Ultramicroscopy

Article	Citations
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	39
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	39
Editorial Board	36
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	34
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	32
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	28
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	25
espm: A Python library for the simulation of STEM-EDXS datasets	23
Development of precession Lorentz transmission electron microscopy	23
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	23
On central focusing for contrast optimization in direct electron ptychography of thick samples	23
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	22
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	21
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	21
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	21
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	20
Editorial Board	18
Calibration-sample free distortion correction of electron diffraction patterns using deep learning	18
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy	18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	17
Edge-induced excitations in Bi2	17
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	16
Perimeter procedure to produce average equivalent area grain size	16
Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiation	16
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	16

FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data	16
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Multimode objective lens for momentum microscopy and XPEEM: Theory	15
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	15
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy	15
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Weld-free mounting of lamellae for electrical biasing operando TEM	14
Gun energy filter for a low energy electron microscope	14
Atomic-scale observation of vacancy ordering in magnetite nanoparticles	14
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	14
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	13
On the Edge: In situ Kelvin probe AFM on InP nanowire arrays	13
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	13
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Editorial Board	12
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	12
Editorial Board	12
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	12
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	12
Editorial Board	12
Exploring deep learning models for 4D-STEM-DPC data processing	12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	12
Accurate magnification determination for cryoEM using gold	12
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	12
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	11
Theoretical study on sixth-order geometrical aberration correction	11
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	11
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	11
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	11
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	11
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	11
Data synchronization in operando gas and heating TEM	11
STEM in an SEM: Towards High-Throughput Imaging and Analysis of Metal Nanoclusters	11
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	11
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	11
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	10
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxide	10
Editorial Board	10
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	10
Temporal coherence envelope function of field emission in electron microscopy	10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Data-driven control in atomic force microscopy using a genetic algorithm	10
Differential phase contrast STEM image calculation software – Magnifier	10

Electron ptychography dose reduction using Moiré sampling on periodic structures	10
Development of a 100 MHz scan controller for the electron microscope	10
Reflection imaging with a helium zone plate microscope	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	10
Phase offset method of ptychographic contrast reversal correction	10
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	9
Accurate and fast localization of EBSD pattern centers for screen moving technology	9
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	9
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography	9
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	9
Reaction-diffusion study of electron-beam-induced contamination growth	9
In multi electron beam systems, “Neighbours Matter”	9
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygen	9
Workflow automation of SEM acquisitions and feature tracking	8
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error	8
Signal detection and imaging methods for MEMS electron microscope	8
Editorial Board	8
Real-time electron clustering in an event-driven hybrid pixel detector	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
Open gas-cell transmission electron microscopy at 0.5 Å information limit	8
Editorial Board	8
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEM	8
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Interfacial excess of solutes across phase boundaries using atom probe microscopy	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Editorial Board	8
Fast tapping mode atomic force microscopy based on fuzzy PI controller	8
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	8
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	7
An electrostatic aberration corrector for improved Low-Voltage SEM imaging	7
Editorial Board	7
New Poisson denoising method for pulse-count STEM imaging	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	7
Process optimization of broad ion beam milling for preparation of coating cross-sections	7
A method for estimating magnetic field of TEM objective lens	7
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	7
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	7
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	7
Maximizing the notional area in single tip field emitters	6
Extracting transverse electron mean free paths in graphene at low energy	6
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	6
ETDMS: Efficient two-stage diffusion model for accelerated SEM image super-resolution	6
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	6
Editorial Board	6
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N	6
Interpretability of high-resolution transmission electron microscopy images	6
Splicing dual-range EELS spectra: Identifying and correcting artefacts	6
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	6
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	6
Editorial Board	6
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	6
Editorial Board	6
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
Editorial Board	6
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	6
Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy	6
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloy	6
Calibrating cryogenic temperature of TEM specimens using EELS	6
Automated atomic site determination by four-dimensional scanning transmission electron microscopy data analytics	6
GHz sample excitation at the ALBA-PEEM	6
Editorial Board	6
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data	6
Prediction of the morphology of nano particles based solely on atom counting data	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Room-temperature focused ion beam preparation of sensitive organic-inorganic hybrid perovskites	6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	6

Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	6
A brief peek at the cyclotron in our microscope	5
Compact design, construction, and evaluation of an in situ ±90° rotatable magnetic force microscope in a 12 T superconducting magnet	5
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	5
A spatial-spectral feature fusion attention residual network for automated bacterial classification via atomic force microscopy	5
Imaging domain boundaries of rubrene thin crystallites by photoemission electron microscopy	5
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study	5
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	5
First step toward complex observations by 4D-STEM with phase plate	5
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation	5
Impact of electron beam propagation on high-resolution quantitative chemical analysis of 1-nm-wide GaN/AlGaN quantum wells	5
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	5
Electron backscattering coefficient, material contrast and response function of BSE- detectors in scanning electron microscopy	5
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	5
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	5
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models	5
Chromatic aberration (Cc) corrected cryo-EM: The structure of pseudorabies virus (PRV) using both zero-loss and energy loss electrons	5
A Fourier-optical approach for segmentation of ion microprobe images into tissue and non-tissue covered areas	5
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	5
EstimateNoiseSEM: A novel framework for deep learning based noise estimation of scanning electron microscopy images	5
SEM characterization technique for air-sensitive all-solid-state lithium battery materials	5
Femtosecond-laser-assisted focused ion beam method for the fabrication of tip specimens for atom probe tomography	5
Editorial Board	5
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	5
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	5
A high-performance reconstruction method for partially coherent ptychography	5
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)	5
Towards atom counting from first moment STEM images: Methodology and possibilities	5
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing	5
Editorial Board	5
High-resolution scanning tunneling microscope and its adaptation for local thermopower measurements in 2D materials	4
Isolated scan unit and scanning tunneling microscope for stable imaging in ultra-high magnetic fields	4
Convexity constraints on linear background models for electron energy-loss spectra	4
Editorial Board	4
Image based evaluation of textured 3DSEM models	4
Chemical and cryo-collection of muscle samples for transmission electron microscopy using Methacarn and dimethyl sulfoxide✰	4
Influence of experimental conditions on apparent AFM tip-surface contact in air	4
Electron-beam-induced charging of an Al	4
Simulation study of the performance of neural network-enhanced PACBED for characterizing atomic-scale deformations in 2D van der Waals materials	4
Point field emission electron source with a magnetically focused electron beam	4
Substrate matters: Coupled phonon modes of a spherical particle on a substrate probed with EELS	4
Removal of silicon-containing contaminants from TEM specimens	4
Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy	4
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	4
Visualization of molecular stacking using low-energy electron microscopy	4
Differences between differential phase contrast and electron holographic measurements of a GaN p-n junction	4
Fifth-order asymptotic geometric aberrations of electron lenses	4
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles	4
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries	4
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	4
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	4
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	4
Negative stain TEM imaging of native spider silk protein superstructures	4
Evaluation of electron threshold energy for predicting radiation damage in transmission electron microscopy	4
Back illuminated photo emission electron microscopy (BIPEEM)	4
Improving the low-dose performance of aberration correction in single sideband ptychography	4
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers	4
Optimizing experimental parameters of integrated differential phase contrast (iDPC) for atomic resolution imaging	4
Mode-dependent phonon relaxation in time-resolved electron diffraction pattern simulations	4
Exploration of atom probe tomography at sub-10K	4
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	4
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	4
Anisotropic redistribution of coherently de-channelled electrons around dislocations in gallium nitride revealed by 4D Scanning Transmission Electron Microscopy	4
Exploring the potential of simultaneous resonance in multi-frequency atomic force microscopy	4
Design and simulation of ellipsoidal single-bounce mono-capillary condensers for a laboratory X-Ray nano-imaging system	4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	4
Strain visualization using large-angle convergent-beam electron diffraction	4
Evaporated amorphous Si protective coatings for dual FIB/SEM preparation of high-quality lamellae for S/TEM analysis	3
Neural field enhanced phase retrieval of atomic-scale structural dynamics in radiation sensitive materials	3
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 K	3
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	3
Neutral helium atom microscopy	3
Secondary electron topographical contrast formation in scanning transmission electron microscopy	3
Editorial Board	3
TEM-EDS microanalysis: Comparison between different electron sources, accelerating voltages and detection systems	3
Large-angle convergent-beam electron diffraction patterns via conditional generative adversarial networks	3
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	3
Ghostbuster: A phase retrieval diffraction tomography algorithm for cryo-EM	3
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	3
Reliable phase quantification in focused probe electron ptychography of thin materials	3
Preface to the Proceedings of the Thirteenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM 13)	3
On the impulse approximation in electron Compton scattering	3
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)	3
Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructions	3
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	3
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force	3
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	3
High-Resolution EELS in an aberration-corrected LEEM: Design of electrostatic transfer lenses for hemispherical filters	3
High-speed multiparametric imaging through off-resonance tapping AFM with active probe	3
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity	3
Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology	3
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learning	3
Enhancing atomic force microscopy stability through second harmonic optical fibre cavity control	3