OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Design & Test is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-02-01 to 2025-02-01.)

Article	Citations
On Backside Probing Techniques and Their Emerging Security Threats	39
Toward Agile Hardware Designs With Chisel: A Network Use Case	32
Top Picks in Hardware and Embedded Security 2022	31
Adaptive Integer Linear Programming Model for Optimal Qubit Permutation	30
The 2020 Embedded Systems Week (ESWEEK): A Virtual Event During a Pandemic	29
IEEE Women in Engineering	25
IEEE Membership	24
TTTC Newsletter	24
Front Cover	23
Reconfigurable Pipelined Control Systems	21
Design of Single-Bit Fault-Tolerant Reversible Circuits	19
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions	18
Special Issue on Testability and Dependability of Artificial Intelligence Hardware	15
Low-Power High-Throughput Architecture for AV1 Arithmetic Decoder	14
Front Cover	14
40th IEEE VLSI Test Symposium 2022	13
IEEE Design & Test Publication Information	13
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips	13
Table of Contents	13
Exact Stochastic Computing Multiplication in Memristive Memory	12
Hardware Penetration Testing Knocks Your SoCs Off	11
IEEE Design&Test Publication Information	11
ISLPED 2021: The 25th Anniversary!	11
PiN: Processing in Network-on-Chip	11
Front Cover	11

TechRxiv: Share Your Preprint Research with the World!	10
IEEE Women in Engineering	10
Report on the 2021 Embedded Systems Week (ESWEEK)	10
Enabling Design Methodologies and Future Trends for Edge AI: Specialization and Codesign	10
TTTC News	10
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators	10
Autonomous Systems Design: Charting a New Discipline	9
A Reinforcement Learning Framework With Region-Awareness and Shared Path Experience for Efficient Routing in Networks-on-Chip	9
Shape Engineering for Custom Nanomagnetic Logic Circuits in NMLSim 2.0	8
Breaking Silos to Guarantee Control Stability with Communication over Ethernet TSN	8
Update Your IEEE Profile	8
Front Cover	8
IEEE Foundation	8
Deep Reinforcement Learning for Optimization at Early Design Stages	8
BHT-NoC: Blaming Hardware Trojans in NoC Routers	8
Front Cover	7
Self-Healing of Redundant FLASH ADCs	7
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm	7
Losing My Memory	7
Product Health Insights Using Telemetry	7
IEEE Design & Test Publication Information	7
RosettaStone: Connecting the Past, Present, and Future of Physical Design Research	7
Machine Learning for CAD/EDA: The Road Ahead	7
Guest Editors’ Introduction: Stochastic Computing for Neuromorphic Applications	6
Special Issue on Postquantum Cryptography for Internet of Things	6
IEEE Foundation	6
Machine Learning and Algorithms: Let Us Team Up for EDA	6
Table of Contents	6
Side Channel and Fault Analyses on Memristor-Based Logic In-Memory	6
Join IEEE	6
IEEE Design & Test Publication Information	6
Robust and Secure Systems	6
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic	5
Fast Analysis Using Finite Queuing Model for Multilayer NoCs	5
Topology-Aided Multicorner Timing Predictor for Wide Voltage Design	5
On the Mitigation of Read Disturbances in Neuromorphic Inference Hardware	5
Attack of the AI Papers	5
Furthering Moore’s Law Integration Benefits in the Chiplet Era	5
A Survey of High-Level Synthesis-Based Hardware (IP) Watermarking Approaches	4
Compact and High-performing Five-stage Pipeline RISC-V Microprocessor Designed for IoT Applications	4
SCA Strikes Back: Reverse-Engineering Neural Network Architectures Using Side Channels	4
STLs for GPUs: Using High-Level Language Approaches	4
Background Receiver IQ Imbalance Correction for In-Field Testing	4
Front Cover	4
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization	4
The 41st IEEE VLSI Test Symposium	4
HPC-Based Malware Detectors Actually Work: Transition to Practice After a Decade of Research	4
Open-Source Multilevel Converter Power IC Design and Test	4
A NoC-Based Spatial DNN Inference Accelerator With Memory-Friendly Dataflow	4
Table of Contents	4

IEEE Design&Test EIC Call for Nominations	4
Front Cover	4
Active and Passive Physical Attacks on Neural Network Accelerators	4
Binary Forward-Only Algorithms	4
TechRxiv: Share Your Preprint Research With the World!	4
SPOCK: Reverse Packet Traversal for Deadlock Recovery	4
Report on the 2024 Embedded Systems Week (ESWEEK)	4
Guest Editors’ Introduction: Machine Intelligence at the Edge	4
Linear Algorithmic Checksums for Deep Neural Network Error Detection: Fundamentals & Recent Advancements	4
The AXIOM Project: IoT on Heterogeneous Embedded Platforms	4
Real-time Hardware Implementation of ARM CoreSight Trace Decoder	3
Report on the 28th Asia and South Pacific Design Automation Conference	3
IEEE Foundation	3
Front Cover	3
The 2021 Asia and South Pacific Design Automation Conference (ASPDAC)	3
An Open-Source EDA Flow for Asynchronous Logic	3
DRAM PUFs in Commodity Devices	3
Deadlock-Freedom in Computational Neuroscience Simulators	3
Training Binarized Neural Networks Using Ternary Multipliers	3
Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes	3
Special Issue on Ethics in Computing	3
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test	3
ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-19	3
Being Learned	3
IEEE Design&Test publication information	3
Guest Editors’ Introduction: Special Issue on Top Picks in Hardware and Embedded Security	2
Front Cover	2
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method	2
On the Impact of Uncertainties in Silicon-Photonic Neural Networks	2
Table of Contents	2
ISLPED 2023: International Symposium on Low-Power Electronics and Design	2
Multiplication Circuit Architecture for Error- Tolerant CNN-Based Keywords Speech Recognition	2
IEEE.tv	2
IEEE Design&Test publication information	2
Recap of the 39th Edition of the International Conference on Computer-Aided Design (ICCAD 2020)	2
Table of Contents	2
Special Issue on Design and Test of Multidie Packages	2
A BIST Approach to Approximate Co-Testing of Embedded Data Converters	2
Expanding Column Line Code Adaptive (CLC-A) for Protecting 32-and 64-Bit Data	2
Front Cover	2
A Mixture of Experts Approach for Low-Cost DNN Customization	2
Machine Learning for CAD/EDA	2
[Front cover]	2
IEEE Foundation	2
Guest Editors’ Introduction: Competing to Secure SoCs	2
Report on First and Second ACM/IEEE Workshop on Machine Learning for CAD (MLCAD)	2
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness	2
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements	2
Design and Test of Innovative Three-Couplers-Based Bandpass Negative Group Delay Active Circuit	2
Front Cover	2
Using STLs for Effective In-Field Test of GPUs	2
The Future of Design for Test and Silicon Lifecycle Management	2
Proceedings of the IEEE	2
Open-Source Electronic Design Automation (EDA) Tools	2