Solid-State Electronics

Papers
(The TQCC of Solid-State Electronics is 4. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-12-01 to 2025-12-01.)
ArticleCitations
Tailoring the optoelectronic properties of PZT through the modulation of the thin film75
Smart-CX – Method of extraction of parasitic capacitances in ICs52
The mechanism of the enhanced intensity for polarization Coulomb field scattering in AlN/GaN heterostructure field effect transistors with submicron gate length28
Negative capacitance field-effect transistor with hetero-dielectric structure for suppression of reverse drain induced barrier lowering25
An enzymatic glucose biosensor using the BESOI MOSFET25
Electrical instabilities in amorphous Si-Zn-sn-O thin film transistors under ultra-violet irradiation depending on oxygen content24
Numerical investigation of effect of Si separator in bottom dielectric isolation forksheet FETs via in-house TCAD process emulator and device simulator23
3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces22
Si nanowire-based micro-capacitors fabricated with metal assisted chemical etching for integrated energy storage applications21
Engineering the contact resistance of copper/copper oxide via inserting a mediated molybdenum trioxide layer21
Editorial Board20
Non-local transport effects in semiconductors under low-field conditions19
Editorial Board19
Design and verification of a hybrid electrostatic discharge model for Gate-Controlled silicon controlled rectifier18
Experimental study of thermal coupling effects in FD-SOI MOSFET18
A polylogarithmic model for thin-film transistors used in a CMOS inverter amplifier18
Low power consumption of non-volatile memory device by tunneling process engineering17
Nanowire behavior under the influence of Polyoxometalates: A Comparative study of depletion and enhancement modes16
On the asymmetry of the DC and low-frequency noise characteristics of vertical nanowire MOSFETs with bulk source contact16
Extraction of trap densities in Al:HfO 15
Analog behavior of V-FET operating in forward and reverse mode14
Compact I-V model for back-gated and double-gated TMD FETs14
Analysis of a Hall-Corbino disk plate having a point current source at the center13
Impedance sensors based on silicon-carbon films for detection low concentrations of organic vapors13
Editorial Board13
Modeling of tunneling through Schottky barriers13
An ultra low power spiking neural encoder of microwave signals12
Impact of substrate resistivity on spiral inductors at mm-wave frequencies12
Mechanisms of negative bias instability of commercial SiC MOSFETs observed by current transients12
Self-aligned nitrogen doping via plasma treatment of NiO/β-Ga2O3 heterojunction diodes12
Spatially resolved ionization current measurements using an active-matrix transimpedance amplifier array12
Electron mobility distribution in FD-SOI MOSFETs using a NEGF-Poisson approach12
Analytical model based estimation of line edge roughness induced V<12
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing12
Study of RRAM devices with PECVD silicon-oxide resistive switching layer11
Extraction of small-signal equivalent circuit for de-embedding of 3D vertical nanowire transistor11
Novel Y-function methodology parameter estimation from weak to strong inversion operation11
Temperature-dependence of current gain and turn-on voltages of GaAs-based HBTs with different base layers grown by MOCVD11
An implicit analytical surface potential based model for long channel symmetric double-gate MOSFETs accounting for oxide and interface trapped charges11
Detailed electrical characterization of 200 mm CMOS compatible GaN/Si HEMTs down to deep cryogenic temperatures11
3D (micro/nano) CdO/p-Si co-doped Zn and La heterojunctions perform as solar light photodetectors11
Ab initio study of electron mobility in V211
Electron-phonon calculations using a Wannier-based supercell approach: Applications to the monolayer MoS11
Estimation of the energy levels of the donor–acceptor polymers of organic solar cells using cyclic voltammetry11
Hierarchical Mixture-of-Experts approach for neural compact modeling of MOSFETs10
Editorial Board10
Self-similar reconfigurable low-pass MEMS filters using coplanar waveguide based on silicon10
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise10
Double Reference Layer STT-MRAM Structures with Improved Performance10
Curvature based feature detection for hierarchical grid refinement in TCAD topography simulations10
Thermal coupling between FD-SOI FETs at cryogenic temperatures10
Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures10
Electrical characteristics of n-type vertically stacked nanowires operating up to 600 K10
Editorial Board10
Editorial Board9
Optimized emitter-base interface cleaning for advanced Heterojunction Bipolar Transistors9
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets9
Editorial Board9
Editorial Board9
On the noise-sensitivity of entangling quantum logic operations implemented with a semiconductor quantum dot platform9
Pragmatic OxRAM compact model ready to use for design studies9
TCAD-Based RF performance prediction and process optimization of 3D monolithically stacked complementary FET9
28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling9
A unified 2-D model for nanowire junctionless accumulation and inversion mode MOSFET in quasi-ballistic regime9
Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET9
Performance of flexible In0.7Ga0.3As MOSFETs by utilizing liquid polyimide (LPI) transfer with effective mobility of 3,667 cm2/V-s8
Graph-based Compact Modeling (GCM) of CMOS transistors for efficient parameter extraction: A machine learning approach8
Reactive sputtering deposited α-MoO3 thin films for forming-free resistive random-access memory8
Impact of the leakage current of an AND-type synapse array on spiking neural networks8
Performance potential of transistors based on tellurium nanowire arrays: A quantum transport study8
Design of a NMOS-triggered SCR for dual-direction low-voltage ESD protection8
Equivalence of proton-induced displacement damage in InP-based HEMT8
Temperature influence on analog parameters of vertical nanowire transistors8
C-V measurement and modeling of double-BOX Trap-Rich SOI substrate8
The core-shell junctionless MOSFET8
Recovering the carrier number conservation in SPICE simulation of PIN diodes and IGBT devices8
Compact modeling of photonic devices in Verilog-A for integrated circuit design8
Evidence of out-of-equilibrium body potential in undoped EZ-FET8
Evaluation of the effective channel length of Junctionless nanowire transistors with different drain bias through the gate capacitance8
Thermal annealing behavior of InP-based HEMT damaged by proton irradiation8
Theoretical study of extreme ultraviolet pellicles with nanometer thicknesses8
Epitaxial p+pn+ vertical short diodes for microbolometers8
Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model8
The impact of electron phonon scattering on transport properties of topological insulators: A first principles quantum transport study8
A wireless stimulator system-on-chip with an optically writable ID for addressable cortical microimplants8
TCAD-based design and verification of the components of a 200 V GaN-IC platform8
Impacts of trench angle on the performance of trench super-junction vertical double-diffused metal-oxide-semiconductor8
Hydrothermally formed copper oxide (CuO) thin films for resistive switching memory devices7
Non-uniform matching performances in mesa-isolated SOI MOSFETs7
Implementation of device-to-device and cycle-to-cycle variability of memristive devices in circuit simulations7
Preparation and electrical characteristics of transparent thin film transistors with sputtered aluminum and phosphorus co-doped indium-zinc-oxide channel layer7
Understanding negative capacitance physical mechanism in organic ferroelectric capacitor7
Palladium selenide as cathode for dye-sensitized solar cell: Effect of palladium content7
Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation7
Effects of electrode materials on solution-processed polyvinylidene fluoride-based piezoelectric nanogenerators: Do they matter?7
Model of threshold voltage and drain current in core-shell junctionless transistor on FD-SOI7
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K7
Corrigendum to “In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets” [Solid-State Electron. 201(2023) 10859]7
Combined effects of NH3 and NF3 post plasma treatment on the performance of spray coated ZnO thin film transistors7
Enhanced linearity of AlGaN/GaN HEMTs via dual-gate configuration for RF amplifier applications7
Estimation of the emission characteristics of solid-state incandescent light emitting devices by linear regression of spectral radiance7
Switching limits of top-gated carbon nanotube field-effect transistors7
Sensitivity implications for programmable transistor based 1T-DRAM7
Behavioral SPICE model for memristive crosspoint arrays operating in the nonlinear transport regime7
Improved electrical performance of InAlN/GaN high electron mobility transistors with forming gas annealing7
Silicon nanowire field-effect transistor biosensors with bowtie antenna7
Extraction of effective mobility of In Ga As/In Al As quantum well high-electron-mobility transistors on InP substrate7
Suppression of de-trapping by remanent polarization in dual-mechanism flash memory7
Sensing performance of Ti/TiO2 nanosheets/Au capacitive device: Implication of resonant frequency7
An improved subthreshold swing expression accounting for back-gate bias in FDSOI FETs7
A multi-energy level agnostic approach for defect generation during TDDB stress7
Precise channel temperature prediction in AlGaN/GaN HEMTs via closed-form empirical expression6
In-situ fluorine-doped ZnSnO thin film and thin-film transistor6
A novel SOI-LDMOS with field plate auxiliary doping layer that has improved breakdown voltage6
MoS2-based multiterminal ionic transistor with orientation-dependent STDP learning rules6
Editorial to Letters from SISPAD-20226
Achieving long-term and short-term synaptic plasticity in adaptive ANNs: A memristor circuit design with switchable dual-mode6
Poisson-Schrödinger simulation and analytical modeling of inversion charge in FDSOI MOSFET down to 0 K – Towards compact modeling for cryo CMOS application6
Editorial Board6
Effect of Al2O3 on the operation of SiNX-based MIS RRAMs6
Influence of N-type substrate’s bias potential on electrical characteristics of 4H-SiC integrated devices for All-SiC ICs6
Sub micro-accelerometer based on spintronic technology: A design optimization6
Boosting the electrical performance of solar cells by using PIN diode structure with different layout styles controlled by MOS capacitor6
Synaptic array using multi-level AND flash memory cells for hardware-based neural networks6
Express method of electro-physical parameters extraction for power Schottky diodes6
Surrogate models for device design using sample-efficient Deep Learning6
An eco-friendly bandgap engineering of semiconductor graphene oxide6
A simulation methodology for superconducting qubit readout fidelity6
Quantum simulations of MoS2 field effect transistors including contact effects6
Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon6
Editorial. Special issue. EUROSOI-ULIS 20236
Investigating random discrete dopant-induced variability in cryogenic gate-all-around nanosheet FETs: A quantum transport simulation study6
Demonstration of an n-ZnO/p-Si/n-Si heterojunction bipolar phototransistor for X-ray detection6
Bias stress stabilities of PMMA-passivated indium-gallium-zinc-oxide thin-film transistors after 100 °C steam exposure6
Building robust machine learning force fields by composite Gaussian approximation potentials6
Preliminary results on industrial 28nm FD-SOI phase change memory at cryogenic temperature6
A compact physical expression for the static drain current in heterojunction barrier CNTFETs6
Editorial Board6
TCAD numerical modeling of negative capacitance ferroelectric devices for radiation detection applications6
Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures6
Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence6
Analysis of the performance of Nb2O5-doped SiO2-based MIM devices for memory and neural computation applications6
Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs6
Investigation of reconfigurable logic gate using integrated amorphous InGaZnO ReRAM and thin-film transistor6
Investigation on the performance limits of Dirac-source FETs6
A simple method for the photometric characterization of organic light-emitting diodes5
Improving cell current in 3D NAND flash memory with fixed oxide charge5
Simulation of low frequency noise in buried-channel MOSFET by a Green’s function-based numerical trap level model5
Simulation study on physical parameters ruling unipolar resistance switching of sputter-deposited silicon oxide film on Si substrate5
Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method5
A differential OTP memory based highly unique and reliable PUF at 180 nm technology node5
Impact of Device Layout on Self-Heating Extraction in MOSFETs5
On the role of power dissipation in the Post-BD behavior of FDSOI NanoWire FETs5
Switching layer optimization in Co-based CBRAM for >105 memory window in sub-100 µA regime5
Application of explainable AI on deep learning-based gate length scalable IV parameter extractor for BSIM-IMG5
About electron transport and spin control in semiconductor devices5
Determination of source series resistances for InP HEMT under normal bias condition5
A simulation physics-guided neural network for predicting semiconductor structure with few experimental data5
Evaluation of a single interface trap position on the low-frequency noise of junctionless nanowire transistors5
Perovskite-based optoelectronic artificial synaptic thin-film transistor5
Corrigendum to “Modeling and simulations of FDSOI five-gate qubit MOS devices down to deep cryogenic temperatures” [Solid State Electron. 193 (2022) 108291]5
CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging5
Mitigating LeTID-Induced performance loss through high-frequency AC carrier injection: Architecture-dependent recovery trends in crystalline silicon solar cells5
Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors5
Modeling electrical resistivity of CrSi thin films5
Experimental assessment of gate-induced drain leakage in SOI stacked nanowire and nanosheet nMOSFETs at high temperatures5
Study of TiN/Ti/HfO2/W resistive switching devices: characterization and modeling of the set and reset transitions using an external capacitor discharge5
Mobility and intrinsic performance of silicon-based nanosheet FETs at 3 nm CMOS and beyond5
One-step variation included compact modeling with conditional variational autoencoder5
An understanding of fracture kinetics during the layer transfer of InP5
Analog resistive switching behavior in BiCoO3 thin film5
Influence of temperature inhomogeneity and trap charge on current imbalance of SiC MOSFETs5
Interface effects in ultra-scaled MRAM cells5
Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics5
Analysis of back-gate bias impact on 22 nm FDSOI SRAM cell5
Opportunity to achieve an efficient SiC/SiO2 interface N passivation by tuning the simultaneous oxidation modes during the SiC surface nitridation in N2 + O2 annealing5
Modulation of ballistic injection velocity in phosphorene nanodevices by bias and confinement effects5
Computational model for predicting structural stability and stress transfer of a new SiGe stressor technique for NMOS devices5
Improved self-heating extraction with RF technique at cryogenic temperatures5
Modelling of self-heating effect in FDSOI and bulk MOSFETs operated in deep cryogenic conditions5
1540 V 21.8mΩ·cm2 4H-SiC lateral MOSFETs with DOUBLE RESURFs for power integration applications5
Nanoscale SOI strain engineering: STRASS-enabled local stress optimization5
Non-Quasi-Static modeling and methodology in fully depleted SOI MOSFET for L-UTSOI model5
Spin-orbit torque magnetic tunnel junction based on 2-D materials: Impact of bias-layer on device performance5
Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs5
Efficient atomistic simulations of lateral heterostructure devices with metal contacts5
Editorial Board5
Design and modeling of resonant tunneling transport-controlled voltage-induced double quantum dot channel nanowire field-effect-transistor (DQD-FET) for multi-threshold current levels5
Improvement of electrical performance in Normally-Off GaN MOSFET with regrown AlGaN layer on the Source/Drain region5
Analysis on effect of hot-carrier-induced degradation of NPT-IGBT5
Competition between heating and cooling during dynamic self-heating degradation of amorphous InGaZnO thin-film transistors5
300 Mm sSOI engineering with ultra thin buried oxide5
Degradation mechanisms for static and dynamic characteristics in 1.2 kV 4H-SiC MOSFETs under repetitive short-circuit tests5
Avalanche breakdown and quenching in Ge SPAD using 3D Monte Carlo simulation5
Addressing source to drain tunneling in extremely scaled Si-transistors using negative capacitance5
Editorial Board5
Deep spiking neural networks with integrate and fire neuron using steep switching device4
Device and circuit-level evaluation of a zero-cost transistor architecture developed via process optimization4
Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET4
Performance of FDSOI double-gate dual-doped reconfigurable FETs4
The study on influence factors of contact properties of metal-MoS2 interfaces4
Editorial Board4
A novel method used to prepare PN junction by plasmon generated under pulsed laser irradiation on silicon chip4
On the breakdown voltage temperature dependence of high-voltage power diodes passivated with diamond-like carbon4
Editorial Board4
Design of auto-store circuit for nvSRAM with SONOS access transistor4
Monte Carlo analysis of hot electron injection in the passivation layer of GaN HEMTs4
Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures4
Reliable parameter extraction method applied to an enhanced GaN HEMT small-signal model4
Pinning voltage model of vertical pinned photodiode for Dual-Pixel image sensor4
Design methodology of a 28 nm FD-SOI capacitive feedback RF LNA based on the ACM model and look-up tables4
Unveiling the mechanism behind the negative capacitance effect in Hf0.5Zr0.5O2-Based ferroelectric gate stacks and introducing a Circuit-Compatible hybrid compact model for Leakage-Aware NCFETs4
Semi-classical transport in MoS2 and MoS2 transistors by a Monte Carlo approach4
Editorial Board4
SPICE simulation of the time-dependent clustering model for dielectric breakdown4
Pseudo-MOSFET transient behavior: Experiments, model, substrate and temperature effect4
High-densities of free holes in homoepitaxial n-GaN induced by fluorine-plasma ion implantation4
Retention failure recovery technique for 3D TLC NAND flash memory via wordline (WL) interference4
Structural distortion in ferroelectric HfO2 – The factor that determines electric field-induced phase transformation4
A well-conditioned surface potential equation for dynamically depleted SOI MOS devices accounting for the front-depletion/back-accumulation operation mode4
Si/Ge1x4
Comprehensive evaluation of torques in ultra-scaled MRAM devices4
Drain-bias dependence of low-frequency Y22 signals for Fe-related GaN traps in GaN HEMTs with different Fe doping concentrations4
Quantum element method for multi-dimensional nanostructures enabled by a projection-based learning algorithm4
Simulation process flow for the implementation of industry-standard FD-SOI quantum dot devices4
Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions4
GaN p-i-n ultraviolet photodetectors grown on homogenous GaN bulk substrates4
Temperature- and variability-aware compact modeling of ferroelectric FDSOI FET for memory and emerging applications4
Effect of SOI substrate on silicon nitride resistance switching using MIS structure4
Silicon nitride resistance switching MIS cells doped with silicon atoms4
Impact of work function metal stacks on the performance and reliability of multi-V RMG CMOS technology4
Electron and spin transport in semiconductor and magnetoresistive devices4
Novel crossbar array of silicon nitride resistive memories on SOI enables memristor rationed logic4
Approximate H-transformation for numerical stabilization of a deterministic Boltzmann transport equation solver based on a spherical harmonics expansion4
Multi-state tunnel field effect transistor based on face tunneling with gate-source overlap4
A computational study of AlScN-based ferroelectric tunnel junction4
Enabling medium thick gate oxide devices in 22FDX® technology for switch and high-performance amplifier application4
Stress management in freestanding membranes obtained by ion implantation induced delamination4
Strong quantization of current-carrying electron states in δ-layer s4
An efficient temperature dependent compact model for nanosheet FET for neuromorphic computing circuit4
Layout dependent hot-carrier-injection-induced pLDMOS degradation from a non-destructive characterization viewpoint4
Efficient circuit simulation of a memristive crossbar array with synaptic weight variability4
Impact of post metallization annealing (PMA) on the electrical properties of Ge nMOSFETs with ZrO2 dielectric4
Methodology for parameters extraction with undoped junctionless EZ-FETs4
An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs4
Hierarchical simulation of nanosheet field effect transistor: NESS flow4
Comparison of impact of channel length- and width-directional taper angle in nanosheet and forksheet FETs for 2 nm node and beyond4
Improved inter-device variability in graphene liquid gate sensors by laser treatment4
A composite model of memristors based on barrier and dopant drift mechanisms4
Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications4
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