IEEE Transactions on Nuclear Science

Papers
(The H4-Index of IEEE Transactions on Nuclear Science is 21. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2020-04-01 to 2024-04-01.)
ArticleCitations
Total-Ionizing-Dose Effects, Border Traps, and 1/f Noise in Emerging MOS Technologies69
Radiation Effects in a Post-Moore World50
Automatic and Real-Time Identification of Radionuclides in Gamma-Ray Spectra: A New Method Based on Convolutional Neural Network Trained With Synthetic Data Set44
Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison With Transistor Performance37
Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs37
Comparison of Zr, Bi, Ti, and Ga as Metal Contacts in Inorganic Perovskite CsPbBr₃ Gamma-Ray Detector35
Ionizing-Radiation Response and Low-Frequency Noise of 28-nm MOSFETs at Ultrahigh Doses35
Electron, Neutron, and Proton Irradiation Effects on SiC Radiation Detectors34
Understanding the Impact of Quantization, Accuracy, and Radiation on the Reliability of Convolutional Neural Networks on FPGAs33
Radiation Effects in AlGaN/GaN HEMTs32
Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs28
Evaluating Soft Core RISC-V Processor in SRAM-Based FPGA Under Radiation Effects27
GAMMA: A 16-Channel Spectroscopic ASIC for SiPMs Readout With 84-dB Dynamic Range27
The MiniSDD-Based 1-Mpixel Camera of the DSSC Project for the European XFEL27
Radiation Effects in Advanced and Emerging Nonvolatile Memories26
A Reconfigurable Neural Network ASIC for Detector Front-End Data Compression at the HL-LHC25
Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies24
Ion-Induced Mesoplasma Formation and Thermal Destruction in 4H-SiC Power MOSFET Devices23
SIRIO: A High-Speed CMOS Charge-Sensitive Amplifier for High-Energy-Resolution X-γ Ray Spectroscopy With Semiconductor Detectors23
How Reduced Data Precision and Degree of Parallelism Impact the Reliability of Convolutional Neural Networks on FPGAs22
TID Degradation Mechanisms in 16-nm Bulk FinFETs Irradiated to Ultrahigh Doses21
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