Ultramicroscopy

Article	Citations
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	39
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	39
Editorial Board	36
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	34
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	32
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	28
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	25
On central focusing for contrast optimization in direct electron ptychography of thick samples	23
espm: A Python library for the simulation of STEM-EDXS datasets	23
Development of precession Lorentz transmission electron microscopy	23
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	23
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	22
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	21
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	21
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	21
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	20
Editorial Board	18
Calibration-sample free distortion correction of electron diffraction patterns using deep learning	18
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy	18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	17
Edge-induced excitations in Bi2	17
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	16
Perimeter procedure to produce average equivalent area grain size	16
Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiation	16
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	16

FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data	16
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Multimode objective lens for momentum microscopy and XPEEM: Theory	15
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	15
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy	15
Atomic-scale observation of vacancy ordering in magnetite nanoparticles	14
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Weld-free mounting of lamellae for electrical biasing operando TEM	14
Gun energy filter for a low energy electron microscope	14
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	13
On the Edge: In situ Kelvin probe AFM on InP nanowire arrays	13
Accurate magnification determination for cryoEM using gold	12
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Editorial Board	12
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	12
Editorial Board	12
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	12
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	12
Editorial Board	12
Exploring deep learning models for 4D-STEM-DPC data processing	12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	12
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	11
Theoretical study on sixth-order geometrical aberration correction	11
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	11
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	11
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	11
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	11
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	11
Data synchronization in operando gas and heating TEM	11
STEM in an SEM: Towards High-Throughput Imaging and Analysis of Metal Nanoclusters	11
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	11
Development of a 100 MHz scan controller for the electron microscope	10
Reflection imaging with a helium zone plate microscope	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	10
Phase offset method of ptychographic contrast reversal correction	10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	10
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxide	10
Editorial Board	10

Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	10
Temporal coherence envelope function of field emission in electron microscopy	10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Data-driven control in atomic force microscopy using a genetic algorithm	10
Differential phase contrast STEM image calculation software – Magnifier	10
Electron ptychography dose reduction using Moiré sampling on periodic structures	10
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	9
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography	9
Accurate and fast localization of EBSD pattern centers for screen moving technology	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygen	9
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	9
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	9
Reaction-diffusion study of electron-beam-induced contamination growth	9
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems	9
In multi electron beam systems, “Neighbours Matter”	9
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
Open gas-cell transmission electron microscopy at 0.5 Å information limit	8
Editorial Board	8
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEM	8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Interfacial excess of solutes across phase boundaries using atom probe microscopy	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Editorial Board	8
Fast tapping mode atomic force microscopy based on fuzzy PI controller	8
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	8
Workflow automation of SEM acquisitions and feature tracking	8
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error	8
Signal detection and imaging methods for MEMS electron microscope	8
Editorial Board	8
Real-time electron clustering in an event-driven hybrid pixel detector	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	7
An electrostatic aberration corrector for improved Low-Voltage SEM imaging	7
Editorial Board	7
New Poisson denoising method for pulse-count STEM imaging	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	7
Process optimization of broad ion beam milling for preparation of coating cross-sections	7
A method for estimating magnetic field of TEM objective lens	7
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	7
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	7
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Splicing dual-range EELS spectra: Identifying and correcting artefacts	6
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	6
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	6
Editorial Board	6
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	6
Editorial Board	6
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
Editorial Board	6
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	6
Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy	6
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloy	6
Calibrating cryogenic temperature of TEM specimens using EELS	6
Automated atomic site determination by four-dimensional scanning transmission electron microscopy data analytics	6
GHz sample excitation at the ALBA-PEEM	6
Editorial Board	6
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data	6
Prediction of the morphology of nano particles based solely on atom counting data	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Room-temperature focused ion beam preparation of sensitive organic-inorganic hybrid perovskites	6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	6
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	6
Maximizing the notional area in single tip field emitters	6
Extracting transverse electron mean free paths in graphene at low energy	6
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	6
ETDMS: Efficient two-stage diffusion model for accelerated SEM image super-resolution	6
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	6
Editorial Board	6
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N	6

Interpretability of high-resolution transmission electron microscopy images

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