Ultramicroscopy

Article	Citations
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	58
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	39
On central focusing for contrast optimization in direct electron ptychography of thick samples	34
espm: A Python library for the simulation of STEM-EDXS datasets	30
Editorial Board	29
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	26
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	22
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	22
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	21
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	21
In search of best automated model: Explaining nanoparticle TEM image segmentation	20
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	20
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	19
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	18
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	18
Gun energy filter for a low energy electron microscope	18
L-shell ionization of Cd: Structure of the x-ray emission spectrum	17
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	17
Weld-free mounting of lamellae for electrical biasing operando TEM	16
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	16
Editorial Board	16
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects	15
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	15
Editorial Board	15
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	14

Perimeter procedure to produce average equivalent area grain size	14
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	13
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	13
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	13
A sorter for electrons based on magnetic elements	13
Edge-induced excitations in Bi2	13
Commonsense and common nonsense opinions: PROSPECTS for further reducing beam damage in electron microscopy of radiation-sensitive specimens	12
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	12
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	12
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	12
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	12
Editorial Board	12
Standardizing resolution definition in scanning helium microscopy	12
Accurate magnification determination for cryoEM using gold	12
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	12
Editorial Board	11
Exploring deep learning models for 4D-STEM-DPC data processing	11
Site-specific plan-view TEM lamella preparation of pristine surfaces with a large field of view	11
Editorial Board	11
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization	11
Editorial Board	11
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	11
Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials	10
Evaluation of electron radiation damage to green fluorescent protein	10
Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM	10
Design of electrostatic lenses through genetic algorithm and particle swarm optimisation methods integrated with differential algebra	10
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	10
The impact of electric field strength on the accuracy of boron dopant quantification in silicon using atom probe tomography	10
Minimum-dose phase-contrast tomography by successive numerical optical sectioning employing the aberration-corrected STEM and a pixelated detector	10
A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images	10
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	10
Editorial Board	10
Data synchronization in operando gas and heating TEM	9
Gold nanoparticles and tilt pairs to assess protein flexibility by cryo-electron microscopy	9
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	9
Photovoltaic and photothermal effects induced by visible laser radiation in atomic force microscopy probes	9
Parameter dependence of depth and lateral resolution of transmission Kikuchi diffraction	9
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	9
Angular dynamics of small nanoparticles induced by non-vortex electron beams	9
Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy	9
Theoretical study on sixth-order geometrical aberration correction	8
Preface to special section on imaging, diffraction and crystallography – John Spence's legacy	8
Dose symmetric electron diffraction tomography (DS-EDT): Implementation of a dose-symmetric tomography scheme in 3D electron diffraction	8
Reflection imaging with a helium zone plate microscope	8
Dose measurement in the TEM and STEM	8
Inter-Bragg crystallographic phase retrieval from shape transforms, stacking faults and substitutional disorder	8
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials	8
Manganese Migration in Li1-xMn2O4 Cathode Materials	8
Dynamical diffraction effects of inhomogeneous strain fields investigated by scanning convergent electron beam diffraction and dark field electron holography	8
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	8

Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	8
Fiber-optic sample illuminator design for the observation of light induced phenomena with transmission electron microscopy in situ: Antimicrobial photodynamic therapy	8
Temporal coherence envelope function of field emission in electron microscopy	8
High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation	8
Editorial Board	8
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	8
Editorial Board	8
Accurate and fast localization of EBSD pattern centers for screen moving technology	7
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	7
An improved method assigning three-dimensional atomic potentials to multiple slices in exit-wave simulations of Transmission Electron Microscopy	7
Differential phase contrast STEM image calculation software – Magnifier	7
Numerical simulations of field emission characteristics of open CNT	7
Reaction-diffusion study of electron-beam-induced contamination growth	7
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	7
Electron ptychography dose reduction using Moiré sampling on periodic structures	7
Accuracy and precision of position determination in ISTEM imaging of BaTiO	7
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	7
High-precision atomic-scale strain mapping of nanoparticles from STEM images	7
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy	7
In situ STEM analysis of electron beam induced chemical etching of an ultra-thin amorphous carbon foil by oxygen during high resolution scanning	7
In multi electron beam systems, “Neighbours Matter”	7
Phase offset method of ptychographic contrast reversal correction	7
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	7
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	6
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	6
Interfacial excess of solutes across phase boundaries using atom probe microscopy	6
Editorial Board	6
In my Good Books	6
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	6
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	6
Real-time electron clustering in an event-driven hybrid pixel detector	6
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	6
Editorial Board	6
Computer vision AC-STEM automated image analysis for 2D nanopore applications	6
Coherent and incoherent imaging of biological specimens with electrons and X-rays	6
Signal detection and imaging methods for MEMS electron microscope	6
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	6
Directly correlated microscopy of trench defects in InGaN quantum wells	6
Editorial Board	6
A method for estimating magnetic field of TEM objective lens	6
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	6
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	6
Workflow automation of SEM acquisitions and feature tracking	6
Semicircular-aperture illumination scanning transmission electron microscopy	6
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	6
Editorial Board	6
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	6
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	5
Non-negative matrix factorization-aided phase unmixing and trace element quantification of STEM-EDXS data	5
Voltage modulation efficiency in scanning capacitance microscopy	5
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	5
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	5
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	5
Symmetry of diffraction patterns of two-dimensional crystal structures	5
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	5
New Poisson denoising method for pulse-count STEM imaging	5
Editorial Board	5
Editorial Board	5
Interpretability of high-resolution transmission electron microscopy images	5
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	5
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	5
Editorial Board	5
Process optimization of broad ion beam milling for preparation of coating cross-sections	5
A versatile sample fabrication method for ultrafast electron diffraction	5
Parameter retrieval of small particles in dark-field Fourier ptychography and a rectangle in real-space ptychography	5
On the instrument-dependent appearance of ion dissociation events in atom probe tomography mass spectra	5
A method for a column-by-column EELS quantification of barium lanthanum ferrate	5
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	5
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	5
Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation	4
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	4
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	4
Investigation of thermal effects of laser micromachining for APT and TEM specimen preparation: A modeling and experimental study	4
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	4
A high-performance reconstruction method for partially coherent ptychography	4
Dimensionality reduction and unsupervised clustering for EELS-SI	4
Optimizing image contrast of second phases in metal alloys	4
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	4

Editorial Board	4
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	4
Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces	4
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	4
Detecting minute amounts of nitrogen in GaNAs thin films using STEM and CBED	4
Atom probe specimen preparation methods for nanoparticles	4
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	4
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	4
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	4
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	4
Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network	4
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	4
Corrigendum to “Structure-preserving Gaussian denoising of FIB-SEM volumes” [Ultramicroscopy Volume 246, 113674]	4
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	4
GHz sample excitation at the ALBA-PEEM	4
Elemental quantification using electron energy-loss spectroscopy with a low voltage scanning transmission electron microscope (STEM-EELS)	4
Editorial Board	4
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	4
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations	4
Correction of step size dependency in local misorientation obtained by EBSD measurements: Introducing equidistant local misorientation	4
Exploration of fs-laser ablation parameter space for 2D/3D imaging of soft and hard materials by tri-beam microscopy	4
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications	4
Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM	4
First step toward complex observations by 4D-STEM with phase plate	4
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope	4
Towards atom counting from first moment STEM images: Methodology and possibilities	4
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	4
Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models	4
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	4
Extracting transverse electron mean free paths in graphene at low energy	4
A precision core drill for transmission electron microscopy sample preparation produced by 3D printing	4
Calibrating cryogenic temperature of TEM specimens using EELS	4
Maximizing the notional area in single tip field emitters	4
A Denoising Autoencoder for Improved Kikuchi Pattern Quality and Indexing in Electron Backscatter Diffraction	4
Editorial Board	4
TEMGYM Advanced: Software for electron lens aberrations and parallelised electron ray tracing	4
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS	4
Editorial Board	4
A precision manual grinding tool for sample preparation	4
Nondestructive and local mapping photoresponse of WSe2 by electrostatic force microscopy	3
Editorial Board	3
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures	3
Editorial Board	3
Point field emission electron source with a magnetically focused electron beam	3
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports	3
Editorial Board	3
Negative stain TEM imaging of native spider silk protein superstructures	3
Collection of propagating electromagnetic fields by uncoated probe	3
A refined plan-view specimen preparation technique for high-quality electron microscopy studies of epitaxially grown atomically thin 2D layers	3
Quantifying the data quality of focal series for inline electron holography	3
Fifth-order asymptotic geometric aberrations of electron lenses	3
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation	3
Electron-beam-induced charging of an Al2	3
Editorial Board	3
A versatile machine learning workflow for high-throughput analysis of supported metal catalyst particles	3
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	3
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	3
Optimizing experimental parameters of integrated differential phase contrast (iDPC) for atomic resolution imaging	3
Origin of giant enhancement of phase contrast in electron holography of modulation-doped	3
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM	3
Alignment of electron optical beam shaping elements using a convolutional neural network	3
Editorial Board	3
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	3
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics	3
Properties of blade-like field emitters	3
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	3
Neutral helium atom microscopy	3
Image based evaluation of textured 3DSEM models	3
Experimental realization of a π/2 vortex mode converter for electron	3
EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries	3
Programmable comprehensive controller for multi-color 3D confocal spinning-disk image scanning microscope	3
Editorial Board	3
Measurement of the pattern shifts for HR-EBSD with larger lattice rotations	3
Back illuminated photo emission electron microscopy (BIPEEM)	3
Advancing analytical electron microscopy methodologies to characterise microstructural features in superalloys	3
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	3
Editorial Board	3
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	3
A mini vibrational polishing machine produced by 3D printing	3
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	3
High-resolution scanning tunneling microscope and its adaptation for local thermopower measurements in 2D materials	3
A brief peek at the cyclotron in our microscope	3
High-speed multiparametric imaging through off-resonance tapping AFM with active probe	3
Chemical and cryo-collection of muscle samples for transmission electron microscopy using Methacarn and dimethyl sulfoxide✰	3
Exploration of atom probe tomography at sub-10K	3
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	3
Direct measurement of the PSF for Coulomb delocalization – a reconsideration	3
Convexity constraints on linear background models for electron energy-loss spectra	3
Effect of sample thinning on strains and lattice rotations measured from Transmission Kikuchi diffraction in the SEM	3
Visualization of molecular stacking using low-energy electron microscopy	3
Reprint of: Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. (“Pico” Festschrift, May 2021)	3
Removal of silicon-containing contaminants from TEM specimens	3
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 K	3
Strain visualization using large-angle convergent-beam electron diffraction	3
The studies on wet chemical etching via in situ liquid cell TEM	3