IEEE Design & Test

Article	Citations
IEEE Foundation	78
Top Picks in Hardware and Embedded Security 2022	40
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design	32
On Backside Probing Techniques and Their Emerging Security Threats	31
Celebrating 20 Years of EDA: Milestones, Challenges, and Future Directions	29
SPOCK: Reverse Packet Traversal for Deadlock Recovery	26
Special Issue on Emerging Challenges With 3-D NAND Flash Storage	23
BHT-NoC: Blaming Hardware Trojans in NoC Routers	22
An Energy-Aware Nanoscale Design of Reversible Atomic Silicon Based on Miller Algorithm	22
Improvement of Functional Safety of the Level-Crossing Barrier Machine by a Noninvasive Angle-Detection Method	21
Tipping the Balance: Imbalanced Classes in Deep-Learning Side-Channel Analysis	19
Report on the 28th Asia and South Pacific Design Automation Conference	18
IEEE Connects You to a Universe of Information!	15
Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond	15
Front Cover	14
Celebrating Three Decades of IEEE/ACM International Symposium on Low Power Electronics and Design	13
On the Impact of Uncertainties in Silicon-Photonic Neural Networks	12
An Open-Source 12-bit 10-kS/s Incremental ADC in 130-nm CMOS	12
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables	12
The 2022 International Conference on Computer-Aided Design (ICCAD)	11
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications	11
IC Phone Home!	11
IEEE App	11
IEEE Design & Test Publication Information	11
The Ultimate Source of Knowledge	11

FlooNoC: A Multi-Tb/s Wide NoC for Heterogeneous AXI4 Traffic	11
Datapath Extension of NPUs to Support Nonconvolutional Layers Efficiently	10
Soft and Hard Error-Correction Techniques in STT-MRAM	10
Blank Page	10
edAttack: Hardware Trojan Attack on On-Chip Packet Compression	10
IEEE Design & Test Publication Information	10
Get in the Conversation!	9
Hardware/Software Coexploration for Hyperdimensional Computing on Network-on-Chip Architecture	9
Eavesdropping Attack Detection Using Machine Learning in Network-on-Chip Architectures	9
Special Issue on the 2021 Workshop on Top Picks in Hardware and Embedded Security	8
IEEE Foundation	8
Remembering Arvind	7
SoC-GPIO-Based Dynamic Power Noise Control for Video Sensor Applications	7
Table of Contents	7
FPGA-Chain: Enabling Holistic Protection of FPGA Supply Chain With Blockchain Technology	7
CLEAR Cross-Layer Resilience: A Retrospective	7
IEEE Design & Test Publication Information	7
IEEE App	7
Evaluating 3-D Flash Memory Retention Reliability Under Temperature Elevation	7
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration	6
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches	6
Special Issue on TinyML	6
Voltage–Resistance-Adaptive MPPT Circuit for Energy Harvesting	6
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables	6
Special Issue on Approximate Computing: Challenges, Methodologies, Algorithms, and Architectures for Dependable and Secure Systems	6
Dynamically Reconfigurable Network Protocol for Shape-Changeable Computer System	6
Traversal Packets: Opportunistic Bypass Packets for Deadlock Recovery	6
On the Relation Between Reliability and Entropy in Physical Unclonable Functions	6
IEEE Design & Test Publication Information	6
Get in the Conversation!	6
Physical Design for Heterogeneous Integration: Challenges and Opportunities	5
Power and Performance Scaling Trends in Modern Intel Xeon Server CPUs	5
Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The “Chips to Systems Conference”	5
IEEE Membership	5
Robust and Secure Systems	5
Binary Forward-Only Algorithms	5
Attack of the AI Papers	5
Estimating Code Vulnerability to Timing Errors Via Microarchitecture-Aware Machine Learning	5
Table of Contents	5
Configuration-Driven RTL Port Initialization with LLM-Assisted Inference	5
20 Years of IEEE CEDA and More of EDA	5
IEEE Design & Test Publication Information	5
TechRxiv	5
A Brief 20-Year History and Future Perspectives on Sizing and Layout Synthesis of Analog/RF ICs	5
Circuits to Systems: Codesigning Efficient AI Hardware	5
A Tutorial on Secure and Efficient Firmware Delivery	5
Tutorial on Power Side-Channel Attacks on Embedded Systems	5
Front Cover	5
Special Issue Dedicated to the 2024 Symposium on Integrated Circuits and Systems Design (SBCCI)	5
Front Cover	4

ISLPED 2023: International Symposium on Low-Power Electronics and Design	4
Edge AI—An Industry View	4
IEEE Membership	4
Novel Technique for Manufacturing, System-Level, and In-System Testing of Large SoC Using Functional Protocol-Based High-Speed I/O	4
Table of Contents	4
A BIST Approach to Approximate Co-Testing of Embedded Data Converters	4
A Global Self-Repair Method for TSV Arrays With Adaptive FNS-CAC Codec	4
Special Issue on Design and Test of Multidie Packages	4
The 28th IEEE European Test Symposium	4
Recap of the 61st ACM/IEEE Design Automation Conference (DAC61): The “Chips to Systems Conference”	4
Functional Verification of a RISC-V Vector Accelerator	4
IEEE Connects You to a Universe of Information!	4
Residual Structural Traces in Logic Locking: Insights From Redundancy Analysis and Beyond	3
Using STLs for Effective In-Field Test of GPUs	3
Testing for Electromigration in Sub-5-nm FinFET Memories	3
Special Issue on the 2023 International Symposium on Networks-on-Chip (NOCS 2023)	3
SAFER: Safety Assurances for Emergent Behavior	3
Report on the 2025 Embedded Systems Week (ESWEEK)	3
Special Issue on Top Picks in Test and Reliability	3
Table of Contents	3
The Future of Design for Test and Silicon Lifecycle Management	3
IEEE Design & Test Publication Information	3
Strange Loops in Design and Technology: 59th DAC Keynote Speech	3
Special Issue on Emerging Challenges With 3-D NAND Flash Storage	3
Front Cover	3
EAVREF: An Evolutionary-Algorithm-Based Tool for Low-Power CMOS Voltage Reference Designs	3
Long-Wire Leakage: The Threat of Crosstalk	3
IEEE Design & Test Publication Information	3
Table of Contents	3
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning	3
Seamless Thermal Optimization of Parallel Workloads	3
Heuristic-Based Algorithms for Low-Complexity AV1 Intraprediction	3
IEEE Membership	3
Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking	3
SeMAP—A Method to Secure the Communication in NoC-Based Many-Cores	3
Table of Contents	3
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing	2
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED’24)	2
SoCProbe: Compositional Post-Silicon Validation of Heterogeneous NoC-Based SoCs	2
Safe from Prying Eyes	2
IEEE Membership	2
Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators	2
Front Cover	2
Postquantum Cryptography for Internet of Things	2
IEEE App	2
Special Issue on NOCS 2022	2
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for Native OS-Like Debug Experience	2
Rethinking SoC Verification for Secure Cross-Layer Interactions	2
Majority-Logic-Based Self-Checking Adder in Quantum-Dot Cellular Automata	2
This Stuff Is Great—Am I Right?	2
Building an Open-Source DNA Assembler Device	2
An EMG Denoising Method Based on Flexible Wearable Sensors	2
3-D Ferroelectric NAND In-Storage Processing Architecture for Mass Spectrometry	2
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications	2
IEEE Foundation	2
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities	2
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs	2
SBCCI 2022	2
Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence	2
Shaping Resilient AI Hardware Through DNN Computational Feature Exploitation	2
VioNet: A Hierarchical Detailed Routing Wire-Short Violation Predictor Based on a Convolutional Neural Network	2
IEEE Design & Test Publication Information	2
Front Cover	2
Guest Editors’ Introduction: SBCCI 2023	2
Is There an Answer?	2
IEEE App	1
IEEE App	1
IEEE Membership	1
Table of Contents	1
Get in the Conversation!	1
IEEE Design & Test Publication Information	1
ASP-DAC 2026: Strengthening Asia’s Expanding Role in Design Automation Research	1
Deadlock-Freedom in Computational Neuroscience Simulators	1
IEEE App	1
ISLPED 2022: An Experience of a Hybrid Conference in the Time of COVID-19	1
Background Receiver IQ Imbalance Correction for In-Field Testing	1
A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective	1
Impact of Partial TMR on RISC-V Processor Reliability	1
Report on the 2024 Embedded Systems Week (ESWEEK)	1
ICCAD 2025: First Time Outside the United States and a Record-Breaking Edition	1

Machine Learning in Advanced IC Design: A Methodological Survey	1
Special Issue on the First IEEE Top Picks in VLSI Test and Reliability Workshop	1
Silent Data Corruption by 10× Test Escapes Threatens Reliable Computing	1
IEEE Membership	1
Reverse-Engineering CNN Models Using Side-Channel Attacks	1
The VCR Effect in Active-RC Continuous-Time Sigma–Delta Modulators	1
Table of Contents	1
Spectre Returns! Speculation Attacks Using the Return Stack Buffer	1
Exploring Asymmetric Autoencoder Architectures for Computationally Efficient Neural Image Compression	1
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test	1
A Coding Efficiency-Aware Hardware Design for VVC Affine Motion Estimation Reconstructor	1
Table of Contents	1
Product Health Insights Using Telemetry	1
IEEE Foundation	1
IEEE Membership	1
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction	1
On the Origin of AI Species	1
Furthering Moore’s Law Integration Benefits in the Chiplet Era	1
IEEE Connects You to a Universe of Information!	1
Analytical Model for Performance Evaluation of Token-Passing-Based WiNoCs	1
Special Issue on 20 Years of IEEE CEDA	1
Special Issue on the 2024 IEEE Top Picks in VLSI Test and Reliability Workshop	1
The 41st IEEE VLSI Test Symposium	1
IEEE Design & Test Publication Information	1
Machine Learning for CAD/EDA	1
40th IEEE VLSI Test Symposium 2022	1
IEEE Design & Test Publication Information	1
Testing of Chiplet-Based Packages Based on Advanced Heterogeneous Integration	1
IEEE Membership	0
FALCON: An FPGA Emulation Platform for Domain-Specific SoCs (DSSoCs)	0
PiN: Processing in Network-on-Chip	0
Dependable STT-MRAM With Emerging Approximation and Speculation Paradigms	0
Open-Source Multilevel Converter Power IC Design and Test	0
ViT-Reg: Regression-Focused Hardware-Aware Fine-Tuning for ViT on TinyML Platforms	0
Addressing the Cross-Temperature Issue in 3-D NAND Flash Memories: Characterization and Mitigation for Solid-State Drives	0
Interview With Janet Olson	0
IEEE Design & Test Publication Information	0
Recap of the 29th Edition of the Asia and South Pacific Design Automation Conference (ASPDAC 2024)	0
Graph-Based Circuit Simulator for Switched Capacitor Circuits	0
Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning	0
STAR: A Mixed Analog Stochastic In-DRAM Convolutional Neural Network Accelerator	0
Toward Attention-Based TinyML: A Heterogeneous Accelerated Architecture and Automated Deployment Flow	0
Threat Detection in NoC-Based Manycores Using Lightweight Machine-Learning Models	0
Table of Contents	0
IEEE Design & Test Publication Information	0
Front Cover	0
SBCCI 2024	0
HLS Register Allocation Attack for Compromising Hardware IP Designs using HLS-aided Trojan	0
Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges	0
Lynn Conway: Two Remembrances	0
Low-Power High-Throughput Architecture for AV1 Arithmetic Decoder	0
TechRxiv: Share Your Preprint Research With the World!	0
Survey of Challenges in Implementation-Security Metrics for Side-Channel and Fault-Injection Attacks	0
TechRxiv: Share Your Preprint Research With the World!	0
Postpandemic Conferences: The DATE 2023 Experience	0
Machine Learning for CAD/EDA: The Road Ahead	0
Get in the Conversation!	0
A NoC-Based Spatial DNN Inference Accelerator With Memory-Friendly Dataflow	0
IEEE Design & Test Publication Information	0
Table of Contents	0
Front Cover	0
Interview With Yao-Wen Chang	0
Memory Usage Estimation for Dataflow-Model-Based Software Development Methodology	0
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives	0
IEEE Design & Test Publication Information	0
Front Cover	0
Testing for Multiple Faults in Deep Neural Networks	0
Remote Power Side- Channel Attacks on FPGAs	0
Special Issue on 2021 Top Picks in Hardware and Embedded Security	0
Using Approximate Circuits Against Hardware Trojans	0
Approximate Computing in Memristive Processing-In-Array (PIA)	0
Secure Interposer-Based Heterogeneous Integration	0
Tree-Based Unidirectional Neural Networks for Low-Power Computer Vision	0
IEEE Membership	0
Workload-Aware Periodic Interconnect BIST	0
Time-Bomb HLS Trojan for Performance Degradation Payload	0
On the Implementation of Fixed-Point Exponential Function for Machine Learning and Signal- Processing Accelerators	0
Can Model-Level Fault Tolerance Be Enough for DNN Hardware Accelerators? A Study	0
HPC-Based Malware Detectors Actually Work: Transition to Practice After a Decade of Research	0
Small Is Good	0
Get in the Conversation!	0
IEEE Foundation	0
Table of Contents	0
Efficient Aspect Verification and Debugging of High-Performance Microprocessor Designs	0
API-Based Hardware Fault Simulation for DNN Accelerators	0
ELEMENT: Energy-Efficient Multi-NoP Architecture for IMC-Based 2.5-D Accelerator for DNN Training	0
Affordable and Comprehensive Testing of 3-D Stacked Die Devices	0
Front Cover	0
Fuzzing for Automated SoC Security Verification: Challenges and Solution	0
LATTE: Library Attack for Evaluating Hardware IP Protections Against Reverse Engineering	0
Hard-Sign: A Hardware Watermarking Scheme Using Dated Handwritten Signature	0
Front Cover	0
Design Challenges of Intrachiplet and Interchiplet Interconnection	0
Our Gated Community	0
Front Cover	0