Microscopy

Papers
(The TQCC of Microscopy is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)
ArticleCitations
In situ pulsed electrical biasing TEM observation of AA707543
In This Issue27
Axonal regrowth under release of myelin-associated glycoprotein: chemotaxis by pioneer Schwann cells and Cajal’s gigantic clubs25
Near-field electron ptychography using full-field structured illumination22
Special issue: advanced spectroscopy in electron microscopy20
Analysis of photo-functional materials using momentum-resolved EELS19
Effective alignment method using a diamond notch knife for correlative array tomography19
Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detector17
Correlative light and volume electron microscopy to study brain development16
Noise reduction of low-dose electron holograms using the wavelet hidden Markov model15
High energy-resolution soft X-ray emission spectrometer using a back-thinned CMOS detector for chemical bonding state analysis15
Optimization of method for cross-section hydrogels preparation using high-pressure freezing13
Probing the effective mass and fermi velocity of charges by momentum-resolved electron energy loss spectroscopy12
Low-dose measurement of electric potential distribution in organic light-emitting diode by phase-shifting electron holography with 3D tensor decomposition12
Electron microscopy studies on interfacial solid-state reactions induced by electronic excitation12
Tight-junction strand networks and tightness of the epithelial barrier12
Rigorous computation of high-order aberrations and their errors11
Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis10
Local strain effects on bandgap energy in flexible h -WO3 nanowires10
Diffraction contrast of ferroelectric domains in DPC STEM images10
Characteristics and exchange interactions observed in L-emission spectra of Fe, Mn and their oxides by using a high-energy-resolution soft X-ray emission spectroscopy instrument9
In This Issue9
Resolution does matter9
In This Issue9
In situ TEM studies on hydrogen-related issues: hydrogen storage, hydrogen embrittlement, fuel cells and electrolysis9
High-resolution spin-polarized scanning tunneling spectroscopy using a functionalized superconducting tip8
Characterization of the INTPIX4 SOI pixel detector in transmission electron microscopy at 120 and 200 keV8
Spin polarization of photoelectrons emitted from spin-orbit coupled surface states of Pb/Ge(111)8
Correction to: Observation and quantitative analysis of dislocations in steel using electron channeling contrast imaging method with precise control of electron beam incident direction8
Tip treatment for subnanoscale atomic force microscopy in liquid by atomic layer deposition Al2O3 coating7
Unraveling the neural code: analysis of large-scale two-photon microscopy data7
Improved dopant fraction variance estimation in statistical ALCHEMI based on correct error propagation rule7
Flow cytometric detection and microscopic observation of activated eosinophils in peripheral blood7
Acceptance characterization of electron detector in SEM using stainless steel sphere6
In This Issue6
Model-based deconvolution for particle analysis applied to a through-focus series of HAADF-STEM images6
Data-driven ELNES/XANES analysis: predicting spectra, unveiling structures and quantifying properties6
Measurement and correction of TEM image distortion using arbitrary samples6
Segmented ring-mesh model of glycosaminoglycan chains based on the 3D analysis of normal individual and musculocontractural Ehlers–Danlos syndrome skin using scanning transmission electron microscopy6
On-grid labeling method for freeze-fracture replicas6
Renewal of the Microscopy Editorial Board6
Development of temporal series 4D-STEM and application to relaxation time measurement6
Correction to: Estimation of projection parameter distribution and initial model generation in single-particle analysis5
Development of silicon-on-insulator direct electron detector with analog memories in pixels for sub-microsecond imaging5
Recent advances in in-resin correlative light and electron microscopy of Epon-embedded cells5
Enhancing performance of electron holography with mathematical and machine learning–based denoising techniques5
Fluorescent protein-based probe architecture modulates rotational and translational diffusion readouts in polarization-dependent fluorescence correlation spectroscopy5
Comparison of large-volume 3D reconstruction using plasma FIB-SEM and X-ray CT5
Cathodoluminescence, light injection and EELS in STEM: from comparative to coincidence experiments5
Correction to: Electron holography observation of electron spin polarization around charged insulating wire5
Development of a wire corrector for low accelerating voltage scanning electron microscopy5
Analyzing the synchronism of stacking-fault formation in side-by-side SiC nanowire pairs using the Levenshtein distance: stochastic versus deterministic processes4
Advances in fluorescence microscopy for orthohantavirus research4
COSY INFINITY and its use for singlepass and multipass systems4
In This Issue4
EELS of phonons: polarity and temperature dependence4
In This Issue4
Correction to: High-resolution and analytical electron microscopy in a liquid flow cell via gas purging4
In-situ heating-and-electron tomography for materials research: from 3D (in-situ 2D) to 4D (in-situ 3D)4
Evaluating the roughness dynamics of kefir biofilms grown on Amazon cupuaçu juice: a monofractal and multifractal approach4
Single-molecule localization microscopy based on denoising, interpolation and local maxima4
Characterization of ultra-variable-pressure detector for secondary electrons in low-vacuum SEM4
A strategy for dose-efficient atomic-resolution OBF-STEM imaging of zeolites4
Attosecond electron-beam technology: a review of recent progress4
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