Ultramicroscopy

Papers
(The TQCC of Ultramicroscopy is 5. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-07-01 to 2024-07-01.)
ArticleCitations
Hybrid pixel direct detector for electron energy loss spectroscopy62
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision41
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures37
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications36
Contrast transfer and noise considerations in focused-probe electron ptychography30
Automated Detection of Helium Bubbles in Irradiated X-75026
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V26
Dose measurement in the TEM and STEM23
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings23
Spectral DQE of the Volta phase plate22
Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)21
Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimens21
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law21
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges20
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition20
Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem19
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition19
Sub-pixel electron detection using a convolutional neural network19
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM18
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets18
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection18
Micrograph contrast in low-voltage SEM and cryo-SEM18
Lattice resolution of vibrational modes in the electron microscope17
FIB/SEM tomography segmentation by optical flow estimation17
Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession17
Exploring the accuracy of isotopic analyses in atom probe mass spectrometry17
Orientation mapping of graphene using 4D STEM-in-SEM16
Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction16
An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB16
Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement16
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio15
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope15
Quantitative electric field mapping of a p–n junction by DPC STEM15
Atom column detection from simultaneously acquired ABF and ADF STEM images15
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy15
Correction of artefacts associated with large area EBSD15
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope14
Integrated correction of optical distortions for global HR-EBSD techniques14
Wavelength-multiplexed single-shot ptychography14
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography14
Event-based hyperspectral EELS: towards nanosecond temporal resolution14
Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images14
Dissecting complex nanoparticle heterostructures via multimodal data fusion with aberration-corrected STEM spectroscopy14
EBSD pattern simulations for an interaction volume containing lattice defects14
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser14
High-quality reconstruction of coherent modulation imaging using weak cascade modulators13
A simple method to clean ligand contamination on TEM grids13
TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps13
Achieving diffraction-limited resolution in soft-X-ray Fourier-transform holography13
In search of best automated model: Explaining nanoparticle TEM image segmentation13
Auto-segmentation technique for SEM images using machine learning: Asphaltene deposition case study12
Integrated super resolution fluorescence microscopy and transmission electron microscopy12
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM12
ab initio description of bonding for transmission electron microscopy12
Charting the low-loss region in electron energy loss spectroscopy with machine learning12
Modulator refinement algorithm for coherent modulation imaging12
TEM bright field imaging of thick specimens: nodes in Thon ring patterns12
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy11
Mapping valence electron distributions with multipole density formalism using 4D-STEM11
On the reduction in the effects of radiation damage to two-dimensional crystals of organic and biological molecules at liquid-helium temperature11
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions11
Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopy11
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods11
High resolution atomic scale characterization of dislocations in high entropy alloys: Critical assessment of template matching and geometric phase analysis11
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon11
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports11
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling11
On 2D-FTIR-XRF microscopy – A step forward correlative tissue studies by infrared and hard X-ray radiation11
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomography10
Precise measurement of the electron beam current in a TEM10
Autofocus of whole slide imaging based on convolution and recurrent neural networks10
Directly correlated microscopy of trench defects in InGaN quantum wells10
Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processing10
Evaluation of different rectangular scan strategies for STEM imaging10
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS10
Dimensionality reduction and unsupervised clustering for EELS-SI10
A versatile sample fabrication method for ultrafast electron diffraction10
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM10
Alignment of electron optical beam shaping elements using a convolutional neural network10
Defocus-dependent Thon-ring fading10
Accurate EELS background subtraction – an adaptable method in MATLAB9
Beam shaping and probe characterization in the scanning electron microscope9
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations9
Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures9
A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope9
Experimental realization of a π/2 vortex mode converter for electron9
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics9
Off-axis electron holography of Néel-type skyrmions in multilayers of heavy metals and ferromagnets9
Transmission imaging on a scintillator in a scanning electron microscope9
Neutral helium atom microscopy9
Quantification of reagent mixing in liquid flow cells for Liquid Phase-TEM9
Support vector machine for EELS oxidation state determination8
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy8
Using local GND density to study SCC initiation8
STEM electron beam-induced current measurements of organic-inorganic perovskite solar cells8
Laser ablation sample preparation for atom probe tomography and transmission electron microscopy8
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactions8
The behavior of Fowler-Nordheim plot from carbon nanotubes-based large area field emitters arrays8
The studies on wet chemical etching via in situ liquid cell TEM8
Atom probe tomography quantification of carbon in silicon8
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection8
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells8
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons7
Three dimensional cluster analysis for atom probe tomography using Ripley’s K-function and machine learning7
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si7
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope7
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet7
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures7
3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods7
Correlation symmetry analysis of electron nanodiffraction from amorphous materials7
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM7
Quantum theory of magnon excitation by high energy electron beams7
Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy Networks7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope7
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy7
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation7
The importance of temporal and spatial incoherence in quantitative interpretation of 4D-STEM7
Theoretical modeling and simulation-based assessment of graded-bandgap AlGaAs/GaAs electron-injection cathode7
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures7
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials7
Influence of experimental conditions on localized surface plasmon resonances measurement by electron energy loss spectroscopy7
Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films6
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy6
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN6
Nanowire facilitated transfer of sensitive TEM samples in a FIB6
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential6
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio6
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns6
A new sample preparation protocol for SEM and TEM particulate matter analysis6
Phase contrast imaging with inelastically scattered electrons from any layer of a thick specimen6
Exploring valence states of abnormal mineral deposits in biological tissues using correlative microscopy and spectroscopy techniques: A case study on ferritin and iron deposits from Alzheimer’s diseas6
Low terahertz-band scanning near-field microscope with 155-nm resolution6
Computer vision AC-STEM automated image analysis for 2D nanopore applications6
Identification and correction of temporal and spatial distortions in scanning transmission electron microscopy6
Structure-preserving Gaussian denoising of FIB-SEM volumes6
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms6
Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolution6
Investigation of gas-electron interactions with electron holography6
Contrast modes in a 3D ion transmission approach at keV energies6
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System6
Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning6
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)6
Line-rotated remapping for high-resolution electron backscatter diffraction6
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector6
Flat electron mirror6
Standard deviation of microscopy images used as indicator for growth stages5
Dynamic compressed sensing for real-time tomographic reconstruction5
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs5
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope5
Multi-exposure microscopic image fusion-based detail enhancement algorithm5
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data5
High-precision atomic-scale strain mapping of nanoparticles from STEM images5
Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a Pd77.5Cu6Si16.5 Metallic Glass Thin Film5
Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides5
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques5
Characterising the performance of an ultrawide field-of-view 3D atom probe5
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy5
Secondary electron count imaging in SEM5
Properties of blade-like field emitters5
Comparative of machine learning classification strategies for electron energy loss spectroscopy: Support vector machines and artificial neural networks5
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope5
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels5
FANM: A software for focus and aberrations of nuclear microprobe5
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy5
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy5
Aberration corrected spin polarized low energy electron microscope5
The differential phase contrast uncertainty relation: Connection between electron dose and field resolution5
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations5
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution5
Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)5
3D reconstruction of curvilinear structures with stereo matching deep convolutional neural networks5
AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM5
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy5
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope5
Approximant-based orientation determination of quasicrystals using electron backscatter diffraction5
Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plate5
Displacement separation analysis from atomic-resolution images5
Coherent and incoherent imaging of biological specimens with electrons and X-rays5
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS5
Advancing analytical electron microscopy methodologies to characterise microstructural features in superalloys5
Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel5
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM5
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning5
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale5
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