Ultramicroscopy

Papers
(The H4-Index of Ultramicroscopy is 18. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)
ArticleCitations
An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps40
Methodology and implementation of a tunable deep-ultraviolet laser source for photoemission electron microscopy36
Editorial Board29
Nano1D: An accurate computer vision software for analysis and segmentation of low-dimensional nanostructures27
Non-contact non-resonant atomic force microscopy method for measurements of highly mobile molecules and nanoparticles27
Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)26
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model25
Can low energy (1–20 eV) electron microscopy produce damage-free images of biological samples?25
Characterization of the mechanical properties of the cortex region of human hair fibers by multiparametric atomic force microscopy mapping25
Quantitative composition determination by ADF-STEM at a low-angular regime: a combination of EFSTEM and 4DSTEM24
Scanning capacitance microscopy of GaN-based high electron mobility transistor structures: A practical guide23
Momentum microscopy with combined hemispherical and time-of-flight electron analyzers at the soft X-ray beamline I09 of the diamond light source23
On central focusing for contrast optimization in direct electron ptychography of thick samples21
espm: A Python library for the simulation of STEM-EDXS datasets21
Editorial Board20
Development of precession Lorentz transmission electron microscopy20
Suppression of secondary recoil cascade damage in high-Z/low-Z heterostructures: a mechanism-driven FIB strategy19
Evaluating atomic counts in metal nanoclusters via scanning transmission electron microscopy18
Mapping of lattice distortion in martensitic steel—Comparison of different evaluation methods of EBSD patterns18
Positioning and atomic imaging of micron-size graphene sheets by a scanning tunneling microscope18
FIB-induced gallium contamination as a tool to access aluminium crystallographic information from atom probe tomography data18
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