IEEE Design & Test

Papers
(The median citation count of IEEE Design & Test is 0. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-05-01 to 2025-05-01.)
ArticleCitations
Join IEEE47
ISLPED 2021: The 25th Anniversary!40
On Backside Probing Techniques and Their Emerging Security Threats39
BHT-NoC: Blaming Hardware Trojans in NoC Routers37
Top Picks in Hardware and Embedded Security 202228
SPOCK: Reverse Packet Traversal for Deadlock Recovery27
IEEE Foundation26
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions26
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm25
Guest Editors’ Introduction: Machine Intelligence at the Edge19
Being Learned17
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables16
IEEE.tv16
IEEE Connects You to a Universe of Information!16
Proceedings of the IEEE16
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method15
Guest Editors’ Introduction: Special Issue on Top Picks in Hardware and Embedded Security15
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond14
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis14
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS14
Report on the 28th Asia and South Pacific Design Automation Conference13
Hardware/Algorithm Codesign for Adversarially Robust Deep Learning12
The 2022 International Conference on Computer-Aided Design (ICCAD)12
On the Impact of Uncertainties in Silicon-Photonic Neural Networks12
Provably Secure Sequential Obfuscation for IC Metering and Piracy Avoidance12
FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic11
Soft and Hard Error-Correction Techniques in STT-MRAM11
IC Phone Home!11
edAttack: Hardware Trojan Attack on On-Chip Packet Compression11
IEEE.tv10
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications10
IEEE Design & Test Publication Information9
IEEE Design&Test Publication Information9
IEEE Membership9
Table of Contents9
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently8
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures8
Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors8
IEEE Women in Engineering8
The Memory Shuffle8
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture8
IEEE Women in Engineering7
Discovering CAN Specification Using On-Board Diagnostics7
Table of Contents7
Blank Page7
IEEE Design & Test Publication Information7
IEEE Design&Test publication information7
A Survey on Machine Learning Accelerators and Evolutionary Hardware Platforms6
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration6
Remembering Arvind6
On the Relation Between Reliability and Entropy in Physical Unclonable Functions6
EM/Power Side-Channel Attack: White-Box Modeling and Signature Attenuation Countermeasures6
TTTC News6
BiomedBench: A benchmark suite of TinyML biomedical applications for low-power wearables6
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology6
Stochastic Computing for Neuromorphic Applications6
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security6
Analog-to-Digital Converter Design Exploration for Compute-in-Memory Accelerators6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches5
IEEE Design & Test Publication Information5
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems5
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting5
Table of Contents5
Design and Test of Digital Logic DNA Systems5
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery5
Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing5
Verification Approaches for Learning-Enabled Autonomous Cyber–Physical Systems5
IEEE Membership5
Table of Contents5
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System5
Power-Quality Configurable Hardware Design for AV1 Directional Intraframe Prediction5
IEEE Design & Test Publication Information4
End-to-End Automated Exploit Generation for Processor Security Validation4
Front Cover4
Embracing Stochasticity to Enable Neuromorphic Computing at the Edge4
IEEE Foundation4
Binary Forward-Only Algorithms4
A BIST Approach to Approximate Co-Testing of Embedded Data Converters4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”4
Attack of the AI Papers4
Table of Contents4
Table of Contents4
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic4
Front Cover4
Robust and Secure Systems4
ISLPED 2023: International Symposium on Low-Power Electronics and Design3
The Future of Design for Test and Silicon Lifecycle Management3
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning3
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness3
Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O3
IEEE Membership3
TTTC News3
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning3
Using STLs for Effective In-Field Test of GPUs3
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec3
The 28th IEEE European Test Symposium3
Functional Verification of a RISC-V Vector Accelerator3
Long-Wire Leakage: The Threat of Crosstalk3
Guest Editors’ Introduction: SBCCI 20203
Special Issue on Design and Test of Multidie Packages3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores2
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence2
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction2
Front Cover2
Is There an Answer?2
A Case for PIM Support in General-Purpose Compilers2
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs2
Table of Contents2
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing2
Cloud-Ready Acceleration of Formal Method Techniques for Cyber–Physical Systems2
Table of Contents2
Testing for Electromigration in Sub-5-nm FinFET Memories2
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking2
IEEE Design & Test Publication Information2
SAFER: Safety Assurances for Emergent Behavior2
Special Issue on NOCS 20222
Real-Time Requirements for ADAS Platforms Featuring Shared Memory Hierarchies2
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)2
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities2
Table of Contents2
IEEE Design&Test Is Going Paperless in 2022!2
Table of Contents2
Strange Loops in Design and Technology: 59th DAC Keynote Speech2
Seamless Thermal Optimization of Parallel Workloads2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata2
Building an Open-Source DNA Assembler Device2
A Cautionary Tale About Detecting Malware Using Hardware Performance Counters and Machine Learning2
Rethinking System-on-Chip Verification for Secure Cross-layer Interactions2
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)2
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience2
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation2
Front Cover2
Front Cover1
Reverse-Engineering CNN Models Using Side-Channel Attacks1
A Graduate Curriculum in Cyber-Physical Systems1
The 41st IEEE VLSI Test Symposium1
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test1
25 Years (and a Bit More) of The Last Byte1
Product Health Insights Using Telemetry1
Furthering Moore’s Law Integration Benefits in the Chiplet Era1
A Coding Efficiency-Aware Hardware Design for VVC Affine Motion Estimation Reconstructor1
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network1
An EMG Denoising Method Based on Flexible Wearable Sensors1
Machine Learning for CAD/EDA1
Report on the 2024 Embedded Systems Week (ESWEEK)1
IEEE App1
Get in the Conversation!1
Guest Editors’ Introduction: Stochastic Computing for Neuromorphic Applications1
Postquantum Cryptography for Internet of Things1
Background Receiver IQ Imbalance Correction for In-Field Testing1
Special Issue on Benchmarking Machine Learning Systems and Applications1
Cross-Layer Design of Automotive Systems1
Analytical Model for Performance Evaluation of Token-Passing-Based WiNoCs1
ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-191
40th IEEE VLSI Test Symposium 20221
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators1
Table of Contents1
TTTC News1
Machine Learning in Advanced IC Design: A Methodological Survey1
Front Cover1
Table of Contents1
SBCCI 20221
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization1
Breaking Silos to Guarantee Control Stability with Communication over Ethernet TSN1
This Stuff Is Great—Am I Right?1
Report on the 2021 Embedded Systems Week (ESWEEK)1
Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes1
Guest Editors’ Introduction: Special Issue on Autonomous Systems Design1
Autonomous Systems, Trust, and Guarantees1
Spectre Returns! Speculation Attacks Using the Return Stack Buffer1
Deadlock-Freedom in Computational Neuroscience Simulators1
Bandpass NGD Time- Domain Experimental Test of Double-Li Microstrip Circuit1
TTTC News1
IEEE Design & Test Publication Information1
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction1
Framework for Load Power Consumption in HANs Using Machine Learning and IoT Assistance1
IEEE Membership1
IEEE Design&Test Is Going Paperless in 2022!1
IEEE Design & Test Publication Information1
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications1
Training Binarized Neural Networks Using Ternary Multipliers1
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips1
IEEE.tv1
Special Issue on Near-Memory and In-Memory Processing1
Mitigating Speculative Execution Attacks via Context-Sensitive Fencing0
Secure Interposer-Based Heterogeneous Integration0
API-Based Hardware Fault Simulation for DNN Accelerators0
Special Issue on 2021 Top Picks in Hardware and Embedded Security0
Interview With Janet Olson0
IEEE Women in Engineering0
Table of Contents0
IEEE Foundation0
IEEE Design & Test Publication Information0
Report on the Design Automation Conference (DAC 2021)0
Table of Contents0
Front Cover0
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms0
Front Cover0
TTTC News0
A Hardware Accelerator for Language-Guided Reinforcement Learning0
Cross-Layer Design of Cyber–Physical Systems0
Tree-Based Unidirectional Neural Networks for Low-Power Computer Vision0
FALCON: An FPGA Emulation Platform for Domain-Specific SoCs (DSSoCs)0
A 703.4-GOPs/W Binary SegNet Processor With Computing-Near-Memory Architecture for Road Detection0
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators0
Report on the 2023 Embedded Systems Week (ESWEEK)0
Front Cover0
Split-Chip Design to Prevent IP Reverse Engineering0
Testing for Multiple Faults in Deep Neural Networks0
Affordable and Comprehensive Testing of 3-D Stacked Die Devices0
Efficient Aspect Verification and Debugging of High-Performance Microprocessor Designs0
ViT-Reg: Regression-Focused Hardware-Aware Fine-Tuning for ViT on tinyML Platforms0
TTTC News0
ELEMENT: Energy-Efficient Multi-NoP Architecture for IMC-Based 2.5-D Accelerator for DNN Training0
Recap of the 29th Edition of the Asia and South Pacific Design Automation Conference (ASPDAC 2024)0
Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning0
STAR: A Mixed Analog Stochastic In-DRAM Convolutional Neural Network Accelerator0
EM Side Channels in Hardware Security: Attacks and Defenses0
Our Gated Community0
Top Picks in Hardware and Embedded Security0
Postpandemic Conferences: The DATE 2023 Experience0
Table of Contents0
Erratum to “Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence”0
Holding Conferences Online in Pandemic Times: The DATE Experience0
Lifelong Exploratory Navigation: An Architecture for Safer Mobile Robots0
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature0
SIT: Stochastic Input Transformation to Defend Against Adversarial Attacks on Deep Neural Networks0
PiN: Processing in Network-on-Chip0
Secure FFT IP Using C-Way Partitioning-Based Obfuscation and Fingerprint0
Design Challenges of Intrachiplet and Interchiplet Interconnection0
Graph-Based Circuit Simulator for Switched Capacitor Circuits0
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology0
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives0
Workload-Aware Periodic Interconnect BIST0
IEEE Design & Test Publication Information0
Small Is Good0
Toward Attention-based TinyML: A Heterogeneous Accelerated Architecture and Automated Deployment Flow0
IEEE Design & Test Publication Information0
Using Approximate Circuits Against Hardware Trojans0
In-Stream Correlation-Based Division and Bit-Inserting Square Root in Stochastic Computing0
Fuzzing for Automated SoC Security Verification: Challenges and Solution0
IEEE Design&Test publication information0
Remote Power Side- Channel Attacks on FPGAs0
IEEE Membership0
IEEE Design & Test Publication Information0
Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges0
Lynn Conway: Two Remembrances0
Migortho: A Design Automation Flow for QCA Circuits0
Front Cover0
A NoC-Based Spatial DNN Inference Accelerator With Memory-Friendly Dataflow0
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