OOIR: Observatory of International Research

Papers

(The TQCC of Ultramicroscopy is 5. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-05-01 to 2025-05-01.)

Article	Citations
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	58
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	39
On central focusing for contrast optimization in direct electron ptychography of thick samples	34
espm: A Python library for the simulation of STEM-EDXS datasets	30
Editorial Board	29
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	26
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	22
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	22
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	21
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	21
In search of best automated model: Explaining nanoparticle TEM image segmentation	20
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	20
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	19
Gun energy filter for a low energy electron microscope	18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	18
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	18
L-shell ionization of Cd: Structure of the x-ray emission spectrum	17
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	17
Editorial Board	16
Weld-free mounting of lamellae for electrical biasing operando TEM	16
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	16
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Editorial Board	15
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	15
Perimeter procedure to produce average equivalent area grain size	14

Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	13
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	13
A sorter for electrons based on magnetic elements	13
Edge-induced excitations in Bi2	13
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	13
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	12
Editorial Board	12
Standardizing resolution definition in scanning helium microscopy	12
Accurate magnification determination for cryoEM using gold	12
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	12
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	12
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	12
Editorial Board	11
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	11
Editorial Board	11
Exploring deep learning models for 4D-STEM-DPC data processing	11
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view	11
Editorial Board	11
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	11
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	10
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	10
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	10
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	10
Editorial Board	10
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	10
Evaluation of electron radiation damage to green fluorescent protein	10
Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM	10
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	10
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	10
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	9
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	9
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	9
Angular dynamics of small nanoparticles induced by non-vortex electron beams	9
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy	9
Data synchronization in operando gas and heating TEM	9
Gold nanoparticles and tilt pairs to assess protein flexibility by cryo-electron microscopy	9
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	9
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	8
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy	8
Temporal coherence envelope function of field emission in electron microscopy	8
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation	8
Editorial Board	8
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	8
Editorial Board	8
Theoretical study on sixth-order geometrical aberration correction	8
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	8
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	8

Reflection imaging with a helium zone plate microscope	8
Dose measurement in the TEM and STEM	8
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	8
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	8
Manganese Migration in Li1-xMn2O4 Cathode Materials	8
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	8
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	8
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy	7
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	7
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	7
In multi electron beam systems, “Neighbours Matter”	7
High-precision atomic-scale strain mapping of nanoparticles from STEM images	7
Phase offset method of ptychographic contrast reversal correction	7
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	7
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	7
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy	7
Accurate and fast localization of EBSD pattern centers for screen moving technology	7
Differential phase contrast STEM image calculation software – Magnifier	7
Numerical simulations of field emission characteristics of open CNT	7
Electron ptychography dose reduction using Moiré sampling on periodic structures	7
Reaction-diffusion study of electron-beam-induced contamination growth	7
Accuracy and precision of position determination in ISTEM imaging of BaTiO	7
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	7
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Editorial Board	6
A method for estimating magnetic field of TEM objective lens	6
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	6
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	6
Workflow automation of SEM acquisitions and feature tracking	6
Semicircular-aperture illumination scanning transmission electron microscopy	6
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	6
Editorial Board	6
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	6
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	6
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	6
Interfacial excess of solutes across phase boundaries using atom probe microscopy	6
Editorial Board	6
In my Good Books	6
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	6
Real-time electron clustering in an event-driven hybrid pixel detector	6
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	6
Editorial Board	6
Computer vision AC-STEM automated image analysis for 2D nanopore applications	6
Coherent and incoherent imaging of biological specimens with electrons and X-rays	6
Signal detection and imaging methods for MEMS electron microscope	6
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	6
Directly correlated microscopy of trench defects in InGaN quantum wells	6
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	5
Editorial Board	5
Process optimization of broad ion beam milling for preparation of coating cross-sections	5
A versatile sample fabrication method for ultrafast electron diffraction	5
Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography	5
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	5
A method for a column-by-column EELS quantification of barium lanthanum ferrate	5
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	5
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	5
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	5
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	5
Voltage modulation efficiency in scanning capacitance microscopy	5
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	5
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	5
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	5
Symmetry of diffraction patterns of two-dimensional crystal structures	5
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	5
New Poisson denoising method for pulse-count STEM imaging	5
Editorial Board	5
Editorial Board	5
Interpretability of high-resolution transmission electron microscopy images	5
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	5