IEEE Transactions on Nuclear Science

Papers
(The H4-Index of IEEE Transactions on Nuclear Science is 21. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-05-01 to 2026-05-01.)
ArticleCitations
Analyzing the Performance of Bayesian Aggregation Under Erroneous Environmental Beliefs116
IEEE Transactions on Nuclear Science publication information78
Chopped Deflector Technique for Single-Bunch Extraction at the 88-in Cyclotron57
Comparison of Gamma Radiation Effects on CCD Cameras Under Different Bias Conditions Using Image Analysis Techniques48
Network-Distributed Data-Acquisition System for Photoproduction Experiments With LEPS247
L1Topo: The Level-1 Topological Processor for ATLAS Phase-I Upgrade and Its Firmware Evolution for Use Within the Phase-II Global Trigger46
IEEE Transactions on Nuclear Science information for authors42
IEEE Transactions on Nuclear Science information for authors37
Simulation Study on Pinhole Imaging of ²³⁹Pu Using Nuclear Resonance Fluorescence With Laser Compton Scattering Gamma Rays36
SCARLET: A Readout ASIC Bump-Bonded to SDD Array for Large Event Throughput34
Proton-Induced Activation of New Scintillator Materials: SrI, GAGG, CLLB, CLLBC, TLYC, CLYC-732
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society29
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society27
List of Reviewers RADECS 2022 Special Issue26
Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society25
2022 IEEE Nuclear and Space Radiation Effects Conference Awards: Comments by the Chair23
Errata to “Effectiveness of NIEL as a Predictor of Single-Event Displacement Damage Effects in CMOS Circuits”23
Table of Contents22
IEEE Transactions on Nuclear Science publication information22
Use of Different Reactor Physics Models and CADIS Accelerated MCNP to Yield a 1 MeV Silicon Equivalent Flux for Neutron Damage21
Online Dark Count Rate Measurements in 150 nm CMOS SPADs Exposed to Low Neutron Fluxes21
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