Ultramicroscopy

Papers
(The TQCC of Ultramicroscopy is 6. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-11-01 to 2025-11-01.)
ArticleCitations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps76
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?47
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy33
In search of best automated model: Explaining nanoparticle TEM image segmentation33
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles33
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source28
On central focusing for contrast optimization in direct electron ptychography of thick samples26
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model26
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM25
Editorial Board24
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide24
espm: A Python library for the simulation of STEM-EDXS datasets24
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping22
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]21
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures19
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)19
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns19
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy18
Editorial Board18
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope18
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation18
Perimeter procedure to produce average equivalent area grain size18
A sorter for electrons based on magnetic elements17
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism17
Multimode objective lens for momentum microscopy and XPEEM: Theory17
L-shell ionization of Cd: Structure of the x-ray emission spectrum16
Editorial Board16
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects16
Gun energy filter for a low energy electron microscope16
Weld-free mounting of lamellae for electrical biasing operando TEM16
Edge-induced excitations in Bi215
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy15
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM15
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography15
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy14
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching14
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM13
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy13
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization13
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography12
Resonant scattering in low energy electron diffraction: Bi/Ni(111)12
Exploring deep learning models for 4D-STEM-DPC data processing12
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images12
Accurate magnification determination for cryoEM using gold12
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra12
Editorial Board12
Standardizing resolution definition in scanning helium microscopy12
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials11
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein11
Editorial Board11
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes11
Data synchronization in operando gas and heating TEM11
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques11
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)11
Editorial Board11
Editorial Board11
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector11
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space10
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography10
Reflection imaging with a helium zone plate microscope10
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials10
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms10
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes10
Theoretical study on sixth-order geometrical aberration correction10
Temporal coherence envelope function of field emission in electron microscopy10
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope10
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy10
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy10
Differential phase contrast STEM image calculation software – Magnifier9
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors9
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning9
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy9
Numerical simulations of field emission characteristics of open CNT9
In multi electron beam systems, “Neighbours Matter”9
Electron ptychography dose reduction using Moiré sampling on periodic structures9
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling9
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder9
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy9
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system9
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential9
Phase offset method of ptychographic contrast reversal correction9
Editorial Board9
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning9
Data-driven control in atomic force microscopy using a genetic algorithm9
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV9
High-precision atomic-scale strain mapping of nanoparticles from STEM images9
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope9
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy8
Reaction-diffusion study of electron-beam-induced contamination growth8
Accurate and fast localization of EBSD pattern centers for screen moving technology8
Directly correlated microscopy of trench defects in InGaN quantum wells8
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy8
Workflow automation of SEM acquisitions and feature tracking8
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy8
Computer vision AC-STEM automated image analysis for 2D nanopore applications8
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 808
Semicircular-aperture illumination scanning transmission electron microscopy8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy8
Signal detection and imaging methods for MEMS electron microscope8
In my Good Books8
Interfacial excess of solutes across phase boundaries using atom probe microscopy7
Real-time electron clustering in an event-driven hybrid pixel detector7
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases7
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection7
Editorial Board7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography7
Editorial Board7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy7
Editorial Board7
Coherent and incoherent imaging of biological specimens with electrons and X-rays7
Editorial Board7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network7
A method for a column-by-column EELS quantification of barium lanthanum ferrate7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients7
A method for estimating magnetic field of TEM objective lens7
Editorial Board7
Process optimization of broad ion beam milling for preparation of coating cross-sections6
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities6
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope6
Editorial Board6
Atom probe specimen preparation methods for nanoparticles6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy6
Prediction of the morphology of nano particles based solely on atom counting data6
New Poisson denoising method for pulse-count STEM imaging6
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials6
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection6
Splicing dual-range EELS spectra: Identifying and correcting artefacts6
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS6
Editorial Board6
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition6
Interpretability of high-resolution transmission electron microscopy images6
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data6
Spectrum imaging measurements with semi-parallel detection using an AES apparatus6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra6
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N6
A versatile sample fabrication method for ultrafast electron diffraction6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM6
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces6
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