OOIR: Observatory of International Research

Papers

(The median citation count of IEEE Transactions on Device and Materials Reliability is 0. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-12-01 to 2025-12-01.)

Article	Citations
From Mega to nano: Beyond one Century of Vacuum Electronics	54
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	50
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters	36
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	29
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	26
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	24
Sintered Silver-Based Direct-Cooled IGBTs With High Output Power and Thermal Reliability	24
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	23
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	23
Location-Aware Error Correction for Mitigating the Impact of Interconnects on STT-MRAM Reliability	22
On the Response Time constant of Interface Defects in Accumulation	20
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	19
IEEE Transactions on Device and Materials Reliability Publication Information	19
IEEE Transactions on Device and Materials Reliability Publication Information	19
Reliability of Advanced Nodes	18
Research of Single-Event Burnout in P-NiO/n-Ga₂O₃ Heterojunction Diode	16
Degradation Analysis of 14 nm SOI FinFETs by Influence of Hot Carrier Injection and Self-Heating Synergistic Effects	15
Unveiling the Degradation Mechanism of Polymer-Based Thermal Interface Materials Under Thermo-Oxidative Condition	15
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	15
A DLTS Study on Deep Trench Processing-Induced Trap States in Silicon Photodiodes	15
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	15
Thermal Effect on Carbon Nanotube Fiber High-Ampacity Conductors at High Frequencies	14
Single-Event Effects Induced by Monoenergetic Fast Neutrons in Silicon Power UMOSFETs	14
Insights Into the Effects of Interface Trap Charges on Electrostatic-Based Magnesium Silicide Tunneling Interface	14
IEEE Transactions on Device and Materials Reliability Publication Information	14

Lifetime Prediction of IGBT by BPNN Based on Improved Dung Beetle Optimization Algorithm	14
Fault Modeling and Test Algorithm Development Framework for Gate-All-Around SRAMs	13
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	13
Table of Contents	13
Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter	13
Effects of Electrolyte Volume on Electrochemical Migration of Tin in Water Drop Test	13
Introducing IEEE Collabratec	12
A Novel Dual-Mode Dual Trench MOSFET With Self-Adjustable Field Plate for Low EMI Noise and High Dynamic Avalanche Robustness	12
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO₂Transistors	12
TechRxiv: Share Your Preprint Research with the World!	12
Study of Trap Influence on Threshold Voltage of SiC MOSFET Based on Transient Current Method	12
Member Get-A-Member (MGM) Program	12
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	12
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	11
IEEE Transactions on Device and Materials Reliability Information for Authors	11
A Lifetime Prediction Method of IGBT Based on Phased Nonlinear Wiener Process	11
IEEE Transactions on Device and Materials Reliability Publication Information	11
Compact Modeling of Process Variation and Reliability Predictions for Nanosheet Gate-All-Around FET	11
Non-Traditional Operational Mechanisms of NbOx-Based Threshold Switching Devices Used on on-Chip ESD Protection	11
From Mega to nano: Beyond one Century of Vacuum Electronics	10
Analysis of Trapping Mechanisms and Capacitance Dispersion in Double-π Gate AlGaN/GaN HEMTs Under High-Temperature Conditions	10
Reliability and Characterization of Nanosilver Joints Prepared by a Time-Reduced Sintering Process	10
Degradation Behavior and Mechanism of SONOS FLASH by Total Ionization Dose Effects	10
Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications	9
Aging-Induced Mg Cluster Observation in GaN-Based Lasers by Atom Probe Tomography	9
Open Model Interface Assisted NBTI-Aware Design With Dual-V_th Logic Synthesis Strategy for Reliability Improvement	9
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	9
TechRxiv: Share Your Preprint Research with the World!	9
Blank Page	9
An Analytical Model of Read-Disturb Failure Time in a Post-Cycling Resistive Switching Memory	9
Erratum to “Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool”	9
Call for Nominations Editor-in-Chief IEEE Transactions on Device and Materials Reliability	9
Impact of Pulse Voltage Stress on the Reliability of Ferroelectric Thin-Film Transistor	9
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	8
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	8
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	8
Table of Contents	8
Evaluations of Gate Oxide Reliability in SiC MOSFETs Under Extremely High Gate Voltage Stress	8
Development of Accelerated Life Testing Apparatus for Light-Emitting Diode Therapy	8
Effects of Temperature and Bias Voltage on Electron Transport Properties in GaN High-Electron-Mobility Transistors	8
FPGA Assessment Methodology of Adverse X-Ray Effects on Secure Digital Circuits	8
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	8
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	8
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Proton Irradiation Effects on Single Event Burnout in AlGaN/GaN HEMTs	8
Design of Robust SRAM Cell With Enhanced Soft-Error Hardening for Radiation-Prone Applications	7
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	7
IEEE Transactions on Device and MaterialsReliability publication information	7
Call for Nominations for Editor-in-Chief IEEE Electron Device Letters	7
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	7

Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y₂O₃ Gate Dielectric	7
TechRxiv: Share Your Preprint Research with the World!	7
Investigation of Electrical Breakdown in AlGaN/GaN/AlN HEMTs Through Nanoscale Analysis and Physics-Based Modeling	7
Exploring the Optimal Solution for Graphene-Based Microstrip Line Attenuators	7
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Influence of Critical Working Conditions on Stability of Varistor Characteristics	7
Error-Corrected RRAM-Based Compute-in-Memory Accelerator Using Voltage-Clamp Current Mirror	7
IEEE Transactions on Device and Materials Reliability Publication Information	6
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D ₂ and N ₂ Annealing	6
An Efficient Modeling Approach for Electrothermal Migration Analysis of On-Chip Interconnects	6
Analytical Model for Cu interconnect Lifetimes Under Combined Thermomigration and Electromigration Stress	6
Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET	6
Call for Nominations for Editor-in-Chief IEEE Transactions on Semiconductor Manufacturing	6
Wide Band Gap Semiconductors for Automotive Applications	6
Lifetime Prediction Method for IGBT Modules Under Combined Power Cycling–Vibration Conditions	6
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	6
Radiation Hardened SOI LDMOS With Dual P-Type Layers Shielding Irradiation Charge Field	6
Introducing IEEE Collabratec	6
Negative Capacitance Vertical Dopingless TFET and Its Analog/RF Analysis Using Interface Trap Charges	6
Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	6
High Gate Reliability and Breakdown Voltage p-GaN HEMTs Based on Post-Annealing-Free Oxygen Plasma Treatment	6
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	5
Metallization Reliability of GaN-Based High-Voltage Light-Emitting Diodes	5
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	5
White X-Ray Radiation Effects in MOS Capacitors With Atomic Layer Deposited HfO₂/Al₂O₃ and Al₂O₃/HfO₂/Al₂O₃ Gate	5
Call for Nominations for Editor-in-Chief	5
Memristive Switching Behavior of MoO₃ Decorated PSi Heterostructure and Impact of Temperature on Device Reliability	5
Analysis of Multicrystalline Si Solar Cell Degradation Due To Reverse Bias and High Temperature Aging	5
IEEE Transactions on Device and Materials Reliability Information for Authors	5
Comprehensive TCAD-Based Single Event Effect Study of TFET-Based 1T DRAM and Crossbar Memory Array	5
A Highly Reliable Dual-Node-Upset-Tolerant 20T Radiation Hardened SRAM Cell for Aerospace Applications	5
IEEE Transactions on Device and MaterialsReliability publication information	4
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	4
Soft-Error-Aware SRAM for Terrestrial Applications	4
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	4
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	4
IEEE Transactions on Device and Materials Reliability information for authors	4
Trap Location and Stress Degradation Analysis of GaN High Electron Mobility Transistors Based on the Transient Current Method	4
Comparison of Different Input Data for the Prediction of LED Solder Joints Using Artificial Neural Networks	4
Correlation of Radiation-Induced Interface Traps With Band Edge Energy Through Band Structure-Based Analysis of Electrostatics of UTB SOI Devices	4
Fe-Related Trapping and Detrapping Dynamics in AlGaN/GaN HEMTs Inspected by Drain Current Transient (DCT) Spectroscopy	4
Modeling Degradation Kinetics of FAPbI₃ Perovskite Solar Cells: Impact of Microstructural and Optoelectronic Defects	4
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	4
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	4
Table of Contents	4
Metastable Operating Stability of Perovskite/Silicon Tandem Solar Cell Modules	4
Design of Highly Reliable 14T and 16T SRAM Cells Combined With Layout Harden Technique	4
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	4
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	4
DAAS: Differential Aging-Aware STA for Precise Timing Closure With Reduced Design Margin	4
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	4
Front Cover	4
2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23	4
Failure Mechanisms of Fluorine-Doped Tin Oxide Thin Films in Glass and Reliability Tests	4
IEEE Transactions on Device and Materials Reliability Information for Authors	4
Influence of Phase Coarsening on Inhomogeneous Deformation and Fracture Behavior in Sn–Bi Solder Interconnects	4
Reliability of Advanced Nodes	4
Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions	3
Weak Snapback Silicon Controlled Rectifier ESD Device With Double Snapback Characteristics	3
Exploring Non-TAP Interfaces for Efficient and Secure Access to IJTAG Network	3
Member Get-A-Member (MGM) Program	3
Resistance Degradation of Unintentionally Doped Single Crystal BaTiO3	3
All-Regions Damage Extraction Method for SiC IGBTs Based on C-V Curves	3
Aging Reliability Compact Modeling of Trap Effects in Power GaN HEMTs	3
Microstructural Evolution of Gate Oxide in SiC Power MOSFETs Under Heavy-Ion Irradiation	3
QRAM4Space: Dual-Node Radiation-Tolerant Quadruple SRAM for Space Systems	3
Correlation of HCD and Percolation Paths in FinFETs: Study of RDF and MGG Impacts Through 3-D Particle-Based Simulation	3
Robustness of Pentacene:MoS₂:ZnO Ternary Blend for Optoelectronic Devices	3
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	3
On-Silicon Characterization of CDM-Like Stress in Long Interconnects Using vf-TLP in Nanometric ICs	3
EXT-TAURUM P2T: An Extended Secure CAN-FD Architecture for Road Vehicles	3
Table of Contents	3
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	3
Analysis of the Degradation of Depletion-Mode GaN High-Electron-Mobility Transistors Under Reverse Pulse Electrical Stress Using the Voltage-Transient Method	3
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Wide and Ultrawide Bandgap Semiconductor Devices for RF and Power Applications"	3
Study on Electromagnetic Pulse Damage of 22nm FDSOI in Radiation Environment	3
An Efficient Dynamic Threshold Voltage Detection Scheme for Improving 3-D NAND Flash Reliability	3
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	3
Reliability Analysis of GaAs-PIN Limiter Under Ultra-Wideband Pulse Radiation	3
Prediction of Crack Initiation at Die Corner of Molded Underfill Flip-Chip Packages Under Thermal Load by New Criteria	3

Comparative Study on the Performance of Digital Low-Light EBAPS Devices Based on Different Multi-Alkali Photocathode Materials	2
Sensitivity of Logic Cells to Laser Fault Injections: An Overview of Experimental Results for IHP Technologies	2
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	2
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	2
Special Issue on Intelligent Sensor Systems for the IEEE Journal of Electron Devices	2
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	2
Research on the Mechanism of Electrical Erosion Accelerating Failure in High-Current Pulse Thyristor-Based Switches	2
Investigation on Traps Dynamics & Negative Bias Stress in D-Mode GaN-on-Si Power MIS HEMTs Under High-Temperature	2
Table of Contents	2
Copper Line Resistance Degradation Caused by Unidirectional and Bidirectional Pulsed Currents	2
A Low Cost Triple-Node-Upset Self-Recoverable Latch Design for Nanoscale CMOS	2
Board Level-Component Solder Joints Normalized Crack Severity Index of Solid-State Drive With Different Reliability Temperature Cycle Test Profiles	2
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	2
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPs	2
Thermal Runaway in Thin Film PV: temperature profile modeling	2
Study on the Effect of Cu Buffer and Cu-wire Bonds on SiC Device Performance	2
Cause Analysis on the Abnormal Failure of SiC Power Modules During the HV-H³TRB Tests	2
[Blank page]	2
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	2
Statistical Model and Transistor Size Effect of Hot Carrier Injection for Stability Reinforced SRAM Physically Unclonable Function	2
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	2
Effect of Gamma Radiation on Static DC, Reliability, and RF Performance of Submicron GaN-on-Si RF MIS-HEMTs With In Situ SiN	2
Aging Monitoring Method of Bond Wires-Based on Phase-Frequency Characteristics of Differential Mode Conducted Interference Signal for IGBT Module	2
Predicting the Degradation and Recovery Trends of the Photovoltaic Efficiency of Sb₂Se₃ Antimony Solar Cells	2
SiC Damage Induced by Heavy Ion Irradiation and Post-Gate Stress in SiC MOSFETs	2
Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability	2
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Comparative Analysis of SGTMOS Degradation Under Repeated Off-State Avalanche and Short Circuit Current Pulses	1
A Comprehensive Modeling Framework for Charge-Sharing and Bias-Dependent Single Event Transient Prediction in FinFETs	1
2024 Index IEEE Transactions on Device and Materials Reliability Vol. 24	1
A DICE Flip-Flop Design by Resetting Redundancy Hardening for Single Event Upset Tolerance	1
Improving Single-Event Effect Performance of SiC MOSFET by Excess Hole Extraction	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
AdAM: Adaptive Approximate Multiplier for Fault Tolerance in DNN Accelerators	1
Multiple Phase Change Materials Integrated Into Power Module for Normal and High Current Reliability Enhancement	1
Effect of Large Amplitude Thermal Cycles on Power Assemblies Based on Ceramic Heat Sink and Multilayer Pressureless Silver Sintering	1
Exploration of the exciting world of multifunctional oxide-based electronic devices: from material to system-level applications	1
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling	1
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Investigation of Switching Characteristics Degradation of GaN HEMT Under Power Cycling Aging	1
Reliability and Optimization Simulation Study of Zero-Temperature-Delay Point in Digital Circuits for Advanced Technology	1
A Novel Lifetime Estimation Method and Structural Optimization Design for Film Capacitors in EVs Considering Material Aging and Power Losses	1
SafeDE: A Low-Cost Hardware Solution to Enforce Diverse Redundancy in Multicores	1
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	1
Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model	1
Correction Masking: A Technique to Implement Efficient SET Tolerant Error Correction Decoders	1
Probing Interface Trapping Characteristics of Au/β-Ga₂O₃ Schottky Barrier Diode on Si (100)	1
Mechanism and Quantitative Modeling of the SRAM Soft Error Induced by Space Electrostatic Discharge	1
A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors	1
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Table of Contents	1
Table of Contents	1
Investigation of the Mechanism of Mixed-Gas Plasma Modulation of Indium Oxide Thin-Film Transistor Performance	1
Radiation Hardened Domino Logic-Based Schmitt Trigger Circuit With Improved Noise Immunity	1
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications	1
Design and Fabrication of FS-IGBTs With Enhanced Ruggedness and the Influence of Circuit Parameters on Short-Circuit	1
Impact of Total Ionizing Dose on the Electrical Performance of Silicon Carbide MOSFET	1
The Achievement of Pulse Laser Deposited Amorphous P-Type N-Doped Ga₂O₃ for Applying in Thin Film Transistor and Homojunction Diode	1
Bridging the Data Gap in Photovoltaics with Synthetic Data Generation	1
A Gate-Level SER Estimation Tool With Event-Driven Dynamic Timing and SET Height Consideration	1
Effect of Titanium-Polymer Interactions on Adhesion of Polymer-Copper Redistribution Layers in Advanced Packaging	1
Life Cycle Assessment of a Lead-Free Cesium Titanium (IV) Single and Mixed Halide Perovskite Solar Cell Based 1 m² PV Module	1
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures	1
IEEE Transactions on Device and Materials Reliability Publication Information	1
The Failure Mechanism of Internal Circuit During ESD Striking a Power to Another Power	1
Assessing the Reliability of DRAM CMOS Periphery: Comparing AC and DC Conditions for BTI and TDDB	1
IEEE Transactions on Device and Materials Reliability Information for Authors	1
ESD Stress Effect on Failure Mechanisms in GaN-on-Si Power Device	0
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	0
Front Cover	0
Introducing IEEE Collabratec	0
Front Cover	0
Solder Dewetting and Reliability Challenges in Microbumps Due to NCF Entrapment	0
Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response	0
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	0
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks	0
Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits	0
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications	0
Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate	0
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H²C-TM: A Hybrid High Coverage Test Method for Improving the Detection of HtD Faults in STT-MRAMs	0
Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles	0
IEEE Transactions on Device and Materials Reliability Information for Authors	0
Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage	0
Impact of Electro-Thermal Transport on HCI and BTI Lifetime of Twin Nanowire FETs: Different Operational Modes	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
An Empirical Study on Fault Detection and Root Cause Analysis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns	0
Investigation on Electrical Properties of Printed Graphene Subjected to Aging, Ambient Environment and Gamma Radiation	0
Effect of Ambient on the Field Emission Induced-Damage in Dielectric-Less MEMS Capacitive Structures	0
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection	0
TechRxiv: Share Your Preprint Research with the World!	0
A Thermal Circuit Representing Frequency Dependent Dynamic Heating Between Electron and Lattice in SOI-FinFET	0
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