IEEE Transactions on Device and Materials Reliability

Article	Citations
Critical Insights Into Fast Charging Techniques for Lithium-Ion Batteries in Electric Vehicles	48
Quadruple and Sextuple Cross-Coupled SRAM Cell Designs With Optimized Overhead for Reliable Applications	37
Design Optimization of Three-Stacked Nanosheet FET From Self-Heating Effects Perspective	36
Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs	31
High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors	24
Design of High-Speed Low Variation Static Noise Margin Ternary S-RAM Cells	23
A β-Ga₂O₃ MESFET to Amend the Carrier Distribution by Using a Tunnel Diode	20
Single-Event Multiple Effect Tolerant RHBD14T SRAM Cell Design for Space Applications	19
LED Lifetime Prediction Under Thermal-Electrical Stress	18
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks	18
Short Circuit Detection and Fault Current Limiting Method for IGBTs	17
ESD Protection Designs: Topical Overview and Perspective	15
Soft-Error-Aware SRAM for Terrestrial Applications	15
TCAD Based Investigation of Single Event Transient Effect in Double Channel AlGaN/GaN HEMT	14
Aging Diagnosis of Bond Wire Using On-State Drain-Source Voltage Separation for SiC MOSFET	14
Reliability Analysis of Power Components in Restructured DC/DC Converters	13
CMOS Reliability From Past to Future: A Survey of Requirements, Trends, and Prediction Methods	13
Time and Temperature Dependence of Copper Protrusion in Metallized Through-Glass Vias (TGVs) Fabricated in Fused Silica Substrate	13
Machine Learning Approach for Prediction of Point Defect Effect in FinFET	13
MOZART+: Masking Outputs With Zeros for Improved Architectural Robustness and Testing of DNN Accelerators	13
A Gate-Grounded NMOS-Based Dual-Directional ESD Protection With High Holding Voltage for 12V Application	13
Monitoring Initial Solder Layer Degradation in a Multichip IGBT Module via Combined TSEPs	12
Investigation of Self-Heating Effect in Tree-FETs by Interbridging Stacked Nanosheets: A Reliability Perspective	12
A Physics-Based Single Event Transient Pulse Width Model for CMOS VLSI Circuits	12
Effect of Wiring Density and Pillar Structure on Chip Packaging Interaction for Mixed-Signal Cu Low k Chips	11

Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization	11
A 10T Soft-Error-Immune SRAM With Multi-Node Upset Recovery for Low-Power Space Applications	11
Solder Joint Reliability Assessment and Pad Size Studies of FO-WLP With Glass Substrate	11
Next-Generation High-Density PCB Development by Fan-Out RDL Technology	10
Elimination of Thermo-Mechanically Driven Circumferential Crack Formation in Copper Through-Glass via Substrate	10
Accelerated Degradation of IGBTs Due to High Gate Voltage at Various Temperature Environments	10
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs	10
Reliability and Performance Analysis of Logic-in-Memory Based Binarized Neural Networks	10
Copper Trace Fatigue Life Modeling for Rigid Electronic Assemblies	10
Design of Compact Reliable Energy Efficient Read Disturb Free 17T CNFET Ternary S-RAM Cell	10
Reliable and Radiation-Hardened Push-Pull pFlash Cell for Reconfigured FPGAs	9
Hot Carrier Degradation in MOSFETs at Cryogenic Temperatures Down to 4.2 K	9
A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance	9
CMOS-Compatible Ex-Situ Incorporated Junctionless Enhancement-Mode Thin Polysilicon Film FET pH Sensor	9
Design, Fabrication and Characterization of Single-Crystalline Graphene gNEMS ESD Switches for Future ICs	9
Novel ESD Compact Modeling Methodology Using Machine Learning Techniques for Snapback and Non-Snapback ESD Devices	9
A New Scheme of the Low-Cost Multiple-Node-Upset-Tolerant Latch	9
A Gated-Diode ESD SCR-Incorporated BJT for Reversed Floating P⁺ Junction Modulation	8
Self-Heating and Reliability-Aware “Intrinsic” Safe Operating Area of Wide Bandgap Semiconductors—An Analytical Approach	8
Effect of Titanium-Polymer Interactions on Adhesion of Polymer-Copper Redistribution Layers in Advanced Packaging	8
A Novel DTSCR With Embedded MOS and Island Diodes for ESD Protection of High-Speed ICs	8
Trap-Assisted and Stress Induced Safe Operating Area Limits of AlGaN/GaN HEMTs	8
Impact of Hot Carrier Aging on the 1/f and Random Telegraph Noise of Short-Channel Triple-Gate Junctionless MOSFETs	8
Impact of Gamma-Ray Radiation on DC and RF Performance of 10-nm Bulk N-Channel FinFETs	7
The Novel Structure to Enhancement Ion /Ioff Ratio Based on Field Effect Diode	7
Accelerated Stress Tests and Statistical Reliability Analysis of Metal-Oxide/GaN Nanostructured Sensor Devices	7
Review of Double-Sided Cooling Power Modules for Driving Electric Vehicles	7
Using the Octagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments	7
Study of TID Radiation Effects on the Breakdown Voltage of Buried P-Pillar SOI LDMOSFETs	7
Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles	7
Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes	7
Layout-Dominated Dynamic Imbalanced Current Analysis and Its Suppression Strategy of Parallel SiC MOSFETs	7
Proton-Induced Effect on AlGaN/GaN HEMTs After Hydrogen Treatment	7
Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate	6
Aging Monitoring Method of Bond Wires-Based on Phase-Frequency Characteristics of Differential Mode Conducted Interference Signal for IGBT Module	6
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI	6
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET’s	6
BTI and Soft-Error Tolerant Voltage Bootstrapped Schmitt Trigger Circuit	6
Improving Breakdown Voltage in AlGaN/GaN Metal-Insulator-Semiconductor HEMTs Through Electric-Field Dispersion Layer Material Selection	6
Simulation Study of High-Speed Ge Photodetector Dark and Light Current Degradation	6
Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells	6
STATE: A Test Structure for Rapid and Reliable Prediction of Resistive RAM Endurance	6
High Pressure Deuterium Annealing for Improved Immunity Against Stress-Induced Threshold Voltage Degradation	6
Stress Analysis and Characterization of PECVD Oxide/Nitride Multi-Layered Films After Thermal Cycling	6
On-Chip Adaptive VDD Scaled Architecture of Reliable SRAM Cell With Improved Soft Error Tolerance	5
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs	5
Effect of Aging Temperature on the Fatigue Resistance and Shear Strength of SAC305 Solder Joints	5
Simulation Study of Single-Event Burnout Reliability for 1.7-kV 4H-SiC VDMOSFET	5
Hybrid Multi-Graphene/Si Avalanche Transit Time <h-ATT> Terahertz Power Oscillator: Theoretical Reliability and Experimental Feasibility Studies	5
CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations	5

The Influence of N-Type Buried Layer on SCR ESD Protection Devices	5
Strain—Engineered Asymmetrical Si/Si1–xGex IR-Photo-Detector: Theoretical Reliability and Experimental Feasibility Studies	5
Single-Event Burnout Hardening 4H-SiC UMOSFET Structure	5
LED Reliability Assessment Using a Novel Monte Carlo-Based Algorithm	5
Workload-Aware Electromigration Analysis in Emerging Spintronic Memory Arrays	5
Impact of Self-Heating on Linearity Performance of In0.53Ga0.47As-Based Gate-All-Around MOSFETs	5
Optimization Techniques for Reliable Low Leakage GNRFET-Based 9T SRAM	5
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability	5
Optimization of Dual Field Plate AlGaN/GaN HEMTs Using Artificial Neural Networks and Particle Swarm Optimization Algorithm	5
Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs	5
On the Distribution of Single Defect Threshold Voltage Shifts in SiON Transistors	5
Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending	5
Probing the Atomic-Scale Mechanisms of Time-Dependent Dielectric Breakdown in Si/SiO2 MOSFETs (June 2022)	5
Electrochemical Migration of Immersion Silver Plated Printed Circuit Boards Contaminated by Dust Solution	4
Effect of Capped Cu Layer on Protrusion Behaviors of Through Silicon via Copper (TSV-Cu) Under Double Annealing Conditions: Comparative Study	4
High Precision IGBT Health Evaluation Method: Extreme Learning Machine Optimized by Improved Krill Herd Algorithm	4
Failure Analysis and Performance Improvement of Phase Change Memory Based on Ge2Sb2Te5	4
Electromigration Performance Improvement of Metal Heaters for Si Photonic Ring Modulators	4
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data	4
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via	4
Mechanisms of Step-Stress Degradation in Carbon-Doped 0.15-μm AlGaN/GaN HEMTs for Power RF Applications	4
Mechanism Analysis and Thermal Damage Prediction of High-Power Microwave Radiated CMOS Circuits	4
Probing Interface Trapping Characteristics of Au/β-Ga2O3 Schottky Barrier Diode on Si (100)	4
Low-Leakage and Variable V HOLD Power Clamp for Wide Stress Time Range From ESD to Surge Test	4
Irradiation-Induced Degradation of Surface Acoustic Wave Devices Fabricated on Bulk AlN	4
Research of Single-Event Burnout in 1.2-kV Rated CoolSiC Trench MOSFET	4
Negative-Bias Temperature Instability of p-GaN Gate GaN-on-Si Power Devices	4
Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs	4
Effects of Temperature and Bias Voltage on Electron Transport Properties in GaN High-Electron-Mobility Transistors	4
Reliability Characterization and Failure Prediction of 3D TLC SSDs in Large-Scale Storage Systems	4
Mono-Energetic Proton Induced Damages in SiC Power MOSFETs	4
Reliability and Characterization of Nanosilver Joints Prepared by a Time-Reduced Sintering Process	4
Categorization of PBTI Mechanisms on 4H-SiC MOSFETs by the Stress Gate Voltage and Channel Plane Orientation	4
Metallic Ratio Equivalent-Time Sampling and Application to TDC Linearity Calibration	4
Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology	4
Reflow Residues on Printed Circuit Board Assemblies and Interaction With Humidity	4
ESD Stress Effect on Failure Mechanisms in GaN-on-Si Power Device	4
Reliable Circuit Design Using a Fast Incremental-Based Gate Sizing Under Process Variation	4
Investigating 3D NAND Flash Read Disturb Reliability With Extreme Value Analysis	4
Low-Temperature Deuterium Annealing for the Recovery of Ionizing Radiation-Induced Damage in MOSFETs	3
Characterization and Analysis of Hot Carrier Degradation Under DC and Large-Signal RF Stress in a PDSOI Floating-Body NFET-Based Power Amplifier Cell Under WiFi Operating Conditions	3
Fundamentals of Circuit Failure Analysis Based on Optical Fault Isolation Techniques	3
BTI-Aware Timing Reliability Improvement of Pulsed Flip-Flops in Nano-Scale CMOS Technology	3
Systematic Reliability Evaluation of FPGA Implemented CNN Accelerators	3
Electron Beam Induced Degradation in Electrical Characteristics of Optocoupler	3
Measurements and Review of Failure Mechanisms and Reliability Constraints of 4H-SiC Power MOSFETs Under Short Circuit Events	3
Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5 nm Node Junctionless Multi-Nanowire FETs	3
Defect-Free and Annealing Influences in P3HT Organic Field-Effect Transistor Performance	3
Designing and Reliability Analysis of Radiation Hardened Stacked Gate Junctionless FinFET and CMOS Inverter	3
Development of Accelerated Life Testing Apparatus for Light-Emitting Diode Therapy	3
Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability	3
Impedance Investigation of MIFM Ferroelectric Tunnel Junction Using a Comprehensive Small-Signal Model	3
Immediate Read-After-Write Capability in p-Type Ferroelectric Field-Effect Transistors and Its Evolution With Fatigue Cycling	3
Mitigation Technique for Single Event Transient via Pulse Quenching	3
Exploiting Resistance Drift Characteristics to Improve Reliability of LDPC-Assisted Phase-Change Memory	3
Reliability Challenges in Advanced 3D Technologies: The Case of Through Silicon Vias and SiCN–SiCN Wafer-to-Wafer Hybrid-Bonding Technologies	3
Reliability Characterization of a Low-k Dielectric Using Magnetoresistance as a Diagnostic Tool	3
Effect of Crack Evolution on the Resistance and Current Density of the Al Metallization in the IGBT Module During Power Cycling	3
Correction Masking: A Technique to Implement Efficient SET Tolerant Error Correction Decoders	3
Combined Methodology for Accurate Evaluation of Distance and Direction of Chromaticity Shifts in LED Reliability Tests	3
Power Durability Enhancement and Failure Analysis of TC-SAW Filter With Ti/Cu/Ti/Cu/Ti Electrodes	3
A Comprehensive Study of Total Ionizing Dose Effect on the Electrical Performance of the GaN MIS-HEMT	3
A Nonvolatile Multilevel Data Storage Memory Based on Two-Dimensional Materials for Aerospace Applications	3
Reliability and Process Scalability of TiO2/Porous Silicon-Based Broadband Photodetectors	3
Plasma Charging Damage in HK-First and HK-Last RMG NMOS Devices	3
Time-Dependent Dielectric Breakdown in 45-nm PD-SOI N-Channel FETs at Cryogenic Temperatures for Quantum Computing Applications	3
Life Cycle Assessment of a Lead-Free Cesium Titanium (IV) Single and Mixed Halide Perovskite Solar Cell Based 1 m² PV Module	3
Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation	2
Simultaneous and Sequential Triggering in Multi-Finger Floating-Base SCRs Depending on TLP Pulse Rise Time	2
On-Chip Heater Design and Control Methodology for Reliability Testing Applications Requiring Over 300°C Local Temperatures	2
Transient Overshoot Voltages During VF-TLP Pulses for Bipolar Devices in the Presence of Lowly Doped Regions	2
A Novel Lifetime Estimation Method and Structural Optimization Design for Film Capacitors in EVs Considering Material Aging and Power Losses	2
Lateral and Vertical Gate Oxide Stacking Impact on Noise Margins and Delays for the 8T SRAM Designed With Source Pocket Engineered GaSb/Si Heterojunction Vertical TFET: A Reliability Study	2
A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking	2
A Thermal Circuit Representing Frequency Dependent Dynamic Heating Between Electron and Lattice in SOI-FinFET	2
Popcorning Failures in Polymer and MnO2 Tantalum Capacitors	2
SOI FinFET Design Optimization for Radiation Hardening and Performance Enhancement	2
Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs	2
Stress-Induced Transistor Degradation Studied by an Indentation Approach	2
A New SiC Quasi MOSFET for Ultra-Low Specific On-Resistance and Improved Reliability	2

4H-SiC Trench Gate Lateral MOSFET With Dual Source Trenches for Improved Performance and Reliability	2
Effect of Hydrogen Molecule Release on NBTI by Low-Temperature Pre-Treatment in P-Channel Power VDMOS Transistors	2
Thermal Effect on Carbon Nanotube Fiber High-Ampacity Conductors at High Frequencies	2
Simulation Study of Stress Effect on Performance and Design Methodology of Proposed Si/SiGe Integrated Bragg Grating Filter	2
Various Reliability Investigations of Low Temperature Polycrystalline Silicon Tunnel Field-Effect Thin-Film Transistor	2
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy	2
An Analytical Model of Read-Disturb Failure Time in a Post-Cycling Resistive Switching Memory	2
A Low-Area Overhead and Low-Delay Triple-Node-Upset Self-Recoverable Design Based on Stacked Transistors	2
Correlation of HCD and Percolation Paths in FinFETs: Study of RDF and MGG Impacts Through 3-D Particle-Based Simulation	2
Development of Diamond Device-Level Heat Spreader for the Advancement of GaN HEMT Power and RF Electronics	2
Power Cycling Modeling and Lifetime Evaluation of SiC Power MOSFET Module Using a Modified Physical Lifetime Model	2
SafeDE: A Low-Cost Hardware Solution to Enforce Diverse Redundancy in Multicores	2
Comprehensive Study on Trap-Induced Bias Instability via High-Pressure D 2 and N 2 Annealing	2
Analysis of Floating Limiting Rings Termination Under Repetitive Avalanche Current Stress for 4H-SiC JBS Rectifiers	2
Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs	2
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module	1
Micromechanical Adhesion Experiments and Simulation on Cu-Damascene Processed Test Devices	1
Comparative Analysis of PEDOT and ITO Under Thermal Bending and Cycling Stresses: Implications for Flexible Solar Cells	1
Effect of Dummy Gate Bias on Breakdown Voltage and Gate Charge of a Novel In0.53Ga0.47As/InP Trench-Gate Pentode Power Device	1
Strain Modulated Asymmetrical Si/SiGe Superlattice p+-i-n+ Switches for MMW Low-Loss Secure Communication Systems	1
Failure Mechanism and Predictive Modeling for Microbump Interconnects Drop Life Under Diverse Impact Angles in Advanced Packaging	1
Frequency Dependent Degradation and Failure of Flexible a-InGaZnO Thin-Film Transistors Under Dynamic Stretch Stress	1
Drain Extended MOS Body Region Engineering for Switching Reliability Under Unclamped Inductive Load Conditions	1
Eight-Level/Cell Storage by Tuning the Spatial Distribution of Dielectrics in a Tri-Layer ReRAM Cell: Electrical Characteristics and Reliability	1
An Improved Thermal Network Model of Press-Pack IGBT Modules Considering Contact Surface Damage	1
Investigation of Quantization Effects on RTS Due to Oxide Traps Induced by Channel Hot-Carrier-Stressing in pMOSFETs	1
Effect of Ambient on the Field Emission Induced-Damage in Dielectric-Less MEMS Capacitive Structures	1
Systematic Unsupervised Recycled Field-Programmable Gate Array Detection	1
Failure Mechanism of Aluminum Diffusion in Low-Voltage Trench MOSFET With High Cell Density	1
Unveiling Tmax Inside GaN HEMT Based X-Band Low-Noise Amplifier by Correlating Thermal Simulations and IR Thermographic Measurements	1
Total Ionizing Dose (TID) Impact on Basic Amplifier Stages	1
Investigation of the Long-Term Reliability of a Velostat-Based Flexible Pressure Sensor Array for 210 Days	1
New Total-Ionizing-Dose Resistant Data Storing Technique for NAND Flash Memory	1
Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors	1
Moisture Dependent Degradation Rate of Silicone in LED Optical Housing Material—Ab-Initio Modelling	1
ESR Modeling for Atmospheric Corrosion Behavior of Metallized Film Capacitors	1
Electro-Mechanical Properties of Molybdenum Thin Film on Polyethylene Terephthalate Subjected to Tensile Stress	1
Thermal Runaway in Thin Film PV: temperature profile modeling	1
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI	1
Single Pulse Charge Pumping Technique Improvement for Interface-States Profiling in the Channel of MOSFET Devices	1
Identification of Multiple Failure Mechanisms for Device Reliability Using Differential Evolution	1
PEAR: Unbalanced Inter-Page Errors Aware Read Scheme for Latency-Efficient 3-D NAND Flash	1
EXT-TAURUM P2T: An Extended Secure CAN-FD Architecture for Road Vehicles	1
Negative Bias Temperature Instability in Top-Gated Carbon Nanotube Thin Film Transistors With Y2O3 Gate Dielectric	1
Aging and Sintered Layer Defect Detection of Discrete MOSFETs Using Frequency Domain Reflectometry Associated With Parasitic Resistance	1
A Study of the Nonlinear Capacitance Variation in Inter Level Copper and Low-k Interconnect Structure	1
Optimization of 3-D IC Routing Based on Thermal Equalization Analysis	1
Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning	1
Integer Codes Correcting Single Errors and Detecting Burst Errors Within a Byte	1
Effect of Large Amplitude Thermal Cycles on Power Assemblies Based on Ceramic Heat Sink and Multilayer Pressureless Silver Sintering	1
Compact 3D Thermal Model for VLSI and ULSI Interconnect Network Reliability Verification	1
Characterization, Analysis, and Modeling of Long-Term RF Reliability and Degradation of SiGe HBTs for High Power Density Applications	1
Universal Dielectric Breakdown Modeling Under Off-State TDDB for Ultra-Scaled Device From 130nm to 28nm Nodes and Beyond	1
The Impact of Gold Plating Process for Bonding Pads on Interconnection Quality	1
LCHC-DFT: A Low-Cost High-Coverage Design-for-Testability Technique to Detect Hard-to-Detect Faults in STT-MRAMs in the Presence of Process Variations	1
Thermal Stress Impact on Electrical Conductivity and Microstructure of Thin Aluminum Films Deposited on Polyethylene Terephthalate Substrates	1
Destructive Testing for Reliability Analysis at High-Power Microwave in GaAs/InGaP Hetero-Junction Bipolar Transistor	1
Study on Lifetime Modeling of IGBT Modules Considering Electric Frequency Influence Mechanism	1
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators	1
Robustness of Pentacene:MoS2:ZnO Ternary Blend for Optoelectronic Devices	1
HEMT Inspired GaN Optical Waveguides: Analysis Under Thermal Stress and Prospects	1
A Comprehensive Evaluation of Time-Dependent Dielectric Breakdown of CuAl₂ on SiO₂ for Advanced Interconnect Application	1
High Sensitivity Temperature Measurements to Track and Compensate Aging Effects on CMOS Amplifiers	0
Editorial for December 2020	0
2021 IEEE EDS Early Career Award	0
IEEE Robert Bosch Micro and Nano Electro Mechanical Systems Award	0
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive	0
Utilizing Two Three-Transistor Structures for Designing Radiation Hardened Circuits	0
TechRxiv: Share Your Preprint Research with the World!	0
A Review: Breakdown Voltage Enhancement of GaN Semiconductors-Based High Electron Mobility Transistors	0
Call for Papers for a Special Issue of IEEE Journal of the Electron Devices Society on "Materials, processing and integration for neuromorphic devices and in-memory computing"	0
From Mega to nano: Beyond one Century of Vacuum Electronics	0
Characterization of LDO Induced Increment of SEE Sensitivity for 22-nm FDSOI SRAM	0
2021 IEEE EDS Early Career Award	0
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Characterization and Modeling of Hot Carrier Degradation Under Dynamic Operation Voltage	0
Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response	0
IEEE Transactions on Device and Materials Reliability Publication Information	0
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers	0
From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks	0
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Analysis of Multicrystalline Si Solar Cell Improvement Using Laser-Beam-Induced Current Technique	0
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "Semiconductor Device Modeling for Circuit and System Design	0
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In-Field Testing of Functionally-Possible Transition Faults With High Activation Frequencies	0
Call for papers: Special issue on Solid-State Image Sensors	0
2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22	0
Side-Channel Attack Resilient RHBD 12T SRAM Cell for Secure Nuclear Environment	0
Editorial Kudos to Our Reviewers	0
Member Get-A-Member (MGM) Program	0
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The Characteristics and Reliability With Channel Length Dependent on the Deposited Sequence of SiO₂ and Si₃N₄ as PV in LTPS TFTs	0
H2C-TM: A Hybrid High Coverage Test Method for Improving the Detection of HtD Faults in STT-MRAMs	0
A Consistent Analytical Method to Assess Reliability of Redundant Safety Instrumented Systems	0
IEEE Transactions on Device and Materials Reliability information for authors	0