Ultramicroscopy

Article	Citations
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	43
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures	42
Contrast transfer and noise considerations in focused-probe electron ptychography	36
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V	27
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	27
Dose measurement in the TEM and STEM	25
Spectral DQE of the Volta phase plate	23
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges	22
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets	21
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	21
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition	21
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio	20
Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem	20
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition	20
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection	20
Orientation mapping of graphene using 4D STEM-in-SEM	20
Micrograph contrast in low-voltage SEM and cryo-SEM	20
Sub-pixel electron detection using a convolutional neural network	19
Lattice resolution of vibrational modes in the electron microscope	19
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope	18
FIB/SEM tomography segmentation by optical flow estimation	18
Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement	18
A simple method to clean ligand contamination on TEM grids	18
An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB	18
Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession	18

TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps	17
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope	16
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser	16
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy	16
Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images	16
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	16
Correction of artefacts associated with large area EBSD	16
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions	15
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography	15
Atom column detection from simultaneously acquired ABF and ADF STEM images	15
Wavelength-multiplexed single-shot ptychography	14
In search of best automated model: Explaining nanoparticle TEM image segmentation	14
Dissecting complex nanoparticle heterostructures via multimodal data fusion with aberration-corrected STEM spectroscopy	14
EBSD pattern simulations for an interaction volume containing lattice defects	14
Integrated correction of optical distortions for global HR-EBSD techniques	14
Event-based hyperspectral EELS: towards nanosecond temporal resolution	14
On the reduction in the effects of radiation damage to two-dimensional crystals of organic and biological molecules at liquid-helium temperature	13
Mapping valence electron distributions with multipole density formalism using 4D-STEM	13
Neutral helium atom microscopy	12
ab initio description of bonding for transmission electron microscopy	12
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods	12
Dimensionality reduction and unsupervised clustering for EELS-SI	12
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells	12
High resolution atomic scale characterization of dislocations in high entropy alloys: Critical assessment of template matching and geometric phase analysis	12
On 2D-FTIR-XRF microscopy – A step forward correlative tissue studies by infrared and hard X-ray radiation	12
Charting the low-loss region in electron energy loss spectroscopy with machine learning	12
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports	12
Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processing	12
Alignment of electron optical beam shaping elements using a convolutional neural network	12
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM	11
Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopy	11
Autofocus of whole slide imaging based on convolution and recurrent neural networks	11
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics	11
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon	11
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy	11
Beam shaping and probe characterization in the scanning electron microscope	10
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations	10
Laser ablation sample preparation for atom probe tomography and transmission electron microscopy	10
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactions	10
Directly correlated microscopy of trench defects in InGaN quantum wells	10
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomography	10
A versatile sample fabrication method for ultrafast electron diffraction	10
Precise measurement of the electron beam current in a TEM	10
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS	10
Defocus-dependent Thon-ring fading	10
Experimental realization of a π/2 vortex mode converter for electron	10
Atom probe tomography quantification of carbon in silicon	10
A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope	10
Transmission imaging on a scintillator in a scanning electron microscope	10
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM	9

Off-axis electron holography of Néel-type skyrmions in multilayers of heavy metals and ferromagnets	9
Quantification of reagent mixing in liquid flow cells for Liquid Phase-TEM	9
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	9
The studies on wet chemical etching via in situ liquid cell TEM	9
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials	9
Low terahertz-band scanning near-field microscope with 155-nm resolution	8
Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning	8
Correlation symmetry analysis of electron nanodiffraction from amorphous materials	8
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation	8
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	8
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection	8
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN	8
3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods	8
Quantum theory of magnon excitation by high energy electron beams	8
Comparative of machine learning classification strategies for electron energy loss spectroscopy: Support vector machines and artificial neural networks	8
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures	8
The behavior of Fowler-Nordheim plot from carbon nanotubes-based large area field emitters arrays	8
Identification and correction of temporal and spatial distortions in scanning transmission electron microscopy	8
Support vector machine for EELS oxidation state determination	8
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms	7
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns	7
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	7
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	7
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	7
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons	7
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si	7
Three dimensional cluster analysis for atom probe tomography using Ripley’s K-function and machine learning	7
AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM	7
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope	7
Multi-exposure microscopic image fusion-based detail enhancement algorithm	7
Structure-preserving Gaussian denoising of FIB-SEM volumes	7
Theoretical modeling and simulation-based assessment of graded-bandgap AlGaAs/GaAs electron-injection cathode	7
Exploring valence states of abnormal mineral deposits in biological tissues using correlative microscopy and spectroscopy techniques: A case study on ferritin and iron deposits from Alzheimer’s diseas	7
Secondary electron count imaging in SEM	7
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy	7
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy	7
A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection	6
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process	6
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio	6
Line-rotated remapping for high-resolution electron backscatter diffraction	6
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications	6
Flat electron mirror	6
3D reconstruction of curvilinear structures with stereo matching deep convolutional neural networks	6
Investigation of gas-electron interactions with electron holography	6
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	6
Computer vision AC-STEM automated image analysis for 2D nanopore applications	6
Automated geometric aberration correction for large-angle illumination STEM	6
Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a Pd77.5Cu6Si16.5 Metallic Glass Thin Film	6
Advancing analytical electron microscopy methodologies to characterise microstructural features in superalloys	6
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector	6
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM	6
Phase contrast imaging with inelastically scattered electrons from any layer of a thick specimen	6
Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films	6
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy	6
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope	6
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	6
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)	6
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential	6
A new sample preparation protocol for SEM and TEM particulate matter analysis	6
Characterising the performance of an ultrawide field-of-view 3D atom probe	6
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy	6
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution	6
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias	6
Properties of blade-like field emitters	6
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learning	6
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	6
Nanowire facilitated transfer of sensitive TEM samples in a FIB	6
High-precision atomic-scale strain mapping of nanoparticles from STEM images	5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS	5
A precision manual grinding tool for sample preparation	5
Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel	5
Data synchronization in operando gas and heating TEM	5
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques	5
Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopy	5
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy	5
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	5
FANM: A software for focus and aberrations of nuclear microprobe	5
Revealing latent pole and zone line information in atom probe detector maps using crystallographically correlated metrics	5
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	5
Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides	5

Shape from projections via differentiable forward projector for computed tomography	5
The differential phase contrast uncertainty relation: Connection between electron dose and field resolution	5
Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography	5
Reconstructing dual-phase nanometer scale grains within a pearlitic steel tip in 3D through 4D-scanning precession electron diffraction tomography and automated crystal orientation mapping	5
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale	5
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System	5
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	5
Approximant-based orientation determination of quasicrystals using electron backscatter diffraction	5
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels	5
Displacement separation analysis from atomic-resolution images	5
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations	5
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning	5
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations	5
Lattice contrast in the core-loss EFTEM signal of graphene	5
Machine learning based de-noising of electron back scatter patterns of various crystallographic metallic materials fabricated using laser directed energy deposition	5
Dynamic compressed sensing for real-time tomographic reconstruction	5
A Fast Frozen Phonon Algorithm Using Mixed Static Potentials	5
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs	5
Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plate	5
Low-noise large-bandwidth transimpedance amplifier for measuring scanning tunneling shot noise spectra in cryogenic STM and its applications	5
Coherent and incoherent imaging of biological specimens with electrons and X-rays	5
Angular dynamics of small nanoparticles induced by non-vortex electron beams	4
WhatEELS. A python-based interactive software solution for ELNES analysis combining clustering and NLLS	4
Efficient preparation of microtip arrays for atom probe tomography using fs-laser processing	4
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt	4
Atomic imaging with a 12 T magnetic field perpendicular or parallel to the sample surface by an ultra-stable scanning tunneling microscope	4
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice	4
Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopy	4
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	4
Extended coherent modulation imaging for single-shot object retrieval free from illumination artifacts	4
Grain analysis of atomic force microscopy images via persistent homology	4
Atomically resolved tomographic reconstruction of nanoparticles from single projection: Influence of amorphous carbon support	4
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	4
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM	4
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	4
AutomAl 6000: Semi-automatic structural labelling of HAADF-STEM images of precipitates in Al–Mg–Si(–Cu) alloys	4
Quantitative atomic force microscopy: A statistical treatment of high-speed AFM data for quality control applications	4
Image-histogram-based secondary electron counting to evaluate detective quantum efficiency in SEM	4
Inversion of dynamical Bragg intensities to complex structure factors by iterated projections. For Ultramic. 2020. ("Pico" Festschrift, May 2021)	4
Factors affecting Confidence Index in EBSD analysis	4
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography	4
Three-dimensional stacked filter: A non-linear filter for series images obtained using a transmission electron microscope	4
Decomposition of CrN induced by laser-assisted atom probe tomography	4
Time-resolved compositional mapping during in situ TEM studies	4
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors	4
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites	4
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV	4
Signal detection and imaging methods for MEMS electron microscope	4
The effect of size distribution and degradation of carbon nanotubes on the Fowler–Nordheim plot behavior	4
Application of electron tomography for comprehensive determination of III-V interface properties	4
Cryogenic spectroscopic imaging scanning tunnelling microscope in a water-cooled magnet down to 1.7 K	4
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	4
Overcoming resolution loss due to thermal magnetic field fluctuations from phase plates in transmission electron microscopy	4
Manganese Migration in Li1-xMn2O4 Cathode Materials	4
Optimizing experimental parameters of integrated differential phase contrast (iDPC) for atomic resolution imaging	4
Complementary LEEM and eV-TEM for imaging and spectroscopy	4
TEM-EDS microanalysis: Comparison among the standardless, Cliff & Lorimer and absorption correction quantification methods	4
Standard deviation of microscopy images used as indicator for growth stages	4
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN	4
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon	4
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures	4
Nanoscale mobility mapping in semiconducting polymer films	4
espm: A Python library for the simulation of STEM-EDXS datasets	4
Principal image decomposition for multi-detector backscatter electron topography reconstruction	4
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	4
Ultramicrotomy preparation of magnetic nanoparticles for transmission electron microscopy	4
Band gap measurement by nano-beam STEM with small off-axis angle transmission electron energy loss spectroscopy (TEELS)	4
Reliable phase quantification in focused probe electron ptychography of thin materials	4
Quantitative reconstruction of the complex-valued object based on complementary phase modulations	4
L-shell ionization of Cd: Structure of the x-ray emission spectrum	3
An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision	3
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	3
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography	3
A reference-area-free strain mapping method using precession electron diffraction data	3
Plasmon energy losses in shear bands of metallic glass	3
Quantitative three-dimensional characterization of critical sizes of non-spherical TiO2 nanoparticles by using atomic force microscopy	3
Accurate magnification determination for cryoEM using gold	3
Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys	3
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced	3
A method for estimating magnetic field of TEM objective lens	3
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	3
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	3
The interaction of proanthocyanidins with DNA molecules studied by atomic force microscopy and spectroscopic method	3
Image based evaluation of textured 3DSEM models	3
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry	3
Image difference metrics for high-resolution electron microscopy	3
Electron crystallography of chiral and non-chiral small molecules	3
Sampling theory perspective on tomographic tilt increment schemes	3
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	3
Optimization of imaging conditions for composition determination by annular dark field STEM	3
Analysis and improvement of positioning reliability and accuracy of theta pipette configuration for scanning ion conductance microscopy	3
Removal of silicon-containing contaminants from TEM specimens	3
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	3
Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplines	3
Spectrum imaging measurements with semi-parallel detection using an AES apparatus	3