OOIR: Observatory of International Research

Papers

(The TQCC of Ultramicroscopy is 7. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-01-01 to 2026-01-01.)

Article	Citations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	80
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	48
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	35
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	35
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	30
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	27
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	26
Editorial Board	26
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	24
espm: A Python library for the simulation of STEM-EDXS datasets	24
On central focusing for contrast optimization in direct electron ptychography of thick samples	23
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	21
In search of best automated model: Explaining nanoparticle TEM image segmentation	20
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	20
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	19
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	19
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	19
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	19
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	19
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	19
Editorial Board	18
Multimode objective lens for momentum microscopy and XPEEM: Theory	18
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	17
Perimeter procedure to produce average equivalent area grain size	17
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	17

Weld-free mounting of lamellae for electrical biasing operando TEM	17
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	17
L-shell ionization of Cd: Structure of the x-ray emission spectrum	16
Gun energy filter for a low energy electron microscope	16
Edge-induced excitations in Bi2	16
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy	16
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	14
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	14
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	14
Standardizing resolution definition in scanning helium microscopy	13
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Accurate magnification determination for cryoEM using gold	13
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	13
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	13
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	13
Exploring deep learning models for 4D-STEM-DPC data processing	13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
Editorial Board	12
Editorial Board	12
Editorial Board	12
Editorial Board	12
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	12
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	11
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	11
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
Data synchronization in operando gas and heating TEM	11
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	11
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	11
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	11
Reflection imaging with a helium zone plate microscope	11
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	11
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	11
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	11
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	11
Temporal coherence envelope function of field emission in electron microscopy	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	10
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	10
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	10
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy	10
Theoretical study on sixth-order geometrical aberration correction	10
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	10
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10

Data-driven control in atomic force microscopy using a genetic algorithm	10
In multi electron beam systems, “Neighbours Matter”	9
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	9
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	9
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	9
Differential phase contrast STEM image calculation software – Magnifier	9
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxide	9
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	9
Editorial Board	9
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	9
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	9
Phase offset method of ptychographic contrast reversal correction	9
Electron ptychography dose reduction using Moiré sampling on periodic structures	9
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	8
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygen	8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
In my Good Books	8
Workflow automation of SEM acquisitions and feature tracking	8
High-precision atomic-scale strain mapping of nanoparticles from STEM images	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
Signal detection and imaging methods for MEMS electron microscope	8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Accurate and fast localization of EBSD pattern centers for screen moving technology	8
Reaction-diffusion study of electron-beam-induced contamination growth	8
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography	8
Interfacial excess of solutes across phase boundaries using atom probe microscopy	8
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEM	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	7
Editorial Board	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	7
Real-time electron clustering in an event-driven hybrid pixel detector	7
Editorial Board	7
Editorial Board	7
A method for a column-by-column EELS quantification of barium lanthanum ferrate	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	7
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	7
A method for estimating magnetic field of TEM objective lens	7
New Poisson denoising method for pulse-count STEM imaging	7
Editorial Board	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	7
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	7
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	7