Journal of Electronic Testing-Theory and Applications

Papers
(The H4-Index of Journal of Electronic Testing-Theory and Applications is 10. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-11-01 to 2025-11-01.)
ArticleCitations
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function36
Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission16
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm15
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement12
On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits12
Design and Simulation of a Dependable Architecture Using Triple Modular Redundancy for Embedded Cyber-Physical Systems12
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach12
Artificial Neural Network Based Prediction Model for IR Drop Measurement in a VLSI Power Delivery Network12
Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive Analysis12
Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations11
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