Ultramicroscopy

Article	Citations
Reaction-diffusion study of electron-beam-induced contamination growth	48
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets	42
On central focusing for contrast optimization in direct electron ptychography of thick samples	36
Momentum transfer resolved electron correlation microscopy	27
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography	26
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy	25
A reference-area-free strain mapping method using precession electron diffraction data	25
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels	24
High-quality TEM specimen preparation for lithium-ion conducting solid electrolytes by low-energy ion milling	22
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles	19
Investigating the effects of solution viscosity on the stability and success rate of SECCM imaging	18
Low energy electron microscopy at cryogenic temperatures	18
Breaking the 10 nm barrier using molecular ions in nuclear microprobes	18
Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control	17
Spectromicroscopic study of the transformation with low energy ions of a hematite thin film into a magnetite/hematite epitaxial bilayer	17
Accurate and fast localization of EBSD pattern centers for screen moving technology	16
Quantitative atomic cross section analysis by 4D-STEM and EELS	16
Measuring scattering distributions in scanning helium microscopy	16
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping	16
Fast detection of micro-objects using scanning electrochemical microscopy based on visual recognition and machine learning	15
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination	15
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures	14
Defocus-dependent Thon-ring fading	14
The target region focused imaging method for scanning ion conductance microscopy	14
Analysis and improvement of positioning reliability and accuracy of theta pipette configuration for scanning ion conductance microscopy	13

Application of electron tomography for comprehensive determination of III-V interface properties	12
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80	12
Tuneable in-situ nanoCT workflow using FIB/SEM	12
Editorial Board	12
Editorial Board	12
Phase imaging in scanning transmission electron microscopy using bright-field balanced divergency method	12
The influence of residual plural scattering after deconvolution in electron magnetic chiral dichroism	12
Editorial Board	12
Directly correlated microscopy of trench defects in InGaN quantum wells	12
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy	12
Comparison of detection limits of direct-counting CMOS and CCD cameras in EELS experiments	12
Editorial Board	12
Correction of artefacts associated with large area EBSD	11
Field Assisted Reactive Gas Etching of Multiple Tips Observed using FIM	11
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy	11
Thermal characterization of morphologically diverse copper phthalocyanine thin layers by scanning thermal microscopy	11
Influence of magnetic field on electron beam-induced Coulomb explosion of gold microparticles in transmission electron microscopy	10
Four-dimensional electron energy-loss spectroscopy	10
Editorial Board	10
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide	10
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings	10
State-of-the-art electron beams for compact tools of ultrafast science	10
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM	9
Reprint of: Automated geometric aberration correction for large-angle illumination STEM	9
Editorial Board	9
Atomic layer deposited Al2O3 as a protective overlayer for focused ion beam preparation of plan-view STEM samples	9
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons, Part II: Differential Holographic Tomography	9
Optimization of imaging conditions for composition determination by annular dark field STEM	8
Focused ion beam milling and MicroED structure determination of metal-organic framework crystals	8
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy	8
Probing the interaction range of electron beam-induced etching in STEM by a non-contact electron beam	8
In my Good Books	8
Determination of five-parameter grain boundary characteristics in nanocrystalline Ni-W by scanning precession electron diffraction tomography	8
Atomic resolution scanning transmission electron microscopy at liquid helium temperatures for quantum materials	8
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model	8
Signal detection and imaging methods for MEMS electron microscope	8
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy	8
In search of best automated model: Explaining nanoparticle TEM image segmentation	7
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN	7
Single scan STEM-EMCD in 3-beam orientation using a quadruple aperture	7
espm: A Python library for the simulation of STEM-EDXS datasets	7
Generational assessment of EBSD detectors for cross-correlation-based analysis: From scintillators to direct detection	7
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data	7
Charting the low-loss region in electron energy loss spectroscopy with machine learning	7
A new TCAD simulation method for direct CMOS electron detectors optimization	7
Dimensionality reduction and unsupervised clustering for EELS-SI	7
Multi-exposure microscopic image fusion-based detail enhancement algorithm	7
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)	7
Computer vision AC-STEM automated image analysis for 2D nanopore applications	7
A precision dimple grinder-polisher produced by 3D printing	7

Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures	7
Quantitative comparison of excitation modes of tuning forks for shear force in probe microscopy	7
A soft touch with electron beams: Digging out structural information of nanomaterials with advanced scanning low energy electron microscopy coupled with deep learning	6
Real-time electron clustering in an event-driven hybrid pixel detector	6
Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy	6
Development of a liquid-helium free cryogenic sample holder with mK temperature control for autonomous electron microscopy	6
Computer-readable Image Markers for Automated Registration in Correlative Microscopy – “autoCRIM”	6
Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy	6
Interfacial excess of solutes across phase boundaries using atom probe microscopy	6
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications	6
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope	6
Characterisation of engineered defects in extreme ultraviolet mirror substrates using lab-scale extreme ultraviolet reflection ptychography	6
A method for estimating magnetic field of TEM objective lens	6
Elastic strain mapping of plastically deformed materials by TEM	6
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope	6
Editorial Board	6
Coherent and incoherent imaging of biological specimens with electrons and X-rays	6
Weld-free mounting of lamellae for electrical biasing operando TEM	6
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser	6
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection	6
Effect of specimen processing for transmission electron microscopy on lattice spacing variation in Si specimens	6
Direct investigations of interactions between nucleolins and aptamers on pancreatic cancer and normal cells by atomic force microscopy	6
Investigation on the precipitate morphology and fraction characterization by atomic force microscopy	6
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy	6
Event-based hyperspectral EELS: towards nanosecond temporal resolution	6
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites	6
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]	6
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials	6
A sorter for electrons based on magnetic elements	6
Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys	6
Alignment of electron optical beam shaping elements using a convolutional neural network	6
2D calculation of parasitic fields in misaligned multipole electron-optical systems	5
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns	5
Point field emission electron source with a magnetically focused electron beam	5
Recovery of spatial frequencies in coherent diffraction imaging in the presence of a central obscuration	5
Editorial Board	5
Editorial Board	5
A brief peek at the cyclotron in our microscope	5
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet	5
Edge-induced excitations in Bi2	5
“Depo-all-around”: A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples	5
Editorial Board	5
Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment	5
The effect of nanochannel length on in situ loading times of diffusion-propelled nanoparticles in liquid cell electron microscopy	5
Editorial Board	5
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope	5
Editorial Board	5
Data-driven dynamics-based optimal filtering of acoustic noise at arbitrary location in atomic force microscope imaging	5
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy	5
Focused light introduction into transmission electron microscope via parabolic mirror	5
Does the order of elastic and inelastic scattering affect an image or is there a top bottom effect from inelastic scattering?	5
Trajectory displacement in a multi beam scanning electron microscope	5
Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)	5
Modeling scanning near-field optical photons scattered from an atomic force microscope for quantum metrology	5
Editorial Board	5
2D imaging spin-filter for NanoESCA based on Au/Ir(001) or Fe(001)-p(1×1)O	5
Portable low-cost and highly accurate programmable triggering controller for confocal spinning disk image scanning microscope	5
Sampling theory perspective on tomographic tilt increment schemes	5
An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision	5
Fluctuation cepstral scanning transmission electron microscopy of mixed-phase amorphous materials	4
TEM-EDS microanalysis: Comparison among the standardless, Cliff & Lorimer and absorption correction quantification methods	4
Electron crystallography of chiral and non-chiral small molecules	4
Editorial Board	4
Scattering angle dependence of temperature susceptivity of electron scattering in scanning transmission electron microscopy	4
Perimeter procedure to produce average equivalent area grain size	4
Prospect for measuring two-dimensional van der Waals magnets by electron magnetic chiral dichroism	4
Editorial Board	4
Low terahertz-band scanning near-field microscope with 155-nm resolution	4
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope	4
Extraction of acceptor concentration map from EBIC experiments	4
Wavelength-multiplexed single-shot ptychography	4
Editorial Board	4
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced	4
Preparation and stability of the hexagonal phase of samarium oxide on Ru(0001)	4
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learning	4
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network	4
Quantitative mapping of strain and displacement fields over HR-TEM and HR-STEM images of crystals with reference to a virtual lattice	4
Toward accurate measurement of electromagnetic field by retrieving and refining the center position of non-uniform diffraction disks in Lorentz 4D-STEM	4
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon	4
Contrast transfer and noise considerations in focused-probe electron ptychography	4

A novel ground-potential monochromator design	4
Comparative of machine learning classification strategies for electron energy loss spectroscopy: Support vector machines and artificial neural networks	4
Active calibration reference of minimized height for characterization of scanning thermal microscopy systems	4
TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps	4
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy	4
Gun energy filter for a low energy electron microscope	4
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope	4
Time-resolved compositional mapping during in situ TEM studies	4
A Fast Frozen Phonon Algorithm Using Mixed Static Potentials	4
WRAP: A wavelet-regularised reconstruction algorithm for magnetic vector electron tomography	4
Characterization of transverse electron pulse trains using RF powered traveling wave metallic comb striplines	4
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM	4
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions	4
Morphology measurements by AFM tapping without causing surface damage: A phase shift characterization	4
Application of Murphy – Good Plot Parameters Extraction Method on Electron Emission from Carbon Fibers	4
The effect of post-acquisition data misalignments on the performance of STEM tomography	4
A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation	4
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures	4
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System	4
Principles of electron wave front modulation with two miniature electron mirrors	4
Coherent imaging with low-energy electrons, quantitative analysis	4
L-shell ionization of Cd: Structure of the x-ray emission spectrum	4
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs	4
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy	4
Standardizing resolution definition in scanning helium microscopy	3
Volume imaging by tracking sparse topological features in electron micrograph tilt series	3
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures	3
Removal of silicon-containing contaminants from TEM specimens	3
Optimized detector configurations for the reconstruction of phase-contrast images in scanning transmission electron microscopy	3
Optimizing experimental parameters for orbital mapping	3
Quantitative nanoscale imaging using transmission He ion channelling contrast: Proof-of-concept and application to study isolated crystalline defects	3
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets	3
New probes based on carbon nano-cones for scanning probe microscopies	3
Precise measurement of the electron beam current in a TEM	3
Editorial Board	3
Impact of beam size and diffraction effects in the measurement of long-range electric fields in crystalline samples via 4DSTEM	3
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt	3
Regularization techniques for 3D surface reconstruction from four quadrant backscattered electron detector images	3
Secondary electron count imaging in SEM	3
Plasmon energy losses in shear bands of metallic glass	3
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope	3
Comparative image simulations for phase-plate transmission electron microscopy	3
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy	3
High order phase contrast and source divergence in low energy electron microscopy	3
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM	3
A method for a column-by-column EELS quantification of barium lanthanum ferrate	3
Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials	3
Calibrate the non-orthogonal error of AFM with two-dimensional self-traceable grating	3
The EBSD spatial resolution of a Timepix-based detector in a tilt-free geometry	3
Automatic center identification of electron diffraction with multi-scale transformer networks	3
Adaptive under-sampling strategy for fast imaging in compressive sensing-based atomic force microscopy	3
A comparison of molecular dynamics potentials used to account for thermal diffuse scattering in multislice simulations	3
Factors affecting Confidence Index in EBSD analysis	3
Process optimization of broad ion beam milling for preparation of coating cross-sections	3
Back illuminated photo emission electron microscopy (BIPEEM)	3
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM	3
Image based evaluation of textured 3DSEM models	3
Integrated correction of optical distortions for global HR-EBSD techniques	3
Dynamic evolution mechanism of scanning moiré fringes	3
Unitary two-state quantum operators realized by quadrupole fields in the electron microscope	3
Standard deviation of microscopy images used as indicator for growth stages	3
A Crystallography-Mediated Reconstruction (CMR) Approach for Atom Probe Tomography: Solution for a Singleton Pole	3
Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples	3
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography	3
Accurate magnification determination for cryoEM using gold	3
Correcting for probe wandering by precession path segmentation	3
Optical STEM detection for scanning electron microscopy	3
High precision orientation mapping from 4D-STEM precession electron diffraction data through quantitative analysis of diffracted intensities	3
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)	3
Automated calculations for computing the sample-limited spatial resolution in (scanning) transmission electron microscopy	3
Chemistry and microstructure of C-supported Ru catalyst nanoparticles: A correlative study	3
Strain visualization using large-angle convergent-beam electron diffraction	3
The characterisation of dental enamel using transmission Kikuchi diffraction in the scanning electron microscope combined with dynamic template matching	3
Multi-scale time-resolved electron diffraction: A case study in moiré materials	3
New Poisson denoising method for pulse-count STEM imaging	3
Phase differentiation based on x-ray energy spectrum correlation with an energy dispersive spectrometer (EDS)	3
Enhancing classification in correlative microscopy using multiple classifier systems with dynamic selection	3
Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV	2
Beyond the random phase approximation (RPA): First principles calculation of the valence EELS spectrum for KBr including local field, quasiparticle, excitonic and spin orbit coupling effects	2
Atom counting based on Voronoi averaged STEM intensities using a crosstalk correction scheme	2
Effect of the surrounding environment on electron beam irradiation damage of enhanced green fluorescent protein	2
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods	2
Toward quantitative thermoelectric characterization of (nano)materials by in-situ transmission electron microscopy	2
On the temporal transfer function in STEM imaging from finite detector response time	2
Chinese knot inspired isotropic linear scanning method for improved imaging performance in AFM	2
Improving the temporal resolution of event-based electron detectors using neural network cluster analysis	2
Learning Atom Probe Tomography time-of-flight peaks for mass-to-charge ratio spectrometry	2
The effect of the acceleration voltage on the quality of structure determination by 3D-electron diffraction	2
Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy	2
Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy	2
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope	2
Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography	2
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy	2
Autoencoder latent space sensitivity to material structure in convergent-beam low energy electron diffraction	2
The reference window for reduced perturbation of the reference wave in electrical biasing off-axis electron holography	2