OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Design & Test is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-04-01 to 2025-04-01.)

Article	Citations
Linear Algorithmic Checksums for Deep Neural Network Error Detection: Fundamentals & Recent Advancements	45
Report on the 2024 Embedded Systems Week (ESWEEK)	40
Top Picks in Hardware and Embedded Security 2022	38
Table of Contents	37
IEEE Foundation	36
IEEE Membership	34
Compact and High-Performing Five-Stage Pipeline RISC-V Microprocessor Designed for IoT Applications	27
IEEE Membership	26
Front Cover	25
SCA Strikes Back: Reverse-Engineering Neural Network Architectures Using Side Channels	23
Front Cover	23
Table of Contents	19
Machine Learning and Algorithms: Let Us Team Up for EDA	15
On the Mitigation of Read Disturbances in Neuromorphic Inference Hardware	15
Autonomous Systems Design: Charting a New Discipline	15
Machine Learning for CAD/EDA: The Road Ahead	15
IEEE Design & Test Publication Information	15
Guest Editors’ Introduction: Stochastic Computing for Neuromorphic Applications	15
BHT-NoC: Blaming Hardware Trojans in NoC Routers	14
HPC-Based Malware Detectors Actually Work: Transition to Practice After a Decade of Research	14
Report on the 2021 Embedded Systems Week (ESWEEK)	13
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators	13
RosettaStone: Connecting the Past, Present, and Future of Physical Design Research	12
On Backside Probing Techniques and Their Emerging Security Threats	12
STLs for GPUs: Using High-Level Language Approaches	12

Special Issue on Testability and Dependability of Artificial Intelligence Hardware	11
Open-Source Multilevel Converter Power IC Design and Test	11
40th IEEE VLSI Test Symposium 2022	11
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm	11
A Survey of High-Level Synthesis-Based Hardware (IP) Watermarking Approaches	11
Product Health Insights Using Telemetry	11
A NoC-Based Spatial DNN Inference Accelerator With Memory-Friendly Dataflow	11
A Reinforcement Learning Framework With Region-Awareness and Shared Path Experience for Efficient Routing in Networks-on-Chip	10
Special Issue on Postquantum Cryptography for Internet of Things	10
Losing My Memory	9
Fast Analysis Using Finite Queuing Model for Multilayer NoCs	9
Side Channel and Fault Analyses on Memristor-Based Logic In-Memory	9
PiN: Processing in Network-on-Chip	9
Robust and Secure Systems	8
Breaking Silos to Guarantee Control Stability with Communication over Ethernet TSN	8
Background Receiver IQ Imbalance Correction for In-Field Testing	8
Exact Stochastic Computing Multiplication in Memristive Memory	8
Attack of the AI Papers	8
Reconfigurable Pipelined Control Systems	8
Self-Healing of Redundant FLASH ADCs	7
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips	7
Adaptive Integer Linear Programming Model for Optimal Qubit Permutation	7
TTTC News	7
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic	7
Topology-Aided Multicorner Timing Predictor for Wide Voltage Design	7
Low-Power High-Throughput Architecture for AV1 Arithmetic Decoder	6
IEEE Design&Test Publication Information	6
TechRxiv: Share Your Preprint Research with the World!	6
Deep Reinforcement Learning for Optimization at Early Design Stages	6
Front Cover	6
IEEE Women in Engineering	6
Update Your IEEE Profile	6
ISLPED 2021: The 25th Anniversary!	6
Enabling Design Methodologies and Future Trends for Edge AI: Specialization and Codesign	6
Front Cover	6
IEEE Foundation	5
Binary Forward-Only Algorithms	5
Furthering Moore’s Law Integration Benefits in the Chiplet Era	5
Table of Contents	5
IC SEM Reverse Engineering Tutorial using Artificial Intelligence	5
Front Cover	5
TechRxiv: Share Your Preprint Research With the World!	5
IEEE Foundation	5
IEEE Design & Test Publication Information	5
IEEE Design & Test Publication Information	5
Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks	5
Join IEEE	5
SPOCK: Reverse Packet Traversal for Deadlock Recovery	5
IEEE Design&Test publication information	4
Design of Single-Bit Fault-Tolerant Reversible Circuits	4

Front Cover	4
Front Cover	4
IEEE Design&Test EIC Call for Nominations	4
[Front cover]	4
IEEE Design&Test publication information	4
Shape Engineering for Custom Nanomagnetic Logic Circuits in NMLSim 2.0	4
Being Learned	4
Front Cover	4
A Mixture of Experts Approach for Low-Cost DNN Customization	4
Proceedings of the IEEE	4
The AXIOM Project: IoT on Heterogeneous Embedded Platforms	4
Ladder Scaling Fracmemristor: A Second Emerging Circuit Structure of Fractional-Order Memristor	4
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions	4
IEEE Foundation	4
Toward Agile Hardware Designs With Chisel: A Network Use Case	4
Guest Editors’ Introduction: Machine Intelligence at the Edge	4
Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes	4
Front Cover	3
Front Cover	3
IEEE Membership	3
Turbo-FHE: Accelerating Fully Homomorphic Encryption with FPGA and HBM Integration	3
IEEE.tv	3
Front Cover	3
Table of Contents	3
May CEDA Currents	3
Table of Contents	3
Front Cover	3
Get in the Conversation!	3
IEEE Design & Test Publication Information	3
Open-Source Electronic Design Automation (EDA) Tools	2
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method	2
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements	2
Creating a Foundation for Next-Generation Autonomous Systems	2
DRAM PUFs in Commodity Devices	2
The 2021 Asia and South Pacific Design Automation Conference (ASPDAC)	2
Spectre Returns! Speculation Attacks Using the Return Stack Buffer	2
End-to-End Automated Exploit Generation for Processor Security Validation	2
Recap of the 39th Edition of the International Conference on Computer-Aided Design (ICCAD 2020)	2
Report on the 2023 Embedded Systems Week (ESWEEK)	2
A BIST Approach to Approximate Co-Testing of Embedded Data Converters	2
ISLPED 2023: International Symposium on Low-Power Electronics and Design	2
The 41st IEEE VLSI Test Symposium	2
A Conceptual Framework for Stochastic Neuromorphic Computing	2
Multiplication Circuit Architecture for Error- Tolerant CNN-Based Keywords Speech Recognition	2
A Survey of Neuromorphic Computing-in-Memory: Architectures, Simulators, and Security	2
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning	2
Mitigating Speculative Execution Attacks via Context-Sensitive Fencing	2
Guest Editors’ Introduction: Special Issue on Top Picks in Hardware and Embedded Security	2
An Open-Source EDA Flow for Asynchronous Logic	2
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”	2
Safety Ethics for Design and Test of Automated Driving Features	2
Special Issue on Ethics in Computing	2
Secure FFT IP Using C-Way Partitioning-Based Obfuscation and Fingerprint	2
Exploring Resilience of LPDRAM Against RowHammer	2
Bandpass NGD Time- Domain Experimental Test of Double-Li Microstrip Circuit	2
Special Issue on Design and Test of Multidie Packages	2
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness	2
Design and Test of Innovative Three-Couplers-Based Bandpass Negative Group Delay Active Circuit	2
25 Years (and a Bit More) of The Last Byte	2
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization	2
Training Binarized Neural Networks Using Ternary Multipliers	2
Open-Source Silicon—Unleashing Innovation and Collaboration	2
The 28th IEEE European Test Symposium	2
Report on First and Second ACM/IEEE Workshop on Machine Learning for CAD (MLCAD)	2
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis	2