Annealing10
Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications9
Physical Modeling of Charge Trapping Effects in GaN/Si Devices and Incorporation in the ASM-HEMT Model9
Narrow Sub-Fin Technique for Suppressing Parasitic-Channel Effect in Stacked Nanosheet Transistors9
Complementary-Like Inverter Based on Organic-Inorganic Heterojunction Ambipolar Transistors on Flexible Substrate9
On the Challenges of Reliable Threshold Voltage Measurement in Ohmic and Schottky Gate p-GaN HEMTs9
Fabrication and Characterization of GaN-Based Fin-Channel Array Metal-Oxide-Semiconductor High-Electron Mobility Transistors With Recessed-Gate and Ga₂O₃ Gate Insulator Layer9
Non-Pad-Based in Situ In-Operando CDM ESD Protection Using Internally Distributed Network9
Fast and Expandable ANN-Based Compact Model and Parameter Extraction for Emerging Transistors9
Junction Design and Complementary Capacitance Matching for NCFET CMOS Logic9
Figures-of-Merit of Lateral GaN Power Devices: Modeling and Comparison of HEMTs and PSJs9
A Zero-Cost Technique to Improve ON-State Performance and Reliability of Power LDMOS Transistors8
BEOL Integrated Ferroelectric HfO₂-Based Capacitors for FeRAM: Extrapolation of Reliability Performance to Use Conditions8
Low-Power Vertical Tunnel Field-Effect Transistor Ternary Inverter8
A Tall Gate Stem GaN HEMT With Improved Power Density and Efficiency at Ka-Band8
Analog Resistive Switching in BEOL, Ferroelectric Synaptic Weights8
Size Effects of Poly-Si Formed by Laser Annealing With Periodic Intensity Distribution on the TFT Characteristics8
Electron Conduction Channel of Silver Nanowire Modified TiO₂ Photoanode for Improvement of Interface Impedance of Dye-Sensitized Solar Cell8
Enhancement of Breakdown Voltage in p-GaN Gate AlGaN/GaN HEMTs With a Stepped Hybrid GaN/AlN Buffer Layer8
A Study of ESD-mmWave-Switch Co-Design of 28GHz Distributed Travelling Wave Switch in 22nm FDSOI for 5G Systems8
Study of Current Collapse Behaviors of Dual-Gate AlGaN/GaN HEMTs on Si8
Reliability Study of 1T1C FeRAM Arrays With Hf0.5Zr0.5O₂ Thickness Scaling8
Interplay Between Charge Trapping and Polarization Switching in BEOL-Compatible Bilayer Ferroelectric Tunnel Junctions8
New Compact Modeling Solutions for Organic and Amorphous Oxide TFTs8
AM Mini-LED Backlight Driving Circuit Using PWM Method With Power-Saving Mechanism8
ESD Design Verification Aided by Mixed-Mode Multiple-Stimuli ESD Simulation7
Physics-Based DC Compact Modeling of Schottky Barrier and Reconfigurable Field-Effect Transistors7
Pd Nanoparticle Adsorption ZnO Nanorods for Enhancing Photodetector UV-Sensing Performance7
Sub-10 nm Top Width Nanowire InGaAs Gate-All-Around MOSFETs With Improved Subthreshold Characteristics and Device Reliability7
Limitations to Electrical Probing of Spontaneous Polarization in Ferroelectric-Dielectric Heterostructures7
AlInGaN/GaN HEMTs With High Johnson’s Figure-of-Merit on Low Resistivity Silicon Substrate7
Investigation of Time Dependent Dielectric Breakdown (TDDB) of Hf0.5Zr0.5O2-Based Ferroelectrics Under Both Forward and Reverse Stress Conditions7
Quenching Statistics of Silicon Single Photon Avalanche Diodes7
On the Critical Role of Ferroelectric Thickness for Negative Capacitance Device-Circuit Interaction6
Wide Bandgap Vertical kV-Class β-Ga₂O₃/GaN Heterojunction p-n Power Diodes With Mesa Edge Termination6
Graded Crystalline HfO₂ Gate Dielectric Layer for High-k/Ge MOS Gate Stack6
Self-Aligned Top-Gate Amorphous Zinc-Tin Oxide Thin-Film Transistor With Source/Drain Regions Doped by Al Reaction6
Effect of the Blocking Oxide Layer With Asymmetric Taper Angles in 3-D NAND Flash Memories6
Assessment of Linear, Hexagonal, and Octagonal Cell Topologies for 650 V 4H-SiC Inversion-Channel Planar-Gate Power JBSFETs Fabricated With 27 nm Gate Oxide Thickness6
Two-Dimensional Transient Temperature Distribution Measurement of GaN Light-Emitting Diode Using High Speed Camera6
Numerical Analysis of Deterministic Switching of a Perpendicularly Magnetized Spin-Orbit Torque Memory Cell6
Investigation on the Influence of Ohmic Structure on Channel-to-Channel Coupling Effect in InAlN/GaN Double Channel HEMTs6
Low-Resistive Source/Drain Formation Using Nitrogen Plasma Treatment in Self-Aligned In-Ga-Zn-Sn-O Thin-Film Transistors6
Improved Electrical and Temporal Stability of In-Zn Oxide Semiconductor Thin-Film Transistors With Organic Passivation Layer6
High Hole Mobility and Low Leakage Thin-Body (In)GaSb p-MOSFETs Grown on High-Bandgap AlGaSb6
Simulation Study of 4H-SiC High-k Pillar MOSFET With Integrated Schottky Barrier Diode6
Area and Thickness Scaling of NbOₓ-Based Threshold Switches for Oscillation Neurons6
Generalized Frequency Dependent Small Signal Model for High Frequency Analysis of AlGaN/GaN MOS-HEMTs6
An Integrator and Schmitt Trigger Based Voltage-to-Frequency Converter Using Unipolar Metal-Oxide Thin Film Transistors6
An RF Stress-Based Thermal Shock Test Method for a CMOS Power Amplifier5
Experimental Investigation of Threshold Voltage Temperature Effect During Cross-Temperature Write–Read Operations in 3-D NAND Flash5
Improvement in Instability of Transparent ALD ZnO TFTs Under Negative Bias Illumination Stress With SiO/AlO Bilayer Dielectric 5
Random Telegraph Noise Modeling for Circuit Analysis: RTN in Ring Oscillators5
Graphene–Silicon Diode for 2-D Heterostructure Electrical Failure Protection5
Simultaneous Analysis of Multi-Variables Effect on the Performance of Multi-Domain MFIS Negative Capacitance Field-Effect Transistors5
Silicon Wafer Gettering Design for Advanced CMOS Image Sensors Using Hydrocarbon Molecular Ion Implantation: A Review5
Subthreshold Swing in Silicon Gate-All-Around Nanowire and Fully Depleted SOI MOSFETs at Cryogenic Temperature5
Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices5
2.3 kV 4H-SiC Planar-Gate Accumulation Channel Power JBSFETs: Analysis of Experimental Data5
Enhancement-Mode Characteristics of Al₀.₆₅Ga₀.₃₅N/Al₀.₃Ga₀.₇N/AlN/SiC MOS-HFETs5
Electrical Properties of Ultra-Thin Body (111) Ge-On-Insulator n-Channel MOSFETs Fabricated by Smart-Cut Process5
SPICE Modeling and Circuit Demonstration of a SiC Power IC Technology5
Two-Dimensional Inverters Based on MoS₂-hBN-Graphene Heterostructures Enabled by a Layer-by-Layer Dry-Transfer Method5
A Snapback-Free and Fast-Switching Shorted-Anode LIGBT With Multiple Current P-Plugs5
Formation Mechanism of Rounded SiGe-Etch Front in Isotropic SiGe Plasma Etching for Gate-All-Around FETs5
Transparent Floating Gate Memory Based on ZnO Thin Film Transistor With Controllable Memory Window5
A Common Drain Operational Amplifier Using Positive Feedback Integrated by Metal-Oxide TFTs5
Analog Read Noise and Quantizer Threshold Estimation From Quanta Image Sensor Bit Density5
-GaO Field Plate Schottky Barrier Diode With Superb Reverse Recovery for High-Efficiency DC–DC Converter 5
Fully Depleted SOI Technology for Millimeter-Wave Integrated Circuits5
Extremely-Low Threshold Voltage FinFET for 5G mmWave Applications5
Comparison of Short-Circuit Safe Operating Areas Between the Conventional Field-Stop IGBT and the Superjunction Field-Stop IGBT4
Efficient Erase Operation by GIDL Current for 3D Structure FeFETs With Gate Stack Engineering and Compact Long-Term Retention Model4
A Novel Split-Gate-Trench MOSFET Integrated With Normal Gate and Built-In Channel Diode4
Cryogenic CMOS RF Device Modeling for Scalable Quantum Computer Design4
Gray Wolf Optimization-Based Modeling Technique Applied to GaN High Mobility Electron Transistors4
Improving the Drift Effect and Hysteresis Effect of Urea Biosensor Based on Graphene Oxide/Nickel Oxide Sensing Film Modified Either by Au Nanoparticles or γ-Fe₂O₃ Nanoparticles Using Back-End 4
Ferroelectric-Like Non-Volatile FET With Amorphous Gate Insulator for Supervised Learning Applications4
Real-Time Switching Dynamics in STT-MRAM4
Characterization of 22 nm FDSOI nMOSFETs With Different Backplane Doping at Cryogenic Temperature4
Analysis of Residual Stresses Induced in the Confined 3D NAND Flash Memory Structure for Process Optimization4
Microstructure and Granularity Effects in Electromigration4
No-Snapback LDMOS Using Adaptive RESURF and Hybrid Source for Ideal SOA4
Improved Perovskite Solar Cell Performance by High Growth Rate Spatial Atomic Layer Deposited Titanium Oxide Compact Layer4
Characterization and Modeling of Quantum Dot Behavior in FDSOI Devices4
Optimum Functionalization of Si Nanowire FET for Electrical Detection of DNA Hybridization4
Low-Temperature Packaging of Ion-Sensitive Organic Field-Effect Transistors on Plastic for Multiple Ion Detection4
Modeling and Analysis of Double Channel GaN HEMTs Using a Physics-Based Analytical Model4
Hf-Based and Zr-Based Charge Trapping Layer Engineering for E-Mode GaN MIS-HEMT Using Ferroelectric Charge Trap Gate Stack4
Low Loss and Low EMI Noise CSTBT With Split Gate and Recessed Emitter Trench4
Low Switching Loss Split-Gate 4H-SiC MOSFET With Integrated Heterojunction Diode4
A Physics-Based Model for Mobile-Ionic Field-Effect Transistors With Steep Subthreshold Swing4
High Single-Event Burnout Resistance 4H-SiC Junction Barrier Schottky Diode4
The Impact of LCE and PAMDLE Regarding Different CMOS ICs Nodes and High Temperatures4
A Stochastic Leaky-Integrate-and-Fire Neuron Model With Floating Gate-Based Technology for Fast and Accurate Population Coding4
Graphitic Carbon Nitride (g-C₃N₄)/Al₂O₃ Heterostructure as Double Dielectric: A Comparative Study in MIS Based on a-IGZO4
The Impact of Width Downscaling on the High-Frequency Characteristics of InGaAs Nanowire FETs4
Statistical and Electrical Modeling of FDSOI Four-Gate Qubit MOS Devices at Room Temperature4
Implant Straggle Impact on 1.2 kV SiC Power MOSFET Static and Dynamic Parameters4
Six Decades of Research on 2D Materials: Progress, Dead Ends, and New Horizons4
Influence of the Acceptor-Type Trap on the Threshold Voltage of the Short-Channel GaN MOS-HEMT4
Variable-Temperature Noise Characterization of N-MOSFETs Using an In-Situ Broadband Amplifier4
Deep Source Metal Trenches in GaN-On-Si HEMTs for Relieving Current Collapse4
Liquid Metal-Based Microfluidic Metasurface for Controllable Electromagnetic Wave Reflection Attenuation4
Statistical Study of Degradation of Flexible Poly-Si TFTs Under Dynamic Bending Stress4
Quasi-Ballistic Drift-Diffusion Simulation of SiGe Nanowire MOSFETs Using the Kinetic Velocity Model4
Notice of Removal: Exceptionally Linear and Highly Sensitive Photo-Induced Unipolar Inverter Device4
High Temperature Operation of E-Mode and D-Mode AlGaN/GaN MIS-HEMTs With Recessed Gates4
Analyses and Experiments of Ultralow Specific On-Resistance LDMOS With Integrated Diodes4
Impact of Die Carrier on Reliability of Power LEDs4
Germanium Spherical Quantum-Dot Single-Hole Transistors With Self-Organized Tunnel Barriers and Self-Aligned Electrodes4
Analysis of Transfer Gate Doping Profile Influence on Dark Current and FWC in CMOS Image Sensors4
Demonstration of p-GaN/AlGaN/GaN High Electron Mobility Transistors With an Indium–Tin–Oxide Gate Electrode4
Effective Suppression of Current Collapse in AlGaN/GaN HEMT With N2O Plasma Treatment Followed by High Temperature Annealing in N2 Ambience4
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