IEEE Transactions on Device and Materials Reliability

Papers
(The H4-Index of IEEE Transactions on Device and Materials Reliability is 16. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-05-01 to 2025-05-01.)
ArticleCitations
[Front cover]48
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers40
IEEE Robert Bosch Micro and Nano Electro Mechanical Systems Award37
From Mega to nano: Beyond one Century of Vacuum Electronics26
CD-DFT: A Current-Difference Design-for-Testability to Detect Short Defects of STT-MRAM Under Process Variations25
A Modified Bypass Circuit for Improved Reliability of PV Module Validated With Real-Time Data22
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via22
Mission Profile-Based Hotspot Temperature and Lifespan Estimation of DC-Link Capacitors Used in Automotive Traction Inverters22
Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part I—Initial Characterization20
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module19
IEEE Transactions on Device and Materials Reliabilityinformation for authors18
Guidelines for the Design of Random Telegraph Noise-Based True Random Number Generators18
IEEE Transactions on Device and Materials Reliability Publication Information17
Device Screening Strategy for Suppressing Current Imbalance in Parallel-Connected SiC MOSFETs17
Machine Learning Approach for Prediction of Point Defect Effect in FinFET16
IEEE Transactions on Device and Materials Reliability Publication Information16
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