IEEE Transactions on Nuclear Science

Papers
(The median citation count of IEEE Transactions on Nuclear Science is 1. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-11-01 to 2024-11-01.)
ArticleCitations
Radiation Effects in a Post-Moore World61
Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison With Transistor Performance56
Radiation Effects in AlGaN/GaN HEMTs50
Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors41
Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs36
A Reconfigurable Neural Network ASIC for Detector Front-End Data Compression at the HL-LHC36
GAMMA: A 16-Channel Spectroscopic ASIC for SiPMs Readout With 84-dB Dynamic Range32
Radiation Effects in Advanced and Emerging Nonvolatile Memories31
The MiniSDD-Based 1-Mpixel Camera of the DSSC Project for the European XFEL30
Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies30
How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs29
TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses29
0.1–10 MeV Neutron Soft Error Rate in Accelerator and Atmospheric Environments27
Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications27
Ion-Induced Mesoplasma Formation and Thermal Destruction in 4H-SiC Power MOSFET Devices26
High Energy and Thermal Neutron Sensitivity of Google Tensor Processing Units24
Silicon Carbide Neutron Detectors for Harsh Nuclear Environments: A Review of the State of the Art23
Impact of Single-Event Upsets on Convolutional Neural Networks in Xilinx Zynq FPGAs23
L₁-Adaptive Robust Control Design for a Pressurized Water-Type Nuclear Power Plant23
SIRIO: A High-Speed CMOS Charge-Sensitive Amplifier for High-Energy-Resolution X-γ Ray Spectroscopy With Semiconductor Detectors23
Application of Total Ionizing Dose Radiation Test Standards to SiC MOSFETs22
Operating Temperature Range of Phosphorous-Doped Optical Fiber Dosimeters Exploiting Infrared Radiation-Induced Attenuation21
Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors21
Analysis of SEGR in Silicon Planar Gate Super-Junction Power MOSFETs21
Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS20
Readout Electronics Prototype of TOF Detectors in CEE of HIRFL19
Effects of Bias and Temperature on Interface-Trap Annealing in MOS and Linear Bipolar Devices19
Energy-Resolved Soft-Error Rate Measurements for 1–800 MeV Neutrons by the Time-of-Flight Technique at LANSCE18
Diagonal 4-in ZnO Nanowire Cold Cathode Flat-Panel X-Ray Source: Preparation and Projection Imaging Properties17
Evaluating and Mitigating Neutrons Effects on COTS EdgeAI Accelerators16
Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions16
Reconstructing the Position and Intensity of Multiple Gamma-Ray Point Sources With a Sparse Parametric Algorithm16
Needs, Trends, and Advances in Scintillators for Radiographic Imaging and Tomography16
Growth of Cd0.9Zn0.1Te1–y Se y Single Crystals for Room-Temperature Gamma Ray Detect16
Analyzing DUE Errors on GPUs With Neutron Irradiation Test and Fault Injection to Control Flow16
Single-Event Latchup in a 7-nm Bulk FinFET Technology15
Optical Single-Event Transients Induced in Integrated Silicon-Photonic Waveguides by Two-Photon Absorption15
Ultra-High Total Ionizing Dose Effects on MOSFETs for Analog Applications15
Characterization of Radio-Photo-Luminescence (RPL) Dosimeters as Radiation Monitors in the CERN Accelerator Complex15
Total Ionizing Dose Responses of 22-nm FDSOI and 14-nm Bulk FinFET Charge-Trap Transistors15
Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation15
Radiation Testing of a Multiprocessor Macrosynchronized Lockstep Architecture With FreeRTOS15
Irradiation Effects on Perpendicular Anisotropy Spin–Orbit Torque Magnetic Tunnel Junctions14
Defect-Induced Phase Transition in Hafnium Oxide Thin Films: Comparing Heavy Ion Irradiation and Oxygen-Engineering Effects14
Development of a Tabletop Setup for the Transient Current Technique Using Two-Photon Absorption in Silicon Particle Detectors14
Radiation Shielding Evaluation of Spacecraft Walls Against Heavy Ions Using Microdosimetry14
Photobleaching Effect on Infrared Radiation-Induced Attenuation of Germanosilicate Optical Fibers at MGy Dose Levels14
Backside Laser Testing of Single-Event Effects in GaN-on-Si Power HEMTs14
Double-Photon Emission Imaging With High-Resolution Si/CdTe Compton Cameras14
Low-Energy Ion-Induced Single-Event Burnout in Gallium Oxide Schottky Diodes14
Hydrogen-Related Recovery Effect of AlGaN/GaN High-Electron-Mobility Transistors Irradiated by High-Fluence Protons14
Design and Verification of a 6.25 GHz LC-Tank VCO Integrated in 65 nm CMOS Technology Operating up to 1 Grad TID14
Neutron Radiation Testing of a TMR VexRiscv Soft Processor on SRAM-Based FPGAs14
Investigating Heavy-Ion Effects on 14-nm Process FinFETs: Displacement Damage Versus Total Ionizing Dose13
Influence of Fin and Finger Number on TID Degradation of 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses13
Heavy Ion Energy Deposition and SEE Intercomparison Within the RADNEXT Irradiation Facility Network13
Temperature Dependence of Low-Dose Radiation-Induced Attenuation of Germanium-Doped Optical Fiber at Infrared Wavelengths13
Effect of Drift Length on Shifts in 400-V SOI LDMOS Breakdown Voltage Due to TID13
3-D Object Tracking in Panoramic Video and LiDAR for Radiological Source–Object Attribution and Improved Source Detection13
TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses13
G4SEE: A Geant4-Based Single Event Effect Simulation Toolkit and Its Validation Through Monoenergetic Neutron Measurements12
A Low-Power Time-to-Digital Converter for the CMS Endcap Timing Layer (ETL) Upgrade12
High-Energy and High-Rate X-Ray Measurements Using HfO₂ Nanoparticle-Loaded Plastic Scintillator12
Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment12
Single-Event Upsets in a 7-nm Bulk FinFET Technology With Analysis of Threshold Voltage Dependence12
The VMM3a ASIC12
Single-Event Effect Responses of Integrated Planar Inductors in 65-nm CMOS12
Single Event Burnout Hardening of Enhancement Mode HEMTs With Double Field Plates12
TID Effects Induced by ARACOR, 60Co, and ORIATRON Photon Sources in MOS Devices: Impact of Geometry and Materials12
Intrinsic Vulnerability to Soft Errors and a Mitigation Technique by Layout Optimization on DICE Flip Flops in a 65-nm Bulk Process11
The Stereoscopic Analog Trigger of the MAGIC Telescopes11
Effect of Hydrogen on Radiation-Induced Displacement Damage in AlGaN/GaN HEMTs11
Radiation-Induced Error Mitigation by Read-Retry Technique for MLC 3-D NAND Flash Memory11
Performance of Larger-Volume 40 × 40 × 10- and 40 × 40 × 15-mm³ CdZnTe Detectors11
Analysis of Single-Event Transients (SETs) Using Machine Learning (ML) and Ionizing Radiation Effects Spectroscopy (IRES)11
X–-Ray Spectroscopy With a CdTe Pixel Detector and SIRIO Preamplifier at Deep Submicrosecond Signal-Processing Time11
Aging Effects and Latent Interface-Trap Buildup in MOS Transistors11
Heavy-Ion-Induced Displacement Damage Effects in Magnetic Tunnel Junctions With Perpendicular Anisotropy11
Combined Temperature and Radiation Effects on the Gain of Er- and Er–Yb-Doped Fiber Amplifiers11
Design of Time-to-Digital Converters for Time-Over-Threshold Measurement in Picosecond Timing Detectors11
Development of a Position-Sensitive 4π Compton Camera Based on a Single Segmented Scintillator11
Online Detuning Computation and Quench Detection for Superconducting Resonators11
Deep Reinforcement Learning Control of a Boiling Water Reactor11
Effects of Bias and Temperature on the Dose-Rate Sensitivity of 65-nm CMOS Transistors11
TIARA: Industrial Platform for Monte Carlo Single-Event Simulations in Planar Bulk, FD-SOI, and FinFET11
Development of Multichannel High Time Resolution Data Acquisition System for TOT-ASIC11
A 1-μW Radiation-Hard Front-End in a 0.18-μm CMOS Process for the MALTA2 Monolithic Sensor11
Hi’Beam-S: A Monolithic Silicon Pixel Sensor-Based Prototype Particle Tracking System for HIAF11
Ionizing Radiation Effects in Silicon Photonics Modulators11
Optimized Design of Slip Ring Assembly for Aerospace to Reduce Deep Dielectric Charging11
Beta Radiation Hardness of GYGAG(Ce) Transparent Ceramic Scintillators10
Performances of C-BORD’s Tagged Neutron Inspection System for Explosives and Illicit Drugs Detection in Cargo Containers10
Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes10
Radiation-Tolerant Digitally Controlled Ring Oscillator in 65-nm CMOS10
Systematic Analysis of Reliability of Large-Area 4H-SiC Charged Particle Detector Under Harsh He Ion Irradiation10
Multiobjective Optimization Shielding Design for Compact Accelerator-Driven Neutron Sources by Application of NSGA-II and MCNP10
Electrical Measurement of Cell-to-Cell Variation of Critical Charge in SRAM and Sensitivity to Single-Event Upsets by Low-Energy Protons10
A Zynq-Based Flexible ADC Architecture Combining Real-Time Data Streaming and Transient Recording10
Effect of Frequency on Total Ionizing Dose Response of Ring Oscillator Circuits at the 7-nm Bulk FinFET Node10
Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment10
Coupling Effect of Electron Irradiation and Operating Voltage on the Deep Dielectric Charging Characteristics of Solar Array Drive Assembly10
Improved Gamma-Ray Point Source Quantification in Three Dimensions by Modeling Attenuation in the Scene10
Fast-Transient Radiation-Hardened Low-Dropout Voltage Regulator for Space Applications10
Dependence of Temperature and Back-Gate Bias on Single-Event Upset Induced by Heavy Ion in 0.2-μm DSOI CMOS Technology10
Gamma-Ray-Induced Error Pattern Analysis for MLC 3-D NAND Flash Memories10
Development of TID Hardness Assurance Methodologies to Capitalize on Statistical Radiation Environment Models10
Total Ionizing Dose Effects on Long-Term Data Retention Characteristics of Commercial 3-D NAND Memories10
High-Resolution Alpha Spectrometry Using 4H-SiC Detectors: A Review of the State-of-the-Art10
Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs10
Deep-Level Transient Spectroscopy and Radiation Detection Performance Studies on Neutron Irradiated 250-μm-Thick 4H-SiC Epitaxial Layers10
A Highly Linear FPGA-Based TDC and a Low-Power Multichannel Readout ASIC With a Shared SAR ADC for SiPM Detectors10
Application of Gallium Nitride Technology in Particle Therapy Imaging9
A Comparison of Radiation-Induced and High-Field Electrically Stress-Induced Interface Defects in Si/SiO₂ MOSFETs via Electrically Detected Magnetic Resonance9
Hadron-Induced Radiation Damage in LuAG:Ce Scintillating Ceramics9
Heavy-Ion Testing Method and Results of Normally OFF GaN-Based High-Electron-Mobility Transistor9
The Mu3e Data Acquisition9
Load-Frequency Control With Multimodule Small Modular Reactor Configuration: Modeling and Dynamic Analysis9
PCI-Express Based High-Speed Readout for the Belle II DAQ Upgrade9
ORION, a Multichip Readout Electronics for Satellite Wide Energy Range X-/γ-Ray Imaging Spectroscopy: Design and Characterization of the Analog Section9
Single-Event Response of 22-nm Fully Depleted Silicon-on-Insulator Static Random Access Memory9
OpenIPMC: A Free and Open-Source Intelligent Platform Management Controller Software9
Observation of Low-Energy Proton Direct Ionization in a 72-Layer 3-D NAND Flash Memory9
Proton-Induced Displacement Damages in 2-D and Stacked CMOS SPADs: Study of Dark Count Rate Degradation9
Analyzing Reduced Precision Triple Modular Redundancy Under Proton Irradiation9
Reliability Evaluation of LU Decomposition on GPU-Accelerated System-on-Chip Under Proton Irradiation9
Integrated Real-Time Supervisory Management for Off-Normal-Event Handling and Feedback Control of Tokamak Plasmas9
A Coupled Deterministic and Monte-Carlo Method for Modeling and Simulation of Self-Powered Neutron Detector9
Effects of Ionization and Displacement Damage in AlGaN/GaN HEMT Devices Caused by Various Heavy Ions9
Carrier Lifetime and Mobility Characterization Using the DTU 3-D CZT Drift Strip Detector9
Assessment of Tiny Machine-Learning Computing Systems Under Neutron-Induced Radiation Effects9
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization With Neutrons and Alpha Particles9
A New Technique Based on Convolutional Neural Networks to Measure the Energy of Protons and Electrons With a Single Timepix Detector9
Influence of Total Ionizing Dose on Magnetic Tunnel Junctions With Perpendicular Anisotropy8
Hi’Beam-A: A Pixelated Beam Monitor for the Accelerator of a Heavy-Ion Therapy Facility8
Estimation of the Trap Energy Characteristics of Row Hammer-Affected Cells in Gamma-Irradiated DDR4 DRAM8
Benchmark Between Measured and Simulated Radiation Level Data at the Mixed-Field CHARM Facility at CERN8
Single-Event Transient Response of Vertical and Lateral Waveguide-Integrated Germanium Photodiodes8
Bi2O3 Nanoparticle-Loaded Plastic Scintillator for High-Energy X-Ray Detection8
Supply Voltage Dependence of Ring Oscillator Frequencies for Total Ionizing Dose Exposures for 7-nm Bulk FinFET Technology8
Configuration Memory Scrubbing of SRAM-Based FPGAs Using a Mixed 2-D Coding Technique8
Development of Neural Network Model With Explainable AI for Measuring Uranium Enrichment8
Testing and Validation Methodology for a Radiation Monitoring System for Electronics in Particle Accelerators8
Neutron Response of the EJ-254 Boron-Loaded Plastic Scintillator8
Investigation of Electrically Active Defects in SiC Power Diodes Caused by Heavy Ion Irradiation8
Real-Time Implementation of the Neutron/Gamma Discrimination in an FPGA-Based DAQ MTCA Platform Using a Convolutional Neural Network8
Analytical Bit-Error Model of NAND Flash Memories for Dosimetry Application8
Improvement in Plastic Scintillator with Loading of BaFBr:Eu²⁺ Radioluminescence Phosphor8
ADC Nonlinearity Correction for the Majorana Demonstrator8
CERN Super Proton Synchrotron Radiation Environment and Related Radiation Hardness Assurance Implications8
Single-Event Transient Space Characterizations in 28-nm UTBB SOI Technologies and Below8
Proportional–Integral Extended State Observer for Monitoring Nuclear Reactors8
Enhanced Energy Resolution of GaN-on-Sapphire p-i-n Alpha-Particle Detector With Isoelectronic Al-Doped i-GaN Layer8
Toward an Embedded and Distributed Optical Fiber-Based Dosimeter for Space Applications8
Analysis of Heavy-Ion-Induced Leakage Current in SiC Power Devices8
Orbital Equivalence of Terrestrial Radiation Tolerance Experiments8
Variability in Total-Ionizing-Dose Response of Fourth-Generation SiGe HBTs8
Impact of Surface Recombination on Single-Event Charge Collection in an SOI Technology8
Threats to Resiliency of Redundant Systems Due to Destructive SEEs8
Total Ionizing Dose Radiation Effects Hardening Using Back-Gate Bias in Double-SOI Structure8
Influence of Drain Bias and Flux on Heavy Ion-Induced Leakage Currents in SiC Power MOSFETs8
Simulation of High-Altitude Nuclear Electromagnetic Pulse Using a Modified Model of Scattered Gamma8
In-Flight Measurements of Radiation Environment Observed by Eutelsat 7C (Electric Orbit Raising Satellite)8
Updates on Testing Microprocessors Effectively8
An Innovative Analog Circuit to Retrieve Energy Information From Signals of Deeply Saturated Preamplifiers Connected to Semiconductor Detectors7
A Comparative Study on Heavy-Ion Irradiation Impact on p-Channel and n-Channel Power UMOSFETs7
Dosimetry of Thermal Neutron Beamlines at a Pulsed Spallation Source for Application to the Irradiation of Microelectronics7
A FPGA-Based Architecture for Real-Time Cluster Finding in the LHCb Silicon Pixel Detector7
Investigations on Spectral Photon Radiation Sources to Perform TID Experiments in Micro- and Nano-Electronic Devices7
Investigating How Software Characteristics Impact the Effectiveness of Automated Software Fault Tolerance7
Hybrid Lockstep Technique for Soft Error Mitigation7
Characterization of Single-Event Upsets Induced by High-LET Heavy Ions in 16-nm Bulk FinFET SRAMs7
Benchmarking a New Digital Data Acquisition System for Fast Neutron Metrology7
Bayesian Approach for Multigamma Radionuclide Quantification Applied on Weakly Attenuating Nuclear Waste Drums7
Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting From Heavy-Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation7
Initial Tests and Characterization of the Readout Electronics for the IXPE Mission7
A Clock Distribution and Synchronization Scheme Over Optical Links for Large-Scale Physics Experiments7
Fabrication and First Characterization of Silicon-Based Full 3-D Microdosimeters7
Schottky Barrier Characteristic Analysis on 4H-SiC Schottky Barrier Diodes With Heavy Ion-Induced Degradation7
A Modified Steady-State Method for Space Charge-Limited Effect of SGEMP7
Partial TMR for Improving the Soft Error Reliability of SRAM-Based FPGA Designs7
Radiation-Hardened Cortex-R4F System-on-Chip Prototype With Total Ionizing Dose Dynamic Compensation in 28-nm FD-SOI7
The Influence of Ion Track Characteristics on Single-Event Upsets and Multiple-Cell Upsets in Nanometer SRAM7
A High Spatial Resolution Muon Tomography Prototype System Based on Micromegas Detector7
Temperature Dependence of Radiation-Induced Attenuation of a Fluorine-Doped Single-Mode Optical Fiber at Infrared Wavelengths7
Charge Trapping and Transconductance Degradation in Irradiated 3-D Sequentially Integrated FDSOI MOSFETs7
Considerations for Training an Artificial Neural Network for Particle Type Identification7
Compton Background Elimination for in Vivo X-Ray Fluorescence Imaging of Gold Nanoparticles Using Convolutional Neural Network7
Reflectance of Silicon Photomultipliers at Vacuum Ultraviolet Wavelengths7
Row–Column Readout Method to Mitigate Radiographic-Image Blurring From Multipixel Events in a Coded-Aperture Imaging System7
Analysis and Mitigation of Single-Event Gate Rupture in VDMOS With Termination Structure7
Polaris-LAMP: Multi-Modal 3-D Image Reconstruction With a Commercial Gamma-Ray Imager7
Ionization and Displacement Damage on Nanostructure of Spin–Orbit Torque Magnetic Tunnel Junction7
Displacement Damage Characterization of CMOS Single-Photon Avalanche Diodes: Alpha-Particle and Fast-Neutron Measurements7
Crystal Growth and Optimization of Cs2LiLaBr6 Scintillator via the Cs2LaBr5-LiBr Phase Diagram Construction7
Electron Irradiation Effect on Van Der Waals Transistor for High-Detectivity Near-Infrared Photodetectors7
Comparison of Photoluminescence and Scintillation Properties Between Lu₂O₃:Eu Single Crystal and Transparent Ceramic7
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits7
LET and Range Characteristics of Proton Recoil Ions in Gallium Nitride (GaN)7
Low and Medium Earth-Orbit Error Rates Using Design-of-Experiments and Monte-Carlo Methods7
A Learning-Based Physical Model of Charge Transport in Room-Temperature Semiconductor Detectors7
The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon Diodes7
Influence of Supply Voltage and Body Biasing on Single-Event Upsets and Single-Event Transients in UTBB FD-SOI7
Temperature Effect on the Radioluminescence of Cu-, Ce-, and CuCe-Doped Silica-Based Fiber Materials6
Study of Multicell Upsets in SRAM at a 5-nm Bulk FinFET Node6
Analytical Model of the Discharge Transient in Pulsed-Reset Charge-Sensitive Amplifiers6
Versatile Configuration and Control Framework for Real-Time Data Acquisition Systems6
Performance of an F-Doped Fiber Under Very High Ionizing Radiation Exposures6
A Code Verification for the Cavity SGEMP Simulation Code LASER-SGEMP6
A Lightweight Mitigation Technique for Resource- Constrained Devices Executing DNN Inference Models Under Neutron Radiation6
Quantitative Prediction of Ion-Induced Single-Event Transients in an Operational Amplifier Using a Quasi-Bessel Beam Pulsed-Laser Approach6
Influence of Hydrogen Treatment on Electrical Properties of Detector-Grade CdMnTe:In Crystals6
Impact of the Bitcell Topology on the Multiple-Cell Upsets Observed in VLSI Nanoscale SRAMs6
Mitigating Total-Ionizing-Dose-Induced Threshold-Voltage Shifts Using Back-Gate Biasing in 22-nm FD-SOI Transistors6
Combined Effects of Proton Irradiation and Forward Gate-Bias Stress on the Interface Traps in AlGaN/GaN Heterostructure6
Design of 4π High-Efficiency Directional Radiation Detector Based on Compton Scattering6
An SRAM SEU Cross Section Curve Physics Model6
Total Ionizing Dose Effects on the Power-Up State of Static Random-Access Memory6
Development of L-Bent Positron Detectors for μSR Applications at China Spallation Neutron Source6
Postirradiation Transmission Characteristics of CYTOP Fiber Exposed by Gamma Radiation6
Comparison of Total Ionizing Dose Effects in SOI FinFETs Between Room and High Temperature6
Real-Time Characterization of Neutron-Induced SEUs in Fusion Experiments at WEST Tokamak During D-D Plasma Operation6
Low-Noise Analog Channel for the Readout of the Si(Li) Detector of the GAPS Experiment6
Investigation on Transient Ionizing Radiation Effects in a 4-Mb SRAM With Dual Supply Voltages6
Pulsed-Laser Testing to Quantitatively Evaluate Latchup Sensitivity in Mixed-Signal ASICs6
Analysis of Bipolar Integrated Circuit Degradation Mechanisms Against Combined TID–DD Effects6
Citation Impact of Outstanding Conference Papers of the IEEE Nuclear and Space Radiation Effects Conference6
Comparison of Parallel Implementation Strategies in GPU-Accelerated System-on-Chip Under Proton Irradiation6
Ionizing Radiation Effects in SONOS-Based Neuromorphic Inference Accelerators6
Nuclide Identification Algorithm for the Large-Size Plastic Detectors Based on Artificial Neural Network6
Total Ionizing Dose Effects on Multistate HfOₓ-Based RRAM Synaptic Array6
Assessment of Radiation Effects on Attitude Estimation Processing for Autonomous Things6
Displacement Damage Effects Mitigation Approach for Heterojunction Bipolar Transistor Frequency Synthesizers6
Improvement of Energy Resolution and Neutron–Gamma Discrimination of NaI:Tl,6Li Single Crystal Scintillators by Ca2+ and Sr2+ Co-Doping6
Characterization of the Total Charge and Time Duration for Single-Event Transient Voltage Pulses in a 65-nm CMOS Technology6
Single-Event Effects on Commercial-Off-the-Shelf Edge-Processing Artificial Intelligence ASICs6
A Heavy-Ion Beam Monitor Based on 3-D NAND Flash Memories6
Properties of High-Energy X-Ray Detector With Heavy-Metal-Oxide Nanoparticle-Loaded Plastic Scintillator6
Relating Gain Degradation to Defects Production in Neutron-Irradiated 4H-SiC Transistors6
Frame-Level Intermodular Configuration Scrubbing of On-Detector FPGAs for the ARICH at Belle II6
Measurements of Low-Energy Protons Using a Silicon Detector for Application to SEE Testing6
Experimental Study of Transient Dose Rate Effect on System-in-Package SZ05016
Mapping the Spatial Dependence of Charge-Collection Efficiency in Semiconductor Devices Using Pulsed-Laser Testing6
Thermal Neutron Discrimination Using a Novel Phoswich Detector of Gd3Ga3Al2O12:Ce,B and CsI:Tl Single Crystals6
Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Core Digital Structures6
Design and Beam Test Results for the 2-D Projective sPHENIX Electromagnetic Calorimeter Prototype6
Reliability Improvement on SRAM Physical Unclonable Function (PUF) Using an 8T Cell in 28 nm FDSOI6
Effects of Ion-Induced Displacement Damage on GaN/AlN MEMS Resonators6
A Compact Front-End Circuit for a Monolithic Sensor in a 65-nm CMOS Imaging Technology6
Source Switched Charge-Pump PLLs for High-Dose Radiation Environments6
TID Response and Radiation-Enhanced Hot-Carrier Degradation in 65-nm nMOSFETs: Concerns on the Layout-Dependent Effects6
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