Ultramicroscopy

Article	Citations
Hybrid pixel direct detector for electron energy loss spectroscopy	62
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision	41
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures	37
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	36
Contrast transfer and noise considerations in focused-probe electron ptychography	30
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V	26
Automated Detection of Helium Bubbles in Irradiated X-750	26
Dose measurement in the TEM and STEM	23
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	23
Spectral DQE of the Volta phase plate	22
Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimens	21
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law	21
Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)	21
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges	20
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition	20
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition	19
Sub-pixel electron detection using a convolutional neural network	19
Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem	19
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets	18
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection	18
Micrograph contrast in low-voltage SEM and cryo-SEM	18
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	18
Lattice resolution of vibrational modes in the electron microscope	17
FIB/SEM tomography segmentation by optical flow estimation	17
Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession	17

Exploring the accuracy of isotopic analyses in atom probe mass spectrometry	17
Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction	16
An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB	16
Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement	16
Orientation mapping of graphene using 4D STEM-in-SEM	16
Quantitative electric field mapping of a p–n junction by DPC STEM	15
Atom column detection from simultaneously acquired ABF and ADF STEM images	15
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy	15
Correction of artefacts associated with large area EBSD	15
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio	15
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope	15
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography	14
Event-based hyperspectral EELS: towards nanosecond temporal resolution	14
Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images	14
Dissecting complex nanoparticle heterostructures via multimodal data fusion with aberration-corrected STEM spectroscopy	14
EBSD pattern simulations for an interaction volume containing lattice defects	14
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser	14
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	14
Integrated correction of optical distortions for global HR-EBSD techniques	14
Wavelength-multiplexed single-shot ptychography	14
A simple method to clean ligand contamination on TEM grids	13
TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps	13
Achieving diffraction-limited resolution in soft-X-ray Fourier-transform holography	13
In search of best automated model: Explaining nanoparticle TEM image segmentation	13
High-quality reconstruction of coherent modulation imaging using weak cascade modulators	13
Integrated super resolution fluorescence microscopy and transmission electron microscopy	12
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	12
ab initio description of bonding for transmission electron microscopy	12
Charting the low-loss region in electron energy loss spectroscopy with machine learning	12
Modulator refinement algorithm for coherent modulation imaging	12
TEM bright field imaging of thick specimens: nodes in Thon ring patterns	12
Auto-segmentation technique for SEM images using machine learning: Asphaltene deposition case study	12
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions	11
Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopy	11
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods	11
High resolution atomic scale characterization of dislocations in high entropy alloys: Critical assessment of template matching and geometric phase analysis	11
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon	11
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports	11
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling	11
On 2D-FTIR-XRF microscopy – A step forward correlative tissue studies by infrared and hard X-ray radiation	11
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy	11
Mapping valence electron distributions with multipole density formalism using 4D-STEM	11
On the reduction in the effects of radiation damage to two-dimensional crystals of organic and biological molecules at liquid-helium temperature	11
Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processing	10
Evaluation of different rectangular scan strategies for STEM imaging	10
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS	10
Dimensionality reduction and unsupervised clustering for EELS-SI	10
A versatile sample fabrication method for ultrafast electron diffraction	10
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM	10
Alignment of electron optical beam shaping elements using a convolutional neural network	10

Defocus-dependent Thon-ring fading	10
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomography	10
Precise measurement of the electron beam current in a TEM	10
Autofocus of whole slide imaging based on convolution and recurrent neural networks	10
Directly correlated microscopy of trench defects in InGaN quantum wells	10
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations	9
Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures	9
A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope	9
Experimental realization of a π/2 vortex mode converter for electron	9
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics	9
Off-axis electron holography of Néel-type skyrmions in multilayers of heavy metals and ferromagnets	9
Transmission imaging on a scintillator in a scanning electron microscope	9
Neutral helium atom microscopy	9
Quantification of reagent mixing in liquid flow cells for Liquid Phase-TEM	9
Accurate EELS background subtraction – an adaptable method in MATLAB	9
Beam shaping and probe characterization in the scanning electron microscope	9
STEM electron beam-induced current measurements of organic-inorganic perovskite solar cells	8
Laser ablation sample preparation for atom probe tomography and transmission electron microscopy	8
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactions	8
The behavior of Fowler-Nordheim plot from carbon nanotubes-based large area field emitters arrays	8
The studies on wet chemical etching via in situ liquid cell TEM	8
Atom probe tomography quantification of carbon in silicon	8
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection	8
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells	8
Support vector machine for EELS oxidation state determination	8
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	8
Using local GND density to study SCC initiation	8
3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods	7
Correlation symmetry analysis of electron nanodiffraction from amorphous materials	7
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM	7
Quantum theory of magnon excitation by high energy electron beams	7
Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy Networks	7
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	7
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy	7
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation	7
The importance of temporal and spatial incoherence in quantitative interpretation of 4D-STEM	7
Theoretical modeling and simulation-based assessment of graded-bandgap AlGaAs/GaAs electron-injection cathode	7
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	7
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials	7
Influence of experimental conditions on localized surface plasmon resonances measurement by electron energy loss spectroscopy	7
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons	7
Three dimensional cluster analysis for atom probe tomography using Ripley’s K-function and machine learning	7
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si	7
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope	7
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	7
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures	7
Phase contrast imaging with inelastically scattered electrons from any layer of a thick specimen	6
Exploring valence states of abnormal mineral deposits in biological tissues using correlative microscopy and spectroscopy techniques: A case study on ferritin and iron deposits from Alzheimer’s diseas	6
Low terahertz-band scanning near-field microscope with 155-nm resolution	6
Computer vision AC-STEM automated image analysis for 2D nanopore applications	6
Identification and correction of temporal and spatial distortions in scanning transmission electron microscopy	6
Structure-preserving Gaussian denoising of FIB-SEM volumes	6
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	6
Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolution	6
Investigation of gas-electron interactions with electron holography	6
Contrast modes in a 3D ion transmission approach at keV energies	6
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System	6
Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning	6
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)	6
Line-rotated remapping for high-resolution electron backscatter diffraction	6
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector	6
Flat electron mirror	6
Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films	6
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy	6
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN	6
Nanowire facilitated transfer of sensitive TEM samples in a FIB	6
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	6
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio	6
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns	6
A new sample preparation protocol for SEM and TEM particulate matter analysis	6
Secondary electron count imaging in SEM	5
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations	5
Properties of blade-like field emitters	5
Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography	5
Comparative of machine learning classification strategies for electron energy loss spectroscopy: Support vector machines and artificial neural networks	5
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope	5
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels	5
FANM: A software for focus and aberrations of nuclear microprobe	5
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	5
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	5

The differential phase contrast uncertainty relation: Connection between electron dose and field resolution	5
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution	5
Displacement separation analysis from atomic-resolution images	5
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	5
3D reconstruction of curvilinear structures with stereo matching deep convolutional neural networks	5
Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel	5
AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM	5
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	5
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy	5
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	5
Approximant-based orientation determination of quasicrystals using electron backscatter diffraction	5
Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plate	5
Coherent and incoherent imaging of biological specimens with electrons and X-rays	5
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications	5
Advancing analytical electron microscopy methodologies to characterise microstructural features in superalloys	5
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	5
High-precision atomic-scale strain mapping of nanoparticles from STEM images	5
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale	5
Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides	5
Standard deviation of microscopy images used as indicator for growth stages	5
Characterising the performance of an ultrawide field-of-view 3D atom probe	5
Dynamic compressed sensing for real-time tomographic reconstruction	5
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs	5
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	5
Multi-exposure microscopic image fusion-based detail enhancement algorithm	5
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	5
Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a Pd77.5Cu6Si16.5 Metallic Glass Thin Film	5
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	5
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy	5
Aberration corrected spin polarized low energy electron microscope	5
Quantitative atomic force microscopy: A statistical treatment of high-speed AFM data for quality control applications	4
AutomAl 6000: Semi-automatic structural labelling of HAADF-STEM images of precipitates in Al–Mg–Si(–Cu) alloys	4
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations	4
Data synchronization in operando gas and heating TEM	4
Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. ("Pico" Festschrift, May 2021)	4
A Fast Frozen Phonon Algorithm Using Mixed Static Potentials	4
Revealing latent pole and zone line information in atom probe detector maps using crystallographically correlated metrics	4
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon	4
Automated geometric aberration correction for large-angle illumination STEM	4
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	4
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	4
Combining high temperature sample preparation and in-situ magnetic fields in XPEEM	4
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	4
Low-noise large-bandwidth transimpedance amplifier for measuring scanning tunneling shot noise spectra in cryogenic STM and its applications	4
Lattice contrast in the core-loss EFTEM signal of graphene	4
Manganese Migration in Li1-xMn2O4 Cathode Materials	4
Correction of EELS dispersion non-uniformities for improved chemical shift analysis	4
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	4
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS	4
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learning	4
Extended coherent modulation imaging for single-shot object retrieval free from illumination artifacts	4
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures	4
Principal image decomposition for multi-detector backscatter electron topography reconstruction	4
Application of electron tomography for comprehensive determination of III-V interface properties	4
Shape from projections via differentiable forward projector for computed tomography	4
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	4
Nanoscale mobility mapping in semiconducting polymer films	4
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	4
Quantitative reconstruction of the complex-valued object based on complementary phase modulations	4
A precision manual grinding tool for sample preparation	4
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	4
Complementary LEEM and eV-TEM for imaging and spectroscopy	4
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography	4
The effect of size distribution and degradation of carbon nanotubes on the Fowler–Nordheim plot behavior	4
Time-resolved compositional mapping during in situ TEM studies	4
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	4
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	4
Ultramicrotomy preparation of magnetic nanoparticles for transmission electron microscopy	4
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	4
Atomically resolved tomographic reconstruction of nanoparticles from single projection: Influence of amorphous carbon support	4
Band gap measurement by nano-beam STEM with small off-axis angle transmission electron energy loss spectroscopy (TEELS)	4
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM	4
A mechanical rotatable magnetic force microscope operated in a 7 T superconducting magnet	3
Nanostructured-membrane electron phase plates	3
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	3
Analysis and improvement of positioning reliability and accuracy of theta pipette configuration for scanning ion conductance microscopy	3
Morphological classification of dense objects in atom probe tomography data	3
Grain analysis of atomic force microscopy images via persistent homology	3
Comparative image simulations for phase-plate transmission electron microscopy	3
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt	3
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	3
L-shell ionization of Cd: Structure of the x-ray emission spectrum	3
Sampling theory perspective on tomographic tilt increment schemes	3
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography	3
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	3
A general and robust analytical method for interface normal determination in TEM	3
The interaction of proanthocyanidins with DNA molecules studied by atomic force microscopy and spectroscopic method	3
Decomposition of CrN induced by laser-assisted atom probe tomography	3
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites	3
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced	3
A reference-area-free strain mapping method using precession electron diffraction data	3
Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector	3
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	3
Plasmon energy losses in shear bands of metallic glass	3