OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Transactions on Device and Materials Reliability is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-11-01 to 2024-11-01.)

Article	Citations
Critical Insights Into Fast Charging Techniques for Lithium-Ion Batteries in Electric Vehicles	48
Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications	37
Design Optimization of Three-Stacked Nanosheet FET From Self-Heating Effects Perspective	36
Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs	31
High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors	24
Design of High-Speed Low Variation Static Noise Margin Ternary S-RAM Cells	23
A β-Ga₂O₃ MESFET to Amend the Carrier Distribution by Using a Tunnel Diode	20
Single-Event Multiple Effect Tolerant RHBD14T SRAM Cell Design for Space Applications	19
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	18
LED Lifetime Prediction Under Thermal-Electrical Stress	18
Short Circuit Detection and Fault Current Limiting Method for IGBTs	17
Soft-Error-Aware SRAM for Terrestrial Applications	15
ESD Protection Designs: Topical Overview and Perspective	15
TCAD Based Investigation of Single Event Transient Effect in Double Channel AlGaN/GaN HEMT	14
Aging Diagnosis of Bond Wire Using On-State Drain-Source Voltage Separation for SiC MOSFET	14
Time and Temperature Dependence of Copper Protrusion in Metallized Through-Glass Vias (TGVs) Fabricated in Fused Silica Substrate	13
Machine Learning Approach for Prediction of Point Defect Effect in FinFET	13
MOZART+: Masking Outputs With Zeros for Improved Architectural Robustness and Testing of DNN Accelerators	13
A Gate-Grounded NMOS-Based Dual-Directional ESD Protection With High Holding Voltage for 12V Application	13
Reliability Analysis of Power Components in Restructured DC/DC Converters	13
CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods	13
Investigation of Self-Heating Effect in Tree-FETs by Interbridging Stacked Nanosheets: A Reliability Perspective	12
A Physics-Based Single Event Transient Pulse Width Model for CMOS VLSI Circuits	12
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPs	12
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications	11

Solder Joint Reliability Assessment and Pad Size Studies of FO-WLP With Glass Substrate	11
Effect of Wiring Density and Pillar Structure on Chip Packaging Interaction for Mixed-Signal Cu Low k Chips	11
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	11
Accelerated Degradation of IGBTs Due to High Gate Voltage at Various Temperature Environments	10
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	10
Reliability and Performance Analysis of Logic-in-Memory Based Binarized Neural Networks	10
Copper Trace Fatigue Life Modeling for Rigid Electronic Assemblies	10
Design of Compact Reliable Energy Efficient Read Disturb Free 17T CNFET Ternary S-RAM Cell	10
Next-Generation High-Density PCB Development by Fan-Out RDL Technology	10
Elimination of Thermo-Mechanically Driven Circumferential Crack Formation in Copper Through-Glass via Substrate	10
Design, Fabrication and Characterization of Single-Crystalline Graphene gNEMS ESD Switches for Future ICs	9
Novel ESD Compact Modeling Methodology Using Machine Learning Techniques for Snapback and Non-Snapback ESD Devices	9
A New Scheme of the Low-Cost Multiple-Node-Upset-Tolerant Latch	9
Reliable and Radiation-Hardened Push-Pull pFlash Cell for Reconfigured FPGAs	9
Hot Carrier Degradation in MOSFETs at Cryogenic Temperatures Down to 4.2 K	9
A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance	9
CMOS-Compatible Ex-Situ Incorporated Junctionless Enhancement-Mode Thin Polysilicon Film FET pH Sensor	9
Effect of Titanium-Polymer Interactions on Adhesion of Polymer-Copper Redistribution Layers in Advanced Packaging	8
A Novel DTSCR With Embedded MOS and Island Diodes for ESD Protection of High-Speed ICs	8
Trap-Assisted and Stress Induced Safe Operating Area Limits of AlGaN/GaN HEMTs	8
Impact of Hot Carrier Aging on the 1/f and Random Telegraph Noise of Short-Channel Triple-Gate Junctionless MOSFETs	8
A Gated-Diode ESD SCR-Incorporated BJT for Reversed Floating P⁺ Junction Modulation	8
Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach	8
Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles	7
Using the Octagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments	7
Study of TID Radiation Effects on the Breakdown Voltage of Buried P-Pillar SOI LDMOSFETs	7
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	7
Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes	7
Layout-Dominated Dynamic Imbalanced Current Analysis and Its Suppression Strategy of Parallel SiC MOSFETs	7
Proton-Induced Effect on AlGaN/GaN HEMTs After Hydrogen Treatment	7
Impact of Gamma-Ray Radiation on DC and RF Performance of 10-nm Bulk N-Channel FinFETs	7
The Novel Structure to Enhancement I_on /I_off Ratio Based on Field Effect Diode	7
Accelerated Stress Tests and Statistical Reliability Analysis of Metal-Oxide/GaN Nanostructured Sensor Devices	7
Improving Breakdown Voltage in AlGaN/GaN Metal-Insulator-Semiconductor HEMTs Through Electric-Field Dispersion Layer Material Selection	6
Simulation Study of High-Speed Ge Photodetector Dark and Light Current Degradation	6
Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells	6
STATE: A Test Structure for Rapid and Reliable Prediction of Resistive RAM Endurance	6
High Pressure Deuterium Annealing for Improved Immunity Against Stress-Induced Threshold Voltage Degradation	6
Stress Analysis and Characterization of PECVD Oxide/Nitride Multi-Layered Films After Thermal Cycling	6
Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate	6
Aging Monitoring Method of Bond Wires-Based on Phase-Frequency Characteristics of Differential Mode Conducted Interference Signal for IGBT Module	6
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	6
Impact of Interface Layer on Device Characteristics of Si:HfO₂-Based FeFET’s	6
BTI and Soft-Error Tolerant Voltage Bootstrapped Schmitt Trigger Circuit	6
The Influence of N-Type Buried Layer on SCR ESD Protection Devices	5
Strain—Engineered Asymmetrical Si/Si_1–xGe_x IR-Photo-Detector: Theoretical Reliability and Experimental Feasibility Studies	5
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	5
LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm	5
Workload-Aware Electromigration Analysis in Emerging Spintronic Memory Arrays	5
Impact of Self-Heating on Linearity Performance of In_0.53Ga_0.47As-Based Gate-All-Around MOSFETs	5

Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	5
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	5
Optimization of Dual Field Plate AlGaN/GaN HEMTs Using Artificial Neural Networks and Particle Swarm Optimization Algorithm	5
Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs	5
On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors	5
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	5
Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO₂ MOSFETs (June 2022)	5
On-Chip Adaptive VDD Scaled Architecture of Reliable SRAM Cell With Improved Soft Error Tolerance	5
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	5
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	5
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	5
Hybrid Multi-Graphene/Si Avalanche Transit Time <h-ATT> Terahertz Power Oscillator: Theoretical Reliability and Experimental Feasibility Studies	5
CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations	5
Reliability and Characterization of Nanosilver Joints Prepared by a Time-Reduced Sintering Process	4
Categorization of PBTI Mechanisms on 4H-SiC MOSFETs by the Stress Gate Voltage and Channel Plane Orientation	4
Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration	4
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	4
Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	4
ESD Stress Effect on Failure Mechanisms in GaN-on-Si Power Device	4
Reliable Circuit Design Using a Fast Incremental-Based Gate Sizing Under Process Variation	4
Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis	4
Electrochemical Migration of Immersion Silver Plated Printed Circuit Boards Contaminated by Dust Solution	4
Effect of Capped Cu Layer on Protrusion Behaviors of Through Silicon via Copper (TSV-Cu) Under Double Annealing Conditions: Comparative Study	4
High Precision IGBT Health Evaluation Method: Extreme Learning Machine Optimized by Improved Krill Herd Algorithm	4
Failure Analysis and Performance Improvement of Phase Change Memory Based on Ge₂Sb₂Te₅	4
Electromigration Performance Improvement of Metal Heaters for Si Photonic Ring Modulators	4
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	4
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	4
Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-μm AlGaN/GaN HEMTs for Power RF Applications	4
Mechanism Analysis and Thermal Damage Prediction of High-Power Microwave Radiated CMOS Circuits	4
Probing Interface Trapping Characteristics of Au/β-Ga₂O₃ Schottky Barrier Diode on Si (100)	4
Low-Leakage and Variable V_HOLD Power Clamp for Wide Stress Time Range From ESD to Surge Test	4
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	4
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	4
Negative-Bias Temperature Instability of p-GaN Gate GaN-on-Si Power Devices	4
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	4
Effects of Temperature and Bias Voltage on Electron Transport Properties in GaN High-Electron-Mobility Transistors	4
Reliability Characterization and Failure Prediction of 3D TLC SSDs in Large-Scale Storage Systems	4
Mono-Energetic Proton Induced Damages in SiC Power MOSFETs	4