Ultramicroscopy

Article	Citations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps	40
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	36
Editorial Board	29
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	27
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	27
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	26
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	25
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?	25
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	25
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	24
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	23
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source	23
On central focusing for contrast optimization in direct electron ptychography of thick samples	21
espm: A Python library for the simulation of STEM-EDXS datasets	21
Development of precession Lorentz transmission electron microscopy	20
Editorial Board	20
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy	19
FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data	18
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy	18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	18
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	18
Gun energy filter for a low energy electron microscope	17
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	17
Dose constraints for high-resolution imaging of biological specimens with extreme ultraviolet and soft X-ray radiation	16
Calibration-sample free distortion correction of electron diffraction patterns using deep learning	16

Multimode objective lens for momentum microscopy and XPEEM: Theory	16
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	16
Perimeter procedure to produce average equivalent area grain size	16
Edge-induced excitations in Bi2	15
A single multi-configuration direct electron detector for various electron imaging and diffraction-based techniques in SEM	15
Navigating the unavoidable: Enhancing the EBSD indexability through adaptation to three hurdles in femtosecond laser ablation	15
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Optimized L1-norm smoothing gradient improves electron tomography’s tilt series alignment with both localized and virtual fiducial markers	15
Atomic-scale observation of vacancy ordering in magnetite nanoparticles	14
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	14
Component substitution and multiresolution analysis on hyperspectral microwave microscopy data sets	14
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	14
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	14
Contamination analysis of the residual gas composition in transmission electron microscopy	14
Weld-free mounting of lamellae for electrical biasing operando TEM	14
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	13
Accurate magnification determination for cryoEM using gold	13
Editorial Board	13
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	13
Exploring deep learning models for 4D-STEM-DPC data processing	13
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	13
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	13
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	13
Editorial Board	13
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	13
On the Edge: In situ Kelvin probe AFM on InP nanowire arrays	13
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	13
Editorial Board	13
Resonant scattering in low energy electron diffraction: Bi/Ni(111)	12
Minimization of spherical aberration for a magnetic lens with the aid of calculus of variations	12
Data synchronization in operando gas and heating TEM	12
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	12
Ultrastructure of antennal sensilla of Anastatus orientalis (Hymenoptera: Eupelmidae), an egg parasitoid of the invasive spotted lanternfly, Lycorma delicatula (Hemiptera: Fulgoridae)	12
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	12
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	12
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materials	12
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	11
STEM in an SEM: Towards high-throughput imaging and analysis of metal nanoclusters	11
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	11
A new EBSD indexing method with enhanced grain boundary indexing performance using a three-dimensional parameter space	11
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	11
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	11
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	11
Guided progressive reconstructive imaging: A new quantization-based framework for low-dose, high-throughput and real-time analytical ptychography	10
Reflection imaging with a helium zone plate microscope	10
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	10
A calculation approach for the virtual source spatial distribution of sub-beams in single-emitter multi-electron-beam systems	10
Growth and oxidation of ultra-thin Pt-Sn layers on Pt(111) by molecular and atomic oxygen	10
Simulation-based super-resolution EBSD for measurements of relative deformation gradient tensors	10

Optimizing laboratory X-ray diffraction contrast tomography: Effects of detector binning	10
Theoretical study on sixth-order geometrical aberration correction	10
High-precision atomic imaging using an innovative vibration-isolated scanning tunneling microscope	10
Temporal coherence envelope function of field emission in electron microscopy	10
Laser-induced electron beam emission from titanium dioxide on silicon photocathodes treated with cesium and barium oxide	10
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	10
Breakdown and polarization contrasts in ferroelectric devices observed by operando laser-based photoemission electron microscopy with the AC/DC electrical characterization system	10
Data-driven control in atomic force microscopy using a genetic algorithm	10
CNT-PVP field electron source formed by thermo-mechanical pulling of carbon nanotubes	10
Development of a 100 MHz scan controller for the electron microscope	10
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	10
Differential phase contrast STEM image calculation software – Magnifier	10
Electron ptychography dose reduction using Moiré sampling on periodic structures	10
Multiscale characterization of nanomechanical behavior and dislocation mechanisms in Cantor CrMnFeCoNi HEA using 3D EBSD and atomistic modeling	10
Fabrication and characterization of boron-terminated tetravacancies in monolayer hBN using STEM, EELS and electron ptychography	9
Minimizing off-axis aberrations in multi-beam electron optical systems: An analytical approach	9
Single photon emitters in hBN: Limitations of atomic resolution imaging and potential sources of error	9
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	9
Open gas-cell transmission electron microscopy at 0.5 Å information limit	9
In multi electron beam systems, “Neighbours Matter”	9
Phase offset method of ptychographic contrast reversal correction	9
Signal detection and imaging methods for MEMS electron microscope	9
Reaction-diffusion study of electron-beam-induced contamination growth	9
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	9
High-precision atomic-scale strain mapping of nanoparticles from STEM images	9
Deep PACBED: Multitask analysis of PACBED images using deep neural networks	9
Accurate and fast localization of EBSD pattern centers for screen moving technology	9
Semicircular-aperture illumination scanning transmission electron microscopy	9
Interfacial excess of solutes across phase boundaries using atom probe microscopy	9
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	9
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	8
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	8
Ω-type jitter-free static magnetic compressor for sub-50-fs 200-keV electron pulses	8
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	8
Editorial Board	8
Real-time electron clustering in an event-driven hybrid pixel detector	8
Fast tapping mode atomic force microscopy based on fuzzy PI controller	8
Cryogen-free low-temperature photoemission electron microscopy for high-resolution nondestructive imaging of electronic phases	8
Workflow automation of SEM acquisitions and feature tracking	8
A method for estimating magnetic field of TEM objective lens	8
Studying the effect of EDAI passivation on surface defects in triple cation mixed halide perovskite with PEEM	8
Elastic and inelastic interactions of electrons in transmission electron microscopy	8
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	8
Editorial Board	8
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	7
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	7
Quantitative comparison of long-range electric field measurements using off-axis electron holography and 4D-STEM via differential phase contrast	7
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	7
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	7
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	7
New Poisson denoising method for pulse-count STEM imaging	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	7
Emittance minimization for aberration correction I: Aberration correction of an electron microscope without knowing the aberration coefficients	7
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	7
Editorial Board	7
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	7
Prediction of the morphology of nano particles based solely on atom counting data	7
Composition fluctuations at interfaces in Mg-Al-Ca alloys revealed by quantitative three-dimensional X-ray energy dispersive spectroscopy	7
Splicing dual-range EELS spectra: Identifying and correcting artefacts	7
An electrostatic aberration corrector for improved Low-Voltage SEM imaging	7
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	7
Process optimization of broad ion beam milling for preparation of coating cross-sections	7
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	7
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	7
Workflows for multimodal electron tomography using EELS and EDX and their application to a spinodally decomposed CuNiFe alloy	7
Interpretability of high-resolution transmission electron microscopy images	7
Calibrating cryogenic temperature of TEM specimens using EELS	6
Editorial Board	6
Editorial Board	6
Improving the elemental and imaging accuracy in atom probe tomography of (Ti,Si)N single and multilayer coatings using isotopic substitution of N	6
Editorial Board	6
Editorial Board	6
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	6
Extracting transverse electron mean free paths in graphene at low energy	6
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	6
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	6
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	6
Exploring 4D-STEM in SEM with an event-driven direct electron detector: Low-dose, high-speed, and sparse data	6
Predictive drift compensation of multi-frame STEM via live scan modification	6
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	6

GHz sample excitation at the ALBA-PEEM	6
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	6
ETDMS: Efficient two-stage diffusion model for accelerated SEM image super-resolution	6
Room-temperature focused ion beam preparation of sensitive organic-inorganic hybrid perovskites	6
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	6
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	6
Editorial Board	6
Automated atomic site determination by four-dimensional scanning transmission electron microscopy data analytics	6
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)	5
Electron backscattering coefficient, material contrast and response function of BSE- detectors in scanning electron microscopy	5
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	5
A spatial-spectral feature fusion attention residual network for automated bacterial classification via atomic force microscopy	5
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models	5
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	5
Femtosecond-laser-assisted focused ion beam method for the fabrication of tip specimens for atom probe tomography	5
Chromatic aberration (Cc) corrected cryo-EM: The structure of pseudorabies virus (PRV) using both zero-loss and energy loss electrons	5
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation	5
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing	5
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	5
A Fourier-optical approach for segmentation of ion microprobe images into tissue and non-tissue covered areas	5
Imaging domain boundaries of rubrene thin crystallites by photoemission electron microscopy	5
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	5
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	5
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	5
First step toward complex observations by 4D-STEM with phase plate	5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	5
EstimateNoiseSEM: A novel framework for deep learning based noise estimation of scanning electron microscopy images	5
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study	5
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	5
A high-performance reconstruction method for partially coherent ptychography	5
Editorial Board	5
Maximizing the notional area in single tip field emitters	5
Impact of electron beam propagation on high-resolution quantitative chemical analysis of 1-nm-wide GaN/AlGaN quantum wells	5
Towards atom counting from first moment STEM images: Methodology and possibilities	5
Fifth-order asymptotic geometric aberrations of electron lenses	4
Substrate matters: Coupled phonon modes of a spherical particle on a substrate probed with EELS	4
New universal technique for plan-view FIB preparation with no additional equipment or manual manipulations	4
A brief peek at the cyclotron in our microscope	4
Removal of silicon-containing contaminants from TEM specimens	4
Detective quantum efficiency of the Timepix4 hybrid pixel detector and its application to parallel-beam diffraction	4
Exploration of atom probe tomography at sub-10K	4
Preparation method for in situ tensile testing in transmission electron microscopy based on push-to-pull chip	4
Comparing sub-gap and above-gap pulsed radiation sources for measuring oxygen concentration in MgO using atom probe tomography	4
Mode-dependent phonon relaxation in time-resolved electron diffraction pattern simulations	4
Simulation study of the performance of neural network-enhanced PACBED for characterizing atomic-scale deformations in 2D van der Waals materials	4
Chemical and cryo-collection of muscle samples for transmission electron microscopy using Methacarn and dimethyl sulfoxide✰	4
Point field emission electron source with a magnetically focused electron beam	4
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	4
Improving the low-dose performance of aberration correction in single sideband ptychography	4
Editorial Board	4
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles	4
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	4
Compact design, construction, and evaluation of an in situ ±90° rotatable magnetic force microscope in a 12 T superconducting magnet	4
Influence of experimental conditions on apparent AFM tip-surface contact in air	4
SEM characterization technique for air-sensitive all-solid-state lithium battery materials	4
Editorial Board	4
Optimizing experimental parameters of integrated differential phase contrast (iDPC) for atomic resolution imaging	4
Back illuminated photo emission electron microscopy (BIPEEM)	4
Visualization of molecular stacking using low-energy electron microscopy	4
Exploring the potential of simultaneous resonance in multi-frequency atomic force microscopy	4
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	4
Strain visualization using large-angle convergent-beam electron diffraction	4
Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy	4
Image based evaluation of textured 3DSEM models	4
Isolated scan unit and scanning tunneling microscope for stable imaging in ultra-high magnetic fields	4
Convexity constraints on linear background models for electron energy-loss spectra	4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	4
Evaluation of electron threshold energy for predicting radiation damage in transmission electron microscopy	4
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	4
Design and simulation of ellipsoidal single-bounce mono-capillary condensers for a laboratory X-Ray nano-imaging system	4
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	4
Electron-beam-induced charging of an Al	4
Noise estimation and suppression in quantitative EMCD measurements	4
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	4
Differences between differential phase contrast and electron holographic measurements of a GaN p-n junction	4
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	4
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries	4
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	4
Anisotropic redistribution of coherently de-channelled electrons around dislocations in gallium nitride revealed by 4D Scanning Transmission Electron Microscopy	4
Negative stain TEM imaging of native spider silk protein superstructures	4
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers	4
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	3
The Cramér–Rao lower bound for the precision of scan position refinement in momentum-resolved STEM	3
Collection of propagating electromagnetic fields by uncoated probe	3
An in-situ magnetising holder achieving 1.5 T in-plane field in 200 kV transmission electron microscope	3
Neural field enhanced phase retrieval of atomic-scale structural dynamics in radiation sensitive materials	3
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	3
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	3
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 K	3
Reliable phase quantification in focused probe electron ptychography of thin materials	3
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	3
Preface to the Proceedings of the Thirteenth International Workshop on Low Energy Electron Microscopy and Photoemission Electron Microscopy (LEEM/PEEM 13)	3
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations	3
A novel STM for quality atomic resolution with piezoelectric motor of high compactness and simplicity	3
High-Resolution EELS in an aberration-corrected LEEM: Design of electrostatic transfer lenses for hemispherical filters	3