Ultramicroscopy

Papers
(The H4-Index of Ultramicroscopy is 19. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)
ArticleCitations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps39
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles38
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures36
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy31
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model29
Corrigendum to “Electron crystallography of chiral and non-chiral small molecules” [Ultramicroscopy 232 (2022) 113417]28
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?26
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping25
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM23
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source22
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)22
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide22
Editorial Board22
espm: A Python library for the simulation of STEM-EDXS datasets22
Development of precession Lorentz transmission electron microscopy21
On central focusing for contrast optimization in direct electron ptychography of thick samples21
Multimode objective lens for momentum microscopy and XPEEM: Theory21
Weld-free mounting of lamellae for electrical biasing operando TEM20
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy20
Editorial Board19
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