Ultramicroscopy

Papers
(The H4-Index of Ultramicroscopy is 18. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-06-01 to 2026-06-01.)
ArticleCitations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps39
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy39
Editorial Board36
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures34
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles32
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)28
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model25
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide23
On central focusing for contrast optimization in direct electron ptychography of thick samples23
espm: A Python library for the simulation of STEM-EDXS datasets23
Development of precession Lorentz transmission electron microscopy23
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping22
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source21
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM21
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?21
Improving the accuracy of temperature measurement on TEM samples using plasmon energy expansion thermometry (PEET): Addressing sample thickness effects20
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy18
Editorial Board18
Calibration-sample free distortion correction of electron diffraction patterns using deep learning18
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