Solid-State Electronics

Papers
(The TQCC of Solid-State Electronics is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-08-01 to 2026-08-01.)
ArticleCitations
Engineering the contact resistance of copper/copper oxide via inserting a mediated molybdenum trioxide layer97
Editorial Board32
Editorial Board29
Non-local transport effects in semiconductors under low-field conditions27
Design and verification of a hybrid electrostatic discharge model for Gate-Controlled silicon controlled rectifier26
Low power consumption of non-volatile memory device by tunneling process engineering22
Experimental study of thermal coupling effects in FD-SOI MOSFET22
Analog behavior of V-FET operating in forward and reverse mode22
An enzymatic glucose biosensor using the BESOI MOSFET21
Impedance sensors based on silicon-carbon films for detection low concentrations of organic vapors21
Electrical instabilities in amorphous Si-Zn-sn-O thin film transistors under ultra-violet irradiation depending on oxygen content18
Negative capacitance field-effect transistor with hetero-dielectric structure for suppression of reverse drain induced barrier lowering18
Nanowire behavior under the influence of Polyoxometalates: A Comparative study of depletion and enhancement modes16
Modeling of tunneling through Schottky barriers16
Compact I-V model for back-gated and double-gated TMD FETs15
Design, Synthesis, and Optoelectronic Characterization of a Novel Cu(II) Complex-Based Photodiode with Prof. Dr. Yakuphanoglu’s Advanced Fytronix Solar Simulator Characterization Techniques15
Si nanowire-based micro-capacitors fabricated with metal assisted chemical etching for integrated energy storage applications15
Extraction of trap densities in Al:HfO 14
Numerical investigation of effect of Si separator in bottom dielectric isolation forksheet FETs via in-house TCAD process emulator and device simulator14
Design of high robustness DDSCR with embedded gate-controlled diodes and Schottky diodes14
Smart-CX – Method of extraction of parasitic capacitances in ICs14
Novel Y-function methodology parameter estimation from weak to strong inversion operation13
An ultra low power spiking neural encoder of microwave signals13
Analytical model based estimation of line edge roughness induced V<13
Tailoring the optoelectronic properties of PZT through the modulation of the thin film13
Study of RRAM devices with PECVD silicon-oxide resistive switching layer13
Editorial Board13
3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces13
Extraction of small-signal equivalent circuit for de-embedding of 3D vertical nanowire transistor12
Mixed finite element method for device simulations12
Detailed electrical characterization of 200 mm CMOS compatible GaN/Si HEMTs down to deep cryogenic temperatures12
Markov model describing progressive degradation of local percolation path in thin oxides12
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing12
Electron-phonon calculations using a Wannier-based supercell approach: Applications to the monolayer MoS11
Impact of substrate resistivity on spiral inductors at mm-wave frequencies11
Epitaxial p+pn+ vertical short diodes for microbolometers11
Self-aligned nitrogen doping via plasma treatment of NiO/β-Ga2O3 heterojunction diodes11
Ab initio study of electron mobility in V211
Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model11
Spatially resolved ionization current measurements using an active-matrix transimpedance amplifier array11
Mechanisms of negative bias instability of commercial SiC MOSFETs observed by current transients11
Implementation of transient-tolerant memristor-based threshold logic gate unit cell10
C-V measurement and modeling of double-BOX Trap-Rich SOI substrate10
Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures10
Compact modeling of photonic devices in Verilog-A for integrated circuit design10
Estimation of the energy levels of the donor–acceptor polymers of organic solar cells using cyclic voltammetry10
Evidence of out-of-equilibrium body potential in undoped EZ-FET10
Evaluation of the effective channel length of Junctionless nanowire transistors with different drain bias through the gate capacitance9
Impact of the leakage current of an AND-type synapse array on spiking neural networks9
Editorial Board9
Editorial Board9
28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling9
The impact of electron phonon scattering on transport properties of topological insulators: A first principles quantum transport study9
3D (micro/nano) CdO/p-Si co-doped Zn and La heterojunctions perform as solar light photodetectors9
Investigation on dielectric wall variations in Forksheet FETs9
Editorial Board9
Thermal coupling between FD-SOI FETs at cryogenic temperatures9
Editorial Board9
Pragmatic OxRAM compact model ready to use for design studies9
Reactive sputtering deposited α-MoO3 thin films for forming-free resistive random-access memory9
Equivalence of proton-induced displacement damage in InP-based HEMT9
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets9
Enhanced photoresponse in Cu/n-Si Schottky photodetectors via RF sputtering: A comparative study with thermal evaporation9
Editorial Board9
On the noise-sensitivity of entangling quantum logic operations implemented with a semiconductor quantum dot platform9
TCAD-based design and verification of the components of a 200 V GaN-IC platform9
Difference in kinetics between thermal nitridation and radical nitridation processes of 4H-SiC surface considering simultaneous N-incorporation and N-desorption reactions9
The core-shell junctionless MOSFET8
TCAD-Based RF performance prediction and process optimization of 3D monolithically stacked complementary FET8
Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET8
A wireless stimulator system-on-chip with an optically writable ID for addressable cortical microimplants8
Graph-based Compact Modeling (GCM) of CMOS transistors for efficient parameter extraction: A machine learning approach8
Temperature-dependence of current gain and turn-on voltages of GaAs-based HBTs with different base layers grown by MOCVD8
Electrical characteristics of n-type vertically stacked nanowires operating up to 600 K8
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise8
Theoretical study of extreme ultraviolet pellicles with nanometer thicknesses8
Optimized emitter-base interface cleaning for advanced Heterojunction Bipolar Transistors8
Performance potential of transistors based on tellurium nanowire arrays: A quantum transport study8
Hierarchical Mixture-of-Experts approach for neural compact modeling of MOSFETs8
Double Reference Layer STT-MRAM Structures with Improved Performance8
Suppression of de-trapping by remanent polarization in dual-mechanism flash memory8
Estimation of the emission characteristics of solid-state incandescent light emitting devices by linear regression of spectral radiance7
Non-uniform matching performances in mesa-isolated SOI MOSFETs7
TCAD numerical modeling of negative capacitance ferroelectric devices for radiation detection applications7
Performance of flexible In0.7Ga0.3As MOSFETs by utilizing liquid polyimide (LPI) transfer with effective mobility of 3,667 cm2/V-s7
An improved subthreshold swing expression accounting for back-gate bias in FDSOI FETs7
MoS2-based multiterminal ionic transistor with orientation-dependent STDP learning rules7
Preliminary results on industrial 28nm FD-SOI phase change memory at cryogenic temperature7
Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation7
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K7
Achieving long-term and short-term synaptic plasticity in adaptive ANNs: A memristor circuit design with switchable dual-mode7
Temperature influence on analog parameters of vertical nanowire transistors7
Model of threshold voltage and drain current in core-shell junctionless transistor on FD-SOI7
Hydrothermally formed copper oxide (CuO) thin films for resistive switching memory devices7
Investigation on pulse repetition frequency characteristics of 4H-Silicon carbide drift step recovery diode7
Understanding negative capacitance physical mechanism in organic ferroelectric capacitor7
Sensing performance of Ti/TiO2 nanosheets/Au capacitive device: Implication of resonant frequency7
Extraction of effective mobility of In Ga As/In Al As quantum well high-electron-mobility transistors on InP substrate7
Sub micro-accelerometer based on spintronic technology: A design optimization7
Editorial Board7
Enhanced linearity of AlGaN/GaN HEMTs via dual-gate configuration for RF amplifier applications7
Impacts of trench angle on the performance of trench super-junction vertical double-diffused metal-oxide-semiconductor7
Silicon nanowire field-effect transistor biosensors with bowtie antenna7
Behavioral SPICE model for memristive crosspoint arrays operating in the nonlinear transport regime7
Implementation of device-to-device and cycle-to-cycle variability of memristive devices in circuit simulations7
Preparation and electrical characteristics of transparent thin film transistors with sputtered aluminum and phosphorus co-doped indium-zinc-oxide channel layer7
Sensitivity implications for programmable transistor based 1T-DRAM7
Improved electrical performance of InAlN/GaN high electron mobility transistors with forming gas annealing7
Synaptic array using multi-level AND flash memory cells for hardware-based neural networks7
An eco-friendly bandgap engineering of semiconductor graphene oxide7
Switching limits of top-gated carbon nanotube field-effect transistors7
Corrigendum to “In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets” [Solid-State Electron. 201(2023) 10859]7
Editorial Board6
Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence6
Boosting the electrical performance of solar cells by using PIN diode structure with different layout styles controlled by MOS capacitor6
300 Mm sSOI engineering with ultra thin buried oxide6
Mitigating LeTID-Induced performance loss through high-frequency AC carrier injection: Architecture-dependent recovery trends in crystalline silicon solar cells6
Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method6
Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs6
Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics6
In-situ fluorine-doped ZnSnO thin film and thin-film transistor6
Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors6
Bias stress stabilities of PMMA-passivated indium-gallium-zinc-oxide thin-film transistors after 100 °C steam exposure6
A compact physical expression for the static drain current in heterojunction barrier CNTFETs6
Quantum simulations of MoS2 field effect transistors including contact effects6
Investigation of reconfigurable logic gate using integrated amorphous InGaZnO ReRAM and thin-film transistor6
Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures6
Editorial. Special issue. EUROSOI-ULIS 20236
A simple method for the photometric characterization of organic light-emitting diodes6
Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs6
Study of TiN/Ti/HfO2/W resistive switching devices: characterization and modeling of the set and reset transitions using an external capacitor discharge6
1540 V 21.8mΩ·cm2 4H-SiC lateral MOSFETs with DOUBLE RESURFs for power integration applications6
Simulation study on physical parameters ruling unipolar resistance switching of sputter-deposited silicon oxide film on Si substrate6
Precise channel temperature prediction in AlGaN/GaN HEMTs via closed-form empirical expression6
Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon6
Enhancement of IGZO TFT performance and reliability by controlling the N2/O2 annealing ambient6
Investigation on the performance limits of Dirac-source FETs6
Building robust machine learning force fields by composite Gaussian approximation potentials6
Influence of N-type substrate’s bias potential on electrical characteristics of 4H-SiC integrated devices for All-SiC ICs6
Surrogate models for device design using sample-efficient Deep Learning6
Investigating random discrete dopant-induced variability in cryogenic gate-all-around nanosheet FETs: A quantum transport simulation study6
Editorial Board6
Effect of Al2O3 on the operation of SiNX-based MIS RRAMs6
Modeling electrical resistivity of CrSi thin films6
Improving cell current in 3D NAND flash memory with fixed oxide charge6
Assessment of dual-oxide options for LDMOS transistors in FinFET technology6
Non-Quasi-Static modeling and methodology in fully depleted SOI MOSFET for L-UTSOI model6
A simulation methodology for superconducting qubit readout fidelity6
Evaluation of a single interface trap position on the low-frequency noise of junctionless nanowire transistors6
Unveiling the output conductance dynamics in Nanosheet FET: Does cryogenic temperature Make a Difference?6
Editorial to Letters from SISPAD-20226
An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs5
Effect of SOI substrate on silicon nitride resistance switching using MIS structure5
Hierarchical simulation of nanosheet field effect transistor: NESS flow5
Quantum element method for multi-dimensional nanostructures enabled by a projection-based learning algorithm5
Application of explainable AI on deep learning-based gate length scalable IV parameter extractor for BSIM-IMG5
Degradation mechanisms for static and dynamic characteristics in 1.2 kV 4H-SiC MOSFETs under repetitive short-circuit tests5
Analog resistive switching behavior in BiCoO3 thin film5
A simulation physics-guided neural network for predicting semiconductor structure with few experimental data5
Pursuing the FD-SOI roadmap down to 10 nm and 7 nm nodes for high energy efficient, low power and RF/mmWave applications5
Editorial Board5
WITHDRAWN: Analysis on effect of hot-carrier-induced degradation of NPT-IGBT5
Competition between heating and cooling during dynamic self-heating degradation of amorphous InGaZnO thin-film transistors5
Determination of source series resistances for InP HEMT under normal bias condition5
Computational model for predicting structural stability and stress transfer of a new SiGe stressor technique for NMOS devices5
Opportunity to achieve an efficient SiC/SiO2 interface N passivation by tuning the simultaneous oxidation modes during the SiC surface nitridation in N2 + O2 annealing5
On the role of power dissipation in the Post-BD behavior of FDSOI NanoWire FETs5
Comprehensive evaluation of torques in ultra-scaled MRAM devices5
Strong quantization of current-carrying electron states in δ-layer s5
GaN p-i-n ultraviolet photodetectors grown on homogenous GaN bulk substrates5
Nanoscale SOI strain engineering: STRASS-enabled local stress optimization5
Influence of temperature inhomogeneity and trap charge on current imbalance of SiC MOSFETs5
Mobility and intrinsic performance of silicon-based nanosheet FETs at 3 nm CMOS and beyond5
Impact of Device Layout on Self-Heating Extraction in MOSFETs5
Improvement of electrical performance in Normally-Off GaN MOSFET with regrown AlGaN layer on the Source/Drain region5
Analysis of back-gate bias impact on 22 nm FDSOI SRAM cell5
Corrigendum to “Modeling and simulations of FDSOI five-gate qubit MOS devices down to deep cryogenic temperatures” [Solid State Electron. 193 (2022) 108291]5
About electron transport and spin control in semiconductor devices5
Avalanche breakdown and quenching in Ge SPAD using 3D Monte Carlo simulation5
Spin-orbit torque magnetic tunnel junction based on 2-D materials: Impact of bias-layer on device performance5
Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions5
Design of auto-store circuit for nvSRAM with SONOS access transistor5
Efficient atomistic simulations of lateral heterostructure devices with metal contacts5
Editorial Board5
Geometrical and thermal effects on mobility and analog parameters of AlGaN/GaN HEMTs on silicon substrates5
Perovskite-based optoelectronic artificial synaptic thin-film transistor5
Experimental assessment of gate-induced drain leakage in SOI stacked nanowire and nanosheet nMOSFETs at high temperatures5
A mathematical model for non-equilibrium body potential of SOI Pseudo-MOS and physical mechanism analysis5
Improved self-heating extraction with RF technique at cryogenic temperatures5
Interface effects in ultra-scaled MRAM cells5
Modulation of ballistic injection velocity in phosphorene nanodevices by bias and confinement effects5
Evidence of trapping and electrothermal effects in vertical junctionless nanowire transistors4
Impact of the W etching process on the resistive switching properties of TiN/Ti/HfO2/W memristors4
Editorial Board4
A computational study of AlScN-based ferroelectric tunnel junction4
Deep spiking neural networks with integrate and fire neuron using steep switching device4
Stress management in freestanding membranes obtained by ion implantation induced delamination4
A well-conditioned surface potential equation for dynamically depleted SOI MOS devices accounting for the front-depletion/back-accumulation operation mode4
Device and circuit-level evaluation of a zero-cost transistor architecture developed via process optimization4
Switching layer optimization in Co-based CBRAM for >105 memory window in sub-100 µA regime4
Multi-state tunnel field effect transistor based on face tunneling with gate-source overlap4
One-step variation included compact modeling with conditional variational autoencoder4
Analysis of 1/f and G–R noise in Phosphorene FETs4
A novel method used to prepare PN junction by plasmon generated under pulsed laser irradiation on silicon chip4
Investigation of DC and low frequency noise parameters of junctionless GAA Si VNW pMOSFETs in the temperature range from 80 K to 340 K4
Enabling medium thick gate oxide devices in 22FDX® technology for switch and high-performance amplifier application4
Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation4
Editorial Board4
Design methodology of a 28 nm FD-SOI capacitive feedback RF LNA based on the ACM model and look-up tables4
The study on influence factors of contact properties of metal-MoS2 interfaces4
Silicon nitride resistance switching MIS cells doped with silicon atoms4
1T-DRAM with retrograde doping4
A novel methodology for neural compact modeling based on knowledge transfer4
An All-GaN cascode device with integrated plane-parallel capacitor with high dynamic breakdown voltage and high switching performance4
Editorial Board4
Pinning voltage model of vertical pinned photodiode for Dual-Pixel image sensor4
Thickness-dependent dielectric breakdown in thick amorphous SiO2 capacitors4
Impact of work function metal stacks on the performance and reliability of multi-V RMG CMOS technology4
An understanding of fracture kinetics during the layer transfer of InP4
Methodology for parameters extraction with undoped junctionless EZ-FETs4
A probabilistic compact model of ReRAM memories for accurate and high-performance simulation4
Editorial Board4
Monte Carlo analysis of hot electron injection in the passivation layer of GaN HEMTs4
Drain-bias dependence of low-frequency Y22 signals for Fe-related GaN traps in GaN HEMTs with different Fe doping concentrations4
Fine-tuning Cesium lead chloride perovskite field-effect transistors for sensing applications: Bridging numerical modeling and experimental validation4
Mechanism of polarization “Wake-Up” in ferroelectric Hafnia-Zirconia thin films4
Unveiling the mechanism behind the negative capacitance effect in Hf0.5Zr0.5O2-Based ferroelectric gate stacks and introducing a Circuit-Compatible hybrid compact model for Leakage-Aware NCFETs4
Temperature- and variability-aware compact modeling of ferroelectric FDSOI FET for memory and emerging applications4
Comparison of impact of channel length- and width-directional taper angle in nanosheet and forksheet FETs for 2 nm node and beyond4
Novel crossbar array of silicon nitride resistive memories on SOI enables memristor rationed logic4
Continual graph learning for physics-constrained CMOS transistor models4
Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications4
Approximate H-transformation for numerical stabilization of a deterministic Boltzmann transport equation solver based on a spherical harmonics expansion4
Improvement of instrumentation consistency using DUV filter in Spectroscopic Ellipsometry4
Effect of PN passivation on MOSFETs performance in 28 nm FD-SOI4
Influence of gate-source/drain overlap on FeFETs4
Efficient circuit simulation of a memristive crossbar array with synaptic weight variability4
Structural distortion in ferroelectric HfO2 – The factor that determines electric field-induced phase transformation4
Design and modeling of resonant tunneling transport-controlled voltage-induced double quantum dot channel nanowire field-effect-transistor (DQD-FET) for multi-threshold current levels4
Performance of FDSOI double-gate dual-doped reconfigurable FETs4
Simulation process flow for the implementation of industry-standard FD-SOI quantum dot devices4
Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs4
An efficient temperature dependent compact model for nanosheet FET for neuromorphic computing circuit4
Editorial Board4
Si/Ge1x4
Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET4
A composite model of memristors based on barrier and dopant drift mechanisms4
A dynamic current hysteresis model for IGZO-TFT4
Electron and spin transport in semiconductor and magnetoresistive devices4
Retention failure recovery technique for 3D TLC NAND flash memory via wordline (WL) interference4
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