IEEE Transactions on Device and Materials Reliability

Papers
(The H4-Index of IEEE Transactions on Device and Materials Reliability is 14. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-02-01 to 2025-02-01.)
ArticleCitations
[Front cover]56
TechRxiv: Share Your Preprint Research with the World!37
Blank Page36
Qualitative and Quantitative Diagnostic Device for Detecting Defects in Crystalline Silicon PV Cells31
Special Issue on Semiconductor Design for Manufacturing (DFM)Joint Call for Papers24
Member Get-A-Member (MGM) Program23
IEEE Transactions on Device and Materials Reliability Publication Information20
Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy19
Impact of Interface Layer on Device Characteristics of Si:HfO2-Based FeFET’s18
Stress Analysis and Characterization of PECVD Oxide/Nitride Multi-Layered Films After Thermal Cycling18
Investigation of the Interaction Effect Between the Microstructure Evolution and the Thermo-Mechanical Behavior of Cu-Filled Through Silicon Via15
Improvement of Encapsulation Technique of Organic Photovoltaics by UV-Curable Adhesive15
Extracting Total Ionizing Dose Threshold Voltage Shifts From Ring Oscillator Circuit Response14
FEA-Dominant Reliability and Lifetime Model of Double-Sided Cooling SiC Power Module14
CMOS-Compatible Ex-Situ Incorporated Junctionless Enhancement-Mode Thin Polysilicon Film FET pH Sensor14
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