Solid-State Electronics

Papers
(The TQCC of Solid-State Electronics is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-11-01 to 2024-11-01.)
ArticleCitations
Reconfigurable field effect transistors: A technology enablers perspective36
20 Years of reconfigurable field-effect transistors: From concepts to future applications35
Silicon photonics for terabit/s communication in data centers and exascale computers33
Trapping effects on AlGaN/GaN HEMT characteristics25
Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures20
Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET20
Coupled spin and charge drift-diffusion approach applied to magnetic tunnel junctions18
Compact modeling of 3D vertical junctionless gate-all-around silicon nanowire transistors towards 3D logic design17
Origin of Incremental Step Pulse Programming (ISPP) slope degradation in charge trap nitride based multi-layer 3D NAND flash16
Switching characteristic of fabricated nonvolatile bipolar resistive switching memory (ReRAM) using PEDOT: PSS/GO16
Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3–4 nm wide fins and 20 nm gate length for quantum computing applications16
Trade-off between interfacial charge and negative capacitance effects in the Hf-Zr-Al-O/Hf0.5Zr0.5O2 bilayer system16
Improving the barrier inhomogeneity of 4H-SiC Schottky diodes by inserting Al2O3 interface layer15
Effect of film thickness and temperature on the resistive switching characteristics of the Pt/HfO2/Al2O3/TiN structure15
CMOS back-end-of-line compatible ferroelectric tunnel junction devices15
Reliability of TCAD study for HfO2-doped Negative capacitance FinFET with different Material-Specific dopants15
Synthesis and characterization of ZnO nanoflowers by using simple spray pyrolysis technique15
Front and back channels coupling and transport on 28 nm FD-SOI MOSFETs down to liquid-He temperature14
Effects of oxygen gas in the sputtering process of the WO3 sensing layer on NO2 sensing characteristics of the FET-type gas sensor13
Carbon-based, all-inorganic, lead-free Ag2BiI5 rudorffite solar cells with high photovoltages13
A fast small signal modeling method for GaN HEMTs13
Barrier height tuning in Ti/4H-SiC Schottky diodes13
2.7-kV AlGaN/GaN Schottky barrier diode on silicon substrate with recessed-anode structure13
Performance enhancement for AlGaN/GaN HEMTs with dual discrete field-plate12
Relaxing non-volatility for energy-efficient DMTJ based cryogenic STT-MRAM12
Negative differential resistance in novel nanoscale devices12
High-quality remote plasma enhanced atomic layer deposition of aluminum oxide thin films for nanoelectronics applications12
Metal-organic framework (MOF)/reduced graphene oxide (rGO) composite for high performance CO sensor12
Effects of La and Ni doping on ferroelectric and photocatalytic properties of Aurivillius Bi7Ti3Fe3O2112
Dispersed and spherically assembled porous NiO nanosheets for low concentration ammonia gas sensing applications12
A triboelectric nanogenerator based on white sugar for self-powered humidity sensor12
Small signal model and analog performance analysis of negative capacitance FETs11
New challenges of printed high-к oxide dielectrics11
SPICE modeling of cycle-to-cycle variability in RRAM devices10
Hydrothermally formed copper oxide (CuO) thin films for resistive switching memory devices10
Assessing the Effect of Scaling High-Aspect-Ratio ISFET with Physical Model Interface for Nano-Biosensing Application10
Life-time degradation of STT-MRAM by self-heating effect with TDDB model10
On-chip adaptive matching learning with charge-trap synapse device and ReLU activation circuit10
Technology of sub-100 nm InAlN/GaN HEMTs on silicon with suppressed leakage current10
STT-MTJ Based Smart Implication for Energy-Efficient Logic-in-Memory Computing10
Ab initio quantum transport simulations of monolayer GeS nanoribbons10
Impact of plasma induced damage on the fabrication of 3D NAND flash memory9
Accurate statistical extraction of AlGaN/GaN HEMT device parameters using the Y-function9
Ruthenium doped Ge2Sb2Te5 nanomaterial as fast speed phase-change materials with good thermal stability9
Diamond Schottky p-i-n diodes for high power RF receiver protectors9
III-V-on-Si transistor technologies: Performance boosters and integration9
Low frequency noise performance of horizontal, stacked and vertical silicon nanowire MOSFETs9
Lambert-W function-based parameter extraction for FDSOI MOSFETs down to deep cryogenic temperatures9
Effect of high temperature irradiation with 15 MeV protons on characteristics of power SiC Schottky diodes8
Correlation of natural honey-based RRAM processing and switching properties by experimental study and machine learning8
Thermal annealing behavior of InP-based HEMT damaged by proton irradiation8
Modeling thermal effects in STT-MRAM8
TCAD simulations of FDSOI devices down to deep cryogenic temperature8
Highly-efficient OLED with cesium fluoride electron injection layer8
MoS2-based multiterminal ionic transistor with orientation-dependent STDP learning rules8
Introducing effective temperature into Arrhenius equation with Meyer-Neldel rule for describing both Arrhenius and non-Arrhenius dependent drain current of amorphous InGaZnO TFTs8
Fully vacuum-free large-area organic solar cell fabrication from polymer top electrode8
Ferroelectric FDSOI FET modeling for memory and logic applications8
Simplified electrical modeling for dye sensitized solar cells: Influences of the blocking layer and chenodeoxycholic acid additive8
TCAD and EM co-simulation method to verify SiGe HBT measurements up to 500 GHz8
Negative capacitance enables GAA scaling VDD to 0.5 V8
Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices7
A generalized EKV charge-based MOSFET model including oxide and interface traps7
Bionic artificial synaptic floating gate transistor based on MXene7
A low-power nanoelectromechanical (NEM) device with Al-doped HfO2-based ferroelectric capacitor7
Performances of perovskite solar cells at low-intensity light irradiation7
Single and triple insulator Metal-Insulator-Metal diodes for infrared rectennas7
Improved fabrication of fully-recessed normally-off SiN/SiO2/GaN MISFET based on the self-terminated gate recess etching technique7
Effect of organic solvent vapor treatment on transistor performance and contact resistance of copper phthalocyanine based organic field-effect transistors7
Current annealing to improve drain output performance of β-Ga2O3 field-effect transistor7
SPICE compatible semi-empirical compact model for ferroelectric hysteresis7
Thickness dependence of dielectric properties in sub-nanometric Al2O3/ZnO laminates7
Semi-classical transport in MoS2 and MoS2 transistors by a Monte Carlo approach7
Evidence of ferroelectric HfO2 phase transformation induced by electric field cycling observed at a macroscopic scale7
CARAT – A reliability analysis framework for BTI-HCD aging in circuits7
Study of RTN signals in resistive switching devices based on neural networks7
Effect of SOI substrate on silicon nitride resistance switching using MIS structure7
Charge-based modeling of ultra narrow junctionless cylindrical nanowire FETs7
Enhancing the temporal response of modified porous silicon-based CO gas sensor7
Deriving a novel methodology for nano-BioFETs and analysing the effect of high-k oxides on the amino-acids sensing application7
Combined effects of NH3 and NF3 post plasma treatment on the performance of spray coated ZnO thin film transistors7
Performance variation of solution-processed memristor induced by different top electrode7
Double Reference Layer STT-MRAM Structures with Improved Performance7
DFT-based layered dielectric model of few-layer MoS27
Architecture optimization of SPAD integrated in 28 nm FD-SOI CMOS technology to reduce the DCR6
Improved interface characteristics of Mo/4H-SiC schottky contact6
Temperature increase in STT-MRAM at writing: A fully three-dimensional finite element approach6
Simulation study of Fermi level depinning in metal-MoS2 contacts6
Thermal cross-coupling effects in side-by-side UTBB-FDSOI transistors6
Extraction of effective mobility of In Ga As/In Al As quantum well high-electron-mobility transistors on InP substrate6
Gate dielectric material influence on DC behavior of MO(I)SHEMT devices operating up to 150 °C6
Characterization of fully silicided source/drain SOI UTBB nMOSFETs at cryogenic temperatures6
Comprehensive Kubo-Greenwood modelling of FDSOI MOS devices down to deep cryogenic temperatures6
Harnessing the unique features of FDSOI CMOS technology in fibreoptic, millimetre-wave, and quantum computing circuits from 2 K to 400 K6
Crystalline insulators for scalable 2D nanoelectronics6
Hierarchical modeling for TCAD simulation of short-channel 2D material-based FETs6
Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures6
Custom measurement system for memristor characterisation6
Effective control of filament efficiency by means of spacer HfAlOx layers and growth temperature in HfO2 based ReRAM devices6
Combination of selective area sublimation of p-GaN and regrowth of AlGaN for the co-integration of enhancement mode and depletion mode high electron mobility transistors6
High performance InGaAs channel MOSFETs on highly resistive InAlAs buffer layers6
Light-induced nonvolatile resistive switching in Cs0.15FA0.85PbI3-XBrX perovskite-based memristors6
A simple method for the photometric characterization of organic light-emitting diodes6
Influence of variability on the performance of HfO2 memristor-based convolutional neural networks6
Engineering of metal-MoS2 contacts to overcome Fermi level pinning6
Nitrogen rich PECVD silicon nitride for passivation of Si and AlGaN/GaN HEMT devices6
Applicability of Sc2O3 versus Al2O3 in MIM rectifiers for IR rectenna6
Addressing source to drain tunneling in extremely scaled Si-transistors using negative capacitance6
Study of the set and reset transitions in HfO2-based ReRAM devices using a capacitor discharge6
Cryogenic characteristics of UTBB SOI Schottky-Barrier MOSFETs6
Interpretation of 28 nm FD-SOI quantum dot transport data taken at 1.4 K using 3D quantum TCAD simulations5
Structure evolution and charge hysteresis in buried Hafnia-Alumina oxides5
Demonstration of an n-ZnO/p-Si/n-Si heterojunction bipolar phototransistor for X-ray detection5
Implementation of device-to-device and cycle-to-cycle variability of memristive devices in circuit simulations5
Calculation of the mobility in Al2O3/GaN electron channel: Effect of p-doping and comparison with experiments5
Poly(V3D3), an iCVD polymer with promising dielectric properties for high voltage capacitors5
Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model5
Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies5
Ultra-low turn-on voltage quasi-vertical GaN Schottky barrier diode with homogeneous barrier height5
Investigation of electrical characteristics of flexible CMOS devices fabricated with thickness-controlled spalling process5
Pragmatic Z2-FET compact model including DC and 1T-DRAM memory operation5
Breaking the subthreshold slope limit in MOSFETs5
Parasitic oscillation in the low-frequency noise characterization of solar cells5
Performance of FDSOI double-gate dual-doped reconfigurable FETs5
Stochastic multiscale model for HfO2-based resistive random access memories with 1T1R configuration5
The core-shell junctionless MOSFET5
Drift of the sensitive direction of Hall-effect devices in (1 0 0)-silicon caused by mechanical shear stress5
Ab initio study of electron mobility in V25
Piezoelectric microsensor for selective detection of low concentrations of ammonia5
Monte Carlo analysis of thermal effects in the DC and AC performance of AlGaN/GaN HEMTs5
Insights into few-atom conductive bridging random access memory cells with a combined force-field/ab initio scheme5
Understanding conditions for the single electron regime in 28 nm FD-SOI quantum dots: Interpretation of experimental data with 3D quantum TCAD simulations5
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions5
Enhanced statistical detection of random telegraph noise in frequency and time domain5
Palladium selenide as cathode for dye-sensitized solar cell: Effect of palladium content5
A novel methodology for neural compact modeling based on knowledge transfer5
Analog performance of GaN/AlGaN high-electron-mobility transistors5
High-resistivity silicon-based substrate using buried PN junctions towards RFSOI applications5
Physical parameters based analytical I-V model of long and short channel a-IGZO TFTs5
An integrate-and-fire neuron with capacitive trans-impedance amplifier for improving linearity in Spiking Neural Networks5
A polylogarithmic model for thin-film transistors used in a CMOS inverter amplifier4
Influence of AlGaN n-type doping and AlN thickness on the two-dimensional electron gas density (ns) and resistance (R2DEG)4
Investigating interface states and oxide traps in the MoS2/oxide/Si system4
Modeling of forward gate leakage current for normally off pGaN/AlGaN/GaN HEMTs4
A novel SOI-LDMOS with field plate auxiliary doping layer that has improved breakdown voltage4
Structural design and experimental analysis for AlN Lamb-wave resonators with different electrical boundary conditions4
Parasitic parameters extraction of InP HBT only from S-parameters measured under cut-off and normal bias conditions4
Demonstration of integrate-and-fire neuron circuit for spiking neural networks4
Channel doping effects in negative capacitance field-effect transistors4
Barium titanate nanorods on micro-machined silicon substrate for performance enhancement of piezoelectric Nanogenerators (NGs)4
Characterization and compact modeling of short channel MOSFETs at cryogenic temperatures4
Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs4
Influence of interface traps density and temperature variation on the NBTI effect in p-Type junctionless nanowire transistors4
Thickness-dependent dielectric breakdown in thick amorphous SiO2 capacitors4
Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO44
Design of RRAM with high storage capacity and high reliability for IoT applications4
Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors4
Study of parasitic oscillation of a multi-chip SiC MOSFET circuit based on a signal flow graph model by TCAD simulation4
Anomalous increase of leakage current in epoxy moulding compounds under wet conditions4
Mechanism of Proton-Induced electrical degradation of AlGaN/GaN high electron mobility transistors4
Low-temperature deuterium annealing to improve performance and reliability in a MOSFET4
Superiority of core–shell junctionless FETs4
Analysis of the performance of Nb2O5-doped SiO2-based MIM devices for memory and neural computation applications4
Analysis of 1/f and G–R noise in Phosphorene FETs4
CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging4
An extended-temperature I-V model for GaN HEMTs4
Assessment of paper-based MoS2 FET for Physically Unclonable Functions4
All inorganic and transparent ITO/boehmite/ITO structure by one-step synthesis method for flexible memristor4
Image-force barrier lowering in top- and side-contacted two-dimensional materials4
Mobility degradation in 4H-SiC MOSFETs and interfacial formation of carbon clusters4
Continuous and symmetric trans-capacitance compact model for triple-gate junctionless MOSFETs4
Electrical characteristics of n-type vertically stacked nanowires operating up to 600 K4
Hierarchical Mixture-of-Experts approach for neural compact modeling of MOSFETs4
Impact of CVD chemistry on band alignment at the MoS2/SiO2 interface4
Phase-change memory electro-thermal analysis and engineering thanks to enhanced thermal confinement4
Modeling of SPAD avalanche breakdown probability and jitter tail with field lines4
Detailed electrical characterization of 200 mm CMOS compatible GaN/Si HEMTs down to deep cryogenic temperatures4
Modeling OFF-state harmonics in MOS transistors used as RF switches4
Efficient atomistic simulations of lateral heterostructure devices with metal contacts4
A simple test structure for the electrical characterization of front and back channels for advanced SOI technology development4
Stochastic based compact model to predict highly variable electrical characteristics of organic CBRAM devices4
Heat sink implementation in back-end of line for self-heating reduction in 22 nm FDSOI MOSFETs4
Small-signal behavioral-level modeling of InP HBT based on SO-BP neural network4
A comprehensive analysis of AlN spacer and AlGaN n-doping effects on the 2DEG resistance in AlGaN/AlN/GaN heterostructures4
Reliability improvement of self-heating effect, hot-carrier injection, and on-current variation by electrical/thermal co-design4
Anodic tantalum: Fabrication, breakdown characteristics of capacitor and integration with a WSe2 field effect transistor4
On noise-induced transient bit flips in subthreshold SRAM4
A low cost and simple structured WOLED device based on exciplex host and full fluorescent materials4
A dynamic current hysteresis model for IGZO-TFT4
A physics-based TCAD framework for NBTI4
Demonstration and characterization of 500 V MIM capacitor with Al2O3 dielectric layer for power integrated circuits4
Cryogenic characterization and modeling of a CMOS floating-gate device for quantum control hardware4
On the feasibility of DoS-engineering for achieving sub-60 mV subthreshold slope in MOSFETs4
PECVD SiNx passivation for AlGaN/GaN HFETs with ultra-thin AlGaN barrier4
Recovering the carrier number conservation in SPICE simulation of PIN diodes and IGBT devices4
Finite element modeling of spin–orbit torques4
Surrogate models for device design using sample-efficient Deep Learning4
Role of temperature, MTJ size and pulse-width on STT-MRAM bit-error rate and backhopping4
Versatile experimental setup for FTJ characterization4
Robust cryogenic ab-initio quantum transport simulation for LG = 10 nm nanowire4
Stochastic switching of memristors and consideration in circuit simulation4
A simulation physics-guided neural network for predicting semiconductor structure with few experimental data4
Exploiting the KPFM capabilities to analyze at the nanoscale the impact of electrical stresses on OTFTs properties4
Thin-film transistor accumulation-mode modeling4
0.051838874816895