IEEE Design & Test

Papers
(The median citation count of IEEE Design & Test is 0. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-10-01 to 2025-10-01.)
ArticleCitations
ISLPED 2021: The 25th Anniversary!58
BHT-NoC: Blaming Hardware Trojans in NoC Routers53
IEEE Foundation47
Top Picks in Hardware and Embedded Security 202238
Flexible and Portable Management of Secure Scan Implementations Exploiting P1687.1 Extensions32
SPOCK: Reverse Packet Traversal for Deadlock Recovery30
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design28
On Backside Probing Techniques and Their Emerging Security Threats21
IEEE.tv20
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm20
Proceedings of the IEEE18
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method17
Report on the 28th Asia and South Pacific Design Automation Conference17
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables17
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis17
IEEE Connects You to a Universe of Information!16
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond15
Front Cover14
IC Phone Home!14
The 2022 International Conference on Computer-Aided Design (ICCAD)14
Soft and Hard Error-Correction Techniques in STT-MRAM14
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS14
On the Impact of Uncertainties in Silicon-Photonic Neural Networks14
edAttack: Hardware Trojan Attack on On-Chip Packet Compression13
FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic13
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications13
IEEE Design&Test Publication Information11
Table of Contents11
IEEE Design & Test Publication Information10
IEEE.tv10
The Memory Shuffle9
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture9
Energy-Efficient and Error-Resilient Cognitive I/O for 3-D-Integrated Manycore Microprocessors9
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently9
Blank Page9
Get in the Conversation!8
Stochastic Computing for Neuromorphic Applications8
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures8
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration8
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology7
Verification Approaches for Learning-Enabled Autonomous Cyber–Physical Systems7
Table of Contents7
A Survey on Machine Learning Accelerators and Evolutionary Hardware Platforms7
Remembering Arvind7
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security7
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables7
IEEE Design & Test Publication Information7
TTTC News7
On the Relation Between Reliability and Entropy in Physical Unclonable Functions6
Table of Contents6
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System6
Analog-to-Digital Converter Design Exploration for Compute-in-Memory Accelerators6
Power-Quality Configurable Hardware Design for AV1 Directional Intraframe Prediction6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches6
CLEAR Cross-Layer Resilience: A Retrospective6
IEEE Membership6
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems6
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery6
Special Issue on TinyML5
IEEE Membership5
Robust and Secure Systems5
Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing5
IEEE Design & Test Publication Information5
Get in the Conversation!5
Table of Contents5
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting5
Embracing Stochasticity to Enable Neuromorphic Computing at the Edge5
Attack of the AI Papers5
IEEE Design & Test Publication Information5
Binary Forward-Only Algorithms4
Circuits to Systems: Co-Designing Efficient AI Hardware4
Design for Test With Unreliable Memories by Restoring the Beauty of Randomness4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”4
The 28th IEEE European Test Symposium4
Front Cover4
Computing-In-Memory Using Ferroelectrics: From Single- to Multi-Input Logic4
Front Cover4
Table of Contents4
ISLPED 2023: International Symposium on Low-Power Electronics and Design4
Guest Editors’ Introduction: SBCCI 20204
A brief history and future perspectives on sizing and layout synthesis of analog/RF integrated circuits4
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning4
Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O4
Special Issue on Design and Test of Multidie Packages4
IEEE Membership3
IEEE Design & Test Publication Information3
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning3
Table of Contents3
Table of Contents3
Front Cover3
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)3
TTTC News3
IEEE Connects You to a Universe of Information!3
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking3
Edge AI—An Industry View3
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction3
Table of Contents3
EAVREF: An Evolutionary Algorithm Based Tool for Low-Power CMOS Voltage Reference Designs3
Table of Contents3
Seamless Thermal Optimization of Parallel Workloads3
Long-Wire Leakage: The Threat of Crosstalk3
IEEE Design & Test Publication Information3
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec3
Using STLs for Effective In-Field Test of GPUs3
Special Issue on Top Picks in Test and Reliability3
Functional Verification of a RISC-V Vector Accelerator3
A BIST Approach to Approximate Co-Testing of Embedded Data Converters3
Strange Loops in Design and Technology: 59th DAC Keynote Speech3
IEEE Design&Test Is Going Paperless in 2022!3
Testing for Electromigration in Sub-5-nm FinFET Memories3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores3
The Future of Design for Test and Silicon Lifecycle Management3
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)2
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience2
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing2
IEEE Membership2
A Coding Efficiency-Aware Hardware Design for VVC Affine Motion Estimation Reconstructor2
An EMG Denoising Method Based on Flexible Wearable Sensors2
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network2
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications2
3D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry2
SBCCI 20222
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs2
Rethinking SoC Verification for Secure Cross-Layer Interactions2
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence2
SAFER: Safety Assurances for Emergent Behavior2
This Stuff Is Great—Am I Right?2
Building an Open-Source DNA Assembler Device2
Special Issue on the First IEEE Top Picks in VLSI Test and Reliability Workshop2
IEEE Design & Test Publication Information2
IEEE Design&Test Is Going Paperless in 2022!2
Guest Editors’ Introduction: SBCCI 20232
Is There an Answer?2
Cloud-Ready Acceleration of Formal Method Techniques for Cyber–Physical Systems2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata2
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities2
Real-Time Requirements for ADAS Platforms Featuring Shared Memory Hierarchies2
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs2
Special Issue on Near-Memory and In-Memory Processing2
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators2
Front Cover2
A Case for PIM Support in General-Purpose Compilers2
IEEE App2
Postquantum Cryptography for Internet of Things2
Special Issue on NOCS 20222
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation2
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction1
Get in the Conversation!1
Guest Editors’ Introduction: Special Issue on Autonomous Systems Design1
Autonomous Systems, Trust, and Guarantees1
IEEE App1
ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-191
40th IEEE VLSI Test Symposium 20221
25 Years (and a Bit More) of The Last Byte1
Silent Data Corruption by 10× Test Escapes Threatens Reliable Computing1
Automated Probe-Mark Analysis for Advanced Probe Technology Characterization1
Breaking Silos to Guarantee Control Stability with Communication over Ethernet TSN1
Fair and Comprehensive Benchmarking of Machine Learning Processing Chips1
Report on the 2021 Embedded Systems Week (ESWEEK)1
IEEE Design & Test Publication Information1
TTTC News1
Machine Learning for CAD/EDA1
Reverse-Engineering CNN Models Using Side-Channel Attacks1
Analytical Model for Performance Evaluation of Token-Passing-Based WiNoCs1
Spectre Returns! Speculation Attacks Using the Return Stack Buffer1
Deadlock-Freedom in Computational Neuroscience Simulators1
Furthering Moore’s Law Integration Benefits in the Chiplet Era1
Bandpass NGD Time- Domain Experimental Test of Double-Li Microstrip Circuit1
TTTC News1
The 41st IEEE VLSI Test Symposium1
Guest Editors’ Introduction: Stochastic Computing for Neuromorphic Applications1
Background Receiver IQ Imbalance Correction for In-Field Testing1
Front Cover1
Report on the 2024 Embedded Systems Week (ESWEEK)1
Machine Learning in Advanced IC Design: A Methodological Survey1
Table of Contents1
A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective1
Cross-Layer Design of Automotive Systems1
The VCR Effect in Active-RC Continuous-Time Sigma-Delta Modulators1
Special Issue on Benchmarking Machine Learning Systems and Applications1
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test1
IEEE Design & Test Publication Information1
Training Binarized Neural Networks Using Ternary Multipliers1
Exploring Asymmetric Autoencoder Architectures for Computationally-Efficient Neural Image Compression1
Product Health Insights Using Telemetry1
Impact of Partial TMR on RISC-V Processor Reliability1
Table of Contents1
STAR: A Mixed Analog Stochastic In-DRAM Convolutional Neural Network Accelerator0
Cross-Layer Design of Cyber–Physical Systems0
Recap of the 29th Edition of the Asia and South Pacific Design Automation Conference (ASPDAC 2024)0
Special Issue on 2021 Top Picks in Hardware and Embedded Security0
Graph-Based Circuit Simulator for Switched Capacitor Circuits0
Table of Contents0
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives0
Using Approximate Circuits Against Hardware Trojans0
Toward Attention-Based TinyML: A Heterogeneous Accelerated Architecture and Automated Deployment Flow0
API-Based Hardware Fault Simulation for DNN Accelerators0
Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges0
Migortho: A Design Automation Flow for QCA Circuits0
Design Challenges of Intrachiplet and Interchiplet Interconnection0
Time-Bomb HLS Trojan for Performance Degradation Payload0
IEEE Women in Engineering0
IEEE Women in Engineering0
Workload-Aware Periodic Interconnect BIST0
IEEE Design & Test Publication Information0
IEEE Membership0
Small Is Good0
Linear Algorithmic Checksums for Deep-Neural-Network Error Detection: Fundamentals and Recent Advancements0
IEEE Design & Test Publication Information0
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators0
SIT: Stochastic Input Transformation to Defend Against Adversarial Attacks on Deep Neural Networks0
Efficient Aspect Verification and Debugging of High-Performance Microprocessor Designs0
Front Cover0
In-Stream Correlation-Based Division and Bit-Inserting Square Root in Stochastic Computing0
IEEE Design & Test Publication Information0
Affordable and Comprehensive Testing of 3-D Stacked Die Devices0
EM Side Channels in Hardware Security: Attacks and Defenses0
A 703.4-GOPs/W Binary SegNet Processor With Computing-Near-Memory Architecture for Road Detection0
IEEE Design&Test publication information0
Secure Interposer-Based Heterogeneous Integration0
Efficient Privacy-Aware Federated Learning by Elimination of Downstream Redundancy0
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature0
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms0
Front Cover0
A Hardware Accelerator for Language-Guided Reinforcement Learning0
Front Cover0
Threat Detection in NoC-based Manycores using Lightweight Machine Learning Models0
TechRxiv: Share Your Preprint Research With the World!0
Interview With Janet Olson0
PiN: Processing in Network-on-Chip0
IEEE Foundation0
Table of Contents0
Front Cover0
IEEE Design & Test Publication Information0
Interview With Yao-Wen Chang0
Table of Contents0
Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning0
ViT-Reg: Regression-Focused Hardware-Aware Fine-Tuning for ViT on TinyML Platforms0
ELEMENT: Energy-Efficient Multi-NoP Architecture for IMC-Based 2.5-D Accelerator for DNN Training0
Lynn Conway: Two Remembrances0
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology0
Addressing the Cross-Temperature Issue in 3D NAND Flash Memories: Characterization and Mitigation for Solid State Drives0
LATTE: Library Attack for Evaluating Hardware IP Protections against Reverse Engineering0
FALCON: An FPGA Emulation Platform for Domain-Specific SoCs (DSSoCs)0
Remote Power Side- Channel Attacks on FPGAs0
Testing for Multiple Faults in Deep Neural Networks0
Lifelong Exploratory Navigation: An Architecture for Safer Mobile Robots0
Low-Power High-Throughput Architecture for AV1 Arithmetic Decoder0
Report on the Design Automation Conference (DAC 2021)0
Open-Source Multilevel Converter Power IC Design and Test0
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