OOIR: Observatory of International Research

Papers

(The median citation count of IEEE Transactions on Device and Materials Reliability is 0. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)

Article	Citations
From Mega to nano: Beyond one Century of Vacuum Electronics	59
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	55
Editorial	34
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	31
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability	30
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	28
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability	28
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	26
Package-Level Electro-Thermal Simulation With Transient Thermal Resistance Model for Surge Stress Failure Analysis of SiC MOSFET	23
On the Response Time Constant of Interface Defects in Accumulation	22
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	21
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	21
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	20
IEEE Transactions on Device and Materials Reliability Publication Information	19
Reliability of Advanced Nodes	18
IEEE Transactions on Device and Materials Reliability Publication Information	18
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	17
Stability in Electroluminescence from Ag-NSi Schottky Junction LED: Role of Ambient Oxidation	16
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	16
Table of Contents	16
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	15
IEEE Transactions on Device and Materials Reliability Publication Information	15
Research of Single-Event Burnout in P-NiO/n-Ga ₂ O ₃ Heterojunction Diode	15
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects	15
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	15

Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	14
Fault Modeling and Test Algorithm Development Framework for Gate-All-Around SRAMs	14
Insights Into the Effects of Interface Trap Charges on Electrostatic-Based Magnesium Silicide Tunneling Interface	13
Effects of Electrolyte Volume on Electrochemical Migration of Tin in Water Drop Test	13
Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm	13
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs	12
Table of Contents	12
IEEE Transactions on Device and Materials Reliability Publication Information	12
Impact of Substrate connection on Dynamic-R _ON drift of 650V normally-off Monolithic Bidirectional AlGaN/GaN HEMT	12
Electrical Switching Safe Operation Area on GaN Bidirectional Switches Under Hard-Switching Conditions by Multiple Pulse Test	11
Member Get-A-Member (MGM) Program	11
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors	11
TechRxiv: Share Your Preprint Research with the World!	11
A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness	11
Introducing IEEE Collabratec	11
Avalanche Failure Mechanisms of 1200-V/40-A 4H-SiC Junction Barrier Schottky Diodes with Various Epilayer Defects	10
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	10
IEEE Transactions on Device and Materials Reliability Information for Authors	10
A Lifetime Prediction Method of IGBT Based on Phased Nonlinear Wiener Process	10
Non-Traditional Operational Mechanisms of NbO _x -Based Threshold Switching Devices Used on On-Chip ESD Protection	10
IEEE Transactions on Device and Materials Reliability Publication Information	10
Analysis of Trapping Mechanisms and Capacitance Dispersion in Double-π Gate AlGaN/GaN HEMTs Under High-Temperature Conditions	10
Reliability Analysis of IGZO Thin Film Transistor for Wearable Biosensing Applications	10
Study of Trap Influence on Threshold Voltage of SiC MOSFET Based on Transient Current Method	10
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	10
Compact Modeling of Process Variation and Reliability Predictions for Nanosheet Gate-All-Around FET	9
Call for Nominations Editor-in-Chief IEEE Transactions on Device and Materials Reliability	9
Degradation Behavior and Mechanism of SONOS FLASH by Total Ionization Dose Effects	9
Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor	9
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	9
Blank Page	9
Open Model Interface Assisted NBTI-Aware Design With Dual-V _th Logic Synthesis Strategy for Reliability Improvement	9
TechRxiv: Share Your Preprint Research with the World!	9
Aging-Induced Mg Cluster Observation in GaN-Based Lasers by Atom Probe Tomography	9
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	9
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	8
Table of Contents	8
Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications	8
NAVIgator under Fire: Characterizing Voltage Limits and Soft Error Resilience of AMD NAVI GPUs	8
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	8
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	8
Mitigating the Process Variations in Negative Capacitance Junctionless Device and Circuit	8
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	8
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	8
Proton Irradiation Effects on Single Event Burnout in AlGaN/GaN HEMTs	8
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	8
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	7
Call for Nominations for Editor-in-Chief IEEE Electron Device Letters	7
TCAD Investigation on a Novel SiC Trench MOSFET With Integrated N ⁺ -PolySi/SiC Heterojunction Diode for Improved Third-Quadrant and High-Temperature	7
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	7

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Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	7
Semi-empirical Modeling of Hot Carrier Degradation in 12 nm FinFET LDMOS devices	7
Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators	7
TechRxiv: Share Your Preprint Research with the World!	7
SiC MOSFET Gate-Oxide and SiC/SiO ₂ Interface Defect Charge Movement Based on the Hi-Lo C _ISS	7
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	7
Error-Corrected RRAM-Based Compute-in-Memory Accelerator Using Voltage-Clamp Current Mirror	6
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	6
Key Factors Affecting Dynamic Reliability in GaN HEMTs and How Can They Be Mitigated?	6
IEEE Transactions on Device and Materials Reliability Publication Information	6
Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET	6
Lifetime Prediction Method for IGBT Modules Under Combined Power Cycling–Vibration Conditions	6
Analysis and Structural Mitigation of Trapping-State-Trap Induced Drain Leakage Current in Buried-Channel-Array-Transistor	6
Investigation of Electrical Breakdown in AlGaN/GaN/AlN HEMTs Through Nanoscale Analysis and Physics-Based Modeling	6
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	6
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing	6
Analytical Model for Cu Interconnect Lifetimes Under Combined Thermomigration and Electromigration Stress	6
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment	6
An Efficient Modeling Approach for Electrothermal Migration Analysis of On-Chip Interconnects	6
Influence of Critical Working Conditions on Stability of Varistor Characteristics	6
Radiation Hardened SOI LDMOS With Dual P-Type Layers Shielding Irradiation Charge Field	6
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	5
Call for Nominations for Editor-in-Chief	5
Design of Highly Reliable 14T and 16T SRAM Cells Combined With Layout Harden Technique	5
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	5
Wide Band Gap Semiconductors for Automotive Applications	5
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	5
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	5
Influence of Phase Coarsening on Inhomogeneous Deformation and Fracture Behavior in Sn–Bi Solder Interconnects	5
IEEE Transactions on Device and Materials Reliability Information for Authors	5
Memristive Switching Behavior of MoO₃ Decorated PSi Heterostructure and Impact of Temperature on Device Reliability	5
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	5
A Highly Reliable Dual-Node-Upset-Tolerant 20T Radiation Hardened SRAM Cell for Aerospace Applications	5
Comparison of Different Input Data for the Prediction of LED Solder Joints Using Artificial Neural Networks	4
Reliability of Advanced Nodes	4
Metastable Operating Stability of Perovskite/Silicon Tandem Solar Cell Modules	4
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	4
Fast Heater‑Based NBTI Resolves the Reverse Antenna Effect in PID‑Degraded High‑k and SiO ₂ pMOSFETs	4
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	4
Failure Mechanisms of Fluorine-Doped Tin Oxide Thin Films in Glass and Reliability Tests	4
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	4
Analysis of Multicrystalline Si Solar Cell Degradation Due to Reverse Bias and High Temperature Aging	4
SafeHDC: Concurrent Uncertainty and Fault Detection in Hyperdimensional Computing	4
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy	4
Front Cover	4
IEEE Transactions on Device and MaterialsReliability publication information	4
Modeling Degradation Kinetics of FAPbI₃ Perovskite Solar Cells: Impact of Microstructural and Optoelectronic Defects	4
IEEE Transactions on Device and Materials Reliability Information for Authors	4
Comprehensive TCAD-Based Single Event Effect Study of TFET-Based 1T DRAM and Crossbar Memory Array	4
Digital Probing of Activation Energy for Evaluating Reliability in 2-D and 3-D NAND Flash Memory	4
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	4
DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin	4
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	4
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	4
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	4
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	4
Table of Contents	4
Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors Under Reverse Pulse Electrical Stress Using the Voltage-Transient Method	3
Correlation of HCD and Percolation Paths in FinFETs: Study of RDF and MGG Impacts Through 3-D Particle-Based Simulation	3
QRAM4Space: Dual-Node Radiation-Tolerant Quadruple SRAM for Space Systems	3
Table of Contents	3
2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23	3
Sensitivity of Logic Cells to Laser Fault Injections: An Overview of Experimental Results for IHP Technologies	3
Study on Electromagnetic Pulse Damage of 22nm FDSOI in Radiation Environment	3
Resistance Degradation of Unintentionally Doped Single Crystal BaTiO ₃	3
All-Regions Damage Extraction Method for SiC IGBTs Based on C-V Curves	3
Impact of EP-CG Interlayer Dielectric on Performance of L-Shaped Split-Gate Flash Memory	3
Microstructural Evolution of Gate Oxide in SiC Power MOSFETs Under Heavy-Ion Irradiation	3
Prediction of Crack Initiation at Die Corner of Molded Underfill Flip-Chip Packages Under Thermal Load by New Criteria	3
Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions	3
Reliability Analysis of GaAs-PIN Limiter Under Ultra-Wideband Pulse Radiation	3
A Low Cost Triple-Node-Upset Self-Recoverable Latch Design for Nanoscale CMOS	3
Total-Ionizing-Dose Radiation Effect on Current Gain for Bipolar Junction Transistor Based 18 V BCD technology	3
On-Silicon Characterization of CDM-Like Stress in Long Interconnects Using vf-TLP in Nanometric ICs	3
Aging Reliability Compact Modeling of Trap Effects in Power GaN HEMTs	3
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Wide and Ultrawide Bandgap Semiconductor Devices for RF and Power Applications"	3
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	3
Weak Snapback Silicon Controlled Rectifier ESD Device With Double Snapback Characteristics	3
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	3

Exploring Non-TAP Interfaces for Efficient and Secure Access to IJTAG Network	3
An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability	3
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	3
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	3
EXT-TAURUM P2T: An Extended Secure CAN-FD Architecture for Road Vehicles	3
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	2
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	2
Comparative Analysis of SGTMOS Degradation Under Repeated Off-State Avalanche and Short Circuit Current Pulses	2
Capacitor-Coupled Offset-Canceled DRAM Sense Amplifier With Ultralow Offset Voltage and Hidden Cancelation Time	2
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	2
Reliability and Optimization Simulation Study of Zero-Temperature-Delay Point in Digital Circuits for Advanced Technology	2
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	2
SafeDE: A Low-Cost Hardware Solution to Enforce Diverse Redundancy in Multicores	2
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	2
Thermal Runaway in Thin Film PV: temperature profile modeling	2
Table of Contents	2
Comparative Study on the Performance of Digital Low-Light EBAPS Devices Based on Different Multi-Alkali Photocathode Materials	2
A Comprehensive Modeling Framework for Charge-Sharing and Bias-Dependent Single Event Transient Prediction in FinFETs	2
Board Level-Component Solder Joints Normalized Crack Severity Index of Solid-State Drive With Different Reliability Temperature Cycle Test Profiles	2
Resilience via Recovery: Gamma-Irradiated Cascode GaN HEMTs Under Electron Wind Force	2
Impact of Post-Metallization Annealing on the Reliability of Barrierless Mo Word Lines	2
Predicting the Degradation and Recovery Trends of the Photovoltaic Efficiency of Sb₂Se₃ Antimony Solar Cells	2
IEEE Transactions on Device and Materials Reliability Information for Authors	2
SiC Damage Induced by Heavy Ion Irradiation and Post-Gate Stress in SiC MOSFETs	2
2024 Index IEEE Transactions on Device and Materials Reliability Vol. 24	2
Effect of Gamma Radiation on Static DC, Reliability, and RF Performance of Submicron GaN-on-Si RF MIS-HEMTs With In Situ SiN	2
Cause Analysis on the Abnormal Failure of SiC Power Modules During the HV-H³TRB Tests	2
Copper Line Resistance Degradation Caused by Unidirectional and Bidirectional Pulsed Currents	2
Drain Field Plate Effects in p-GaN HEMTs During Surge Voltage Hard Switching	2
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	2
Study on the Effect of Cu Buffer and Cu-Wire Bonds on SiC Device Performance	2
Deep Learning-Driven Ensemble Learning for Solar PV Faults Detection Under Low Irradiance Condition	2
Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature	2
On the Reliability of Complementary Field Effect Transistor: Unveiling the Role of Grain Granularities and Random Fluctuations	2
Research on the Mechanism of Electrical Erosion Accelerating Failure in High-Current Pulse Thyristor-Based Switches	2
Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices	2
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Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function	2
Performance-Limiting Trapping Effects in n-Type Ga ₂ O ₃ Schottky Barrier Diodes	2
Investigation of Switching Characteristics Degradation of GaN HEMT Under Power Cycling Aging	1
Multiple Phase Change Materials Integrated Into Power Module for Normal and High Current Reliability Enhancement	1
The Achievement of Pulse Laser Deposited Amorphous P-Type N-Doped Ga₂O₃ for Applying in Thin Film Transistor and Homojunction Diode	1
A Gate-Level SER Estimation Tool With Event-Driven Dynamic Timing and SET Height Consideration	1
The Failure Mechanism of Internal Circuit During ESD Striking a Power to Another Power	1
Investigating the Arc-Shaped Kink Drain Voltage of Drain Current With Capacitance-Voltage Measurement Method in GaN HEMTs	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
Numerical Simulation of Trapped Hole Lateral Migration and Induced Threshold Voltage Retention Loss in a SONOS Flash Memory	1
Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model	1
AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
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Thermal Stress Impact on Electrical Conductivity and Microstructure of Thin Aluminum Films Deposited on Polyethylene Terephthalate Substrates	1
A Novel Lifetime Estimation Method and Structural Optimization Design for Film Capacitors in EVs Considering Material Aging and Power Losses	1
Mechanism and Quantitative Modeling of the SRAM Soft Error Induced by Space Electrostatic Discharge	1
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy	1
Reliability Analysis of MOS Devices Using Burst Pulse CV Measurement Technique	1
Impact of Total Ionizing Dose on the Electrical Performance of Silicon Carbide MOSFET	1
IEEE Transactions on Device and Materials Reliability information for authors	1
Improving Single-Event Effect Performance of SiC MOSFET by Excess Hole Extraction	1
Next-Generation High-Density PCB Development by Fan-Out RDL Technology	1
Table of Contents	1
An Aging Small-Signal Equivalent Circuit Modeling Method for InP HBT	1
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures	1
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	1
Radiation Hardened Domino Logic-Based Schmitt Trigger Circuit With Improved Noise Immunity	1
IEEE Transactions on Device and Materials Reliability Information for Authors	1
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling	1
A Process-Robust Split-Gate eFlash Memory with Spacer-Defined Floating Gate in 55-nm Node	1
IEEE Transactions on Device and Materials Reliability Information for Authors	1
Bridging the Data Gap in Photovoltaics with Synthetic Data Generation	1
Design and Fabrication of FS-IGBTs With Enhanced Ruggedness and the Influence of Circuit Parameters on Short-Circuit	1
2025 Index IEEE Transactions on Device and Materials Reliability Vol. 25	1
A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors	1
2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22	1
Assessing the Reliability of DRAM CMOS Periphery: Comparing AC and DC Conditions for BTI and TDDB	1
Unveiling T_max Inside GaN HEMT Based X-Band Low-Noise Amplifier by Correlating Thermal Simulations and IR Thermographic Measurements	1
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Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-μm AlGaN/GaN HEMTs for Power RF Applications	1
Exploration of the exciting world of multifunctional oxide-based electronic devices: from material to system-level applications	1
An Improved Thermal Network Model of Press-Pack IGBT Modules Considering Contact Surface Damage	1
Investigation of the Mechanism of Mixed-Gas Plasma Modulation of Indium Oxide Thin-Film Transistor Performance	1
Die-Attach Influence on Thermal/Electrical Parameters of GaN RF Device	1
Effect of Large Amplitude Thermal Cycles on Power Assemblies Based on Ceramic Heat Sink and Multilayer Pressureless Silver Sintering	1
Enhanced Stability in Sn-Doped InGaZnO TFTs: The Critical Role of Channel Length and the Dual Effect of Lateral Field Revealed by eMSM Analysis	1
Table of Contents	1
Special Issue on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2023) in the IEEE Transactions on Device and Materials Reliability	1
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	1
Characterization of Electromagnetic Susceptibility in Optocouplers Exposed to Different Interference Waveforms	1
Experimental Comparison of TID Hardness in MOSFETs Implemented With the Enclosed, Diamond (Hexagonal Gate), and Rectangular Layout Styles	1
A DICE Flip-Flop Design by Resetting Redundancy Hardening for Single Event Upset Tolerance	1
Investigation of Single-Event Burnout in Laterally-Diffused Metal-Oxide Semiconductor for Power Modulation Circuits	1
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	0
H²C-TM: A Hybrid High Coverage Test Method for Improving the Detection of HtD Faults in STT-MRAMs	0
IEEE Transactions on Device and Materials Reliability Publication Information	0