Solid-State Electronics

Papers
(The median citation count of Solid-State Electronics is 2. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)
ArticleCitations
Tailoring the optoelectronic properties of PZT through the modulation of the thin film86
Smart-CX – Method of extraction of parasitic capacitances in ICs30
An enzymatic glucose biosensor using the BESOI MOSFET27
Negative capacitance field-effect transistor with hetero-dielectric structure for suppression of reverse drain induced barrier lowering26
Electrical instabilities in amorphous Si-Zn-sn-O thin film transistors under ultra-violet irradiation depending on oxygen content24
Si nanowire-based micro-capacitors fabricated with metal assisted chemical etching for integrated energy storage applications23
Numerical investigation of effect of Si separator in bottom dielectric isolation forksheet FETs via in-house TCAD process emulator and device simulator20
3xVDD-tolerant power-rail ESD clamp circuit for negative mixed-voltage interfaces20
Engineering the contact resistance of copper/copper oxide via inserting a mediated molybdenum trioxide layer19
Non-local transport effects in semiconductors under low-field conditions18
Editorial Board18
Design and verification of a hybrid electrostatic discharge model for Gate-Controlled silicon controlled rectifier18
Editorial Board18
Experimental study of thermal coupling effects in FD-SOI MOSFET16
Low power consumption of non-volatile memory device by tunneling process engineering15
Analog behavior of V-FET operating in forward and reverse mode15
Nanowire behavior under the influence of Polyoxometalates: A Comparative study of depletion and enhancement modes14
Design of high robustness DDSCR with embedded gate-controlled diodes and Schottky diodes14
Compact I-V model for back-gated and double-gated TMD FETs14
Impedance sensors based on silicon-carbon films for detection low concentrations of organic vapors13
Extraction of trap densities in Al:HfO 13
Modeling of tunneling through Schottky barriers13
Electron-phonon calculations using a Wannier-based supercell approach: Applications to the monolayer MoS13
Design, Synthesis, and Optoelectronic Characterization of a Novel Cu(II) Complex-Based Photodiode with Prof. Dr. Yakuphanoglu’s Advanced Fytronix Solar Simulator Characterization Techniques13
On the asymmetry of the DC and low-frequency noise characteristics of vertical nanowire MOSFETs with bulk source contact13
An ultra low power spiking neural encoder of microwave signals12
Electron mobility distribution in FD-SOI MOSFETs using a NEGF-Poisson approach12
Editorial Board12
Detailed electrical characterization of 200 mm CMOS compatible GaN/Si HEMTs down to deep cryogenic temperatures11
Analytical model based estimation of line edge roughness induced V<11
Impact of substrate resistivity on spiral inductors at mm-wave frequencies11
Spatially resolved ionization current measurements using an active-matrix transimpedance amplifier array11
Extraction of small-signal equivalent circuit for de-embedding of 3D vertical nanowire transistor11
Study of RRAM devices with PECVD silicon-oxide resistive switching layer11
Mechanisms of negative bias instability of commercial SiC MOSFETs observed by current transients11
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing11
Self-aligned nitrogen doping via plasma treatment of NiO/β-Ga2O3 heterojunction diodes11
Novel Y-function methodology parameter estimation from weak to strong inversion operation11
Ab initio study of electron mobility in V211
Enhanced photoresponse in Cu/n-Si Schottky photodetectors via RF sputtering: A comparative study with thermal evaporation10
Double Reference Layer STT-MRAM Structures with Improved Performance10
C-V measurement and modeling of double-BOX Trap-Rich SOI substrate10
Markov model describing progressive degradation of local percolation path in thin oxides10
Electrical characteristics of n-type vertically stacked nanowires operating up to 600 K10
28 nm FD-SOI MEOL parasitic capacitance segmentation using electrical testing and semiconductor process modeling9
TCAD-Based RF performance prediction and process optimization of 3D monolithically stacked complementary FET9
Thermal coupling between FD-SOI FETs at cryogenic temperatures9
Impact of the leakage current of an AND-type synapse array on spiking neural networks9
Thermal annealing behavior of InP-based HEMT damaged by proton irradiation9
Investigation and Modeling of Multifrequency CV characteristics for 10-nm Bulk FinFETs at Cryogenic Temperatures9
Performance potential of transistors based on tellurium nanowire arrays: A quantum transport study9
Optimized emitter-base interface cleaning for advanced Heterojunction Bipolar Transistors9
Editorial Board9
On the noise-sensitivity of entangling quantum logic operations implemented with a semiconductor quantum dot platform9
Editorial Board9
The impact of electron phonon scattering on transport properties of topological insulators: A first principles quantum transport study9
Investigation on dielectric wall variations in Forksheet FETs9
Hierarchical Mixture-of-Experts approach for neural compact modeling of MOSFETs9
TCAD-based design and verification of the components of a 200 V GaN-IC platform9
On the accuracy of the formula used to extract trap density in MOSFETs from 1/f noise9
Editorial Board9
Curvature based feature detection for hierarchical grid refinement in TCAD topography simulations9
Editorial Board9
Reactive sputtering deposited α-MoO3 thin films for forming-free resistive random-access memory9
In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets9
Evaluation of the effective channel length of Junctionless nanowire transistors with different drain bias through the gate capacitance9
Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET9
Epitaxial p+pn+ vertical short diodes for microbolometers9
3D (micro/nano) CdO/p-Si co-doped Zn and La heterojunctions perform as solar light photodetectors8
Editorial Board8
Pragmatic OxRAM compact model ready to use for design studies8
Vertical GaN diode BV maximization through rapid TCAD simulation and ML-enabled surrogate model8
Equivalence of proton-induced displacement damage in InP-based HEMT8
Theoretical study of extreme ultraviolet pellicles with nanometer thicknesses8
Difference in kinetics between thermal nitridation and radical nitridation processes of 4H-SiC surface considering simultaneous N-incorporation and N-desorption reactions8
Compact modeling of photonic devices in Verilog-A for integrated circuit design8
Evidence of out-of-equilibrium body potential in undoped EZ-FET8
Temperature-dependence of current gain and turn-on voltages of GaAs-based HBTs with different base layers grown by MOCVD8
Temperature influence on analog parameters of vertical nanowire transistors8
The core-shell junctionless MOSFET8
A unified 2-D model for nanowire junctionless accumulation and inversion mode MOSFET in quasi-ballistic regime8
Graph-based Compact Modeling (GCM) of CMOS transistors for efficient parameter extraction: A machine learning approach8
Estimation of the energy levels of the donor–acceptor polymers of organic solar cells using cyclic voltammetry8
MnFe2O4 nanoparticles for VOCs sensing application at low operating temperature8
A wireless stimulator system-on-chip with an optically writable ID for addressable cortical microimplants8
Understanding negative capacitance physical mechanism in organic ferroelectric capacitor7
Non-uniform matching performances in mesa-isolated SOI MOSFETs7
Performance of flexible In0.7Ga0.3As MOSFETs by utilizing liquid polyimide (LPI) transfer with effective mobility of 3,667 cm2/V-s7
Sensitivity enhancement in OCD metrology by optimizing azimuth angle based on the RCWA simulation7
Enhanced linearity of AlGaN/GaN HEMTs via dual-gate configuration for RF amplifier applications7
Corrigendum to “In-depth static and low frequency noise assessment of p-channel gate-all-around vertically stacked silicon nanosheets” [Solid-State Electron. 201(2023) 10859]7
Hydrothermally formed copper oxide (CuO) thin films for resistive switching memory devices7
An improved subthreshold swing expression accounting for back-gate bias in FDSOI FETs7
Characterization of DC performance and low-frequency noise of an array of nMOS Forksheets from 300 K to 4 K7
Sensing performance of Ti/TiO2 nanosheets/Au capacitive device: Implication of resonant frequency7
Improved electrical performance of InAlN/GaN high electron mobility transistors with forming gas annealing7
An eco-friendly bandgap engineering of semiconductor graphene oxide7
Estimation of the emission characteristics of solid-state incandescent light emitting devices by linear regression of spectral radiance7
Suppression of de-trapping by remanent polarization in dual-mechanism flash memory7
A multi-energy level agnostic approach for defect generation during TDDB stress7
Model of threshold voltage and drain current in core-shell junctionless transistor on FD-SOI7
Preparation and electrical characteristics of transparent thin film transistors with sputtered aluminum and phosphorus co-doped indium-zinc-oxide channel layer7
Behavioral SPICE model for memristive crosspoint arrays operating in the nonlinear transport regime7
MoS2-based multiterminal ionic transistor with orientation-dependent STDP learning rules7
Extraction of effective mobility of In Ga As/In Al As quantum well high-electron-mobility transistors on InP substrate7
Impacts of trench angle on the performance of trench super-junction vertical double-diffused metal-oxide-semiconductor7
Investigation of reconfigurable logic gate using integrated amorphous InGaZnO ReRAM and thin-film transistor6
Synaptic array using multi-level AND flash memory cells for hardware-based neural networks6
Editorial Board6
Sensitivity implications for programmable transistor based 1T-DRAM6
Surrogate models for device design using sample-efficient Deep Learning6
Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence6
Impact of series resistance on the drain current variability in inversion mode and junctionless nanowire transistors6
Editorial. Special issue. EUROSOI-ULIS 20236
Editorial: Letters from the 8th Joint International EUROSOI workshop and International Conference on Ultimate Integration on Silicon6
Investigation on the performance limits of Dirac-source FETs6
Bias stress stabilities of PMMA-passivated indium-gallium-zinc-oxide thin-film transistors after 100 °C steam exposure6
Building robust machine learning force fields by composite Gaussian approximation potentials6
Influence of N-type substrate’s bias potential on electrical characteristics of 4H-SiC integrated devices for All-SiC ICs6
A simulation methodology for superconducting qubit readout fidelity6
Implementation of device-to-device and cycle-to-cycle variability of memristive devices in circuit simulations6
Silicon nanowire field-effect transistor biosensors with bowtie antenna6
Editorial to Letters from SISPAD-20226
Compact modeling of Schottky barrier field-effect transistors at deep cryogenic temperatures6
Investigating random discrete dopant-induced variability in cryogenic gate-all-around nanosheet FETs: A quantum transport simulation study6
Effect of Al2O3 on the operation of SiNX-based MIS RRAMs6
Precise channel temperature prediction in AlGaN/GaN HEMTs via closed-form empirical expression6
Boosting the electrical performance of solar cells by using PIN diode structure with different layout styles controlled by MOS capacitor6
Editorial Board6
A compact physical expression for the static drain current in heterojunction barrier CNTFETs6
TCAD numerical modeling of negative capacitance ferroelectric devices for radiation detection applications6
Switching limits of top-gated carbon nanotube field-effect transistors6
Sub micro-accelerometer based on spintronic technology: A design optimization6
Preliminary results on industrial 28nm FD-SOI phase change memory at cryogenic temperature6
A simple method for the photometric characterization of organic light-emitting diodes6
Editorial Board6
Achieving long-term and short-term synaptic plasticity in adaptive ANNs: A memristor circuit design with switchable dual-mode6
In-situ fluorine-doped ZnSnO thin film and thin-film transistor6
Quantum simulations of MoS2 field effect transistors including contact effects6
Non-Quasi-Static modeling and methodology in fully depleted SOI MOSFET for L-UTSOI model5
Competition between heating and cooling during dynamic self-heating degradation of amorphous InGaZnO thin-film transistors5
Impact of Gate Oxide Thickness on Flicker Noise (1/f) in PDSOI n-channel FETs5
Modeling electrical resistivity of CrSi thin films5
CMOS inverter performance degradation and its correlation with BTI, HCI and OFF state MOSFETs aging5
Computational model for predicting structural stability and stress transfer of a new SiGe stressor technique for NMOS devices5
Strong quantization of current-carrying electron states in δ-layer s5
Editorial Board5
Perovskite-based optoelectronic artificial synaptic thin-film transistor5
Application of explainable AI on deep learning-based gate length scalable IV parameter extractor for BSIM-IMG5
Editorial Board5
Mobility and intrinsic performance of silicon-based nanosheet FETs at 3 nm CMOS and beyond5
Simulation of low frequency noise in buried-channel MOSFET by a Green’s function-based numerical trap level model5
Pursuing the FD-SOI roadmap down to 10 nm and 7 nm nodes for high energy efficient, low power and RF/mmWave applications5
Evaluation of a single interface trap position on the low-frequency noise of junctionless nanowire transistors5
Modelling of self-heating effect in FDSOI and bulk MOSFETs operated in deep cryogenic conditions5
Degradation mechanisms for static and dynamic characteristics in 1.2 kV 4H-SiC MOSFETs under repetitive short-circuit tests5
Simulation study on physical parameters ruling unipolar resistance switching of sputter-deposited silicon oxide film on Si substrate5
Analysis of back-gate bias impact on 22 nm FDSOI SRAM cell5
About electron transport and spin control in semiconductor devices5
A simulation physics-guided neural network for predicting semiconductor structure with few experimental data5
Improved self-heating extraction with RF technique at cryogenic temperatures5
Impact of Device Layout on Self-Heating Extraction in MOSFETs5
Effect of SOI substrate on silicon nitride resistance switching using MIS structure5
Spin-orbit torque magnetic tunnel junction based on 2-D materials: Impact of bias-layer on device performance5
Opportunity to achieve an efficient SiC/SiO2 interface N passivation by tuning the simultaneous oxidation modes during the SiC surface nitridation in N2 + O2 annealing5
Nanoscale SOI strain engineering: STRASS-enabled local stress optimization5
Impact of the channel doping on the low-frequency noise of gate-all-around silicon vertical nanowire pMOSFETs5
Experimental assessment of gate-induced drain leakage in SOI stacked nanowire and nanosheet nMOSFETs at high temperatures5
Mitigating LeTID-Induced performance loss through high-frequency AC carrier injection: Architecture-dependent recovery trends in crystalline silicon solar cells5
Analog resistive switching behavior in BiCoO3 thin film5
1540 V 21.8mΩ·cm2 4H-SiC lateral MOSFETs with DOUBLE RESURFs for power integration applications5
Assessment of ion-sensitivity of Si3N4 based feedback field effect transistor using snap-back characteristics5
Corrigendum to “Modeling and simulations of FDSOI five-gate qubit MOS devices down to deep cryogenic temperatures” [Solid State Electron. 193 (2022) 108291]5
WITHDRAWN: Analysis on effect of hot-carrier-induced degradation of NPT-IGBT5
Interface effects in ultra-scaled MRAM cells5
Study of TiN/Ti/HfO2/W resistive switching devices: characterization and modeling of the set and reset transitions using an external capacitor discharge5
A mathematical model for non-equilibrium body potential of SOI Pseudo-MOS and physical mechanism analysis5
Quantum element method for multi-dimensional nanostructures enabled by a projection-based learning algorithm5
GaN p-i-n ultraviolet photodetectors grown on homogenous GaN bulk substrates5
Switching layer optimization in Co-based CBRAM for >105 memory window in sub-100 µA regime5
Avalanche breakdown and quenching in Ge SPAD using 3D Monte Carlo simulation5
Modulation of ballistic injection velocity in phosphorene nanodevices by bias and confinement effects5
Influence of temperature inhomogeneity and trap charge on current imbalance of SiC MOSFETs5
300 Mm sSOI engineering with ultra thin buried oxide5
Improvement of electrical performance in Normally-Off GaN MOSFET with regrown AlGaN layer on the Source/Drain region5
Determination of source series resistances for InP HEMT under normal bias condition5
Investigation and optimization of traps properties in Al2O3/SiO2 dielectric stacks using conductance method5
Geometrical and thermal effects on mobility and analog parameters of AlGaN/GaN HEMTs on silicon substrates5
Improving cell current in 3D NAND flash memory with fixed oxide charge5
Influence of gate-source/drain overlap on FeFETs4
Improved inter-device variability in graphene liquid gate sensors by laser treatment4
A dynamic current hysteresis model for IGZO-TFT4
Approximate H-transformation for numerical stabilization of a deterministic Boltzmann transport equation solver based on a spherical harmonics expansion4
Novel Y-function based strategy for parameter extraction in S/D asymmetric architecture devices and low frequency noise characterization in GAA Si VNW pMOSFETs4
Drain-bias dependence of low-frequency Y22 signals for Fe-related GaN traps in GaN HEMTs with different Fe doping concentrations4
Multi-state tunnel field effect transistor based on face tunneling with gate-source overlap4
Device and circuit-level evaluation of a zero-cost transistor architecture developed via process optimization4
Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET4
A novel method used to prepare PN junction by plasmon generated under pulsed laser irradiation on silicon chip4
A well-conditioned surface potential equation for dynamically depleted SOI MOS devices accounting for the front-depletion/back-accumulation operation mode4
Thickness-dependent dielectric breakdown in thick amorphous SiO2 capacitors4
On the breakdown voltage temperature dependence of high-voltage power diodes passivated with diamond-like carbon4
Application of forksheet transistor in operational transconductance amplifier4
An understanding of fracture kinetics during the layer transfer of InP4
Hierarchical simulation of nanosheet field effect transistor: NESS flow4
Methodology for parameters extraction with undoped junctionless EZ-FETs4
Mechanism of polarization “Wake-Up” in ferroelectric Hafnia-Zirconia thin films4
Model and parameter extraction strategy impact on the estimated values of MOSFET parameters in ohmic operation4
Deep spiking neural networks with integrate and fire neuron using steep switching device4
An All-GaN cascode device with integrated plane-parallel capacitor with high dynamic breakdown voltage and high switching performance4
Silicon nitride resistance switching MIS cells doped with silicon atoms4
The study on influence factors of contact properties of metal-MoS2 interfaces4
Evidence of trapping and electrothermal effects in vertical junctionless nanowire transistors4
Evidence of Transport Degradation in 22 nm FD-SOI Charge Trapping Transistors for Neural Network Applications4
Performance of FDSOI double-gate dual-doped reconfigurable FETs4
Monte Carlo analysis of hot electron injection in the passivation layer of GaN HEMTs4
Impact of the W etching process on the resistive switching properties of TiN/Ti/HfO2/W memristors4
Effect of PN passivation on MOSFETs performance in 28 nm FD-SOI4
Si/Ge1x4
One-step variation included compact modeling with conditional variational autoencoder4
A composite model of memristors based on barrier and dopant drift mechanisms4
On the role of power dissipation in the Post-BD behavior of FDSOI NanoWire FETs4
SPICE simulation of the time-dependent clustering model for dielectric breakdown4
An accurate machine learning model to study the impact of realistic metal grain granularity on Nanosheet FETs4
Efficient atomistic simulations of lateral heterostructure devices with metal contacts4
Design methodology of a 28 nm FD-SOI capacitive feedback RF LNA based on the ACM model and look-up tables4
Efficient circuit simulation of a memristive crossbar array with synaptic weight variability4
Simulation process flow for the implementation of industry-standard FD-SOI quantum dot devices4
Editorial Board4
Semi-classical transport in MoS2 and MoS2 transistors by a Monte Carlo approach4
Editorial Board4
Novel crossbar array of silicon nitride resistive memories on SOI enables memristor rationed logic4
Enabling medium thick gate oxide devices in 22FDX® technology for switch and high-performance amplifier application4
Editorial Board4
Analysis of 1/f and G–R noise in Phosphorene FETs4
An efficient temperature dependent compact model for nanosheet FET for neuromorphic computing circuit4
Stress management in freestanding membranes obtained by ion implantation induced delamination4
Design and modeling of resonant tunneling transport-controlled voltage-induced double quantum dot channel nanowire field-effect-transistor (DQD-FET) for multi-threshold current levels4
A novel methodology for neural compact modeling based on knowledge transfer4
Back-gate effects on DC performance and carrier transport in 22 nm FDSOI technology down to cryogenic temperatures4
Unveiling the mechanism behind the negative capacitance effect in Hf0.5Zr0.5O2-Based ferroelectric gate stacks and introducing a Circuit-Compatible hybrid compact model for Leakage-Aware NCFETs4
Design of auto-store circuit for nvSRAM with SONOS access transistor4
Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions4
Comparison of impact of channel length- and width-directional taper angle in nanosheet and forksheet FETs for 2 nm node and beyond4
Comprehensive evaluation of torques in ultra-scaled MRAM devices4
Electron and spin transport in semiconductor and magnetoresistive devices4
Operation of junctionless nanowire transistors down to 4.2 Kelvin3
Impact of back-biasing on the series resistance in ultrathin SOI devices3
Analogies for Dirac fermions physics in graphene3
Investigation of compliance current effect on resistive switching properties in Ag/SiOx/Cr RRAM devices3
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