(The median citation count of Ultramicroscopy is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-04-01 to 2024-04-01.)
Hybrid pixel direct detector for electron energy loss spectroscopy61
Fast-ADT: A fast and automated electron diffraction tomography setup for structure determination and refinement49
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision39
Event driven 4D STEM acquisition with a Timepix3 detector: Microsecond dwell time and faster scans for high precision and low dose applications36
Adaptive domain misorientation approach for the EBSD measurement of deformation induced dislocation sub-structures35
Contrast transfer and noise considerations in focused-probe electron ptychography28
3D electron backscatter diffraction study of α lath morphology in additively manufactured Ti-6Al-4V26
Automated Detection of Helium Bubbles in Irradiated X-75023
Spectral DQE of the Volta phase plate22
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findings22
Imaging Polarity in Two Dimensional Materials by Breaking Friedel's Law20
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition20
Simulation-based optimisation of thermodynamic conditions in the ESEM for dynamical in-situ study of spherical polyelectrolyte complex particles in their native state20
Sub-pixel electron detection using a convolutional neural network19
Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)19
Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition19
Training artificial neural networks for precision orientation and strain mapping using 4D electron diffraction datasets18
Micrograph contrast in low-voltage SEM and cryo-SEM18
Tracking the picoscale spatial motion of atomic columns during dynamic structural change18
Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimens18
Dose measurement in the TEM and STEM18
Source shot noise mitigation in focused ion beam microscopy by time-resolved measurement17
Exploring the accuracy of isotopic analyses in atom probe mass spectrometry17
Free, flexible and fast: Orientation mapping using the multi-core and GPU-accelerated template matching capabilities in the Python-based open source 4D-STEM analysis toolbox Pyxem17
Low energy nano diffraction (LEND) – A versatile diffraction technique in SEM16
Deep learning for scanning electron microscopy: Synthetic data for the nanoparticles detection16
Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges16
FIB/SEM tomography segmentation by optical flow estimation16
Spatial and spectral dynamics in STEM hyperspectral imaging using random scan patterns16
Lattice resolution of vibrational modes in the electron microscope16
Sub-Sampled Imaging for STEM: Maximising Image Speed, Resolution and Precision Through Reconstruction Parameter Refinement15
Beam-sensitive metal-organic framework structure determination by microcrystal electron diffraction15
Correction of artefacts associated with large area EBSD15
Quantitative electric field mapping of a p–n junction by DPC STEM15
Atom column detection from simultaneously acquired ABF and ADF STEM images15
Orientation mapping of graphene using 4D STEM-in-SEM15
Non-negative matrix factorization for mining big data obtained using four-dimensional scanning transmission electron microscopy15
Suppressing dynamical diffraction artefacts in differential phase contrast scanning transmission electron microscopy of long-range electromagnetic fields via precession15
A multi-ion plasma FIB study: Determining ion implantation depths of Xe, N, O and Ar in tungsten via atom probe tomography14
Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio14
A high-speed atomic force microscopy with super resolution based on path planning scanning14
Variable voltage electron microscopy: Toward atom-by-atom fabrication in 2D materials14
Integrated correction of optical distortions for global HR-EBSD techniques14
Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser14
Stroboscopic ultrafast imaging using RF strip-lines in a commercial transmission electron microscope14
EBSD pattern simulations for an interaction volume containing lattice defects14
Wavelength-multiplexed single-shot ptychography13
A simple method to clean ligand contamination on TEM grids13
Event-based hyperspectral EELS: towards nanosecond temporal resolution13
An in-situ method for protecting internal cracks/pores from ion beam damage and reducing curtaining for TEM sample preparation using FIB13
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscope13
Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM13
Dissecting complex nanoparticle heterostructures via multimodal data fusion with aberration-corrected STEM spectroscopy13
ab initio description of bonding for transmission electron microscopy12
30 T scanning tunnelling microscope in a hybrid magnet with essentially non-metallic design12
Auto-segmentation technique for SEM images using machine learning: Asphaltene deposition case study12
Achieving diffraction-limited resolution in soft-X-ray Fourier-transform holography12
High-quality reconstruction of coherent modulation imaging using weak cascade modulators12
The performance evaluation of direct detection electron energy-loss spectroscopy at 200 kV and 80 kV accelerating voltages12
In search of best automated model: Explaining nanoparticle TEM image segmentation12
Quantifying the performance of a hybrid pixel detector with GaAs:Cr sensor for transmission electron microscopy11
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling11
TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps11
A simple program for fast tilting electron-beam sensitive crystals to zone axes11
High resolution atomic scale characterization of dislocations in high entropy alloys: Critical assessment of template matching and geometric phase analysis11
3D characterisation using plasma FIB-SEM: A large-area tomography technique for complex surfaces like black silicon11
Mapping valence electron distributions with multipole density formalism using 4D-STEM11
Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM11
Charting the low-loss region in electron energy loss spectroscopy with machine learning11
Reconstructing porous structures from FIB-SEM image data: Optimizing sampling scheme and image processing10
Accurate measurement of strain at interfaces in 4D-STEM: A comparison of various methods10
Evaluation of different rectangular scan strategies for STEM imaging10
Autofocus of whole slide imaging based on convolution and recurrent neural networks10
Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen10
On the reduction in the effects of radiation damage to two-dimensional crystals of organic and biological molecules at liquid-helium temperature10
Dirac, c and a Supper date10
Effect of electron beam irradiation on the temperature of single AuGe nanoparticles in a TEM10
Alignment of electron optical beam shaping elements using a convolutional neural network10
Modulator refinement algorithm for coherent modulation imaging10
Integrated super resolution fluorescence microscopy and transmission electron microscopy10
A versatile sample fabrication method for ultrafast electron diffraction10
TEM bright field imaging of thick specimens: nodes in Thon ring patterns10
Unravelling new principles of site-selective doping contrast in the dual-beam focused ion beam/scanning electron microscope10
Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images10
Spin structure relation to phase contrast imaging of isolated magnetic Bloch and Néel skyrmions10
Beam shaping and probe characterization in the scanning electron microscope9
Aggregated nanoparticles: Sample preparation and analysis by atom probe tomography9
Cepstral scanning transmission electron microscopy imaging of severe lattice distortions9
Dimensionality reduction and unsupervised clustering for EELS-SI9
A new approach for repeated tip-sample relocation for AFM imaging of nano and micro sized particles and cells in liquid environment9
Wet-chemical etching of FIB lift-out TEM lamellae for damage-free analysis of 3-D nanostructures9
Off-axis electron holography of Néel-type skyrmions in multilayers of heavy metals and ferromagnets9
Transmission imaging on a scintillator in a scanning electron microscope9
A new solution to the curved Ewald sphere problem for 3D image reconstruction in electron microscopy9
Origin and Suppression of Beam Damage-Induced Oxygen-K Edge Artifact from γ-Al2O3 using Cryo-EELS9
Accurate EELS background subtraction – an adaptable method in MATLAB9
Defocus-dependent Thon-ring fading9
Experimental realization of a π/2 vortex mode converter for electron8
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations8
On 2D-FTIR-XRF microscopy – A step forward correlative tissue studies by infrared and hard X-ray radiation8
4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection8
Quantification of reagent mixing in liquid flow cells for Liquid Phase-TEM8
Laser ablation sample preparation for atom probe tomography and transmission electron microscopy8
Atom probe tomography quantification of carbon in silicon8
A cartridge-based turning specimen holder with wireless tilt angle measurement for magnetic induction mapping in the transmission electron microscope8
Quantitative analysis of spectroscopic low energy electron microscopy data: High-dynamic range imaging, drift correction and cluster analysis8
Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports8
Beam displacement and blur caused by fast electron beam deflection8
Precise measurement of the electron beam current in a TEM8
The behavior of Fowler-Nordheim plot from carbon nanotubes-based large area field emitters arrays8
Correlation symmetry analysis of electron nanodiffraction from amorphous materials7
Theoretical modeling and simulation-based assessment of graded-bandgap AlGaAs/GaAs electron-injection cathode7
Quantum theory of magnon excitation by high energy electron beams7
Observer Design for Topography Estimation in Atomic Force Microscopy Using Neural and Fuzzy Networks7
Directly correlated microscopy of trench defects in InGaN quantum wells7
Reducing bias and variance for CTF estimation in single particle cryo-EM7
3D electron backscatter diffraction characterization of fine α titanium microstructures: collection, reconstruction, and analysis methods7
Correlating local chemical and structural order using Geographic Information Systems-based spatial statistics7
Implementation and operation of a fiber-coupled CMOS detector in a low energy electron Microscope7
Chemical kinetics for operando electron microscopy of catalysts: 3D modeling of gas and temperature distributions during catalytic reactions7
Spectral detection of spin-polarized ultra low-energy electrons in semiconductor heterostructures7
Neutral helium atom microscopy7
STEM electron beam-induced current measurements of organic-inorganic perovskite solar cells7
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si7
Advancing characterisation with statistics from correlative electron diffraction and X-ray spectroscopy, in the scanning electron microscope7
Direct investigations of the electrical conductivity of normal and cancer breast cells by conductive atomic force microscopy7
Local electronic transport across probe/ionic conductor interface in scanning probe microscopy7
Controlling the parameters of focused ion beam for ultra-precise fabrication of nanostructures6
The Performance of EDXS at Elevated Sample Temperatures Using a MEMS-Based In Situ TEM Heating System6
Low terahertz-band scanning near-field microscope with 155-nm resolution6
Atomically resolved low-temperature scanning tunneling microscope operating in a 22 T water-cooled magnet6
Nanowire facilitated transfer of sensitive TEM samples in a FIB6
Sub-Kelvin thermometry for evaluating the local temperature stability within in situ TEM gas cells6
Evaluation of microstructure and conductivity of two-phase materials by the scanning spreading resistance microscopy (the case of shungite)6
Orientation, pattern center refinement and deformation state extraction through global optimization algorithms6
A new sample preparation protocol for SEM and TEM particulate matter analysis6
Phase contrast imaging with inelastically scattered electrons from any layer of a thick specimen6
Exploring valence states of abnormal mineral deposits in biological tissues using correlative microscopy and spectroscopy techniques: A case study on ferritin and iron deposits from Alzheimer’s diseas6
Brightness evaluation of pulsed electron gun using negative electron affinity photocathode developed for time-resolved measurement using scanning electron microscope6
Influence of experimental conditions on localized surface plasmon resonances measurement by electron energy loss spectroscopy6
Field dependent study on the impact of co-evaporated multihits and ion pile-up for the apparent stoichiometric quantification of GaN and AlN6
Computer vision AC-STEM automated image analysis for 2D nanopore applications6
Towards the interpretation of a shift of the central beam in nano-beam electron diffraction as a change in mean inner potential6
The importance of temporal and spatial incoherence in quantitative interpretation of 4D-STEM6
Relative roles of multiple scattering and Fresnel diffraction in the imaging of small molecules using electrons6
Three dimensional cluster analysis for atom probe tomography using Ripley’s K-function and machine learning6
Conductivity models for electron energy loss spectroscopy of graphene in a scanning transmission electron microscope with high energy resolution6
Contrast modes in a 3D ion transmission approach at keV energies6
Extracting weak magnetic contrast from complex background contrast in plan-view FeGe thin films6
Effects of atom probe analysis parameters on composition measurement of precipitates in an Al-Mg-Si-Cu alloy6
Convergent beam electron diffraction of multilayer Van der Waals structures6
Molecular dynamics simulation of bimodal atomic force microscopy6
SIM-STEM Lab: Incorporating Compressed Sensing Theory for Fast STEM Simulation6
Identification and correction of temporal and spatial distortions in scanning transmission electron microscopy6
The studies on wet chemical etching via in situ liquid cell TEM6
An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samples6
Flat electron mirror6
Secondary electron count imaging in SEM5
Properties of blade-like field emitters5
Identifying and imaging polymer functionality at high spatial resolution with core-loss EELS5
Coherent light emission in cathodoluminescence when using GaAs in a scanning (transmission) electron microscope5
Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides5
UEMtomaton: A Source-Available Platform to Aid in Start-up of Ultrafast Electron Microscopy Labs5
High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns5
Using local GND density to study SCC initiation5
Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications5
Spherical-angular dark field imaging and sensitive microstructural phase clustering with unsupervised machine learning5
Influence of field conditions on quantitative analysis of single crystal thorium dioxide by atom probe tomography5
Dynamical diffraction of high-energy electrons investigated by focal series momentum-resolved scanning transmission electron microscopy at atomic resolution5
Investigation of gas-electron interactions with electron holography5
Dynamic compressed sensing for real-time tomographic reconstruction5
Aberration corrected spin polarized low energy electron microscope5
Resistivity contrast imaging in semiconductor structures using ultra-low energy scanning electron microscopy5
Discrimination of coherent and incoherent cathodoluminescence using temporal photon correlations5
Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope5
Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM5
FANM: A software for focus and aberrations of nuclear microprobe5
Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a Pd77.5Cu6Si16.5 Metallic Glass Thin Film5
Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector5
Standard deviation of microscopy images used as indicator for growth stages5
AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM5
HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale5
High-precision atomic-scale strain mapping of nanoparticles from STEM images5
Fabrication and characterization of a miniaturized octupole deflection system for the MEMS electron microscope5
The differential phase contrast uncertainty relation: Connection between electron dose and field resolution5
A semi-classical theory of magnetic inelastic scattering in transmission electron energy loss spectroscopy5
Transmission Kikuchi diffraction: The impact of the signal-to-noise ratio5
Approximant-based orientation determination of quasicrystals using electron backscatter diffraction5
Advancing analytical electron microscopy methodologies to characterise microstructural features in superalloys5
Automated classification of nanoparticles with various ultrastructures and sizes via deep learning5
Support vector machine for EELS oxidation state determination5
Nanoscale mobility mapping in semiconducting polymer films4
Application of electron tomography for comprehensive determination of III-V interface properties4
Low-noise large-bandwidth transimpedance amplifier for measuring scanning tunneling shot noise spectra in cryogenic STM and its applications4
In-situ characterization of discharge products of lithium-oxygen battery using Flow Electrochemical Atomic Force Microscopy4
Quantitative reconstruction of the complex-valued object based on complementary phase modulations4
Structure-preserving Gaussian denoising of FIB-SEM volumes4
A precision manual grinding tool for sample preparation4
The effect of secondary electrons on radiolysis as observed by in liquid TEM: The role of window material and electrical bias4
Complementary LEEM and eV-TEM for imaging and spectroscopy4
Obtaining diffraction patterns from annular dark-field STEM-in-SEM images: Towards a better understanding of image contrast4
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network4
Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon4
Angle-dependence of ADF-STEM intensities for chemical analysis of InGaN/GaN4
Combining high temperature sample preparation and in-situ magnetic fields in XPEEM4
Reducing electron beam damage through alternative STEM scanning strategies, Part II: Attempt towards an empirical model describing the damage process4
Particle encapsulation techniques for atom probe tomography of precipitates in microalloyed steels4
Automated geometric aberration correction for large-angle illumination STEM4
Coherent and incoherent imaging of biological specimens with electrons and X-rays4
Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations4
Correction of EELS dispersion non-uniformities for improved chemical shift analysis4
The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy4
Data synchronization in operando gas and heating TEM4
Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography4
An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)4
Atomic resolution HOLZ-STEM imaging of atom position modulation in oxide heterostructures4
Atomically resolved tomographic reconstruction of nanoparticles from single projection: Influence of amorphous carbon support4
A user-friendly FIB lift-out technique to prepare plan-view TEM sample of 2D thin film materials4
Shape from projections via differentiable forward projector for computed tomography4
Strategy for optimizing experimental settings for studying low atomic number colloidal assemblies using liquid phase scanning transmission electron microscopy4
Exploiting the full potential of the advanced two-hexapole corrector for STEM exemplified at 60kV4
Enhancement of low-spatial-frequency components by a new phase-contrast STEM using a probe formed with an amplitude Fresnel zone plate4
Sample preparation methods for optimal HS-AFM analysis: Duplex stainless steel4
Band gap measurement by nano-beam STEM with small off-axis angle transmission electron energy loss spectroscopy (TEELS)4
Manganese Migration in Li1-xMn2O4 Cathode Materials4
Characterising the performance of an ultrawide field-of-view 3D atom probe4
Analysis of Local Charges at Hetero-interfaces by Electron Holography – A Comparative Study of Different Techniques4
Angstrom-scale imaging of magnetization in antiferromagnetic Fe2As via 4D-STEM4
3D reconstruction of curvilinear structures with stereo matching deep convolutional neural networks4
Identification of ultra-thin molecular layers atop monolayer terraces in sub-monolayer organic films with scanning probe microscopy4
Time-resolved compositional mapping during in situ TEM studies4
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors4
Multi-exposure microscopic image fusion-based detail enhancement algorithm4
Correlative atomic force microscopy and scanning electron microscopy of bacteria-diamond-metal nanocomposites3
Dislocations at coalescence boundaries in heteroepitaxial GaN/sapphire studied after the epitaxial layer has completely coalesced3
Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets3
Selective growth of platinum nanolines by helium ion beam induced deposition and atomic layer deposition3
Morphological classification of dense objects in atom probe tomography data3
Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy3
L-shell ionization of Cd: Structure of the x-ray emission spectrum3
A Fast Frozen Phonon Algorithm Using Mixed Static Potentials3
Grain analysis of atomic force microscopy images via persistent homology3
A general and robust analytical method for interface normal determination in TEM3
Nanoimmunosensor based on atomic force spectroscopy to detect anti-myelin basic protein related to early-stage multiple sclerosis3
Resolution of non-destructive imaging by controlled acceleration voltage in scanning electron microscopy3
Reconstructing the exit wave of 2D materials in high-resolution transmission electron microscopy using machine learning3
A quantitative method for in situ pump-beam metrology in 4D ultrafast electron microscopy3
Correction of AFM data artifacts using a convolutional neural network trained with synthetically generated data3
Local thickness and composition measurements from scanning convergent-beam electron diffraction of a binary non-crystalline material obtained by a pixelated detector3
Accurate post-mortem alignment for Focused Ion Beam and Scanning Electron Microscopy (FIB-SEM) tomography3