IEEE Design & Test

Papers
(The TQCC of IEEE Design & Test is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)
ArticleCitations
IEEE Foundation78
Top Picks in Hardware and Embedded Security 202240
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design32
On Backside Probing Techniques and Their Emerging Security Threats31
Celebrating 20 Years of EDA: Milestones, Challenges, and Future Directions29
SPOCK: Reverse Packet Traversal for Deadlock Recovery26
Special Issue on Emerging Challenges With 3-D NAND Flash Storage23
BHT-NoC: Blaming Hardware Trojans in NoC Routers22
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm22
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method21
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis19
Report on the 28th Asia and South Pacific Design Automation Conference18
IEEE Connects You to a Universe of Information!15
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond15
Front Cover14
Celebrating Three Decades of IEEE/ACM International Symposium on Low Power Electronics and Design13
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS12
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables12
On the Impact of Uncertainties in Silicon-Photonic Neural Networks12
IC Phone Home!11
IEEE App11
IEEE Design & Test Publication Information11
The Ultimate Source of Knowledge11
FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic11
The 2022 International Conference on Computer-Aided Design (ICCAD)11
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications11
Blank Page10
edAttack: Hardware Trojan Attack on On-Chip Packet Compression10
IEEE Design & Test Publication Information10
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently10
Soft and Hard Error-Correction Techniques in STT-MRAM10
Get in the Conversation!9
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture9
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures9
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security8
IEEE Foundation8
Remembering Arvind7
SoC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications7
Table of Contents7
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology7
CLEAR Cross-Layer Resilience: A Retrospective7
IEEE Design & Test Publication Information7
IEEE App7
Evaluating 3-D Flash Memory Retention Reliability Under Temperature Elevation7
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting6
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables6
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems6
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System6
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery6
On the Relation Between Reliability and Entropy in Physical Unclonable Functions6
IEEE Design & Test Publication Information6
Get in the Conversation!6
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches6
Special Issue on TinyML6
IEEE Membership5
Robust and Secure Systems5
Binary Forward-Only Algorithms5
Attack of the AI Papers5
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning5
Table of Contents5
Configuration-Driven RTL Port Initialization with LLM-Assisted Inference5
20 Years of IEEE CEDA and More of EDA5
IEEE Design & Test Publication Information5
TechRxiv5
A Brief 20-Year History and Future Perspectives on Sizing and Layout Synthesis of Analog/RF ICs5
Circuits to Systems: Codesigning Efficient AI Hardware5
A Tutorial on Secure and Efficient Firmware Delivery5
Tutorial on Power Side-Channel Attacks on Embedded Systems5
Front Cover5
Special Issue Dedicated to the 2024 Symposium on Integrated Circuits and Systems Design (SBCCI)5
Physical Design for Heterogeneous Integration: Challenges and Opportunities5
Power and Performance Scaling Trends in Modern Intel Xeon Server CPUs5
Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”5
IEEE Membership4
Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O4
Table of Contents4
A BIST Approach to Approximate Co-Testing of Embedded Data Converters4
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec4
Special Issue on Design and Test of Multidie Packages4
The 28th IEEE European Test Symposium4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”4
Functional Verification of a RISC-V Vector Accelerator4
IEEE Connects You to a Universe of Information!4
Front Cover4
ISLPED 2023: International Symposium on Low-Power Electronics and Design4
Edge AI—An Industry View4
Table of Contents3
The Future of Design for Test and Silicon Lifecycle Management3
IEEE Design & Test Publication Information3
Strange Loops in Design and Technology: 59th DAC Keynote Speech3
Front Cover3
EAVREF: An Evolutionary-Algorithm-Based Tool for Low-Power CMOS Voltage Reference Designs3
Long-Wire Leakage: The Threat of Crosstalk3
Special Issue on Emerging Challenges With 3-D NAND Flash Storage3
IEEE Design & Test Publication Information3
Table of Contents3
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning3
Seamless Thermal Optimization of Parallel Workloads3
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction3
IEEE Membership3
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores3
Table of Contents3
Residual Structural Traces in Logic Locking: Insights From Redundancy Analysis and Beyond3
Using STLs for Effective In-Field Test of GPUs3
Testing for Electromigration in Sub-5-nm FinFET Memories3
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)3
SAFER: Safety Assurances for Emergent Behavior3
Report on the 2025 Embedded Systems Week (ESWEEK)3
Special Issue on Top Picks in Test and Reliability3
Special Issue on NOCS 20222
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience2
Rethinking SoC Verification for Secure Cross-Layer Interactions2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata2
This Stuff Is Great—Am I Right?2
Building an Open-Source DNA Assembler Device2
An EMG Denoising Method Based on Flexible Wearable Sensors2
3-D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry2
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications2
IEEE Foundation2
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities2
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs2
SBCCI 20222
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence2
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation2
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network2
IEEE Design & Test Publication Information2
Front Cover2
Guest Editors’ Introduction: SBCCI 20232
Is There an Answer?2
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing2
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)2
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs2
Safe from Prying Eyes2
IEEE Membership2
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators2
Front Cover2
Postquantum Cryptography for Internet of Things2
IEEE App2
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