OOIR: Observatory of International Research

Papers

(The TQCC of Ultramicroscopy is 7. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)

Article	Citations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	40
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	36
Editorial Board	29
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	27
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	27
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	26
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	25
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	25
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	25
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	24
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	23
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	23
espm: A Python library for the simulation of STEM-EDXS datasets	21
On central focusing for contrast optimization in direct electron ptychography of thick samples	21
Editorial Board	20
Development of precession Lorentz transmission electron microscopy	20
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy	19
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	18
FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data	18
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy	18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	18
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	17
Gun energy filter for a low energy electron microscope	17
Perimeter procedure to produce average equivalent area grain size	16
Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiation	16

Calibration-sample free distortion correction of electron diffraction patterns using deep learning	16
Multimode objective lens for momentum microscopy and XPEEM: Theory	16
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	16
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Optimized L1-norm smoothing gradient improves electron tomography’s tilt series alignment with both localized and virtual fiducial markers	15
Edge-induced excitations in Bi2	15
A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques in SEM	15
Navigating the unavoidable: Enhancing the EBSD indexability through adaptation to three hurdles in femtosecond laser ablation	15
Component substitution and multiresolution analysis on hyperspectral microwave microscopy data sets	14
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	14
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	14
Contamination analysis of the residual gas composition in transmission electron microscopy	14
Weld-free mounting of lamellae for electrical biasing operando TEM	14
Atomic-scale observation of vacancy ordering in magnetite nanoparticles	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	13
Editorial Board	13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
On the Edge: In situ Kelvin probe AFM on InP nanowire arrays	13
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	13
Editorial Board	13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	13
Accurate magnification determination for cryoEM using gold	13
Editorial Board	13
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	13
Exploring deep learning models for 4D-STEM-DPC data processing	13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	13
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	12
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	12
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	12
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	12
Minimization of spherical aberration for a magnetic lens with the aid of calculus of variations	12
Data synchronization in operando gas and heating TEM	12
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	12
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	11
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	11
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	11
STEM in an SEM: Towards high-throughput imaging and analysis of metal nanoclusters	11
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	11
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	11
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxide	10
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	10
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	10
Data-driven control in atomic force microscopy using a genetic algorithm	10
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	10
Development of a 100 MHz scan controller for the electron microscope	10

Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Differential phase contrast STEM image calculation software – Magnifier	10
Electron ptychography dose reduction using Moiré sampling on periodic structures	10
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	10
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	10
Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography	10
Reflection imaging with a helium zone plate microscope	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems	10
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygen	10
Optimizing laboratory X-ray diffraction contrast tomography: Effects of detector binning	10
Theoretical study on sixth-order geometrical aberration correction	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10
Temporal coherence envelope function of field emission in electron microscopy	10
Accurate and fast localization of EBSD pattern centers for screen moving technology	9
Semicircular-aperture illumination scanning transmission electron microscopy	9
Interfacial excess of solutes across phase boundaries using atom probe microscopy	9
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	9
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography	9
Minimizing off-axis aberrations in multi-beam electron optical systems: An analytical approach	9
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error	9
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	9
Open gas-cell transmission electron microscopy at 0.5 Å information limit	9
In multi electron beam systems, “Neighbours Matter”	9
Phase offset method of ptychographic contrast reversal correction	9
Signal detection and imaging methods for MEMS electron microscope	9
Reaction-diffusion study of electron-beam-induced contamination growth	9
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Deep PACBED: Multitask analysis of PACBED images using deep neural networks	9
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Editorial Board	8
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	8
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	8
Ω-type jitter-free static magnetic compressor for sub-50-fs 200-keV electron pulses	8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
Editorial Board	8
Real-time electron clustering in an event-driven hybrid pixel detector	8
Fast tapping mode atomic force microscopy based on fuzzy PI controller	8
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	8
Workflow automation of SEM acquisitions and feature tracking	8
A method for estimating magnetic field of TEM objective lens	8
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEM	8
Elastic and inelastic interactions of electrons in transmission electron microscopy	8
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	7
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	7
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloy	7
Interpretability of high-resolution transmission electron microscopy images	7
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	7
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	7
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	7
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	7
New Poisson denoising method for pulse-count STEM imaging	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Editorial Board	7
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	7
Prediction of the morphology of nano particles based solely on atom counting data	7
Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy	7
Splicing dual-range EELS spectra: Identifying and correcting artefacts	7
An electrostatic aberration corrector for improved Low-Voltage SEM imaging	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Process optimization of broad ion beam milling for preparation of coating cross-sections	7