OOIR: Observatory of International Research

Papers

(The H4-Index of Microelectronics Reliability is 25. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)

Article	Citations
Multistate time lag dynamic Bayesian networks model for reliability prediction of smart meters	48
Elucidating the large variation in ion diffusivity of microelectronic packaging materials	46
Single event burnout failures caused in silicon and silicon carbide power devices by single alpha particles emitted from radioactive nuclides	42
Evaluating switch lifetime in soft-switched single-stage differential-mode SST	35
Interface traps in the sub-3 nm technology node: A comprehensive analysis and benchmarking of negative capacitance FinFET and nanosheet FETs - A reliability perspective from device to circuit level	34
A Π-shaped p-GaN HEMT for reliable enhancement mode operation	34
Editorial Board	33
Reliability assessment of miniaturised electromechanical RF relays for space applications	33
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation	32
New reliability model for power SiC MOSFET technologies under static and dynamic gate stress	31
Laser voltage probing and simulation of a flip-flop with undesired quasi-static switching	31
A novel in-situ approach to monitor the variations in the on-resistance of power transistors during switching operation	31
Investigation of the role of pre-existing oxide in the initial degradation mechanism in AlGaN/GaN HEMTs under ON-state stress	31
DC and RF/analog performances of split source horizontal pocket and hetero stack TFETs considering interface trap charges: A simulation study	29
Effect of solder junction void variation in power semiconductor package on power cycle lifetime	28
Study on annealing effect of bipolar transistors at different temperatures after total dose irradiation	28
Editorial Board	28
The characterization of low-k thin films and their fracture analysis in a WLCSP device	27
Failure analysis on capacitor failures using simple circuit edit passive voltage contrast method	27
Boosting the thermal stability of paralleled GaAs HBTs through temperature-dependent ballasting resistors: A proof-of-concept study	26
A physics-based electromigration model for advanced interconnects	26
Electrical deterioration of 4H-SiC MOS capacitors due to bulk and interface traps induced by proton irradiation	25
A remaining useful life prediction method of aluminum electrolytic capacitor based on wiener process and similarity measurement	25
Investigating the solder mask defects impact on leakage current on PCB under condensing humidity conditions	25
Impacts and mitigation strategies of process-induced packaging defects for enhancing reliability of power devices	25