IEEE Transactions on Electron Devices

Papers
(The TQCC of IEEE Transactions on Electron Devices is 8. The table below lists those papers that are above that threshold based on CrossRef citation counts [max. 250 papers]. The publications cover those that have been published in the past four years, i.e., from 2022-04-01 to 2026-04-01.)
ArticleCitations
IEEE Transactions on Electron Devices information for authors312
Compact Numerical Modeling of Indirect Time-of-Flight CMOS Image Sensors161
Improved Performance of MoS2 Negative-Capacitance Field-Effect Transistors by Optimizing Gate-Stack of Al-Doped HfO2/Al2O3113
Mobility Enhancement Induced by Oxygen Gettering of TiAl for Metal Gated NMOSFETs108
Corrections to “Diamond-on-Si IGBT With Ultrahigh Breakdown Voltage and On-State Current”104
The Reliability and Noise Investigation of Boron Diffusion Under Positive Bias Temperature Instability in 16 nm Node High Voltage FinFETs104
Low-Frequency Noise of 4H-SiC CMOS Technology for Analog ICs91
Fabrication and Characterization of a Novel Varistor Based on AlInGaN/GaN Heterojunction Epitaxy on High Resistance Silicon (111) Substrates87
Utilizing Valley–Spin Hall Effect in Monolayer WSe2 for Designing Low Power Nonvolatile Spintronic Devices and Flip-Flops81
Demonstration of Reconfigurable FET and Logic Gates on Epitaxial Lateral Overgrowth Silicon Platform78
The Regime of the Efficiency Increase by Use of Long Circuits in the THz Cherenkov Oscillator69
Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors65
Changes in the Editorial Board65
Synaptic Transistors Based on Electrospun Aligned Nanowire for Neuromorphic Computing64
Table of Contents61
A Physics-Based Compact Model for Silicon Cold-Source Transistors60
Call for Nominations for Editor-in-Chief: IEEE Transactions on Semiconductor Manufacturing60
Investigation of Bending-Induced Degradation of Flexible AlGaN/GaN HEMTs59
Investigation on Robust Avalanche Capacity of Super-Junction IGBT Under UIS Stress58
Performance Boost of Si TFETs by Insertion of III–V Dipole Formation Layer: A First Principle Study56
Preliminary Analysis of the Coaxial Double Staggered Grating Structure for a Hollow Beam Backward Wave Oscillator55
High Switching Speed and Stability ECM STO Resistive Memory on n+-Si Substrate Realized Using Cu Filament Mechanism55
First Experimental Demonstration of TiN x O y Resistive Field Plate on p-GaN HEMTs Wi54
Analysis of the Avalanche Operation of a GaN Photoconductive Semiconductor Switch54
Mode-Locking Operation of a Ka-Band Helical Gyro-BWO Equipped With a Saturable-Absorber Feedback Loop52
Pinned Photodiode Imaging Pixel With Floating Gate Readout and Dual Gain51
A Method to Isolate Intrinsic HCD and NBTI Contributions Under Self Heating During Varying VG/VD Stress in GAA Nanosheet PFETs50
Electrical Stress on the CMOS Inverters Made by Junctionless Gate-All-Around Transistors49
CRESCENT-1D: A 1-D Solver of Coupled Charge and Light Transport in Heterostructures for the Design of Near-Field Thermophotonic Engines48
IEEE Transactions on Electron Devices Publication Information47
Stack Optimization of TiO x -Based Resistive Switching Devices Through Interface Engineering47
Research on Folded Double-Groove Waveguide With Two Sheet Beams Operating on High-Order TE20 Mode for High-Power Terahertz TWT46
Opposing Mean Error Compensation for Accuracy Enhancement in Analog Compute-in-Memory With Resistive Switching Devices46
Investigating Thermionic Emission Properties of Polycrystalline Perovskite BaMoO346
Model of Finite Velocity Injection Into Coaxial Cylindrical Diode Based on Ramo-Shockley Theory45
Effect of Trap Behavior on Recombination in AlGaN-Based UV-C LEDs Degradation45
Intrinsic Gate Capacitance of Ultrathin Body Nanosheets Considering Quantum Effects44
Application of Pulsed Green Laser Activation to Top-Tier MOSFET Fabrication for Monolithic 3-D Integration44
Effect of Source/Drain Electrode Materials on the Electrical Performance and Stability of Amorphous Indium-Tin-Zinc-Oxide FETs44
Exploring the Effect of Dy Doping on the Performance of Solution-Processed Indium Oxide Thin Films and Thin-Film Transistors44
Monolithic 3-D Integration of 2T0C DRAM and 1T1R RRAM for Accelerating Dynamic/Static Matrix Computation in Transformer Network43
Performance Regulation of Near-Field Electroluminescent Cooling Device Based on 2-D Material43
Design and Experiment of 1 THz Slow Wave Structure Fabricated by Nano-CNC Technology43
Roles of Trap States in the Dynamic Degradation of Polycrystalline Silicon Thin-Film Transistors Under AC Gate Bias Stress43
Optimized Design of W -Band High-Power Folded-Waveguide Traveling-Wave Tube43
The Influence of Hole Transport in GaN Super-Heterojunction Transistor Switching Time42
400-V Amorphous IGZO Thin-Film Transistors With Drift Region Doped by Hydrogen42
Defect-Engineered Resistive Switching in van der Waal Metals42
Compensation Method for Displacement Caused by CTE Mismatch in Micro-LED Bonding Process42
Suppression of Circularly Polarized Microwave Dielectric Multipactor by Normal Gyromagnetic Field42
Investigation of Peak-to-Valley Current Ratio of GaN/AlN Resonant Tunneling Diodes41
TiO2 Nanofibers Doped With NiS as Photoanode to Improve the Photovoltaic Conversion Efficiency of Dye-Sensitized Solar Cells41
Modeling and Analysis of Terminal Capacitances in High-Power Devices: Application to p-GaN Gate HEMTs41
HEMT With Ultralow Contact Resistance by Room Temperature Process With One-Step EBL T-Shape Gates for Subterahertz Applications: Design, Fabrication, and Characterization41
Event-Driven CsPbBr3 Perovskite Visual Neurons for Motion Direction Recognition in Low-Light Scenes40
The Investigation of Reduced Variation Effect in FinFETs With Ultrathin 3-nm Ferroelectric Hf₀.₅Zr₀.₅O₂40
Test and Analysis on the Gyromagnetic Nonlinear Transmission Lines With Different Magnetic Cores40
Reliable Operation of FeFET Reservoir Computing With Robustness Against Interface Degradation39
L-Cysteine Functionalized Al0.18Ga0.82N/GaN High Electron Mobility Transistor Sensor for Copper Ion Detection39
Research on Bonding Strength Enhancement Process of Micro LED Devices Filled With Epoxy Resin Adhesive39
Compact Modeling of Impact Ionization in High-Voltage Devices39
Contact/Via Failure Recovery Using Nanosecond Green Laser Annealing39
Pd/Ge/Ti/Pt/Au Metal Stack on Semi-Insulating Gallium Arsenide: Ohmic Contact and Temperature Dependence39
Extended Scale Length Theory for Low-Dimensional Field-Effect Transistors38
Orientation Polarization Effect in Al2O3/Hydrogen-Terminated Diamond MISFETs38
Analysis of Vertical GaN JBS and p-n Diodes by Mg Ion Implantation and Ultrahigh-Pressure Annealing38
Low-Resistance and Thermally Stable Ohmic Contacts on n-GeSn Using Ni and Ti Metallization38
Capacitance Modeling With Charge Partitions Covering Full-Region Operations of TFETs38
1.2-kV Vertical GaN PIN Rectifier With Ion-Implanted Floating Guard Rings37
Linear Error Correction Codec Implementation Based on an In-Memory Computing Architecture for Nonvolatile Memories37
Peak Response Wavelength Tunable 4H-SiC UV Detector Covering Near-Ultraviolet Region With High-Temperature Stability and Radiation Hardness37
Fabrication and Characterization of Self-Assembled Low Voltage Operated OTFT for H2S Gas Sensor for Oil and Gas Industry37
Low-Voltage Operated High DC Gain Amplification Stage Based on Large-Area Manufacturable Amorphous Oxide Semiconductor Thin-Film Transistor37
Plasma Jet Printing: An Introduction37
Numerical Modeling of Dynamic Thermal Coupling in GaN HEMTs Calibrated by Transient Measurements36
A Graphene/Ge Heterostructure-Based Short-Wavelength Infrared Photodetector With >1 AW --1 Responsivity Boosted by a CuI Antireflection Layer36
Frequency Doubler Based on Ferroelectric Tunnel Field-Effect Transistor36
Ga 2 O 3 TCAD Mobility Parameter Calibration Using Simulation Augmented Machine Learning With Phys35
Design and Testing of Metal Photocathode X-Ray Source Based on Microchannel Plate35
High-Throughput Screening Ferroelectric–Dielectric Heterostructure for Robust Memristor and Artificial Synapse35
15 GHz GaN Hi–Lo IMPATT Diodes With Pulsed Peak Power of 25.5 W35
Enhanced Resistive Switching in Flexible Hybrid RRAM Devices With PVK:MoS2/TiO2 Bilayer35
Reduction of Metal/Carbon Nano-Tubes Interface Contact Resistance by Floating Catalyst Growing Method and Semimetals34
Contact Length Scaling in In 2 O 3 and InGaZnO FETs: Critical Roles of Quantum Confinement and Ind34
Sigmoid Probabilistic Bits Using SiO Threshold Switching Devices for Probabilistic Computing34
Recovery Operation in HfZrO x -Based FeFETs With Interfacial Layer Scavenging34
A Review on Cell Structure Optimization of IGBT Under Overload Condition34
Gate Stress Polarity Dependence of AC Bias Temperature Instability in Silicon Carbide MOSFETs33
Theoretical Study for Carrier Transit Limited Performance of Gate-All-Around Si Nanowire Transistor by Time-Dependent Quantum Transport Simulation33
SiC Trench MOSFET With Embedded Schottky Super Barrier Rectifier for High Temperature Ruggedness33
Numerical Analysis for a P-Drift Region N-IGBT With Enhanced Dynamic Electric Field Modulation Effect33
Compact E-Band Sheet Beam Folded Waveguide Traveling Wave Tube for High Data Rate Communication32
Impedance Spectroscopy of Hafnium Oxide: Memristive and Memcapacitive Switching With Annealing32
Endurance Study of Silicon-Doped Hafnium Oxide (HSO) and Zirconium-Doped Hafnium Oxide (HZO)-Based FeFET Memory32
Influence of BCB Protection on Irradiation Response of InP-Based HEMTs: A Comparative Study32
BTI Reliability of IGZTO FETs: Hydrogen Dynamics, AC/DC Stress Effects, and Advanced Modeling32
Understanding Switching Mechanism of Selector-Only Memory Using Se-Based Ovonic Threshold Switch Device32
Accurate ML-Based Prediction of Next-Generation nand With Limited Data Using Generative AI and Transfer Learning31
Linearity Performance of Derivative Superposition in GaN HEMTs: A Device-to-Circuit Perspective31
Physical Compact Model for Source-Gated Transistors for DC Application31
One-Step Complementary-Magnetization-Switching Spin-Orbit Torque Memory Based on U-Shaped Bending Current for Compute-in-Memory Applications31
High-Voltage E-Mode p-GaN Gate HEMT on Sapphire With Gate Termination Extension31
Design of High-Sensitivity Piezoelectric Micromachined Ultrasonic Transducer Based on Single-Crystal Lithium Niobate Thin Films31
A SPICE-Compatible High-Efficiency Equivalent Mechanical Circuit Method for Electro-Thermal-Mechanical Coupling Simulation31
A True Random Number Generator Based on High-Speed Ag/a-Si/Pt Memristor31
Channel Thickness and Grain Size Engineering for Improvement of Variability and Performance in 3-D NAND Flash Memory31
Study of the Input Cavity Characteristics With Two-Beam Loading for Developing a Compact and High-Power Ka-Band Klystron30
Performance Enhancement of Thin-Film Transistor Based on In2O3:F/In2O3 Homojunction30
Unipolar Conductivity Enhancement and Its Experiments in SOI-LIGBT30
A Sheet Beam Electron Gun Based on Carbon Nanotube Cold Cathode30
Investigation on Electrical–Thermal-Stress Failure of GaN HEMTs Under High-Power Microwave-Induced Pulse Injection30
Stochastic Resonance in HfO₂-Based Memristors: Impact of External Noise on the Binary STDP Protocol30
Novel Ultrafast Backscattered Electron Detector With Field-Effect Transistor Enhanced In Situ Signal Amplification30
Transport Properties of 5-nm Tunnel Field-Effect Transistor for High-Performance Switches Decorated With Blue Phosphorene and Transition Metals29
Metamaterial-Inspired 0.22 THz Traveling-Wave Tubes With Double Sheet Beams29
Alpha Particle Detection Using Highly Rectifying Ni/Ga 2 O 3 /4H-SiC Heteroepitaxial MOS Junction29
Avalanche Breakdown in the Base-Emitter- Shorted Silicon Avalanche Transistor Affected by Voltage Ramp29
Tight-Binding Device Modeling of 2-D Topological Insulator Field-Effect Transistors With Gate-Induced Phase Transition29
Symmetric BSIM-SOI—Part II: A Compact Model for Partially Depleted SOI MOSFETs29
Thickness-Dependent Enhancement of Ferroelectric Properties in ${\text{HfZrO}_{x}}$ Devices by Bottom ${\text{TiO}_{2}}$ Interlayer29
Proposal of Low-Loss Non-Volatile Mid-Infrared Optical Phase Shifter Based on Ge2Sb2Te3S229
A MEMS Thermopile Pirani Sensor Integrated With Composite Nanoforests for Vacuum Monitoring in Semiconductor Equipment28
Gate Oxide Instability of 4H-SiC p-Channel MOSFET Induced by AC Stress at 200 °C28
Characterization of Trapping Effects Related to Carbon Doping Level in AlGaN Back-Barriers for AlGaN/GaN HEMTs28
Spontaneously Oxidized CuxO/β-Ga2O3 p-n Junction for Self-Powered Deep-Ultraviolet Photodetection28
Temperature-Dependent Dynamic Ron of GaN E-HEMTs: The Impact of p-GaN Drain28
Grating Perovskite Enhanced Polarization-Sensitive GaAs-Based Photodetector28
Effect of X-Ray Irradiation on Colloidal Quantum Dot SWIR CMOS Image Sensor28
Analytical Modeling of Potential Barrier for Charge Transfer in Pinned Photodiode CMOS Image Sensors28
Compact Modeling of Impact Ionization and Conductivity Modulation in LDMOS Transistors28
Three-Dimensional Design of a 4H-SiC NPN Lateral Phototransistor for Micro-Pixel in Ultraviolet Optoelectronic Integration28
Highly Efficient Gyrotron Mode Converter With a Launcher Changing Angular Spectrum of the Operating Mode28
Electrical Characterization of AlGaN/GaN-HEMTs on Semi-Insulating GaN Substrates Doped With Fe, C, or Mn and Grown by Hydride Vapor Phase Epitaxy28
Temperature-Dependent Accuracy Analysis and Resistance Temperature Correction in RRAM-Based In-Memory Computing28
Preparation of Dome-Shaped SiO2/Al2O3 Composite-Patterned Sapphire Substrate for High-Performance Mini-LED Backlight Modules28
Unraveling the Impact of Cation Composition on Atomic Layer Deposited Ultrathin In–Sn–O Field-Effect Transistors28
Energy and Disturbance Analysis of 1T-DRAM With Nanowire Gate-All-Around RFET27
Fully Physical BTI Analysis Tool (BAT) for Modeling of NBTI Architecture, Materials, Process, and Dimension Dependence27
Study on Scalable Model of Multifinger Structure for GaN p-i-n Diode27
Temperature-Dependent Dynamic Performance of p-GaN Gate HEMT on Si27
Design and Characterization of n/p-well CMOS SPAD With Low Dark Count Rate and High Photon Detection Efficiency27
Interfacial Layer Engineering in Sub-5-nm HZO: Enabling Low-Temperature Process, Low-Voltage Operation, and High Robustness27
Analysis of Thermal Disturbance in Vertically Stacked Phase-Change Memory Using Multiphysics Simulation27
Influences of Adjacent High Voltage on the Characteristics and Reliability of SOI Power Devices for Automotive Application27
Effect of Microwave Leakage on Backward Current in an X-Band Dual-Mode RBWO Packaged With Permanent Magnet27
Design and Experimental Demonstration of 4H-SiC Lateral High-Voltage MOSFETs With Double-RESURFs Technology for Power ICs27
IEEE Transactions on Electron Devices Publication Information27
A High Voltage Gain Inverter Integrated With Enhancement- and Depletion-Mode a-InGaZnO Thin-Film Transistors26
IEEE ELECTRON DEVICES SOCIETY26
Multiscale Modeling of Self-Heating-Induced and Deformation-Accelerated Dielectric Traps Impacting Critical Path of Dielectric Breakdown in 5-nm Stacked Nanosheet FET26
Enhancement of ISPP Efficiency Using Neural Network-Based Optimization of 3-D NAND Cell26
Controlled Acceleration of PCM Cells Time Drift Through On-Chip Current-Induced Annealing for AIMC Multilevel MVM Computation26
TechRxiv: Share Your Preprint Research with the World!26
IEEE Transactions on Electron Devices information for authors26
Modeling Thermal Effects for 28-nm Node Fully Depleted SOI Devices Under Cryogenic Temperatures26
IEEE Transactions on Electron Devices Information for Authors26
IEEE ELECTRON DEVICES SOCIETY26
IEEE Transactions on Electron Devices Information for Authors26
IEEE ELECTRON DEVICES SOCIETY25
IEEE Transactions on Electron Devices Information for Authors25
Investigation of a Low-Loss Transmission Structure for W-Band TWT25
Plateau Voltage and Dynamic Capacitance Effect on SiC MOSFETs’ Gate Ringing25
A Capacitance Extraction Method Using Local Discontinuous Galerkin Method on Adaptive Triangular Meshes25
A Difference-Microvariation Solution and Analytical Model for Generic HEMTs25
Avalanche Multiplication Factor Modeling and Extraction at High Currents in SiGe HBTs25
HfO2–ZrO2 Superlattice Ferroelectric Field-Effect Transistor With Improved Endurance and Fatigue Recovery Performance25
Hot-Electron Hardening in GaN-Based Power Devices by Selective p-GaN Gate Epitaxy25
Improvement of Electron Gun Breakdown Performance Through Surface Flashover and Discharge Studies25
Highly Sensitive Free-Standing Waveguide-Integrated Bolometer on Germanium-on-Insulator Platform for Mid-Infrared On-Chip Spectroscopy25
Blank Page25
High Breakdown Voltage and High Current Injection Vertical GaN-on-GaN p-n Diodes With Extremely Low On-Resistance Fabricated on Ammonothermally Grown Bulk GaN Substrates25
Thermal Dynamic of Single-Event Burnout in SiC Power MOSFETs25
Tandem Evaluation of AlN/β - and ε-Ga2O3 Tri-Gate MOSHEMTs24
The Rectification Ability in the Si-Based Geometric Diode Based on Au/p-Si Nanocone/Au Heterostructure24
An Investigation of HZO-Based n/p-FeFET Operation Mechanism and Improved Device Performance by the Electron Detrapping Mode24
Junction Temperature Correction Method for SiC MOSFET Based on Turn-Off Oscillation Frequency of Drain-Source Voltage24
High Number of Transport Modes: A Requirement for Contact Resistance Reduction to Atomically Thin Semiconductors24
Corrections to “Low-Temperature Microwave Annealing Processes for Future IC Fabrication—A Review” [Mar 14 651-665]24
A Novel Electron Gun Design Approach With an Externally Assembled Anode24
Toward the Development of High-Performance Direct Electron Detectors by Means of TCAD Simulations24
Impact of Trap States at Deep Trench Sidewalls on the Responsivity of Island Photodiodes24
Source-Drain Series Resistance Model for N-Stack Nanosheet FETs Using Transmission Line Matrix Method24
Ultrathin Indium Oxide Thin-Film Transistors With Gigahertz Operation Frequency24
Frequency Adaptive Single-Transistor Neuron Based on Temporal Charge Trapping24
Characterization and Analysis of 4H-SiC Super Junction JFETs Fabricated by Sidewall Implantation24
Toward the Understanding on Threshold Voltage Drift Mechanisms in GaN MOSc-HEMTs Through the Influence of Device Architecture24
High-Performance Flexible Solution-Processed Organic Nonvolatile Memory Transistors24
Review of Quanta Image Sensors for Ultralow-Light Imaging24
Analysis of SiC NPN Ultraviolet Phototransistor Under Ultrahigh Temperature24
Comprehensive Study of Improved Negative-Bias-Illumination-Temperature Stress Stability in Terbium-Doped Indium-Zinc-Oxide Thin-Film Transistors24
IEEE Transactions on Electron Devices Information for Authors24
Enhancing Optical Performance for White Light-Emitting Diodes Using Quantum- Dots/Boron Nitride Hybrid Reflective Structure24
Optimization of a Cusp Gun With a Grid for a Terahertz Gyrotron Traveling-Wave Amplifier24
A Finite Element Analysis for Vacuum Amplifier Electron Gun of Fine Pencil Beam24
A Physical Charge-Based Model for Transient Response of Metal Oxide Thin-Film Transistors Considering Relaxation of Trap States23
Cross-Coupled Gated Tunneling Diodes With Unprecedented PVCRs Enabling Compact SRAM Design—Part I: Device Concept23
Temperature-Dependent High Magnetoresistance in Zigzag Silicene Nanoribbon Heterostructure23
A Photoelectric Synergistically Excited Cold-Cathode High-Frequency Radiation Source: From GHz to THz23
Nearly Ideal Breakdown Voltage Observed in Lateral p-i-n Diodes Fabricated on a SiC High-Purity Semi-Insulating Substrate23
Switching Dynamics of HfO2–ZrO2 Nanolaminates With Different Laminate Thicknesses23
Computational Investigation of c-GaN/GaAs1–x N x /GaAs Heterojunction Solar Cell23
A Wideband High-Power Microwave Mode Converter Using Vane-Loaded Waveguide23
On-Chip Learning of Neural Network Using Spin-Based Activation Function Nodes23
Role of Channel Inversion in Ambient Degradation of Phosphorene FETs23
Reliability of Advanced Nodes23
Thermionic Electron Emission Capacity of the Ba₃ScGa₂O₇.₅ Impregnated Cathode23
A RepetitiveKu-Band Coaxial Relativistic Klystron Amplifier Packaged With Permanent Magnets23
Resistive Switching Characteristics of HfO x -Based Memristor by Inserting GeTe Layer23
Unveiling Unintentional Fluorine Doping in TMDs During the Reactive Ion Etching: Root Cause Analysis, Physical Insights, and Solution23
Comparison of Single-Event Transient Under Heavy Ion and Pulsed Laser Irradiation in SiGe HBT Ultrawideband LNA23
Simulation of Parasitic Backward-Wave Excitation in High-Power Gyrotron Cavities23
Neuromorphic System Using Crosspoint-Type TaO x /Ta Memristors and Direct Device Training for Associative Memory23
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on Wide Band Gap Semiconductors for Automotive Applications23
High-Sensitivity Single-Walled Carbon Nanotube/Graphene/Al₂O₃/Ge Near-Infrared Photodetector23
Control of Resistive Switching Endurance in TiO2/TiO2–x Memristors via Thermally Assisted Oxygen Plasma With Power Modulation23
Real-Time Ultraviolet Flame Detection System Based on 4H-SiC Phototransistor23
Online Junction Temperature Detection for IGBTs Using Voltage Rise Time23
The ESD Behavior of D-Mode GaN MIS-HEMT22
Design and Cold Test of a G-Band 10-kW-Level Pulse TE01-Mode Gyrotron Traveling-Wave Tube22
Demonstration of 1.2-kV Rated Novel Power Poly-Si/4H-SiC Heterojunction Diode With Record Low Forward Voltage Drop22
Dielectrics for 2-D Electronics: From Device to Circuit Applications22
Tunable Synaptic Plasticity in Europium 2-D Perovskite ReRAM With Sub-0.5 V Switchings22
SOT-MRAM-Based Design for Energy-Efficient and Reliable Binary Neural Network Acceleration22
Stochastic Resonance Modeling of Floating Gate-Based Neurons in Summing Networks for Accurate and Energy-Efficient Operations22
Impacts of SiO2-Buried Structure on Performances of GaN-Based Vertical-Cavity Surface-Emitting Lasers22
A Data-Driven Remaining Useful Life Prediction Method for Power MOSFETs Considering Nonlinear Dynamical Behaviors22
Investigation on Degradation of 1200-V Planar and Trench SiC MOSFET Under Surge Current Stress of Body Diode22
High-Yield and Uniform NbO x -Based Threshold Switching Devices for Neuron Applications22
Enabling Low-Power Charge-Domain Nonvolatile Computing-in-Memory (CIM) With Ferroelectric Memcapacitor22
Advanced Bragg Resonator Integration for Enhanced Bandwidth and Stability in G-Band TWT With Staggered Double Vane Structure22
Effect of Substrate Bias in Ohmic p-Gate GaN-HEMTs on Unclamped Inductive Switching Capability22
Mathematical Modeling of Field Emission From a Microscale-Size Cathode to a Vacuum22
A Cross-Band High-Power Microwave Generator With Wide Frequency Tunability Based on a Relativistic Magnetron and a Radial Transit-Time Oscillator22
Scaling of GaSb/InAs Vertical Nanowire Esaki Diodes Down to Sub-10-nm Diameter22
Call for Papers for a Special Issue of IEEE Transactions on Electron Devices: Ultrawide Band Gap Semiconductor Devices for RF, Power and Optoelectronic Applications22
A Novel Self-Activated Gate-Clamping SiC MOSFET Enhancing Short Circuit Capability With Merit of Multicell Combination22
Broadband Photodetector Based on SnS 2 /MoS 2 /CuO/WSe 2 22
A Neuromorphic Brain Interface Based on RRAM Crossbar Arrays for High Throughput Real-Time Spike Sorting22
Evaluation of a Large Area, 83 μm Pixel Pitch Amorphous Selenium Indirect Flat Panel Detector22
Device-Level Thermal Analysis for Gallium Oxide Lateral Field-Effect Transistor22
Single-Event Effects of AlGaN/GaN HEMTs Under Different Biases22
Self-Heating Mitigation of TreeFETs by Interbridges22
Experimental Investigation on Threshold Voltage Instability for β-Ga2O3 MOSFET Under Electrical and Thermal Stress22
Novel Integrated Double pMOS SOI-LIGBT With Low Loss and High Short-Circuit Capability22
Study on Schottky Al x Ga1-x N/GaN IMPATT Diodes for Millimeter-Wave Application22
Enhanced Resistive Switching Performances of Mn-Doped BiFeO₃ Memristor by Introducing Oxygen Reservoir Interface21
Impact of Back-Gate Bias on the Total Ionizing Dose and Hot Carrier Injection Effects in Double SOI nMOSFETs21
Electrothermal Design of Silicon-Doped Microheaters for Optical Phase Change Memory21
Cu–Cu Bonded Microbump Interconnects With a 10-μm Pitch for 3-D-Stacked Chiplets21
Carrier Mobility in a 55-nm CMOS at 4 K: Characterization, Modeling, and Circuit Implications21
1.4690690040588