OOIR: Observatory of International Research

Papers

(The TQCC of IEEE Transactions on Device and Materials Reliability is 3. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-02-01 to 2025-02-01.)

Article	Citations
[Front cover]	56
TechRxiv: Share Your Preprint Research with the World!	37
Blank Page	36
Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells	31
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	24
Member Get-A-Member (MGM) Program	23
IEEE Transactions on Device and Materials Reliability Publication Information	20
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy	19
Stress Analysis and Characterization of PECVD Oxide/Nitride Multi-Layered Films After Thermal Cycling	18
Impact of Interface Layer on Device Characteristics of Si:HfO₂-Based FeFET’s	18
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	15
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	15
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	14
CMOS-Compatible Ex-Situ Incorporated Junctionless Enhancement-Mode Thin Polysilicon Film FET pH Sensor	14
Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response	14
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	13
Defect-Free and Annealing Influences in P3HT Organic Field-Effect Transistor Performance	13
2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22	13
IEEE Robert Bosch Micro and Nano Electro Mechanical Systems Award	13
2021 IEEE EDS Early Career Award	13
[Blank page]	12
Simulation Study of High-Speed Ge Photodetector Dark and Light Current Degradation	11
2021 IEEE EDS Early Career Award	11
Single-Event Multiple Effect Tolerant RHBD14T SRAM Cell Design for Space Applications	11
Call for papers: Special issue on Solid-State Image Sensors	11

High Sensitivity Temperature Measurements to Track and Compensate Aging Effects on CMOS Amplifiers	10
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications	10
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	10
High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors	10
In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies	10
Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool	10
IEEE Transactions on Device and Materials Reliability information for authors	9
IEEE Transactions on Device and Materials Reliability Information for Authors	9
Characterization of LDO Induced Increment of SEE Sensitivity for 22-nm FDSOI SRAM	9
From Mega to nano: Beyond one Century of Vacuum Electronics	9
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	9
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	9
HEMT Inspired GaN Optical Waveguides: Analysis Under Thermal Stress and Prospects	9
CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods	8
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	8
Impact of Hot Carrier Aging on the 1/f and Random Telegraph Noise of Short-Channel Triple-Gate Junctionless MOSFETs	8
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	8
H²C-TM: A Hybrid High Coverage Test Method for Improving the Detection of HtD Faults in STT-MRAMs	8
Analysis of Multicrystalline Si Solar Cell Improvement Using Laser-Beam-Induced Current Technique	7
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	7
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	7
A Novel DTSCR With Embedded MOS and Island Diodes for ESD Protection of High-Speed ICs	7
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection	7
ESD Stress Effect on Failure Mechanisms in GaN-on-Si Power Device	7
Numerical Simulation of Trapped Hole Lateral Migration and Induced Threshold Voltage Retention Loss in a SONOS Flash Memory	7
Design of Compact Reliable Energy Efficient Read Disturb Free 17T CNFET Ternary S-RAM Cell	7
Front Cover	6
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	6
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	6
CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations	6
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	6
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	6
PEAR: Unbalanced Inter-Page Errors Aware Read Scheme for Latency-Efficient 3-D NAND Flash	6
A Review: Breakdown Voltage Enhancement of GaN Semiconductors-Based High Electron Mobility Transistors	6
IEEE Transactions on Device and Materials Reliability Publication Information	6
Critical Insights Into Fast Charging Techniques for Lithium-Ion Batteries in Electric Vehicles	6
An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns	6
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	6
Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	5
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	5
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks	5
Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits	5
Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage	5
Solid-State Image Sensors	5
Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO₂ MOSFETs (June 2022)	5
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	5
Optimization of 3-D IC Routing Based on Thermal Equalization Analysis	5
Detection and Analysis of Stress Wave in MOSFET Under Gate-Source Overvoltage Failure	5
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	5
IEEE Transactions on Device and Materials Reliability Publication Information	5

The Characteristics and Reliability With Channel Length Dependent on the Deposited Sequence of SiO₂ and Si₃N₄ as PV in LTPS TFTs	5
Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment	5
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	5
Blank Page	5
TechRxiv: Share Your Preprint Research with the World!	4
Destructive Testing for Reliability Analysis at High-Power Microwave in GaAs/InGaP Hetero-Junction Bipolar Transistor	4
IEEE Transactions on Device and Materials Reliabilityinformation for authors	4
IEEE Transactions on Device and MaterialsReliability publication information	4
TechRxiv: Share Your Preprint Research with the World!	4
Spintronics-Devices and Circuits	4
Nondestructive and Quantitative Evaluation of a GaAs Epitaxial Layer Covered With a Silicon Nitride Insulating Thin Film After a Highly Accelerated Temperature and Humidity Stress With the Use of Phot	4
Impact of Self-Heating on Linearity Performance of In_0.53Ga_0.47As-Based Gate-All-Around MOSFETs	4
TechRxiv: Share Your Preprint Research with the World!	4
Highly Reproducible and Reliable Methanol Sensor Based on Hydrothermally Grown TiO₂ Nanoparticles	4
Table of contents	4
Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET Devices	4
Negative-Bias Temperature Instability of p-GaN Gate GaN-on-Si Power Devices	4
Accelerated Lifetime Testing and Analysis of Delta-Doped Silicon Test Structures	4
Table of contents	4
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	4
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	4
IEEE Transactions on Device and Materials Reliability Information for Authors	4
IEEE Transactions on Device and Materials Reliabilityinformation for authors	4
[Blank page]	4
Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs	4
Table of Contents	4
IEEE Transactions on Semiconductor Manufacturing CALL FOR PAPERS for Special Issue on Process-Level Machine Learning Applications in Semiconductor Manufacturing	4
Blank Page	4
Popcorning Failures in Polymer and MnO2 Tantalum Capacitors	4
Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability	3
Blank Page	3
IEEE Transactions on Device and Materials Reliability Publication Information	3
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	3
Suppression of Total Dose Effects on the Performance of InAlGaN/GaN MIS-HEMT via Field Plate Implementation	3
Elimination of Thermo-Mechanically Driven Circumferential Crack Formation in Copper Through-Glass via Substrate	3
Electromigration Performance Improvement of Metal Heaters for Si Photonic Ring Modulators	3
Research of Single-Event Burnout in P-NiO/n-Ga₂O₃ Heterojunction Diode	3
Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events	3
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	3
A Thermal Circuit Representing Frequency Dependent Dynamic Heating Between Electron and Lattice in SOI-FinFET	3
Blank Page	3
Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach	3
Influence of Hot Carrier Degradation on Total Ionizing Dose in Bulk I/O-FinFETs	3
Guest Editorial TDMR IIRW Special Section	3
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	3
Cause Analysis on the Abnormal Failure of SiC Power Modules During the HV-H³TRB Tests	3
Reliability Challenges in Advanced 3D Technologies: The Case of Through Silicon Vias and SiCN–SiCN Wafer-to-Wafer Hybrid-Bonding Technologies	3
Negative Capacitance Vertical Dopingless TFET and its Analog/RF Analysis Using Interface Trap Charges	3
TechRxiv: Share Your Preprint Research with the World!	3
Table of contents	3
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices	3
Dynamic Reliability Assessment of Vertical GaN Trench MOSFETs With Thick Bottom Dielectric	3
Reliability and Process Scalability of TiO₂/Porous Silicon-Based Broadband Photodetectors	3
Analysis of Floating Limiting Rings Termination Under Repetitive Avalanche Current Stress for 4H-SiC JBS Rectifiers	3
A SiC Trench Schottky Diode With Accelerated Hole Extraction and Recombination Structure for Enhancing Single-Event Burnout Tolerance	3