IEEE Electron Device Letters

Papers
(The H4-Index of IEEE Electron Device Letters is 40. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-11-01 to 2025-11-01.)
ArticleCitations
Blank Page150
Table of Contents95
Table of Contents77
IEEE Electron Device Letters Publication Information72
Table of Contents67
Hot Carrier Degradation Reduction in Metal Oxide Thin-Film Transistors by Implementing a Lightly Doped Drain-Like Structure63
Front Cover63
Blank Page62
Choice of Metal as Gate Electrode of Thin-Film Transistor With High-k Gate Dielectric60
Plasma Processes for Vertical Niobium Nitride Superconducting Through Silicon Vias58
First Experiment of a 600-GHz CW Gyrotron Developed as Light Source for EMF Exposure Assessment57
0.18 dB Low-Noise Figure at 10 GHz for GaN MIS-HEMT With Plasma-Enhanced Atomic Layer Deposition SiN Layer54
High-Efficiency Metal-Insulator-Metal Electron Emitter Based on Porous Alumina Film54
Modulation of Ciss of a 4H-SiC Planar MOSFET With a Shorter Sidewall and a Thicker Gate54
Conductive Bridging Random Access Memory-Based Switch Matrix for Reconfigurable Interconnection of Chiplet Integration53
Triple-Node FinFET With Non-Ohmic Schottky Junctions for Synaptic Devices53
A Novel Non-Volatile Optoelectronic Memory: The Photon-Triggered FGMOS52
Ultrathin Interfacial Layer and Pre-Gate Annealing to Suppress Virtual Gate Formation in GaN-Based Transistors: The Impact of Trapping and Fluorine Inclusion52
Changes to the Editorial Board52
Highly Sensitive Mutual-Capacitive Fingerprint Sensor With Reference Electrode52
Rapid On-Wafer Quality Screening of AlGaN/GaN Superlattice Castellated Field Effect Transistors Using Short-Term Stress and Electroluminescence52
Au- and Ag-Containing Contacts to GaSb-Photovoltaic Converters51
3D Van der Pauw Device for MOS Channel Characterization on 4H-SiC Trench Sidewalls51
RFIC 2023 Call for Papers49
Self-Curable Synaptor With Tri-Node Charge- Trap FinFET for Semi-Supervised Learning49
Table of Contents48
EDS Meetings Calendar47
Blank Page46
IEEE Electron Device Letters Information for Authors46
IEEE Electron Device Letters information for authors46
Front Cover45
High-Performance SAW Device Based on Zinc-Oxide Substrate With Electric Field Regulating Graphene Film Conductivity for Signal Amplifier44
IEEE Electron Device Letters Information for Authors43
Table of Contents42
Exploration of the exciting world of multifunctional oxide-based electronic devices: from material to system-level applications42
EDS Meetings Calendar41
Beneficial Hydrogen Doping in Single Spinel Phase Crystallized IZTO Thin-Film Transistors41
A Novel Insulated Gate Trigger Thyristor Integrated With Gate Transient Voltage Suppressor for Ultrahigh di/dt Pulse Switching41
GaN Optopairs With Asymmetric Spiral Patterns for High-Resolution 360° Angle Detection41
La In Situ Doping-Engineered HZO Capacitors Achieving High- k (~56.2) and Ferroelectricity (2Pr~43.4 μ C/cm2) at 1.5 MV/Cm With 1010 Cycles Endurance40
Short-Length, High-Efficiency S-Band Coaxial Cavity Relativistic Multibeam Klystron Amplifier for Potential High Power Microwave Application40
A Compact Model of Amorphous InGaZnO TFTs to Predict Temperature-Dependent Characteristics40
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