IEEE Design & Test

Papers
(The TQCC of IEEE Design & Test is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-10-01 to 2025-10-01.)
ArticleCitations
ISLPED 2021: The 25th Anniversary!58
BHT-NoC: Blaming Hardware Trojans in NoC Routers53
IEEE Foundation47
Top Picks in Hardware and Embedded Security 202238
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions32
SPOCK: Reverse Packet Traversal for Deadlock Recovery30
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design28
On Backside Probing Techniques and Their Emerging Security Threats21
IEEE.tv20
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm20
Proceedings of the IEEE18
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis17
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method17
Report on the 28th Asia and South Pacific Design Automation Conference17
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables17
IEEE Connects You to a Universe of Information!16
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond15
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS14
On the Impact of Uncertainties in Silicon-Photonic Neural Networks14
Front Cover14
IC Phone Home!14
The 2022 International Conference on Computer-Aided Design (ICCAD)14
Soft and Hard Error-Correction Techniques in STT-MRAM14
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications13
edAttack: Hardware Trojan Attack on On-Chip Packet Compression13
FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic13
Table of Contents11
IEEE Design&Test Publication Information11
IEEE.tv10
IEEE Design & Test Publication Information10
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture9
Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors9
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently9
Blank Page9
The Memory Shuffle9
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration8
Get in the Conversation!8
Stochastic Computing for Neuromorphic Applications8
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures8
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables7
IEEE Design & Test Publication Information7
TTTC News7
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology7
Verification Approaches for Learning-Enabled Autonomous Cyber–Physical Systems7
Table of Contents7
A Survey on Machine Learning Accelerators and Evolutionary Hardware Platforms7
Remembering Arvind7
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security7
CLEAR Cross-Layer Resilience: A Retrospective6
IEEE Membership6
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems6
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery6
On the Relation Between Reliability and Entropy in Physical Unclonable Functions6
Table of Contents6
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System6
Analog-to-Digital Converter Design Exploration for Compute-in-Memory Accelerators6
Power-Quality Configurable Hardware Design for AV1 Directional Intraframe Prediction6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches6
IEEE Design & Test Publication Information5
Get in the Conversation!5
Table of Contents5
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting5
Embracing Stochasticity to Enable Neuromorphic Computing at the Edge5
Attack of the AI Papers5
IEEE Design & Test Publication Information5
Special Issue on TinyML5
IEEE Membership5
Robust and Secure Systems5
Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing5
Guest Editors’ Introduction: SBCCI 20204
A brief history and future perspectives on sizing and layout synthesis of analog/RF integrated circuits4
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning4
Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O4
Special Issue on Design and Test of Multidie Packages4
Binary Forward-Only Algorithms4
Circuits to Systems: Co-Designing Efficient AI Hardware4
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”4
The 28th IEEE European Test Symposium4
Front Cover4
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic4
Front Cover4
Table of Contents4
ISLPED 2023: International Symposium on Low-Power Electronics and Design4
Functional Verification of a RISC-V Vector Accelerator3
A BIST Approach to Approximate Co-Testing of Embedded Data Converters3
Strange Loops in Design and Technology: 59th DAC Keynote Speech3
IEEE Design&Test Is Going Paperless in 2022!3
Testing for Electromigration in Sub-5-nm FinFET Memories3
Special Issue on Top Picks in Test and Reliability3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores3
The Future of Design for Test and Silicon Lifecycle Management3
IEEE Membership3
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning3
Table of Contents3
Table of Contents3
Front Cover3
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)3
IEEE Design & Test Publication Information3
TTTC News3
IEEE Connects You to a Universe of Information!3
Edge AI—An Industry View3
Table of Contents3
EAVREF: An Evolutionary Algorithm Based Tool for Low-Power CMOS Voltage Reference Designs3
Table of Contents3
Seamless Thermal Optimization of Parallel Workloads3
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking3
Long-Wire Leakage: The Threat of Crosstalk3
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction3
IEEE Design & Test Publication Information3
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec3
Using STLs for Effective In-Field Test of GPUs3
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities2
Real-Time Requirements for ADAS Platforms Featuring Shared Memory Hierarchies2
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs2
Special Issue on Near-Memory and In-Memory Processing2
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators2
Front Cover2
A Case for PIM Support in General-Purpose Compilers2
Postquantum Cryptography for Internet of Things2
IEEE App2
Special Issue on NOCS 20222
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation2
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)2
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience2
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing2
IEEE Membership2
A Coding Efficiency-Aware Hardware Design for VVC Affine Motion Estimation Reconstructor2
An EMG Denoising Method Based on Flexible Wearable Sensors2
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network2
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications2
SBCCI 20222
3D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry2
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs2
Rethinking SoC Verification for Secure Cross-Layer Interactions2
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence2
SAFER: Safety Assurances for Emergent Behavior2
This Stuff Is Great—Am I Right?2
Building an Open-Source DNA Assembler Device2
Special Issue on the First IEEE Top Picks in VLSI Test and Reliability Workshop2
IEEE Design & Test Publication Information2
IEEE Design&Test Is Going Paperless in 2022!2
Guest Editors’ Introduction: SBCCI 20232
Is There an Answer?2
Cloud-Ready Acceleration of Formal Method Techniques for Cyber–Physical Systems2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata2
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