Solid-State Electronics

Papers
(The TQCC of Solid-State Electronics is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-09-01 to 2025-09-01.)
ArticleCitations
Accurate statistical extraction of AlGaN/GaN HEMT device parameters using the Y-function68
An enzymatic glucose biosensor using the BESOI MOSFET51
Design and verification of a hybrid electrostatic discharge model for Gate-Controlled silicon controlled rectifier26
The mechanism of the enhanced intensity for polarization Coulomb field scattering in AlN/GaN heterostructure field effect transistors with submicron gate length24
Understanding the impact of split-gate LDMOS transistors: Analysis of performance and hot-carrier-induced degradation23
Si nanowire-based micro-capacitors fabricated with metal assisted chemical etching for integrated energy storage applications23
Non-local transport effects in semiconductors under low-field conditions21
Low power consumption of non-volatile memory device by tunneling process engineering20
Smart-CX – Method of extraction of parasitic capacitances in ICs20
Tailoring the optoelectronic properties of PZT through the modulation of the thin film19
Editorial Board19
Editorial Board19
Electrical instabilities in amorphous Si-Zn-sn-O thin film transistors under ultra-violet irradiation depending on oxygen content19
Engineering the contact resistance of copper/copper oxide via inserting a mediated molybdenum trioxide layer19
Analog behavior of V-FET operating in forward and reverse mode18
A polylogarithmic model for thin-film transistors used in a CMOS inverter amplifier18
Compact I-V model for back-gated and double-gated TMD FETs18
Experimental study of thermal coupling effects in FD-SOI MOSFET16
Impedance sensors based on silicon-carbon films for detection low concentrations of organic vapors14
Negative capacitance field-effect transistor with hetero-dielectric structure for suppression of reverse drain induced barrier lowering14
On the asymmetry of the DC and low-frequency noise characteristics of vertical nanowire MOSFETs with bulk source contact14
Analytical model based estimation of line edge roughness induced V<13
Editorial Board13
Robustness of using degree of match in performing analog multiplication with spin-torque oscillators13
Novel Y-function methodology parameter estimation from weak to strong inversion operation13
Ab initio study of electron mobility in V213
Analysis of a Hall-Corbino disk plate having a point current source at the center13
An ultra low power spiking neural encoder of microwave signals12
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing12
Extraction of small-signal equivalent circuit for de-embedding of 3D vertical nanowire transistor12
Electron mobility distribution in FD-SOI MOSFETs using a NEGF-Poisson approach12
Electron-phonon calculations using a Wannier-based supercell approach: Applications to the monolayer MoS12
Detailed electrical characterization of 200 mm CMOS compatible GaN/Si HEMTs down to deep cryogenic temperatures12
Mechanisms of negative bias instability of commercial SiC MOSFETs observed by current transients12
Thermal cross-coupling effects in side-by-side UTBB-FDSOI transistors12
Impact of substrate resistivity on spiral inductors at mm-wave frequencies12
TCAD-Based RF performance prediction and process optimization of 3D monolithically stacked complementary FET11
Quantum capacitance transient phenomena in high-k dielectric armchair graphene nanoribbon field-effect transistor model11
Editorial Board11
An implicit analytical surface potential based model for long channel symmetric double-gate MOSFETs accounting for oxide and interface trapped charges11
28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling11
Pragmatic OxRAM compact model ready to use for design studies11
Curvature based feature detection for hierarchical grid refinement in TCAD topography simulations11
Editorial Board11
A unified 2-D model for nanowire junctionless accumulation and inversion mode MOSFET in quasi-ballistic regime10
Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures10
Self-similar reconfigurable low-pass MEMS filters using coplanar waveguide based on silicon10
Optimized emitter-base interface cleaning for advanced Heterojunction Bipolar Transistors10
Editorial Board10
C-V measurement and modeling of double-BOX Trap-Rich SOI substrate10
Impact of the leakage current of an AND-type synapse array on spiking neural networks10
Modeling of the degradation of CMOS inverters under pulsed stress conditions from ‘on-the-fly’ measurements10
Editorial Board10
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets10
Double Reference Layer STT-MRAM Structures with Improved Performance10
On the noise-sensitivity of entangling quantum logic operations implemented with a semiconductor quantum dot platform10
Thermal annealing behavior of InP-based HEMT damaged by proton irradiation9
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise9
Compact modeling of photonic devices in Verilog-A for integrated circuit design9
Performance potential of transistors based on tellurium nanowire arrays: A quantum transport study9
Reactive sputtering deposited α-MoO3 thin films for forming-free resistive random-access memory9
Equivalence of proton-induced displacement damage in InP-based HEMT9
Editorial Board9
The impact of electron phonon scattering on transport properties of topological insulators: A first principles quantum transport study9
Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model9
TCAD-based design and verification of the components of a 200 V GaN-IC platform9
Graph-based Compact Modeling (GCM) of CMOS transistors for efficient parameter extraction: A machine learning approach9
Thermal coupling between FD-SOI FETs at cryogenic temperatures9
Stability and Vmin<9
The core-shell junctionless MOSFET9
Suppression of de-trapping by remanent polarization in dual-mechanism flash memory8
Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET8
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K8
A wireless stimulator system-on-chip with an optically writable ID for addressable cortical microimplants8
Estimation of the emission characteristics of solid-state incandescent light emitting devices by linear regression of spectral radiance8
Preparation and electrical characteristics of transparent thin film transistors with sputtered aluminum and phosphorus co-doped indium-zinc-oxide channel layer8
Corrigendum to “In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets” [Solid-State Electron. 201(2023) 10859]8
Hierarchical Mixture-of-Experts approach for neural compact modeling of MOSFETs8
Electrical characteristics of n-type vertically stacked nanowires operating up to 600 K8
Design of a NMOS-triggered SCR for dual-direction low-voltage ESD protection8
Understanding negative capacitance physical mechanism in organic ferroelectric capacitor8
Performance of flexible In0.7Ga0.3As MOSFETs by utilizing liquid polyimide (LPI) transfer with effective mobility of 3,667 cm2/V-s8
A multi-energy level agnostic approach for defect generation during TDDB stress8
3D (micro/nano) CdO/p-Si co-doped Zn and La heterojunctions perform as solar light photodetectors8
Recovering the carrier number conservation in SPICE simulation of PIN diodes and IGBT devices8
Editorial Board8
Sensitivity implications for programmable transistor based 1T-DRAM8
Switching limits of top-gated carbon nanotube field-effect transistors8
An improved subthreshold swing expression accounting for back-gate bias in FDSOI FETs8
Impacts of trench angle on the performance of trench super-junction vertical double-diffused metal-oxide-semiconductor8
A novel SOI-LDMOS with field plate auxiliary doping layer that has improved breakdown voltage7
Sensing performance of Ti/TiO2 nanosheets/Au capacitive device: Implication of resonant frequency7
Combined effects of NH3 and NF3 post plasma treatment on the performance of spray coated ZnO thin film transistors7
Improved electrical performance of InAlN/GaN high electron mobility transistors with forming gas annealing7
Enhanced linearity of AlGaN/GaN HEMTs via dual-gate configuration for RF amplifier applications7
Editorial to Letters from SISPAD-20227
Demonstration of an n-ZnO/p-Si/n-Si heterojunction bipolar phototransistor for X-ray detection7
Building robust machine learning force fields by composite Gaussian approximation potentials7
Effects of electrode materials on solution-processed polyvinylidene fluoride-based piezoelectric nanogenerators: Do they matter?7
Theoretical study of extreme ultraviolet pellicles with nanometer thicknesses7
Hydrothermally formed copper oxide (CuO) thin films for resistive switching memory devices7
An eco-friendly bandgap engineering of semiconductor graphene oxide7
Non-uniform matching performances in mesa-isolated SOI MOSFETs7
Express method of electro-physical parameters extraction for power Schottky diodes7
Investigation of the anomalous effect of the AC-signal frequency on flat-band voltage of Al/HfO2/SiO2/Si structures7
Inversion layer electron mobility distribution in fully-depleted silicon-on-insulator MOSFETs7
Implementation of device-to-device and cycle-to-cycle variability of memristive devices in circuit simulations7
Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation7
TCAD numerical modeling of negative capacitance ferroelectric devices for radiation detection applications7
MoS2-based multiterminal ionic transistor with orientation-dependent STDP learning rules7
Palladium selenide as cathode for dye-sensitized solar cell: Effect of palladium content7
Extraction of effective mobility of In Ga As/In Al As quantum well high-electron-mobility transistors on InP substrate7
Bias stress stabilities of PMMA-passivated indium-gallium-zinc-oxide thin-film transistors after 100 °C steam exposure7
A compact physical expression for the static drain current in heterojunction barrier CNTFETs7
Unified RTN and BTI statistical compact modeling from a defect-centric perspective7
A simple method for the photometric characterization of organic light-emitting diodes6
Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs6
Simulation of low frequency noise in buried-channel MOSFET by a Green’s function-based numerical trap level model6
Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence6
Precise channel temperature prediction in AlGaN/GaN HEMTs via closed-form empirical expression6
Editorial Board6
Synaptic array using multi-level AND flash memory cells for hardware-based neural networks6
Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon6
Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs6
Study of TiN/Ti/HfO2/W resistive switching devices: characterization and modeling of the set and reset transitions using an external capacitor discharge6
Investigating random discrete dopant-induced variability in cryogenic gate-all-around nanosheet FETs: A quantum transport simulation study6
Editorial. Special issue. EUROSOI-ULIS 20236
Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors6
Editorial Board6
Influence of fin width variation on the electrical characteristics of n-type junctionless nanowire transistors at high temperatures6
Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures6
In-situ fluorine-doped ZnSnO thin film and thin-film transistor6
CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging6
Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3–4 nm wide fins and 20 nm gate length for quantum computing applications6
Improving cell current in 3D NAND flash memory with fixed oxide charge6
Modelling of self-heating effect in FDSOI and bulk MOSFETs operated in deep cryogenic conditions6
1540 V 21.8mΩ·cm2 4H-SiC lateral MOSFETs with DOUBLE RESURFs for power integration applications6
Analysis of the performance of Nb2O5-doped SiO2-based MIM devices for memory and neural computation applications6
Effect of Al2O3 on the operation of SiNX-based MIS RRAMs6
A simulation methodology for superconducting qubit readout fidelity6
Sub micro-accelerometer based on spintronic technology: A design optimization6
Simulation study on physical parameters ruling unipolar resistance switching of sputter-deposited silicon oxide film on Si substrate6
Boosting the electrical performance of solar cells by using PIN diode structure with different layout styles controlled by MOS capacitor6
Surrogate models for device design using sample-efficient Deep Learning6
Investigation of reconfigurable logic gate using integrated amorphous InGaZnO ReRAM and thin-film transistor6
Poisson-Schrödinger simulation and analytical modeling of inversion charge in FDSOI MOSFET down to 0 K – Towards compact modeling for cryo CMOS application6
Modeling electrical resistivity of CrSi thin films6
Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method6
Non-Quasi-Static modeling and methodology in fully depleted SOI MOSFET for L-UTSOI model6
Corrigendum to “Modeling and simulations of FDSOI five-gate qubit MOS devices down to deep cryogenic temperatures” [Solid State Electron. 193 (2022) 108291]5
Fabrication and modelling of MInM diodes with low turn-on voltage5
A differential OTP memory based highly unique and reliable PUF at 180 nm technology node5
Improvement of electrical performance in Normally-Off GaN MOSFET with regrown AlGaN layer on the Source/Drain region5
On the breakdown voltage temperature dependence of high-voltage power diodes passivated with diamond-like carbon5
Editorial Board5
On the role of power dissipation in the Post-BD behavior of FDSOI NanoWire FETs5
Reliable parameter extraction method applied to an enhanced GaN HEMT small-signal model5
Spin-orbit torque magnetic tunnel junction based on 2-D materials: Impact of bias-layer on device performance5
Impact of post metallization annealing (PMA) on the electrical properties of Ge nMOSFETs with ZrO2 dielectric5
Analog resistive switching behavior in BiCoO3 thin film5
An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs5
Analysis of back-gate bias impact on 22 nm FDSOI SRAM cell5
Comprehensive evaluation of torques in ultra-scaled MRAM devices5
Addressing source to drain tunneling in extremely scaled Si-transistors using negative capacitance5
Efficient atomistic simulations of lateral heterostructure devices with metal contacts5
Stochastic based compact model to predict highly variable electrical characteristics of organic CBRAM devices5
Modeling current and voltage peaks generation in complementary resistive switching devices5
Strong quantization of current-carrying electron states in δ-layer s5
Avalanche breakdown and quenching in Ge SPAD using 3D Monte Carlo simulation5
Perovskite-based optoelectronic artificial synaptic thin-film transistor5
Analysis on effect of hot-carrier-induced degradation of NPT-IGBT5
Switching layer optimization in Co-based CBRAM for >105 memory window in sub-100 µA regime5
Enabling medium thick gate oxide devices in 22FDX® technology for switch and high-performance amplifier application5
Design of auto-store circuit for nvSRAM with SONOS access transistor5
Influence of temperature inhomogeneity and trap charge on current imbalance of SiC MOSFETs5
GaN p-i-n ultraviolet photodetectors grown on homogenous GaN bulk substrates5
Degradation mechanisms for static and dynamic characteristics in 1.2 kV 4H-SiC MOSFETs under repetitive short-circuit tests5
Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides5
Computational model for predicting structural stability and stress transfer of a new SiGe stressor technique for NMOS devices5
Layout dependent hot-carrier-injection-induced pLDMOS degradation from a non-destructive characterization viewpoint5
Opportunity to achieve an efficient SiC/SiO2 interface N passivation by tuning the simultaneous oxidation modes during the SiC surface nitridation in N2 + O2 annealing5
Effect of SOI substrate on silicon nitride resistance switching using MIS structure5
Editorial Board5
Interface effects in ultra-scaled MRAM cells5
Quantum element method for multi-dimensional nanostructures enabled by a projection-based learning algorithm5
Competition between heating and cooling during dynamic self-heating degradation of amorphous InGaZnO thin-film transistors5
Determination of source series resistances for InP HEMT under normal bias condition5
About electron transport and spin control in semiconductor devices5
Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions5
Design methodology of a 28 nm FD-SOI capacitive feedback RF LNA based on the ACM model and look-up tables5
Opportunity for band alignment manipulation of perovskite oxide stacks by interfacial dipole layer formation5
Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures5
Experimental assessment of gate-induced drain leakage in SOI stacked nanowire and nanosheet nMOSFETs at high temperatures5
Deep insights on new embedded resistance and gated diode on thin film silicon BIMOS device with and without external polysilicon resistance for advanced ESD protection in FD-SOI technology5
Modulation of ballistic injection velocity in phosphorene nanodevices by bias and confinement effects5
One-step variation included compact modeling with conditional variational autoencoder5
Current annealing to improve drain output performance of β-Ga2O3 field-effect transistor5
Editorial Board5
A simulation physics-guided neural network for predicting semiconductor structure with few experimental data5
Hierarchical simulation of nanosheet field effect transistor: NESS flow5
Improved self-heating extraction with RF technique at cryogenic temperatures5
Si/Ge1x4
Investigation of effects of lateral boundary conditions on current filament movements in Trench-Gate IGBTs4
Drain-bias dependence of low-frequency Y22 signals for Fe-related GaN traps in GaN HEMTs with different Fe doping concentrations4
Editorial Board4
SPICE simulation of the time-dependent clustering model for dielectric breakdown4
Pinning voltage model of vertical pinned photodiode for Dual-Pixel image sensor4
Role of temperature, MTJ size and pulse-width on STT-MRAM bit-error rate and backhopping4
Analysis of 1/f and G–R noise in Phosphorene FETs4
The study on influence factors of contact properties of metal-MoS2 interfaces4
Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs4
Impact of the W etching process on the resistive switching properties of TiN/Ti/HfO2/W memristors4
Multi-state tunnel field effect transistor based on face tunneling with gate-source overlap4
Interface traps density extraction through transient measurements in junctionless transistors4
Study of ISFET for KCl sensing4
Crystalline insulators for scalable 2D nanoelectronics4
Fine-tuning Cesium lead chloride perovskite field-effect transistors for sensing applications: Bridging numerical modeling and experimental validation4
DC and low a frequency noise analysis of p channel gate all around vertically stacked silicon nanosheets4
Silicon nitride resistance switching MIS cells doped with silicon atoms4
Post-deposition annealing challenges for ALD Al0.5Si0.5Ox/n-GaN MOS devices4
A composite model of memristors based on barrier and dopant drift mechanisms4
Structural distortion in ferroelectric HfO2 – The factor that determines electric field-induced phase transformation4
Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET4
Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications4
Evidence of trapping and electrothermal effects in vertical junctionless nanowire transistors4
Stress management in freestanding membranes obtained by ion implantation induced delamination4
A well-conditioned surface potential equation for dynamically depleted SOI MOS devices accounting for the front-depletion/back-accumulation operation mode4
Performance of FDSOI double-gate dual-doped reconfigurable FETs4
High-quality remote plasma enhanced atomic layer deposition of aluminum oxide thin films for nanoelectronics applications4
Switching characteristic of fabricated nonvolatile bipolar resistive switching memory (ReRAM) using PEDOT: PSS/GO4
Improved interface characteristics of Mo/4H-SiC schottky contact4
Effects of oxygen gas in the sputtering process of the WO3 sensing layer on NO2 sensing characteristics of the FET-type gas sensor4
Improvement of instrumentation consistency using DUV filter in Spectroscopic Ellipsometry4
Influence of gate-source/drain overlap on FeFETs4
Analog characteristics of n-type vertically stacked nanowires4
Efficient circuit simulation of a memristive crossbar array with synaptic weight variability4
Semi-classical transport in MoS2 and MoS2 transistors by a Monte Carlo approach4
Deep spiking neural networks with integrate and fire neuron using steep switching device4
Interconnect effects on thermal resistance of CMOS-SOI transistors in microwave power integrated circuits4
Approximate H-transformation for numerical stabilization of a deterministic Boltzmann transport equation solver based on a spherical harmonics expansion4
Novel crossbar array of silicon nitride resistive memories on SOI enables memristor rationed logic4
Improved inter-device variability in graphene liquid gate sensors by laser treatment4
Impact of work function metal stacks on the performance and reliability of multi-V RMG CMOS technology4
Electron and spin transport in semiconductor and magnetoresistive devices4
A dynamic current hysteresis model for IGZO-TFT4
Pseudo-MOSFET transient behavior: Experiments, model, substrate and temperature effect4
Discontinuous Galerkin concept for Quantum-Liouville type equations4
Editorial Board4
Investigation of DC and low frequency noise parameters of junctionless GAA Si VNW pMOSFETs in the temperature range from 80 K to 340 K4
Low-Frequency noise investigation of AlGaN/GaN high-electron-mobility transistors4
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