OOIR: Observatory of International Research

Papers

(The TQCC of Ultramicroscopy is 5. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-04-01 to 2025-04-01.)

Article	Citations
Reaction-diffusion study of electron-beam-induced contamination growth	57
Semicircular-aperture illumination scanning transmission electron microscopy	37
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	32
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	28
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	27
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning	26
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	21
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	21
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	20
Editorial Board	19
Accurate and fast localization of EBSD pattern centers for screen moving technology	19
Tuneable in-situ nanoCT workflow using FIB/SEM	18
Editorial Board	17
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	17
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	16
Editorial Board	16
Editorial Board	16
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	15
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force	15
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	15
Atomic layer deposited Al2O3 as a protective overlayer for focused ion beam preparation of plan-view STEM samples	14
Editorial Board	14
Editorial Board	14
Optimization of imaging conditions for composition determination by annular dark field STEM	13
Correction of artefacts associated with large area EBSD	13

Directly correlated microscopy of trench defects in InGaN quantum wells	13
Analysis and improvement of positioning reliability and accuracy of theta pipette configuration for scanning ion conductance microscopy	13
In my Good Books	13
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	12
Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments	12
A precision dimple grinder-polisher produced by 3D printing	12
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN	12
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	12
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	12
Four-dimensional electron energy-loss spectroscopy	12
A reference-area-free strain mapping method using precession electron diffraction data	11
Computer vision AC-STEM automated image analysis for 2D nanopore applications	11
Breaking the 10 nm barrier using molecular ions in nuclear microprobes	11
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	11
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	11
Signal detection and imaging methods for MEMS electron microscope	11
Application of electron tomography for comprehensive determination of III-V interface properties	11
Investigating the effects of solution viscosity on the stability and success rate of SECCM imaging	11
Low energy electron microscopy at cryogenic temperatures	11
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	10
Momentum transfer resolved electron correlation microscopy	10
Aberration calculation of microlens array using differential algebraic method	10
Focused ion beam milling and MicroED structure determination of metal-organic framework crystals	10
Quantitative atomic cross section analysis by 4D-STEM and EELS	10
The target region focused imaging method for scanning ion conductance microscopy	10
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	10
Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials	10
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	9
Workflow automation of SEM acquisitions and feature tracking	9
Interfacial excess of solutes across phase boundaries using atom probe microscopy	9
State-of-the-art electron beams for compact tools of ultrafast science	9
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	9
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	9
Field Assisted Reactive Gas Etching of Multiple Tips Observed using FIM	9
Computer-readable Image Markers for Automated Registration in Correlative Microscopy – “autoCRIM”	8
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	8
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	8
A new TCAD simulation method for direct CMOS electron detectors optimization	8
Reprint of: Automated geometric aberration correction for large-angle illumination STEM	8
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels	8
Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopy	8
Probing the interaction range of electron beam-induced etching in STEM by a non-contact electron beam	8
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	8
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography	8
Dimensionality reduction and unsupervised clustering for EELS-SI	8
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	8
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	7

In search of best automated model: Explaining nanoparticle TEM image segmentation	7
On central focusing for contrast optimization in direct electron ptychography of thick samples	7
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	7
Multi-exposure microscopic image fusion-based detail enhancement algorithm	7
Coherent and incoherent imaging of biological specimens with electrons and X-rays	7
Measuring scattering distributions in scanning helium microscopy	7
Elastic strain mapping of plastically deformed materials by TEM	7
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	7
espm: A Python library for the simulation of STEM-EDXS datasets	7
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser	7
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	7
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	7
Editorial Board	6
Portable low-cost and highly accurate programmable triggering controller for confocal spinning disk image scanning microscope	6
Editorial Board	6
Perimeter procedure to produce average equivalent area grain size	6
Editorial Board	6
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions	6
Morphology measurements by AFM tapping without causing surface damage: A phase shift characterization	6
The effect of post-acquisition data misalignments on the performance of STEM tomography	6
Editorial Board	6
A brief peek at the cyclotron in our microscope	6
Preparation and stability of the hexagonal phase of samarium oxide on Ru(0001)	6
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	6
Editorial Board	6
Edge-induced excitations in Bi2	6
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)	6
Editorial Board	6
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	6
Extraction of acceptor concentration map from EBIC experiments	6
Editorial Board	6
Application of Murphy – Good Plot Parameters Extraction Method on Electron Emission from Carbon Fibers	6
2D imaging spin-filter for NanoESCA based on Au/Ir(001) or Fe(001)-p(1×1)O	6
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	6
Editorial Board	6
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced	5
Effect of specimen processing for transmission electron microscopy on lattice spacing variation in Si specimens	5
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon	5
Weld-free mounting of lamellae for electrical biasing operando TEM	5
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	5
A novel ground-potential monochromator design	5
Data-driven dynamics-based optimal filtering of acoustic noise at arbitrary location in atomic force microscope imaging	5
A sorter for electrons based on magnetic elements	5
L-shell ionization of Cd: Structure of the x-ray emission spectrum	5
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions	5
A Fast Frozen Phonon Algorithm Using Mixed Static Potentials	5
Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys	5
Editorial Board	5
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy	5
Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography	5
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	5
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs	5
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	5
Principles of electron wave front modulation with two miniature electron mirrors	5
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	5
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials	5
Sampling theory perspective on tomographic tilt increment schemes	5
Electron crystallography of chiral and non-chiral small molecules	5
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice	5