IEEE Transactions on Electron Devices

Papers
(The TQCC of IEEE Transactions on Electron Devices is 8. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2021-10-01 to 2025-10-01.)
ArticleCitations
Utilizing Valley–Spin Hall Effect in Monolayer WSe2 for Designing Low Power Nonvolatile Spintronic Devices and Flip-Flops165
Demonstration of Reconfigurable FET and Logic Gates on Epitaxial Lateral Overgrowth Silicon Platform128
The Regime of the Efficiency Increase by Use of Long Circuits in the THz Cherenkov Oscillator95
Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors94
Study of the Input Cavity Characteristics With Two-Beam Loading for Developing a Compact and High-Power Ka-Band Klystron87
Changes in the Editorial Board79
IEEE Transactions on Electron Devices information for authors71
IEEE Transactions on Electron Devices publication information71
Compact Numerical Modeling of Indirect Time-of-Flight CMOS Image Sensors68
Design and Characterization of n/p-well CMOS SPAD With Low Dark Count Rate and High Photon Detection Efficiency62
Improved Performance of MoS2 Negative-Capacitance Field-Effect Transistors by Optimizing Gate-Stack of Al-Doped HfO2/Al2O362
Orientation Polarization Effect in Al2O3/Hydrogen-Terminated Diamond MISFETs59
Cyclotron Resonance Maser With Zigzag Quasi-Optical Transmission Line: Concept and Modeling56
A 0.35-THz Extended Interaction Oscillator Based on Overmoded and Bi-Periodic Structure56
Investigation of Bending-Induced Degradation of Flexible AlGaN/GaN HEMTs55
Mobility Enhancement Induced by Oxygen Gettering of TiAl for Metal Gated NMOSFETs54
Numerical Modeling of Dynamic Thermal Coupling in GaN HEMTs Calibrated by Transient Measurements54
The Reliability and Noise Investigation of Boron Diffusion Under Positive Bias Temperature Instability in 16 nm Node High Voltage FinFETs54
Unipolar Conductivity Enhancement and Its Experiments in SOI-LIGBT53
Test and Analysis on the Gyromagnetic Nonlinear Transmission Lines With Different Magnetic Cores52
Low-Frequency Noise of 4H-SiC CMOS Technology for Analog ICs52
Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”52
Fabrication and Characterization of a Novel Varistor Based on AlInGaN/GaN Heterojunction Epitaxy on High Resistance Silicon (111) Substrates51
Performance Regulation of Near-Field Electroluminescent Cooling Device Based on 2-D Material51
Low-Voltage Operated High DC Gain Amplification Stage Based on Large-Area Manufacturable Amorphous Oxide Semiconductor Thin-Film Transistor51
Reduction of Metal/Carbon Nano-Tubes Interface Contact Resistance by Floating Catalyst Growing Method and Semimetals50
A True Random Number Generator Based on High-Speed Ag/a-Si/Pt Memristor49
Accurate and Efficient Algorithm for Computing Structure Functions From the Spatial Distribution of Thermal Properties in Electronic Devices49
Temperature-Dependent Dynamic Ron of GaN E-HEMTs: The Impact of p-GaN Drain49
Performance Boost of Si TFETs by Insertion of III–V Dipole Formation Layer: A First Principle Study48
A Physics-Based Compact Model for Silicon Cold-Source Transistors48
Analytical Modeling of Potential Barrier for Charge Transfer in Pinned Photodiode CMOS Image Sensors48
Preparation of Dome-Shaped SiO2/Al2O3 Composite-Patterned Sapphire Substrate for High-Performance Mini-LED Backlight Modules47
Modeling and Analysis of Terminal Capacitances in High-Power Devices: Application to p-GaN Gate HEMTs45
Compact Modeling of Impact Ionization in High-Voltage Devices45
Design and Testing of Metal Photocathode X-Ray Source Based on Microchannel Plate45
Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors45
Capacitance Modeling With Charge Partitions Covering Full-Region Operations of TFETs45
First Experimental Demonstration of TiN x O y Resistive Field Plate on p-GaN HEMTs Wi44
Avalanche Breakdown in the Base-Emitter- Shorted Silicon Avalanche Transistor Affected by Voltage Ramp44
Compact E-Band Sheet Beam Folded Waveguide Traveling Wave Tube for High Data Rate Communication44
Opposing Mean Error Compensation for Accuracy Enhancement in Analog Compute-in-Memory With Resistive Switching Devices44
Electrical Characterization of AlGaN/GaN-HEMTs on Semi-Insulating GaN Substrates Doped With Fe, C, or Mn and Grown by Hydride Vapor Phase Epitaxy43
Physical Compact Model for Source-Gated Transistors for DC Application43
Modeling Thermal Effects for 28-nm Node Fully Depleted SOI Devices Under Cryogenic Temperatures43
400-V Amorphous IGZO Thin-Film Transistors With Drift Region Doped by Hydrogen43
Call for Nominations for Editor-in-Chief: IEEE Transactions on Semiconductor Manufacturing43
Table of Contents42
Numerical Analysis for a P-Drift Region N-IGBT With Enhanced Dynamic Electric Field Modulation Effect42
Spontaneously Oxidized CuxO/β-Ga2O3 p-n Junction for Self-Powered Deep-Ultraviolet Photodetection41
Intrinsic Gate Capacitance of Ultrathin Body Nanosheets Considering Quantum Effects41
Enhancement of ISPP Efficiency Using Neural Network-Based Optimization of 3-D NAND Cell40
BTI Reliability of IGZTO FETs: Hydrogen Dynamics, AC/DC Stress Effects, and Advanced Modeling40
The Influence of Hole Transport in GaN Super-Heterojunction Transistor Switching Time39
Comments on “Experimental Demonstration of Memristor-Aided Logic (MAGIC) Using Valence Change Memory (VCM)”39
HEMT With Ultralow Contact Resistance by Room Temperature Process With One-Step EBL T-Shape Gates for Subterahertz Applications: Design, Fabrication, and Characterization39
15 GHz GaN Hi–Lo IMPATT Diodes With Pulsed Peak Power of 25.5 W39
Novel Ultrafast Backscattered Electron Detector With Field-Effect Transistor Enhanced In Situ Signal Amplification39
Low-Resistance and Thermally Stable Ohmic Contacts on n-GeSn Using Ni and Ti Metallization38
Fabrication and Characterization of Self-Assembled Low Voltage Operated OTFT for H2S Gas Sensor for Oil and Gas Industry38
Alpha Particle Detection Using Highly Rectifying Ni/Ga2O3/4H-SiC Heteroepitaxial MOS Junction38
Theoretical Study for Carrier Transit Limited Performance of Gate-All-Around Si Nanowire Transistor by Time-Dependent Quantum Transport Simulation38
Highly Efficient Gyrotron Mode Converter With a Launcher Changing Angular Spectrum of the Operating Mode37
Investigating Thermionic Emission Properties of Polycrystalline Perovskite BaMoO337
Controlled Acceleration of PCM Cells Time Drift Through On-Chip Current-Induced Annealing for AIMC Multilevel MVM Computation37
Design and Experimental Demonstration of 4H-SiC Lateral High-Voltage MOSFETs With Double-RESURFs Technology for Power ICs37
Linearity Performance of Derivative Superposition in GaN HEMTs: A Device-to-Circuit Perspective36
Plasma Jet Printing: An Introduction36
Enhanced Resistive Switching in Flexible Hybrid RRAM Devices With PVK:MoS2/TiO2 Bilayer36
Extended Scale Length Theory for Low-Dimensional Field-Effect Transistors36
Performance Enhancement of Thin-Film Transistor Based on In2O3:F/In2O3 Homojunction36
Defect-Engineered Resistive Switching in van der Waal Metals35
Suppression of Circularly Polarized Microwave Dielectric Multipactor by Normal Gyromagnetic Field35
Interfacial Layer Engineering in Sub-5-nm HZO: Enabling Low-Temperature Process, Low-Voltage Operation, and High Robustness35
Influences of Adjacent High Voltage on the Characteristics and Reliability of SOI Power Devices for Automotive Application35
Sigmoid Probabilistic Bits Using SiO Threshold Switching Devices for Probabilistic Computing35
Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide FETs34
Investigation of Peak-to-Valley Current Ratio of GaN/AlN Resonant Tunneling Diodes34
A High Voltage Gain Inverter Integrated With Enhancement- and Depletion-Mode a-InGaZnO Thin-Film Transistors34
Analysis of Vertical GaN JBS and p-n Diodes by Mg Ion Implantation and Ultrahigh-Pressure Annealing34
Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress34
Stack Optimization of TiO x -Based Resistive Switching Devices Through Interface Engineering34
Understanding Switching Mechanism of Selector-Only Memory Using Se-Based Ovonic Threshold Switch Device34
Temperature-Dependent Accuracy Analysis and Resistance Temperature Correction in RRAM-Based In-Memory Computing34
Characterization of Trapping Effects Related to Carbon Doping Level in AlGaN Back-Barriers for AlGaN/GaN HEMTs34
Effect of Trap Behavior on Recombination in AlGaN-Based UV-C LEDs Degradation34
Exploring the Effect of Dy Doping on the Performance of Solution-Processed Indium Oxide Thin Films and Thin-Film Transistors33
Synaptic Transistors Based on Electrospun Aligned Nanowire for Neuromorphic Computing33
Frequency Doubler Based on Ferroelectric Tunnel Field-Effect Transistor33
The Investigation of Reduced Variation Effect in FinFETs With Ultrathin 3-nm Ferroelectric Hf₀.₅Zr₀.₅O₂33
Barrier Lowering-Induced Capacitance Increase of Short-Channel Power p-GaN HEMTs at High Temperature33
Peak Response Wavelength Tunable 4H-SiC UV Detector Covering Near-Ultraviolet Region With High-Temperature Stability and Radiation Hardness32
Effect of X-Ray Irradiation on Colloidal Quantum Dot SWIR CMOS Image Sensor32
Preliminary Analysis of the Coaxial Double Staggered Grating Structure for a Hollow Beam Backward Wave Oscillator32
Stochastic Resonance in HfO₂-Based Memristors: Impact of External Noise on the Binary STDP Protocol32
IEEE Transactions on Electron Devices Publication Information32
Research on Folded Double-Groove Waveguide With Two Sheet Beams Operating on High-Order TE20 Mode for High-Power Terahertz TWT32
Pinned Photodiode Imaging Pixel With Floating Gate Readout and Dual Gain32
Application of Pulsed Green Laser Activation to Top-Tier MOSFET Fabrication for Monolithic 3-D Integration32
Analysis of the Avalanche Operation of a GaN Photoconductive Semiconductor Switch32
TiO2 Nanofibers Doped With NiS as Photoanode to Improve the Photovoltaic Conversion Efficiency of Dye-Sensitized Solar Cells32
Mode-Locking Operation of a Ka-Band Helical Gyro-BWO Equipped With a Saturable-Absorber Feedback Loop32
Linear Error Correction Codec Implementation Based on an In-Memory Computing Architecture for Nonvolatile Memories31
CRESCENT-1D: A 1-D Solver of Coupled Charge and Light Transport in Heterostructures for the Design of Near-Field Thermophotonic Engines31
Effect of Microwave Leakage on Backward Current in an X-Band Dual-Mode RBWO Packaged With Permanent Magnet31
Grating Perovskite Enhanced Polarization-Sensitive GaAs-Based Photodetector31
Investigation on Robust Avalanche Capacity of Super-Junction IGBT Under UIS Stress31
1.2-kV Vertical GaN PIN Rectifier With Ion-Implanted Floating Guard Rings31
Optimized Design of W-Band High-Power Folded-Waveguide Traveling-Wave Tube31
Study of Drain Injected Breakdown Mechanisms in AlGaN/GaN-on-SiC HEMTs31
Complementary Vacuum Field Emission Transistor31
Impedance Spectroscopy of Hafnium Oxide: Memristive and Memcapacitive Switching With Annealing31
Endurance Study of Silicon-Doped Hafnium Oxide (HSO) and Zirconium-Doped Hafnium Oxide (HZO)-Based FeFET Memory31
Proposal of Low-Loss Non-Volatile Mid-Infrared Optical Phase Shifter Based on Ge2Sb2Te3S231
A Method to Isolate Intrinsic HCD and NBTI Contributions Under Self Heating During Varying VG/VD Stress in GAA Nanosheet PFETs31
Energy and Disturbance Analysis of 1T-DRAM With Nanowire Gate-All-Around RFET30
Three-Dimensional Design of a 4H-SiC NPN Lateral Phototransistor for Micro-Pixel in Ultraviolet Optoelectronic Integration30
Investigation of Self-Heating Effects in Vertically Stacked GAA MOSFET With Wrap-Around Contact30
SiC Trench MOSFET With Embedded Schottky Super Barrier Rectifier for High Temperature Ruggedness30
Electrical Stress on the CMOS Inverters Made by Junctionless Gate-All-Around Transistors29
Gate Stress Polarity Dependence of AC Bias Temperature Instability in Silicon Carbide MOSFETs29
Tight-Binding Device Modeling of 2-D Topological Insulator Field-Effect Transistors With Gate-Induced Phase Transition29
Implementing a Ternary Inverter Using Dual-Pocket Tunnel Field-Effect Transistors29
Transport Properties of 5-nm Tunnel Field-Effect Transistor for High-Performance Switches Decorated With Blue Phosphorene and Transition Metals29
High-Voltage E-Mode p-GaN Gate HEMT on Sapphire With Gate Termination Extension29
L-Cysteine Functionalized Al0.18Ga0.82N/GaN High Electron Mobility Transistor Sensor for Copper Ion Detection29
Model of Finite Velocity Injection Into Coaxial Cylindrical Diode Based on Ramo-Shockley Theory29
Influence of BCB Protection on Irradiation Response of InP-Based HEMTs: A Comparative Study29
Channel Thickness and Grain Size Engineering for Improvement of Variability and Performance in 3-D NAND Flash Memory29
Temperature-Dependent Dynamic Performance of p-GaN Gate HEMT on Si29
A Sheet Beam Electron Gun Based on Carbon Nanotube Cold Cathode29
Design and Experiment of 1 THz Slow Wave Structure Fabricated by Nano-CNC Technology28
High-Throughput Screening Ferroelectric–Dielectric Heterostructure for Robust Memristor and Artificial Synapse28
Metamaterial-Inspired 0.22 THz Traveling-Wave Tubes With Double Sheet Beams28
Pd/Ge/Ti/Pt/Au Metal Stack on Semi-Insulating Gallium Arsenide: Ohmic Contact and Temperature Dependence28
Gate Oxide Instability of 4H-SiC p-Channel MOSFET Induced by AC Stress at 200 °C28
Design of High-Sensitivity Piezoelectric Micromachined Ultrasonic Transducer Based on Single-Crystal Lithium Niobate Thin Films28
Partial Recovery of Dynamic R ON Versus OFF-State Stress Voltage in p-GaN Gate AlGaN/GaN Power HEMTs28
High Switching Speed and Stability ECM STO Resistive Memory on n+-Si Substrate Realized Using Cu Filament Mechanism28
Symmetric BSIM-SOI—Part II: A Compact Model for Partially Depleted SOI MOSFETs28
A MEMS Thermopile Pirani Sensor Integrated With Composite Nanoforests for Vacuum Monitoring in Semiconductor Equipment28
Mathematical Modeling of Field Emission From a Microscale-Size Cathode to a Vacuum27
IEEE ELECTRON DEVICES SOCIETY27
Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET27
Enhancing Optical Performance for White Light-Emitting Diodes Using Quantum- Dots/Boron Nitride Hybrid Reflective Structure27
Low-Power Ultradeep-Submicrometer Junctionless Carbon Nanotube Field-Effect Diode27
Event-Driven CsPbBr3 Perovskite Visual Neurons for Motion Direction Recognition in Low-Light Scenes27
IEEE Transactions on Electron Devices Information for Authors27
TechRxiv: Share Your Preprint Research with the World!27
Toward the Understanding on Threshold Voltage Drift Mechanisms in GaN MOSc-HEMTs Through the Influence of Device Architecture27
Optimization of a Cusp Gun With a Grid for a Terahertz Gyrotron Traveling-Wave Amplifier27
SOT-MRAM-Based Design for Energy-Efficient and Reliable Binary Neural Network Acceleration27
Fully On-Chip MAC at 14 nm Enabled by Accurate Row-Wise Programming of PCM-Based Weights and Parallel Vector-Transport in Duration-Format27
IEEE ELECTRON DEVICES SOCIETY27
IEEE Transactions on Electron Devices information for authors27
Corrections to “Low-Temperature Microwave Annealing Processes for Future IC Fabrication—A Review” [Mar 14 651-665]27
Cross-Coupled Gated Tunneling Diodes With Unprecedented PVCRs Enabling Compact SRAM Design—Part I: Device Concept27
Toward the Development of High-Performance Direct Electron Detectors by Means of TCAD Simulations27
Machine-Learning-Assisted Anchor Loss Reduction of MEMS Resonator With One-Dimensional Phononic Crystal Tether26
High-Performance Flexible Solution-Processed Organic Nonvolatile Memory Transistors26
Junction Temperature Correction Method for SiC MOSFET Based on Turn-Off Oscillation Frequency of Drain-Source Voltage26
Unleashing Endurance Limits of Emerging Memory: Multi-Level FeRAM Recovery Array Empowered by a Coordinated Inverting Amplifier Circuit26
Resistive Switching Characteristics of HfO x -Based Memristor by Inserting GeTe Layer26
A Novel Electron Gun Design Approach With an Externally Assembled Anode26
Impacts of SiO2-Buried Structure on Performances of GaN-Based Vertical-Cavity Surface-Emitting Lasers26
Neuromorphic System Using Crosspoint-Type TaO x /Ta Memristors and Direct Device Training for Associative Memory26
Enhanced Resistive Switching Performances of Mn-Doped BiFeO₃ Memristor by Introducing Oxygen Reservoir Interface26
Improved Scalability of Negative Capacitance Junctionless Transistors With Underlap Design25
Investigation on Degradation of 1200-V Planar and Trench SiC MOSFET Under Surge Current Stress of Body Diode25
Plateau Voltage and Dynamic Capacitance Effect on SiC MOSFETs’ Gate Ringing25
Scaling of GaSb/InAs Vertical Nanowire Esaki Diodes Down to Sub-10-nm Diameter25
Monolithic Integration of Oxide Semiconductor FET and Ferroelectric Capacitor Enabled by Sn-Doped InGaZnO for 3-D Embedded RAM Application25
Impact of Nonuniform Ozone Anneal Treatment on the Resistance Levels in an IGZO-ReRAM Fabricated on ITO-Coated Glass Substrate25
A Cross-Band High-Power Microwave Generator With Wide Frequency Tunability Based on a Relativistic Magnetron and a Radial Transit-Time Oscillator25
Dynamic Thermal Management in SOI Transistors Using Holey Silicon-Based Thermoelectric Cooling25
Tandem Evaluation of AlN/β - and ε-Ga2O3 Tri-Gate MOSHEMTs25
A Low-Loss Diode Integrated SiC Trench MOSFET for Improving Switching Performance25
High Number of Transport Modes: A Requirement for Contact Resistance Reduction to Atomically Thin Semiconductors25
Extreme Anisotropic Dispersion and One-Dimensional Confined Electrons in 2-D SiP₂ FETs With High Transmission Coefficients25
A Finite Element Analysis for Vacuum Amplifier Electron Gun of Fine Pencil Beam25
High Breakdown Voltage and High Current Injection Vertical GaN-on-GaN p-n Diodes With Extremely Low On-Resistance Fabricated on Ammonothermally Grown Bulk GaN Substrates25
Comparison of Single-Event Transient Under Heavy Ion and Pulsed Laser Irradiation in SiGe HBT Ultrawideband LNA25
Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Currents of Scaled MOSFETs25
Analysis of Abnormal GIDL Current Degradation Under Hot Carrier Stress in DSOI-MOSFETs25
Investigation of Threshold Voltage Instability of SiC MOSFETs Under Different Gate Voltage Sequences25
Thermionic Electron Emission Capacity of the Ba₃ScGa₂O₇.₅ Impregnated Cathode24
Blank Page24
Novel Low-Loss 0.65-THz Multisectional Folded Waveguide High-Frequency Circuit24
IEEE Transactions on Electron Devices Information for Authors24
Device-Level Thermal Analysis for Gallium Oxide Lateral Field-Effect Transistor24
Two-Dimensional Photothermal Modeling of Multichip LEDs Device With Thermal Coupling Matrix by Microscopic Hyperspectral Imaging24
Characterization and Analysis of 4H-SiC Super Junction JFETs Fabricated by Sidewall Implantation24
Online Junction Temperature Detection for IGBTs Using Voltage Rise Time24
Enabling Low-Power Charge-Domain Nonvolatile Computing-in-Memory (CIM) With Ferroelectric Memcapacitor24
Design and Cold Test of a G-Band 10-kW-Level Pulse TE01-Mode Gyrotron Traveling-Wave Tube24
IEEE ELECTRON DEVICES SOCIETY24
A Difference-Microvariation Solution and Analytical Model for Generic HEMTs24
Novel Integrated Double pMOS SOI-LIGBT With Low Loss and High Short-Circuit Capability24
Investigation of a Low-Loss Transmission Structure for W-Band TWT24
Cu–Cu Bonded Microbump Interconnects With a 10-μm Pitch for 3-D-Stacked Chiplets24
An Easy-to-Fabricate Circular TE₂₁/TE₀₁ Mode Generator24
Unveiling Unintentional Fluorine Doping in TMDs During the Reactive Ion Etching: Root Cause Analysis, Physical Insights, and Solution24
IEEE Transactions on Electron Devices Information for Authors24
Sub-μm Gate-All-Around-Like Amorphous-InGaZnO Transistors With Record-High fT of 2.09 GHz24
Investigation of a Multibeam Magnetron Injection Gun for a W-Band Sectorial-Tunnel Gyro-TWT24
Source-Drain Series Resistance Model for N-Stack Nanosheet FETs Using Transmission Line Matrix Method23
Role of Channel Inversion in Ambient Degradation of Phosphorene FETs23
Comprehensive Study of Improved Negative-Bias-Illumination-Temperature Stress Stability in Terbium-Doped Indium-Zinc-Oxide Thin-Film Transistors23
Stochastic Resonance Modeling of Floating Gate-Based Neurons in Summing Networks for Accurate and Energy-Efficient Operations23
Simulation-Based Study of High-Permittivity Inserted-Oxide FinFET With Low-Permittivity Inner Spacers23
High-Sensitivity Single-Walled Carbon Nanotube/Graphene/Al₂O₃/Ge Near-Infrared Photodetector23
Evaluation of a Large Area, 83 μm Pixel Pitch Amorphous Selenium Indirect Flat Panel Detector23
Control of Resistive Switching Endurance in TiO2/TiO2–x Memristors via Thermally Assisted Oxygen Plasma With Power Modulation23
A Data-Driven Remaining Useful Life Prediction Method for Power MOSFETs Considering Nonlinear Dynamical Behaviors23
Nearly Ideal Breakdown Voltage Observed in Lateral p-i-n Diodes Fabricated on a SiC High-Purity Semi-Insulating Substrate23
Ultrathin Indium Oxide Thin-Film Transistors With Gigahertz Operation Frequency23
Reliability of Advanced Nodes23
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Wide Band Gap Semiconductors for Automotive Applications23
IEEE Transactions on Electron Devices Information for Authors22
Electrical Stability of MOS Structures With AlON and Al₂O₃ Dielectrics Deposited on n- and p-Type GaN22
HfO2–ZrO2 Superlattice Ferroelectric Field-Effect Transistor With Improved Endurance and Fatigue Recovery Performance22
Novel Enhance-Mode AlGaN/GaN JFET With BV of Over 1.2 kV Maintaining Low R ON,sp22
Demonstration of 1.2-kV Rated Novel Power Poly-Si/4H-SiC Heterojunction Diode With Record Low Forward Voltage Drop22
Design and Power Capacity Investigation of a Q-Band 100-kW-Continuous-Wave Gyro-TWT22
Design and Development of Polarization-Enhanced E-Mode GaN p-FET and Complementary Logic (CL) Circuits22
Improvement of Electron Gun Breakdown Performance Through Surface Flashover and Discharge Studies22
Real-Time Ultraviolet Flame Detection System Based on 4H-SiC Phototransistor22
A High RF-Performance AlGaN/GaN HEMT With Ultrathin Barrier and Stressor In Situ SiN22
An Analytical Model of RRAM Relaxation Effect and Its Application for Neural Network Weight Refresh Strategy in Large-Scale RRAM Array22
The ESD Behavior of D-Mode GaN MIS-HEMT22
Dielectrics for 2-D Electronics: From Device to Circuit Applications22
Impact of Back-Gate Bias on the Total Ionizing Dose and Hot Carrier Injection Effects in Double SOI nMOSFETs22
Highly Sensitive Free-Standing Waveguide-Integrated Bolometer on Germanium-on-Insulator Platform for Mid-Infrared On-Chip Spectroscopy22
Study on Schottky Al x Ga1-x N/GaN IMPATT Diodes for Millimeter-Wave Application22
Hybrid Integration of Gate-All-Around Stacked Si Nanosheet FET and Si/SiGe Super-Lattice FinFET to Optimize 6T-SRAM for N3 Node and Beyond22
Comprehensive Investigation of Gate Oxide Instability in 4H-SiC MOSFETs and MOS Capacitors Under High Gate Bias Stress22
A Photoelectric Synergistically Excited Cold-Cathode High-Frequency Radiation Source: From GHz to THz22
Self-Heating Mitigation of TreeFETs by Interbridges22
Single-Event Effects of AlGaN/GaN HEMTs Under Different Biases22
Switching Dynamics of HfO2–ZrO2 Nanolaminates With Different Laminate Thicknesses22
Thermal Dynamic of Single-Event Burnout in SiC Power MOSFETs21
Bulk Field Effect Diode21
A RepetitiveKu-Band Coaxial Relativistic Klystron Amplifier Packaged With Permanent Magnets21
Multiport Relativistic Magnetron for Phased Array Application21
Advanced Bragg Resonator Integration for Enhanced Bandwidth and Stability in G-Band TWT With Staggered Double Vane Structure21
Effect of Substrate Bias in Ohmic p-Gate GaN-HEMTs on Unclamped Inductive Switching Capability21
1.7-kV Vertical GaN-on-GaN Schottky Barrier Diodes With Helium-Implanted Edge Termination21
Temperature-Dependent High Magnetoresistance in Zigzag Silicene Nanoribbon Heterostructure21
Analysis of SiC NPN Ultraviolet Phototransistor Under Ultrahigh Temperature21
Back-End-of-Line-Compatible Scaled InGaZnO Transistors by Atomic Layer Deposition21
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