Ultramicroscopy

Article	Citations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	76
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	47
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	33
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	33
In search of best automated model: Explaining nanoparticle TEM image segmentation	33
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	28
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	26
On central focusing for contrast optimization in direct electron ptychography of thick samples	26
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	25
espm: A Python library for the simulation of STEM-EDXS datasets	24
Editorial Board	24
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	24
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	22
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	21
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	19
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	19
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	19
Perimeter procedure to produce average equivalent area grain size	18
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	18
Editorial Board	18
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	18
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	18
Multimode objective lens for momentum microscopy and XPEEM: Theory	17
A sorter for electrons based on magnetic elements	17
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	17

L-shell ionization of Cd: Structure of the x-ray emission spectrum	16
Editorial Board	16
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	16
Gun energy filter for a low energy electron microscope	16
Weld-free mounting of lamellae for electrical biasing operando TEM	16
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	15
Edge-induced excitations in Bi2	15
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	15
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	15
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	14
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	14
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	13
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	13
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	13
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	12
Editorial Board	12
Standardizing resolution definition in scanning helium microscopy	12
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	12
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	12
Exploring deep learning models for 4D-STEM-DPC data processing	12
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	12
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	12
Accurate magnification determination for cryoEM using gold	12
Editorial Board	11
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	11
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	11
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	11
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	11
Editorial Board	11
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	11
Data synchronization in operando gas and heating TEM	11
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	11
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	11
Editorial Board	11
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy	10
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy	10
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	10
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	10
Reflection imaging with a helium zone plate microscope	10
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	10
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	10
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	10
Theoretical study on sixth-order geometrical aberration correction	10

Temporal coherence envelope function of field emission in electron microscopy	10
Data-driven control in atomic force microscopy using a genetic algorithm	9
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	9
Electron ptychography dose reduction using Moiré sampling on periodic structures	9
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	9
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	9
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	9
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy	9
Numerical simulations of field emission characteristics of open CNT	9
In multi electron beam systems, “Neighbours Matter”	9
Editorial Board	9
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	9
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	9
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	9
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	9
Phase offset method of ptychographic contrast reversal correction	9
Differential phase contrast STEM image calculation software – Magnifier	9
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	9
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	8
Reaction-diffusion study of electron-beam-induced contamination growth	8
Accurate and fast localization of EBSD pattern centers for screen moving technology	8
Directly correlated microscopy of trench defects in InGaN quantum wells	8
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	8
Workflow automation of SEM acquisitions and feature tracking	8
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
Computer vision AC-STEM automated image analysis for 2D nanopore applications	8
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	8
Semicircular-aperture illumination scanning transmission electron microscopy	8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
Signal detection and imaging methods for MEMS electron microscope	8
In my Good Books	8
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	7
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Editorial Board	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Editorial Board	7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	7
Editorial Board	7
Coherent and incoherent imaging of biological specimens with electrons and X-rays	7
Editorial Board	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
A method for a column-by-column EELS quantification of barium lanthanum ferrate	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	7
A method for estimating magnetic field of TEM objective lens	7
Editorial Board	7
Interfacial excess of solutes across phase boundaries using atom probe microscopy	7
Real-time electron clustering in an event-driven hybrid pixel detector	7
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	7
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	7
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	6
Editorial Board	6
Atom probe specimen preparation methods for nanoparticles	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
Prediction of the morphology of nano particles based solely on atom counting data	6
New Poisson denoising method for pulse-count STEM imaging	6
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	6
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	6
Splicing dual-range EELS spectra: Identifying and correcting artefacts	6
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS	6
Editorial Board	6
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	6
Interpretability of high-resolution transmission electron microscopy images	6
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	6
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N	6
A versatile sample fabrication method for ultrafast electron diffraction	6
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	6
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	6
Process optimization of broad ion beam milling for preparation of coating cross-sections	6
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	6
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	6

First step toward complex observations by 4D-STEM with phase plate	5
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	5
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models	5
GHz sample excitation at the ALBA-PEEM	5
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation	5
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	5
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	5
EstimateNoiseSEM: A novel framework for deep learning based noise estimation of scanning electron microscopy images	5
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study	5
A high-performance reconstruction method for partially coherent ptychography	5
Extracting transverse electron mean free paths in graphene at low energy	5
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing	5
Editorial Board	5
Editorial Board	5
Editorial Board	5
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications	5
Editorial Board	5
Towards atom counting from first moment STEM images: Methodology and possibilities	5
Maximizing the notional area in single tip field emitters	5
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	5
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	5
Calibrating cryogenic temperature of TEM specimens using EELS	5
A precision manual grinding tool for sample preparation	5
Detecting minute amounts of nitrogen in GaNAs thin films using STEM and CBED	5
Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation	5
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	5
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)	5
Chromatic aberration (Cc) corrected cryo-EM: The structure of pseudorabies virus (PRV) using both zero-loss and energy loss electrons	5
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	5
Editorial Board	4
Strain visualization using large-angle convergent-beam electron diffraction	4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	4
Properties of blade-like field emitters	4
Dimensionality reduction and unsupervised clustering for EELS-SI	4
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	4
SEM characterization technique for air-sensitive all-solid-state lithium battery materials	4
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	4
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	4
Improving the low-dose performance of aberration correction in single sideband ptychography	4
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	4
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	4
Negative stain TEM imaging of native spider silk protein superstructures	4
Isolated scan unit and scanning tunneling microscope for stable imaging in ultra-high magnetic fields	4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	4
Removal of silicon-containing contaminants from TEM specimens	4
Point field emission electron source with a magnetically focused electron beam	4
Image based evaluation of textured 3DSEM models	4
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	4
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	4
Impact of electron beam propagation on high-resolution quantitative chemical analysis of 1-nm-wide GaN/AlGaN quantum wells	4
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	4
Influence of experimental conditions on apparent AFM tip-surface contact in air	4
Convexity constraints on linear background models for electron energy-loss spectra	4
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries	4
A brief peek at the cyclotron in our microscope	4
Electron-beam-induced charging of an Al2	4
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	4
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	4
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	4
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles	4
Electron backscattering coefficient, material contrast and response function of BSE- detectors in scanning electron microscopy	4
Visualization of molecular stacking using low-energy electron microscopy	4
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	4
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	4
Back illuminated photo emission electron microscopy (BIPEEM)	4
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	4
Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy	4
Exploration of atom probe tomography at sub-10K	4
Differences between differential phase contrast and electron holographic measurements of a GaN p-n junction	4
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	4
Fifth-order asymptotic geometric aberrations of electron lenses	4
Compact design, construction, and evaluation of an in situ ±90° rotatable magnetic force microscope in a 12 T superconducting magnet	4
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	4
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?	3
TEM-EDS microanalysis: Comparison between different electron sources, accelerating voltages and detection systems	3
Large-angle convergent-beam electron diffraction patterns via conditional generative adversarial networks	3
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions	3
Editorial Board	3
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells	3
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	3
Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography	3
Using non-parametric statistical testing to quantify solute clustering in atom probe reconstructions	3
Morphology measurements by AFM tapping without causing surface damage: A phase shift characterization	3
Neutral helium atom microscopy	3
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	3
Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force	3
Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopy	3
On the impulse approximation in electron Compton scattering	3
Elastic strain mapping of plastically deformed materials by TEM	3
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	3
Fast reconstruction of scanning transmission electron microscopy images using Markov random field model	3
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	3
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	3
Preface to the Proceedings of the Thirteenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM 13)	3