Journal of Electronic Testing-Theory and Applications

Papers
(The H4-Index of Journal of Electronic Testing-Theory and Applications is 10. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)
ArticleCitations
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function54
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm22
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach19
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission18
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits16
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive Analysis16
Artificial Neural Network Based Prediction Model for IR Drop Measurement in a VLSI Power Delivery Network12
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical Systems11
Design and Verification of an Asynchronous NoC Router Architecture for GALS Systems11
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing10
Wafer-level Adaptive Testing Based on Dual-Predictor Collaborative Decision10
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