IEEE Electron Device Letters

Papers
(The H4-Index of IEEE Electron Device Letters is 40. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-05-01 to 2025-05-01.)
ArticleCitations
Table of Contents160
Editorial 2020 Electron Devices Society George E. Smith Award130
IEEE Electron Device Letters information for authors129
Blank Page122
EDS Meetings Calendar84
Front Cover78
Hot Carrier Degradation Reduction in Metal Oxide Thin-Film Transistors by Implementing a Lightly Doped Drain-Like Structure66
RFIC 2023 Call for Papers65
Blank Page64
Table of Contents60
Fabrication of Bilayer Stacked Antiferroelectric/ Ferroelectric HfxZr1-xO2 FeRAM and FeFET With Improved Leakage Current and Robust Reliability by Modifying Atomic Lay58
Hot Carrier Degradation Accompanied by Recovery in InSnZnO Thin-Film Transistors56
High-Voltage β-Ga2O3 RF MOSFETs With a Shallowly-Implanted 2DEG-Like Channel55
Choice of Metal as Gate Electrode of Thin-Film Transistor With High-k Gate Dielectric55
High-Mobility Amorphous InGaZnO Thin-Film Transistors With Nitrogen Introduced via Low-Temperature Annealing54
Small-Area Perovskite Photodiodes With High Detectivity and Stability54
Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias53
Low-Cost, Printed Memristor Using Indigo and a Dispersion of Colloidal Graphite Deposited by Spray Coating52
A Voltage-Controlled Gain Cell Magnetic Memory50
First Experiment of a 600-GHz CW Gyrotron Developed as Light Source for EMF Exposure Assessment48
High-Efficiency Metal-Insulator-Metal Electron Emitter Based on Porous Alumina Film47
0.18 dB Low-Noise Figure at 10 GHz for GaN MIS-HEMT With Plasma-Enhanced Atomic Layer Deposition SiN Layer47
Modulation of Ciss of a 4H-SiC Planar MOSFET With a Shorter Sidewall and a Thicker Gate46
A Novel Insulated Gate Trigger Thyristor Integrated With Gate Transient Voltage Suppressor for Ultrahigh di/dt Pulse Switching46
Toward the Measurement of Microwave Electric Field Using Cesium Vapor MEMS Cell45
Guar Gum-WTe2 Nanohybrid-Based Biomemristor Synapse With Short- and Long-Term Plasticity45
Asymmetric Interference Behavior in 3D NAND Cell and the Reverse Trend Induced by Undercut of Sacrificial Nitride Film44
Conductive Bridging Random Access Memory-Based Switch Matrix for Reconfigurable Interconnection of Chiplet Integration43
Effective Mitigation of Persistent Photoconductivity in AlGaN Solar-Blind Field-Effect Phototransistors via In-Situ SiNx Passivation43
Design and Experimental Research of a Compact Ku-Band Triaxial Klystron Amplifier With Low Seed Injection Power43
Highly-Sensitive, Flexible, and Self-Powered UV Photodetectors Based on Perovskites Cs₃Cu₂I₅/ PEDOT: PSS Heterostructure43
Triple-Node FinFET With Non-Ohmic Schottky Junctions for Synaptic Devices43
The Nanoscale Electrical Damage Mechanism of Ge₂Sb₂Te₅ Phase-Change Films Discovered by Conductive Atomic Force Microscopy43
Investigation Between Recover Behavior and Defect With Variation of Light Source in AlGaN/GaN HEMTs After Hot-Carrier Stress42
Rapid On-Wafer Quality Screening of AlGaN/GaN Superlattice Castellated Field Effect Transistors Using Short-Term Stress and Electroluminescence41
Thermal Process and Dopant Diffusion Model of a-InGaZnO TFTs for VT Prediction Using Lateral Carrier Density Profiling Technique40
Organic-Inorganic Hybrid Integrated Optical Waveguide Gain Compensator Based on CsPbBr3 Perovskite Nanocrystals40
High-Performance Short-Channel Top-Gate Indium-Tin-Oxide Transistors by Optimized Gate Dielectric40
Influence of Annealing Temperature on ZrO2 Nanoparticles for Improved Photodetection40
High-Reliability HfO2/ZrO2 Superlattice Ferroelectric Poly-Si FinFET Memory Device Utilizing Green Laser Crystallization40
Flexible Organic Optoelectronic Devices for Neuromorphic Computing40
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