Microelectronics International

Papers
(The TQCC of Microelectronics International is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-05-01 to 2025-05-01.)
ArticleCitations
A failure location technology for SiP devices based on TDR nondestructive testing method11
The preparation of anisotropic conductive paste and its application in FOB interconnection6
Strengthening mechanisms of Cu/SACZ/Al micro-connection joints with solid-state bonding6
Design and implementation of miniaturized tri-band microwave bandpass filter5
Influence of selected factors on parameters of a cooling system with a Peltier module and forced air flow5
Atomic structure for AlN grown on different plane orientation of sapphire via numerical study5
Quasi-elliptic band pass filter using resonators based on coupling theory for ultra-wide band applications4
Real-time contact angle’s measurement of molten solder balls in laboratory conditions4
Computer‐aided selective production of low-resistance NiP and NiCuP layers4
Magnetic alignment technology for wafer bonding4
Improving displacement of silicon V-shaped electrothermal microactuator using platinum sputter deposition process4
Study of the electronic transport performance of ZnO-SiO2 film: the construction of grain boundary barrier4
Facile ligand-exchange strategy to promote low-temperature nano-sintering of oleylamine-capped Ag nanoparticles4
A modal analysis based optimal mounting support locations of a printed circuit board3
High-transconductance silicon carbide nanowire-based field-effect transistor (SiC-NWFET) for high-temperature applications3
Influence of Ag particle shape on mechanical and thermal properties of TIM joints3
3-pass and 5-pass laser grooving & die strength characterization for reinforced internal low-k 55nm node wafer structure via heat-treatment process3
Packaging design and thermal analysis for 1 mm2 high power VCSEL3
Influence of copper pillar bump structure on flip chip packaging during reflow soldering: a numerical approach3
Effects of V/III ratio of InGaN quantum well at high growth temperature for near ultraviolet light emitting diodes3
Improvement of c-axis (002) AlN crystal plane by temperature assisted HiPIMS technique3
Influence of different etching methods on the structural properties of porous silicon3
Effects of interface cracks on reliability of surface mount technology interconnection in service environment2
Guest editorial: Heterogeneous integration and chiplets interconnection2
Identification of printed circuit boards mechanical properties using response surface methods2
A chemosensitive-based ammonia gas sensor with PANI/PEO–ZnO nanofiber composites sensing layer2
Model of boron diffusion in silicon used for solar cell fabrication based on boric acid solutions2
Recent progress on bumpless Cu/SiO2 hybrid bonding for 3D heterogeneous integration2
W-band antenna in package module with hybrid glass-compound WLFO process2
Effects of three-step magnesium doping in p-GaN layer on the properties of InGaN-based light-emitting diode2
Experimental study on the fracture behavior variation of the Au stud bump bonding with different high temperature storage times2
Effect of reflow temperature and solder size on Cu-Ni cross-interaction in the Cu/Sn/Ni micro solder joints2
Surface quality prediction and lapping process optimisation on the fixed-abrasive lapping plate of sapphire wafers2
Retraction notice: Packaging design and thermal analysis for 1 mm2 high power VCSEL2
Extreme temperature thermal shock induced microstructure degradation and shear property deterioration of Sn3.0Ag0.5Cu/Cu solder joints2
Comparative study on solid-solid interfacial reaction and bonding property of Sn-Ag-Cu/Ni-P joints by laser and reflow soldering2
Fabrication of fluorine and silver co-doped ZnO photodetector using modified hydrothermal method2
Study on electronic transport performance of Ag-ZnO film by photoassisted conductive atomic force microscopy2
Radiation-hardened flip-flop for single event upset tolerance2
A monopole polarisation diversity antenna for high density packaging MIMO applications2
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