IEEE Transactions on Device and Materials Reliability

Article	Citations
Impact of Interface Trap Charges on Analog/RF and Linearity Performances of Dual-Material Gate-Oxide-Stack Double-Gate TFET	48
Critical Insights Into Fast Charging Techniques for Lithium-Ion Batteries in Electric Vehicles	40
Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications	34
Design Optimization of Three-Stacked Nanosheet FET From Self-Heating Effects Perspective	31
A Novel Hot Spot Mitigation Circuit for Improved Reliability of PV Module	29
Modeling of NBTI Using BAT Framework: DC-AC Stress-Recovery Kinetics, Material, and Process Dependence	29
Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs	25
Impact of Geometry, Doping, Temperature, and Boundary Conductivity on Thermal Characteristics of 14-nm Bulk and SOI FinFETs	25
Modeling of NBTS Effects in P-Channel Power VDMOSFETs	23
EMSpice: Physics-Based Electromigration Check Using Coupled Electronic and Stress Simulation	23
A Highly Reliable and Energy Efficient Radiation Hardened 12T SRAM Cell Design	21
High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors	20
Design of High-Speed Low Variation Static Noise Margin Ternary S-RAM Cells	20
Exceeding Conservative Limits: A Consolidated Analysis on Modern Hardware Margins	20
Double Node Upset Tolerant RHBD15T SRAM Cell Design for Space Applications	20
Reliability-Aware Design Strategies for Stateful Logic-in-Memory Architectures	19
Study of Charge Trapping Effects on AlGaN/GaN HEMTs Under UV Illumination With Pulsed I-V Measurement	18
A β-Ga₂O₃ MESFET to Amend the Carrier Distribution by Using a Tunnel Diode	18
Single-Event Multiple Effect Tolerant RHBD14T SRAM Cell Design for Space Applications	17
Warpage Analysis of Fan-Out Panel-Level Packaging Using Equivalent CTE	17
Ultra-Low Noise Defect Probing Instrument for Defect Spectroscopy of MOS Transistors	15
LED Lifetime Prediction Under Thermal-Electrical Stress	15
A Gate-Grounded NMOS-Based Dual-Directional ESD Protection With High Holding Voltage for 12V Application	13
Worst-Case Bias for High Voltage, Elevated-Temperature Stress of AlGaN/GaN HEMTs	12
Aging Diagnosis of Bond Wire Using On-State Drain-Source Voltage Separation for SiC MOSFET	12

SRAM Radiation Hardening Through Self-Refresh Operation and Error Correction	12
Reliability-Oriented Automated Design of Double-Sided Cooling Power Module: A Thermo-Mechanical-Coordinated and Multi-Objective-Oriented Optimization Methodology	12
Electromigration Effects in Power Grids Characterized From a 65 nm Test Chip	12
Soft-Error-Aware SRAM for Terrestrial Applications	12
Short Circuit Detection and Fault Current Limiting Method for IGBTs	12
Physical Study of SiC Power MOSFETs Towards HTRB Stress Based on C-V Characteristics	11
Fundamental Thermal Limits on Data Retention in Low-Voltage CMOS Latches and SRAM	11
Solder Joint Reliability Assessment and Pad Size Studies of FO-WLP With Glass Substrate	11
Die Shift Assessment of Reconstituted Wafer for Fan-Out Wafer-Level Packaging	11
TCAD Based Investigation of Single Event Transient Effect in Double Channel AlGaN/GaN HEMT	10
Reliability Analysis of Power Components in Restructured DC/DC Converters	10
Reliability Assessment of GaAs/Al₂O₃ Junctionless FinFET in the Presence of Interfacial Layer Defects and Radiations	10
ESD Protection Designs: Topical Overview and Perspective	10
Time and Temperature Dependence of Copper Protrusion in Metallized Through-Glass Vias (TGVs) Fabricated in Fused Silica Substrate	10
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	10
Effect of Wiring Density and Pillar Structure on Chip Packaging Interaction for Mixed-Signal Cu Low k Chips	10
Copper Trace Fatigue Life Modeling for Rigid Electronic Assemblies	10
Accelerated Degradation of IGBTs Due to High Gate Voltage at Various Temperature Environments	9
Overview of Bias Temperature Instability in Scaled DRAM Logic for Memory Transistors	9
A Physics-Based Single Event Transient Pulse Width Model for CMOS VLSI Circuits	9
Reliable and Radiation-Hardened Push-Pull pFlash Cell for Reconfigured FPGAs	9
Reliability and Performance Analysis of Logic-in-Memory Based Binarized Neural Networks	9
Investigation of Single Event Transient Effects in Junctionless Accumulation Mode MOSFET	9
Warpage Modeling of Ultra-Thin Packages Based on Chemical Shrinkage and Cure-Dependent Viscoelasticity of Molded Underfill	9
Automated Die Inking	8
Using Confocal Microscopy and Digital Image Correlation to Measure Local Strains Around a Chip Corner and a Crack Front	8
Machine Learning Approach for Prediction of Point Defect Effect in FinFET	8
CMOS-Compatible Ex-Situ Incorporated Junctionless Enhancement-Mode Thin Polysilicon Film FET pH Sensor	8
Design, Fabrication and Characterization of Single-Crystalline Graphene gNEMS ESD Switches for Future ICs	8
Stealthy Information Leakage Through Peripheral Exploitation in Modern Embedded Systems	8
Design of Compact Reliable Energy Efficient Read Disturb Free 17T CNFET Ternary S-RAM Cell	8
Investigation of Self-Heating Effect in Tree-FETs by Interbridging Stacked Nanosheets: A Reliability Perspective	8
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications	8
Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning	7
A New Scheme of the Low-Cost Multiple-Node-Upset-Tolerant Latch	7
Reliability Assessment of AlGaN/GaN Schottky Barrier Diodes Under ON-State Stress	7
The Novel Structure to Enhancement Ion /Ioff Ratio Based on Field Effect Diode	7
Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach	7
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	7
Impact of Hot Carrier Aging on the 1/f and Random Telegraph Noise of Short-Channel Triple-Gate Junctionless MOSFETs	7
Design for High Reliability of CMOS IC With Tolerance on Total Ionizing Dose Effect	7
Trap-Assisted and Stress Induced Safe Operating Area Limits of AlGaN/GaN HEMTs	7
Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes	7
Novel ESD Compact Modeling Methodology Using Machine Learning Techniques for Snapback and Non-Snapback ESD Devices	7
Honeycomb Texturing of Hierarchical Nanoflowers of WO3as an Efficient Route to Improve Repeatability and Stability of Room Temperature Vapor Sensor	7
Reliability of NAND Flash Memory as a Weight Storage Device of Artificial Neural Network	7
Impact of Gamma-Ray Radiation on DC and RF Performance of 10-nm Bulk N-Channel FinFETs	7
Next-Generation High-Density PCB Development by Fan-Out RDL Technology	7
Reliability Characterization of Ring Oscillator Circuits for Advanced CMOS Technologies	7
A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance	7

Energy Transformation Between the Inductor and the Power Transistor for the Unclamped Inductive Switching (UIS) Test	7
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPs	7
Impact of Dimensions of Memory Periphery FinFETs on Bias Temperature Instability	7
CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods	6
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET’s	6
Effect of Titanium-Polymer Interactions on Adhesion of Polymer-Copper Redistribution Layers in Advanced Packaging	6
Study of TID Radiation Effects on the Breakdown Voltage of Buried P-Pillar SOI LDMOSFETs	6
Reconstituted Wafer Deformation Analysis Through Whole Process Emulation	6
Single Event Transients in Sub-10nm SOI MuGFETs Due to Heavy-Ion Irradiation	6
Accelerated Stress Tests and Statistical Reliability Analysis of Metal-Oxide/GaN Nanostructured Sensor Devices	6
Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells	6
A Novel DTSCR With Embedded MOS and Island Diodes for ESD Protection of High-Speed ICs	6
A Gated-Diode ESD SCR-Incorporated BJT for Reversed Floating P⁺ Junction Modulation	6
The TID Characteristics of a Radiation Hardened Sense-Switch pFLASH Cell	6
Improving Breakdown Voltage in AlGaN/GaN Metal-Insulator-Semiconductor HEMTs Through Electric-Field Dispersion Layer Material Selection	6
High Pressure Deuterium Annealing for Improved Immunity Against Stress-Induced Threshold Voltage Degradation	6
Elimination of Thermo-Mechanically Driven Circumferential Crack Formation in Copper Through-Glass via Substrate	6
Demonstration of an Equivalent Material Approach for the Strain-Induced Reliability Estimation of Stacked-Chip Packaging	6
Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate	6
Impact of the Formation of Intermetallic Compounds in Current-Carrying Connections	6
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	6
Using the Octagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments	6
Low Temperature and High Pressure Oxidized Al2O3as Gate Dielectric for AlInN/GaN MIS-HEMTs	5
MOZART+: Masking Outputs With Zeros for Improved Architectural Robustness and Testing of DNN Accelerators	5
Detection of ESD-Induced Soft Failures by Analyzing Linux Kernel Function Calls	5
Stress Analysis and Characterization of PECVD Oxide/Nitride Multi-Layered Films After Thermal Cycling	5
The Influence of N-Type Buried Layer on SCR ESD Protection Devices	5
Reliability Testing of 3D-Printed Polyamide Actuators	5
LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm	5
Time Dependent Shift in SOA Boundary and Early Breakdown of Epi-Stack in AlGaN/ GaN HEMTs Under Fast Cyclic Transient Stress	5
Reliability-Aware Design Space Exploration for Fully Integrated RF CMOS PA	5
On-Chip Adaptive VDD Scaled Architecture of Reliable SRAM Cell With Improved Soft Error Tolerance	5
Investigation of Chip Temperature on Response Characteristics of the Humidity Sensor From ppm to %RH	5
Proton-Induced Effect on AlGaN/GaN HEMTs After Hydrogen Treatment	5
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	4
Hybrid Multi-Graphene/Si Avalanche Transit Time <h-ATT> Terahertz Power Oscillator: Theoretical Reliability and Experimental Feasibility Studies	4
Design and Analysis of Leakage-Induced False Error Tolerant Error Detecting Latch for Sub/Near-Threshold Applications	4
Unveiling the Failure Mechanism of Electrical Interconnection in Thermal-Aged PV Modules	4
Hot Carrier Degradation in MOSFETs at Cryogenic Temperatures Down to 4.2 K	4
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	4
A Study of the Relationship Between Endurance and Retention Reliability for a HfOₓ-Based Resistive Switching Memory	4
On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors	4
An Extended Building-In Reliability Methodology on Evaluating SRAM Reliability by Wafer-Level Reliability Systems	4
Workload-Aware Electromigration Analysis in Emerging Spintronic Memory Arrays	4
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	4
Online Research on Reliability of Thermal-Vibration Coupling for PLC Optical Splitters	4
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	4
Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs	4
Run-Time Protection of Multi-Core Processors From Power-Noise Denial-of-Service Attacks	4
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	4
Impact of Self-Heating on Linearity Performance of In0.53Ga0.47As-Based Gate-All-Around MOSFETs	4
CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations	4
Low-Leakage and Variable V HOLD Power Clamp for Wide Stress Time Range From ESD to Surge Test	4
BTI and Soft-Error Tolerant Voltage Bootstrapped Schmitt Trigger Circuit	4
STATE: A Test Structure for Rapid and Reliable Prediction of Resistive RAM Endurance	4
Reliability and Characterization of Nanosilver Joints Prepared by a Time-Reduced Sintering Process	3
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	3
Non-Simultaneous Triggering Induced Failure of CS-MCT Under Repetitive High-Current Pulse Condition	3
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	3
Negative-Bias Temperature Instability of p-GaN Gate GaN-on-Si Power Devices	3
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	3
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	3
Insights Into the Effect of TiN Thickness Scaling on DC and AC NBTI Characteristics in Replacement Metal Gate pMOSFETs	3
Reliability Characterization and Failure Prediction of 3D TLC SSDs in Large-Scale Storage Systems	3
Effect of Device Dimensions, Layout and Pre-Gate Carbon Implant on Hot Carrier Induced Degradation in HKMG nMOS Transistors	3
BTI-Aware Timing Reliability Improvement of Pulsed Flip-Flops in Nano-Scale CMOS Technology	3
Aging Monitoring Method of Bond Wires-Based on Phase-Frequency Characteristics of Differential Mode Conducted Interference Signal for IGBT Module	3
Layout-Dominated Dynamic Imbalanced Current Analysis and Its Suppression Strategy of Parallel SiC MOSFETs	3
High Precision IGBT Health Evaluation Method: Extreme Learning Machine Optimized by Improved Krill Herd Algorithm	3
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	3
Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO2 MOSFETs (June 2022)	3
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	3
Life Cycle Assessment of a Lead-Free Cesium Titanium (IV) Single and Mixed Halide Perovskite Solar Cell Based 1 m² PV Module	3
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	3
Probing Interface Trapping Characteristics of Au/β-Ga2O3 Schottky Barrier Diode on Si (100)	3
Impedance Investigation of MIFM Ferroelectric Tunnel Junction Using a Comprehensive Small-Signal Model	3
NrGO Floating Gate/SiOXNY Tunneling Layer Stack for Nonvolatile Flash Memory Applications	3
Electron Beam Induced Degradation in Electrical Characteristics of Optocoupler	3
Failure Analysis and Performance Improvement of Phase Change Memory Based on Ge2Sb2Te5	3
An Investigation of Field Reduction Effect on NBTI Parameter Characterization and Lifetime Prediction Using a Constant Field Stress Method	3

Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	3
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices	3
Geometric Nonlinear Effect on Biaxial Bending Strength of Thin Silicon Die in the PoEF Test	3
Efficiency and Catastrophic Failure of High-Power Blue GaN LEDs During Extremely High Temperature and Current Stress	3
Mechanism Analysis and Thermal Damage Prediction of High-Power Microwave Radiated CMOS Circuits	3
Strain—Engineered Asymmetrical Si/Si1–xGex IR-Photo-Detector: Theoretical Reliability and Experimental Feasibility Studies	3
Effect of Crack Evolution on the Resistance and Current Density of the Al Metallization in the IGBT Module During Power Cycling	2
Effect of Ion Implant Modification on Electrical Properties of MTM Antifuse a-Si Films	2
Applying a Statistical Model to the Observed Texture Evolution of Fatigued Metal Films	2
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	2
A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking	2
Electrochemical Migration of Immersion Silver Plated Printed Circuit Boards Contaminated by Dust Solution	2
Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs	2
Various Reliability Investigations of Low Temperature Polycrystalline Silicon Tunnel Field-Effect Thin-Film Transistor	2
Combined Methodology for Accurate Evaluation of Distance and Direction of Chromaticity Shifts in LED Reliability Tests	2
Method of Precise Positioning for Defect Failure Analysis Based on Nano-Probing and EBAC	2
Power Durability Enhancement and Failure Analysis of TC-SAW Filter With Ti/Cu/Ti/Cu/Ti Electrodes	2
Simulation Study of High-Speed Ge Photodetector Dark and Light Current Degradation	2
Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration	2
Effect of Different PBO-Based RDL Structures on Chip-Package Interaction Reliability of Wafer Level Package	2
Development of Accelerated Life Testing Apparatus for Light-Emitting Diode Therapy	2
Effects of Temperature and Bias Voltage on Electron Transport Properties in GaN High-Electron-Mobility Transistors	2
Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions	2
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D 2 and N 2 Annealing	2
Simultaneous and Sequential Triggering in Multi-Finger Floating-Base SCRs Depending on TLP Pulse Rise Time	2
Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter	2
Temperature Dependent Reliability of Polysilicon Emitter Bipolar Transistors Under High Current Stress	2
Analysis of Floating Limiting Rings Termination Under Repetitive Avalanche Current Stress for 4H-SiC JBS Rectifiers	2
Electromigration Performance Improvement of Metal Heaters for Si Photonic Ring Modulators	2
Correlation Study of Bulk Si Stress and Lithography Defects Using Polarized Stress Imager	2
Defect-Free and Annealing Influences in P3HT Organic Field-Effect Transistor Performance	2
Effect of Capped Cu Layer on Protrusion Behaviors of Through Silicon via Copper (TSV-Cu) Under Double Annealing Conditions: Comparative Study	2
Mitigation Technique for Single Event Transient via Pulse Quenching	2
An Analytical Model of Read-Disturb Failure Time in a Post-Cycling Resistive Switching Memory	2
Low-Temperature Deuterium Annealing for the Recovery of Ionizing Radiation-Induced Damage in MOSFETs	2
Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-μm AlGaN/GaN HEMTs for Power RF Applications	2
Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles	2
A VDD Correction Method for Static Stability Test of SRAM Bit Cell	2
Stress-Induced Transistor Degradation Studied by an Indentation Approach	2
Extraction of Statistical Gate Oxide Parameters From Large MOSFET Arrays	2
Fundamentals of Circuit Failure Analysis Based on Optical Fault Isolation Techniques	2
Exploiting Resistance Drift Characteristics to Improve Reliability of LDPC-Assisted Phase-Change Memory	2
Popcorning Failures in Polymer and MnO2 Tantalum Capacitors	2
Micro-Compression of Freestanding Electroplated Copper Through-Glass Vias	2
Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool	2
Transient Overshoot Voltages During VF-TLP Pulses for Bipolar Devices in the Presence of Lowly Doped Regions	2
Thermal Effect on Carbon Nanotube Fiber High-Ampacity Conductors at High Frequencies	2
Efficient Majority-Logic Reed-Solomon Decoders for Single Symbol Correction	1
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	1
Immediate Read-After-Write Capability in p-Type Ferroelectric Field-Effect Transistors and Its Evolution With Fatigue Cycling	1
Effect of Dummy Gate Bias on Breakdown Voltage and Gate Charge of a Novel In0.53Ga0.47As/InP Trench-Gate Pentode Power Device	1
Compact 3D Thermal Model for VLSI and ULSI Interconnect Network Reliability Verification	1
SafeDE: A Low-Cost Hardware Solution to Enforce Diverse Redundancy in Multicores	1
Lateral and Vertical Gate Oxide Stacking Impact on Noise Margins and Delays for the 8T SRAM Designed With Source Pocket Engineered GaSb/Si Heterojunction Vertical TFET: A Reliability Study	1
Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs	1
Destructive Testing for Reliability Analysis at High-Power Microwave in GaAs/InGaP Hetero-Junction Bipolar Transistor	1
A Study of the Nonlinear Capacitance Variation in Inter Level Copper and Low-k Interconnect Structure	1
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications	1
SOI FinFET Design Optimization for Radiation Hardening and Performance Enhancement	1
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection	1
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures	1
ESD Stress Effect on Failure Mechanisms in GaN-on-Si Power Device	1
Micromechanical Adhesion Experiments and Simulation on Cu-Damascene Processed Test Devices	1
Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte	1
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors	1
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling	1
Categorization of PBTI Mechanisms on 4H-SiC MOSFETs by the Stress Gate Voltage and Channel Plane Orientation	1
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	1
A Thermal Circuit Representing Frequency Dependent Dynamic Heating Between Electron and Lattice in SOI-FinFET	1
Unveiling Tmax Inside GaN HEMT Based X-Band Low-Noise Amplifier by Correlating Thermal Simulations and IR Thermographic Measurements	1
Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET Devices	1
Reliable Circuit Design Using a Fast Incremental-Based Gate Sizing Under Process Variation	1
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy	1
Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis	1
HEMT Inspired GaN Optical Waveguides: Analysis Under Thermal Stress and Prospects	1
Mono-Energetic Proton Induced Damages in SiC Power MOSFETs	1
Correlation of HCD and Percolation Paths in FinFETs: Study of RDF and MGG Impacts Through 3-D Particle-Based Simulation	1
Strain Modulated Asymmetrical Si/SiGe Superlattice p+-i-n+ Switches for MMW Low-Loss Secure Communication Systems	1
Characterization and Image-Based Performance Evaluation on the Longevity of LCDs Under High Temperature and Humid Environment	1
A Comprehensive Study of Total Ionizing Dose Effect on the Electrical Performance of the GaN MIS-HEMT	1
Optimization of Dual Field Plate AlGaN/GaN HEMTs Using Artificial Neural Networks and Particle Swarm Optimization Algorithm	1
LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations	1
Effect of Ambient on the Field Emission Induced-Damage in Dielectric-Less MEMS Capacitive Structures	1
Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability	1
EXT-TAURUM P2T: An Extended Secure CAN-FD Architecture for Road Vehicles	1
Investigation of Quantization Effects on RTS Due to Oxide Traps Induced by Channel Hot-Carrier-Stressing in pMOSFETs	1
Robustness of Pentacene:MoS2:ZnO Ternary Blend for Optoelectronic Devices	1
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	1
Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability	1
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	1